Search

Paresh H. Patel

Examiner (ID: 5802, Phone: (571)272-1968 , Office: P/2868 )

Most Active Art Unit
2868
Art Unit(s)
2858, 2829, 2868
Total Applications
1817
Issued Applications
1428
Pending Applications
110
Abandoned Applications
301

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18094670 [patent_doc_number] => 20220413011 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-29 [patent_title] => IC CHIP HOLDER [patent_app_type] => utility [patent_app_number] => 17/896816 [patent_app_country] => US [patent_app_date] => 2022-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5465 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17896816 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/896816
IC chip holder Aug 25, 2022 Issued
Array ( [id] => 18213475 [patent_doc_number] => 20230059740 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-02-23 [patent_title] => PROBE SYSTEM AND MACHINE APPARATUS THEREOF [patent_app_type] => utility [patent_app_number] => 17/888500 [patent_app_country] => US [patent_app_date] => 2022-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14175 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17888500 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/888500
Probe system and machine apparatus thereof Aug 15, 2022 Issued
Array ( [id] => 18676840 [patent_doc_number] => 20230314473 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-05 [patent_title] => PROBE AND ELASTIC STRUCTURE THEREOF [patent_app_type] => utility [patent_app_number] => 17/889034 [patent_app_country] => US [patent_app_date] => 2022-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7147 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17889034 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/889034
Probe and elastic structure thereof Aug 15, 2022 Issued
Array ( [id] => 20130190 [patent_doc_number] => 12372497 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-29 [patent_title] => Plate cushion device having a compression gap lock [patent_app_type] => utility [patent_app_number] => 17/887481 [patent_app_country] => US [patent_app_date] => 2022-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 0 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 292 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17887481 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/887481
Plate cushion device having a compression gap lock Aug 13, 2022 Issued
Array ( [id] => 18486211 [patent_doc_number] => 20230213554 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-07-06 [patent_title] => MODULE SUBSTRATE FOR SEMICONDUCTOR MODULE, SEMICONDUCTOR MODULE AND TEST SOCKET FOR TESTING THE SAME [patent_app_type] => utility [patent_app_number] => 17/884661 [patent_app_country] => US [patent_app_date] => 2022-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6876 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17884661 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/884661
Module substrate for semiconductor module, semiconductor module and test socket for testing the same Aug 9, 2022 Issued
Array ( [id] => 18973308 [patent_doc_number] => 20240053400 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-15 [patent_title] => Semiconductor Test Equipment and Method of Performing Current and Voltage Test Measurements [patent_app_type] => utility [patent_app_number] => 17/818520 [patent_app_country] => US [patent_app_date] => 2022-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3052 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 31 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17818520 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/818520
Semiconductor test equipment and method of performing current and voltage test measurements Aug 8, 2022 Issued
Array ( [id] => 20373541 [patent_doc_number] => 12480973 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-25 [patent_title] => Probe card device [patent_app_type] => utility [patent_app_number] => 17/883830 [patent_app_country] => US [patent_app_date] => 2022-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 0 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 304 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17883830 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/883830
Probe card device Aug 8, 2022 Issued
Array ( [id] => 18168264 [patent_doc_number] => 20230034874 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-02-02 [patent_title] => OSCILLATION DETECTOR AND OPERATING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 17/873795 [patent_app_country] => US [patent_app_date] => 2022-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6018 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17873795 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/873795
Oscillation detector and operating method thereof Jul 25, 2022 Issued
Array ( [id] => 19978304 [patent_doc_number] => 12345778 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-01 [patent_title] => High-bandwidth coaxial interface test fixture [patent_app_type] => utility [patent_app_number] => 17/997116 [patent_app_country] => US [patent_app_date] => 2022-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 2355 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17997116 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/997116
High-bandwidth coaxial interface test fixture Jul 21, 2022 Issued
Array ( [id] => 17991330 [patent_doc_number] => 20220357367 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-10 [patent_title] => Method and System for Improved Current Sensor [patent_app_type] => utility [patent_app_number] => 17/868986 [patent_app_country] => US [patent_app_date] => 2022-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11668 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17868986 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/868986
Method and system for improved current sensor Jul 19, 2022 Issued
Array ( [id] => 19227887 [patent_doc_number] => 12007521 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-06-11 [patent_title] => Detection method of a user of an apparatus for controlling one or more functionalities of the apparatus [patent_app_type] => utility [patent_app_number] => 17/867175 [patent_app_country] => US [patent_app_date] => 2022-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 8336 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 245 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17867175 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/867175
Detection method of a user of an apparatus for controlling one or more functionalities of the apparatus Jul 17, 2022 Issued
Array ( [id] => 18022096 [patent_doc_number] => 20220373595 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-24 [patent_title] => SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE [patent_app_type] => utility [patent_app_number] => 17/813298 [patent_app_country] => US [patent_app_date] => 2022-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 20515 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17813298 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/813298
System for testing an integrated circuit of a device and its method of use Jul 17, 2022 Issued
Array ( [id] => 18150188 [patent_doc_number] => 20230024045 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-26 [patent_title] => SEMICONDUCTOR TESTING APPARATUS WITH ADAPTOR [patent_app_type] => utility [patent_app_number] => 17/865419 [patent_app_country] => US [patent_app_date] => 2022-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8300 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17865419 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/865419
SEMICONDUCTOR TESTING APPARATUS WITH ADAPTOR Jul 14, 2022 Abandoned
Array ( [id] => 19340049 [patent_doc_number] => 12050234 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-07-30 [patent_title] => IC socket includes a base part with a contact pin and a sheet member for electrical connection between the IC package and the wiring board [patent_app_type] => utility [patent_app_number] => 17/863440 [patent_app_country] => US [patent_app_date] => 2022-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 20 [patent_no_of_words] => 11682 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17863440 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/863440
IC socket includes a base part with a contact pin and a sheet member for electrical connection between the IC package and the wiring board Jul 12, 2022 Issued
Array ( [id] => 19481038 [patent_doc_number] => 20240329080 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-03 [patent_title] => SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOARD INTERFACES [patent_app_type] => utility [patent_app_number] => 18/579270 [patent_app_country] => US [patent_app_date] => 2022-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3895 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18579270 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/579270
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOARD INTERFACES Jul 11, 2022 Pending
Array ( [id] => 18182985 [patent_doc_number] => 20230043715 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-02-09 [patent_title] => PROBE, PROBE DEVICE, AND INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 17/858333 [patent_app_country] => US [patent_app_date] => 2022-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4310 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 35 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17858333 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/858333
PROBE, PROBE DEVICE, AND INSPECTION METHOD Jul 5, 2022 Abandoned
Array ( [id] => 18122394 [patent_doc_number] => 20230007997 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-12 [patent_title] => VERTICAL PROBE HEAD [patent_app_type] => utility [patent_app_number] => 17/858424 [patent_app_country] => US [patent_app_date] => 2022-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9860 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 470 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17858424 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/858424
Vertical probe head Jul 5, 2022 Issued
Array ( [id] => 18226902 [patent_doc_number] => 20230065896 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => PROBE CARD AND WAFER TESTING ASSEMBLY THEREOF [patent_app_type] => utility [patent_app_number] => 17/856678 [patent_app_country] => US [patent_app_date] => 2022-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4238 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17856678 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/856678
Probe card and wafer testing assembly thereof Jun 30, 2022 Issued
Array ( [id] => 19465558 [patent_doc_number] => 20240319228 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-26 [patent_title] => PROBE MEMBER FOR INSPECTION, AND MANUFACTURING METHOD THEREFOR [patent_app_type] => utility [patent_app_number] => 18/574132 [patent_app_country] => US [patent_app_date] => 2022-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6212 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18574132 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/574132
PROBE MEMBER FOR INSPECTION, AND MANUFACTURING METHOD THEREFOR Jun 27, 2022 Pending
Array ( [id] => 18863360 [patent_doc_number] => 20230417796 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-28 [patent_title] => INTEGRATED CIRCUIT TEST SOCKET WITH INTEGRATED DEVICE PICKING MECHANISM [patent_app_type] => utility [patent_app_number] => 17/850858 [patent_app_country] => US [patent_app_date] => 2022-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6550 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17850858 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/850858
Integrated circuit test socket with integrated device picking mechanism Jun 26, 2022 Issued
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