Search

Paresh H. Patel

Examiner (ID: 5802, Phone: (571)272-1968 , Office: P/2868 )

Most Active Art Unit
2868
Art Unit(s)
2858, 2829, 2868
Total Applications
1817
Issued Applications
1428
Pending Applications
110
Abandoned Applications
301

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18538765 [patent_doc_number] => 20230243871 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-03 [patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES [patent_app_type] => utility [patent_app_number] => 18/295721 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 41604 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 398 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295721 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295721
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES Apr 3, 2023 Abandoned
Array ( [id] => 18740967 [patent_doc_number] => 20230349947 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-02 [patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES [patent_app_type] => utility [patent_app_number] => 18/295728 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 40920 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 399 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295728 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295728
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES Apr 3, 2023 Abandoned
Array ( [id] => 18676841 [patent_doc_number] => 20230314474 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-05 [patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES [patent_app_type] => utility [patent_app_number] => 18/295755 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 43745 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -23 [patent_words_short_claim] => 296 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295755 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295755
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES Apr 3, 2023 Abandoned
Array ( [id] => 18755352 [patent_doc_number] => 20230358785 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-09 [patent_title] => PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES [patent_app_type] => utility [patent_app_number] => 18/295716 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 40941 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -23 [patent_words_short_claim] => 404 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295716 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295716
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES Apr 3, 2023 Abandoned
Array ( [id] => 18538766 [patent_doc_number] => 20230243872 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-03 [patent_title] => Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes [patent_app_type] => utility [patent_app_number] => 18/295748 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 39810 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 399 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295748 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295748
Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes Apr 3, 2023 Abandoned
Array ( [id] => 18676849 [patent_doc_number] => 20230314482 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-05 [patent_title] => Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes [patent_app_type] => utility [patent_app_number] => 18/295738 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 40376 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 493 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18295738 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/295738
Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes Apr 3, 2023 Abandoned
Array ( [id] => 19911730 [patent_doc_number] => 12287940 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-04-29 [patent_title] => Noise measurements with a capacitance sensor [patent_app_type] => utility [patent_app_number] => 18/123474 [patent_app_country] => US [patent_app_date] => 2023-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 4940 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18123474 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/123474
Noise measurements with a capacitance sensor Mar 19, 2023 Issued
Array ( [id] => 18973299 [patent_doc_number] => 20240053391 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-15 [patent_title] => APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 18/183446 [patent_app_country] => US [patent_app_date] => 2023-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5987 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18183446 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/183446
Apparatus for testing image sensor and operating method thereof Mar 13, 2023 Issued
Array ( [id] => 19197302 [patent_doc_number] => 11994534 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-05-28 [patent_title] => Testing device for integrated circuit package [patent_app_type] => utility [patent_app_number] => 18/182717 [patent_app_country] => US [patent_app_date] => 2023-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6315 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18182717 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/182717
Testing device for integrated circuit package Mar 12, 2023 Issued
Array ( [id] => 20086479 [patent_doc_number] => 20250216415 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-03 [patent_title] => PROBE [patent_app_type] => utility [patent_app_number] => 18/850058 [patent_app_country] => US [patent_app_date] => 2023-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 40 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18850058 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/850058
PROBE Mar 12, 2023 Pending
Array ( [id] => 18981437 [patent_doc_number] => 11906602 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-20 [patent_title] => Magnetic sensor and magnetic sensor system [patent_app_type] => utility [patent_app_number] => 18/112605 [patent_app_country] => US [patent_app_date] => 2023-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 35 [patent_no_of_words] => 17961 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 254 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18112605 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/112605
Magnetic sensor and magnetic sensor system Feb 21, 2023 Issued
Array ( [id] => 19879735 [patent_doc_number] => 20250111992 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-04-03 [patent_title] => SWITCH CURRENT SENSORS [patent_app_type] => utility [patent_app_number] => 18/839405 [patent_app_country] => US [patent_app_date] => 2023-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 19408 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18839405 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/839405
Switch current sensors Feb 15, 2023 Issued
Array ( [id] => 19382330 [patent_doc_number] => 20240272200 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-15 [patent_title] => PROBE CARD FOR FINE PITCH CIRCUIT PROBE TESTING OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICES AND METHODS OF FORMING THE SAME [patent_app_type] => utility [patent_app_number] => 18/110176 [patent_app_country] => US [patent_app_date] => 2023-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11734 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18110176 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/110176
Probe card for fine pitch circuit probe testing of semiconductor integrated circuit devices and methods of forming the same Feb 14, 2023 Issued
Array ( [id] => 20467653 [patent_doc_number] => 12523689 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-01-13 [patent_title] => Low power capacitor sensor array [patent_app_type] => utility [patent_app_number] => 18/169417 [patent_app_country] => US [patent_app_date] => 2023-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1265 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18169417 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/169417
Low power capacitor sensor array Feb 14, 2023 Issued
Array ( [id] => 20026306 [patent_doc_number] => 20250164528 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-05-22 [patent_title] => LIQUID-COOLED TERMINATION FOR RADIO FREQUENCY POWER MEASUREMENT [patent_app_type] => utility [patent_app_number] => 18/836196 [patent_app_country] => US [patent_app_date] => 2023-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3472 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18836196 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/836196
LIQUID-COOLED TERMINATION FOR RADIO FREQUENCY POWER MEASUREMENT Feb 6, 2023 Pending
Array ( [id] => 19302143 [patent_doc_number] => 20240230720 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-11 [patent_title] => DETECTION DEVICE AND DETECTION METHOD [patent_app_type] => utility [patent_app_number] => 18/150587 [patent_app_country] => US [patent_app_date] => 2023-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3346 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18150587 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/150587
DETECTION DEVICE AND DETECTION METHOD Jan 4, 2023 Abandoned
Array ( [id] => 19710302 [patent_doc_number] => 20250020444 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-16 [patent_title] => SENSING DEVICE [patent_app_type] => utility [patent_app_number] => 18/715611 [patent_app_country] => US [patent_app_date] => 2023-01-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5042 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18715611 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/715611
SENSING DEVICE Jan 1, 2023 Pending
Array ( [id] => 18613677 [patent_doc_number] => 20230280413 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-07 [patent_title] => Non-Intrusive, In-Situ Power Measurement Method [patent_app_type] => utility [patent_app_number] => 18/146091 [patent_app_country] => US [patent_app_date] => 2022-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10746 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18146091 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/146091
Non-intrusive, in-situ power measurement method Dec 22, 2022 Issued
Array ( [id] => 19755756 [patent_doc_number] => 20250044321 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-06 [patent_title] => CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRISING SAME [patent_app_type] => utility [patent_app_number] => 18/717410 [patent_app_country] => US [patent_app_date] => 2022-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12239 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18717410 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/717410
CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRISING SAME Dec 4, 2022 Pending
Array ( [id] => 18470347 [patent_doc_number] => 20230204632 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-29 [patent_title] => CURRENT SENSING WITH POSITIONING STABILITY [patent_app_type] => utility [patent_app_number] => 18/070953 [patent_app_country] => US [patent_app_date] => 2022-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9029 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18070953 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/070953
Current sensing with positioning stability Nov 28, 2022 Issued
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