Search

Patrick David Maines

Examiner (ID: 13328, Phone: (571)270-1911 , Office: P/3748 )

Most Active Art Unit
3748
Art Unit(s)
3746, 3748, 6218, OPQA, 4165
Total Applications
643
Issued Applications
540
Pending Applications
11
Abandoned Applications
101

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19551509 [patent_doc_number] => 12135211 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-11-05 [patent_title] => Device for measuring a substrate and method for correcting cyclic error components of an interferometer [patent_app_type] => utility [patent_app_number] => 17/737209 [patent_app_country] => US [patent_app_date] => 2022-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3687 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17737209 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/737209
Device for measuring a substrate and method for correcting cyclic error components of an interferometer May 4, 2022 Issued
Array ( [id] => 19014004 [patent_doc_number] => 11920928 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-05 [patent_title] => System and method for correcting optical path length measurement errors [patent_app_type] => utility [patent_app_number] => 17/733846 [patent_app_country] => US [patent_app_date] => 2022-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 22 [patent_no_of_words] => 9413 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 223 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17733846 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/733846
System and method for correcting optical path length measurement errors Apr 28, 2022 Issued
Array ( [id] => 20101183 [patent_doc_number] => 20250231119 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-17 [patent_title] => INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION METHOD, AND PROGRAM [patent_app_type] => utility [patent_app_number] => 18/853865 [patent_app_country] => US [patent_app_date] => 2022-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2235 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18853865 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/853865
INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION METHOD, AND PROGRAM Apr 27, 2022 Pending
Array ( [id] => 18888738 [patent_doc_number] => 11867505 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-01-09 [patent_title] => Interferometric speckle visibility spectroscopy [patent_app_type] => utility [patent_app_number] => 17/661254 [patent_app_country] => US [patent_app_date] => 2022-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 29 [patent_figures_cnt] => 49 [patent_no_of_words] => 18159 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17661254 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/661254
Interferometric speckle visibility spectroscopy Apr 27, 2022 Issued
Array ( [id] => 18040004 [patent_doc_number] => 20220384221 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-01 [patent_title] => DISPLACEMENT MEASUREMENTS IN SEMICONDUCTOR WAFER PROCESSING [patent_app_type] => utility [patent_app_number] => 17/731124 [patent_app_country] => US [patent_app_date] => 2022-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14665 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17731124 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/731124
Displacement measurements in semiconductor wafer processing Apr 26, 2022 Issued
Array ( [id] => 20506925 [patent_doc_number] => 12541200 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-02-03 [patent_title] => Non-uniform light-emitting lidar apparatus and autonomous robot including the same [patent_app_type] => utility [patent_app_number] => 17/724225 [patent_app_country] => US [patent_app_date] => 2022-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 900 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17724225 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/724225
Non-uniform light-emitting lidar apparatus and autonomous robot including the same Apr 18, 2022 Issued
Array ( [id] => 17762527 [patent_doc_number] => 20220236139 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-28 [patent_title] => METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICAL ELEMENT [patent_app_type] => utility [patent_app_number] => 17/720344 [patent_app_country] => US [patent_app_date] => 2022-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8080 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -22 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17720344 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/720344
Method and device for characterizing the surface shape of an optical element Apr 13, 2022 Issued
Array ( [id] => 19702534 [patent_doc_number] => 12196551 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-01-14 [patent_title] => Broadband interferometry and method for measurement range extension by using same [patent_app_type] => utility [patent_app_number] => 17/716266 [patent_app_country] => US [patent_app_date] => 2022-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 5767 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17716266 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/716266
Broadband interferometry and method for measurement range extension by using same Apr 7, 2022 Issued
Array ( [id] => 20607475 [patent_doc_number] => 12583056 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-03-24 [patent_title] => Method for monitoring a laser machining process and laser machining system therefor [patent_app_type] => utility [patent_app_number] => 17/715386 [patent_app_country] => US [patent_app_date] => 2022-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7124 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17715386 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/715386
Method for monitoring a laser machining process and laser machining system therefor Apr 6, 2022 Issued
Array ( [id] => 18696290 [patent_doc_number] => 20230326726 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-12 [patent_title] => OPTICAL SPECTRUM SENSOR WAFER OR ROBOT FOR CHAMBER CONDITION MONITORING [patent_app_type] => utility [patent_app_number] => 17/715866 [patent_app_country] => US [patent_app_date] => 2022-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6279 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 33 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17715866 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/715866
Optical spectrum sensor wafer or robot for chamber condition monitoring Apr 6, 2022 Issued
Array ( [id] => 18078863 [patent_doc_number] => 20220404475 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-22 [patent_title] => Single-chip optical transceiver [patent_app_type] => utility [patent_app_number] => 17/714161 [patent_app_country] => US [patent_app_date] => 2022-04-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3488 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17714161 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/714161
Single-chip optical transceiver Apr 5, 2022 Issued
Array ( [id] => 19668842 [patent_doc_number] => 12181583 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-12-31 [patent_title] => Lidar sensor with orthogonal arrays [patent_app_type] => utility [patent_app_number] => 17/712264 [patent_app_country] => US [patent_app_date] => 2022-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 4581 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 242 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17712264 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/712264
Lidar sensor with orthogonal arrays Apr 3, 2022 Issued
Array ( [id] => 17735913 [patent_doc_number] => 20220221372 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-14 [patent_title] => HETERODYNE ONE-DIMENSIONAL GRATING MEASURING DEVICE AND MEASURING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 17/710967 [patent_app_country] => US [patent_app_date] => 2022-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12595 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 298 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17710967 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/710967
Heterodyne one-dimensional grating measuring device and measuring method thereof Mar 30, 2022 Issued
Array ( [id] => 17735810 [patent_doc_number] => 20220221269 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-14 [patent_title] => MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE SHAPE [patent_app_type] => utility [patent_app_number] => 17/708409 [patent_app_country] => US [patent_app_date] => 2022-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8620 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17708409 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/708409
Measuring apparatus for interferometrically determining a surface shape Mar 29, 2022 Issued
Array ( [id] => 19181978 [patent_doc_number] => 11988562 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-05-21 [patent_title] => Interferometer with at least one dispersive element [patent_app_type] => utility [patent_app_number] => 17/701847 [patent_app_country] => US [patent_app_date] => 2022-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4755 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17701847 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/701847
Interferometer with at least one dispersive element Mar 22, 2022 Issued
Array ( [id] => 17898160 [patent_doc_number] => 20220307822 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-29 [patent_title] => INTERFEROMETRIC MEASUREMENT METHOD AND INTERFEROMETRIC MEASUREMENT ARRANGEMENT [patent_app_type] => utility [patent_app_number] => 17/701012 [patent_app_country] => US [patent_app_date] => 2022-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6921 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 256 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17701012 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/701012
Interferometric measurement method and interferometric measurement arrangement Mar 21, 2022 Issued
Array ( [id] => 17706139 [patent_doc_number] => 20220206145 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-06-30 [patent_title] => OPTICAL DISTANCE MEASUREMENT DEVICE AND MACHINING DEVICE [patent_app_type] => utility [patent_app_number] => 17/697189 [patent_app_country] => US [patent_app_date] => 2022-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15043 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 275 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17697189 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/697189
Optical distance measurement device and machining device Mar 16, 2022 Issued
Array ( [id] => 19188905 [patent_doc_number] => 20240167818 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-23 [patent_title] => METHOD FOR REDUCING THE KERR EFFECT IN AN INTERFEROMETRY MEASURING DEVICE, AND INTERFEROMETRY MEASURING DEVICE CONFIGURED TO IMPLEMENT THIS METHOD [patent_app_type] => utility [patent_app_number] => 18/548849 [patent_app_country] => US [patent_app_date] => 2022-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7666 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 365 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18548849 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/548849
METHOD FOR REDUCING THE KERR EFFECT IN AN INTERFEROMETRY MEASURING DEVICE, AND INTERFEROMETRY MEASURING DEVICE CONFIGURED TO IMPLEMENT THIS METHOD Mar 2, 2022 Pending
Array ( [id] => 19173563 [patent_doc_number] => 20240159537 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-16 [patent_title] => GENERATOR FOR GENERATING AN ANTI-KERR-EFFECT MODULATED LIGHT SIGNAL, INTERFEROMETRY MEASURING DEVICE COMPRISING SUCH A GENERATOR, AND METHOD FOR MODULATING A LIGHT SIGNAL [patent_app_type] => utility [patent_app_number] => 18/548842 [patent_app_country] => US [patent_app_date] => 2022-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4976 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18548842 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/548842
GENERATOR FOR GENERATING AN ANTI-KERR-EFFECT MODULATED LIGHT SIGNAL, INTERFEROMETRY MEASURING DEVICE COMPRISING SUCH A GENERATOR, AND METHOD FOR MODULATING A LIGHT SIGNAL Mar 2, 2022 Pending
Array ( [id] => 20042207 [patent_doc_number] => 20250180429 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-06-05 [patent_title] => METHOD FOR MEASURING OPTICAL LENS SURFACES [patent_app_type] => utility [patent_app_number] => 18/841753 [patent_app_country] => US [patent_app_date] => 2022-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 305 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18841753 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/841753
METHOD FOR MEASURING OPTICAL LENS SURFACES Feb 27, 2022 Pending
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