Search

Patrick J. Assouad

Supervisory Patent Examiner (ID: 18966, Phone: (571)272-2210 , Office: P/2858 )

Most Active Art Unit
2857
Art Unit(s)
2858, 2764, 2862, 2314, 2857, 2414, 2855
Total Applications
948
Issued Applications
723
Pending Applications
89
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 13447383 [patent_doc_number] => 20180275234 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-09-27 [patent_title] => UNIFIED COIL (UNIC) SYSTEMS AND METHOD FOR NEXT GENERATION MAGNETIC RESONANCE COILS [patent_app_type] => utility [patent_app_number] => 15/763383 [patent_app_country] => US [patent_app_date] => 2016-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13089 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -24 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15763383 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/763383
Unified coil (UNIC) systems and method for next generation magnetic resonance coils Nov 2, 2016 Issued
Array ( [id] => 12685570 [patent_doc_number] => 20180120356 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-05-03 [patent_title] => CURRENT MEASURING METHOD AND SYSTEM THEREOF [patent_app_type] => utility [patent_app_number] => 15/341278 [patent_app_country] => US [patent_app_date] => 2016-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3784 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15341278 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/341278
CURRENT MEASURING METHOD AND SYSTEM THEREOF Nov 1, 2016 Abandoned
Array ( [id] => 11664563 [patent_doc_number] => 20170153282 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-06-01 [patent_title] => 'ECU GROUND FAULT ISOLATION FOR A DELAY SYSTEM' [patent_app_type] => utility [patent_app_number] => 15/340043 [patent_app_country] => US [patent_app_date] => 2016-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5695 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15340043 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/340043
ECU ground fault isolation for a delay system Oct 31, 2016 Issued
Array ( [id] => 11708131 [patent_doc_number] => 20170176630 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-06-22 [patent_title] => 'DECONVOLUTION OF ELECTROMAGNETIC THICKNESS MEASUREMENT' [patent_app_type] => utility [patent_app_number] => 15/340258 [patent_app_country] => US [patent_app_date] => 2016-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7545 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15340258 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/340258
DECONVOLUTION OF ELECTROMAGNETIC THICKNESS MEASUREMENT Oct 31, 2016 Abandoned
Array ( [id] => 11620893 [patent_doc_number] => 20170131080 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-05-11 [patent_title] => 'THROUGH-THE-WALL MAGNETOQUASISTATIC POSITIONING' [patent_app_type] => utility [patent_app_number] => 15/339663 [patent_app_country] => US [patent_app_date] => 2016-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6259 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15339663 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/339663
Through-the-wall magnetoquasistatic positioning Oct 30, 2016 Issued
Array ( [id] => 12120177 [patent_doc_number] => 20180003763 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-01-04 [patent_title] => 'OPERATION VOLTAGE TESTING CIRCUIT AND METHOD' [patent_app_type] => utility [patent_app_number] => 15/339901 [patent_app_country] => US [patent_app_date] => 2016-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2950 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15339901 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/339901
Operation voltage testing circuit and method Oct 30, 2016 Issued
Array ( [id] => 12685552 [patent_doc_number] => 20180120350 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-05-03 [patent_title] => DIFFERENTIAL TEST PROBE [patent_app_type] => utility [patent_app_number] => 15/339730 [patent_app_country] => US [patent_app_date] => 2016-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4122 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15339730 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/339730
Differential test probe Oct 30, 2016 Issued
Array ( [id] => 13592935 [patent_doc_number] => 20180348016 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-12-06 [patent_title] => ENCODER AND BEARING UNIT COMPRISING AN ENCODER [patent_app_type] => utility [patent_app_number] => 15/775611 [patent_app_country] => US [patent_app_date] => 2016-10-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2537 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15775611 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/775611
ENCODER AND BEARING UNIT COMPRISING AN ENCODER Oct 25, 2016 Abandoned
Array ( [id] => 12645012 [patent_doc_number] => 20180106835 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-04-19 [patent_title] => SYSTEMS AND METHODS FOR DEPOPULATING PINS FROM CONTACTOR TEST SOCKETS FOR PACKAGED SEMICONDUCTOR DEVICES [patent_app_type] => utility [patent_app_number] => 15/296480 [patent_app_country] => US [patent_app_date] => 2016-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3736 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15296480 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/296480
Systems and methods for depopulating pins from contactor test sockets for packaged semiconductor devices Oct 17, 2016 Issued
Array ( [id] => 13464723 [patent_doc_number] => 20180283904 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-10-04 [patent_title] => MAGNETIC MARKER DETECTION METHOD AND MAGNETIC MARKER DETECTION DEVICE [patent_app_type] => utility [patent_app_number] => 15/763177 [patent_app_country] => US [patent_app_date] => 2016-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8083 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15763177 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/763177
Magnetic marker detection method and magnetic marker detection device Oct 16, 2016 Issued
Array ( [id] => 16736032 [patent_doc_number] => 10961670 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-03-30 [patent_title] => Magnetic marker and magnetic marker detection system [patent_app_type] => utility [patent_app_number] => 15/763196 [patent_app_country] => US [patent_app_date] => 2016-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7983 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15763196 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/763196
Magnetic marker and magnetic marker detection system Oct 16, 2016 Issued
Array ( [id] => 12644274 [patent_doc_number] => 20180106589 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-04-19 [patent_title] => THREE-DIMENSIONAL GAP MEASUREMENT SYSTEMS AND METHODS [patent_app_type] => utility [patent_app_number] => 15/295686 [patent_app_country] => US [patent_app_date] => 2016-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 28755 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -22 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15295686 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/295686
Three-dimensional gap measurement systems and methods Oct 16, 2016 Issued
Array ( [id] => 16743605 [patent_doc_number] => 10968581 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-04-06 [patent_title] => Magnetic marker and magnetic marker detection system [patent_app_type] => utility [patent_app_number] => 15/763236 [patent_app_country] => US [patent_app_date] => 2016-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5881 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15763236 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/763236
Magnetic marker and magnetic marker detection system Oct 16, 2016 Issued
Array ( [id] => 13946661 [patent_doc_number] => 10209096 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-02-19 [patent_title] => Rotation detecting device [patent_app_type] => utility [patent_app_number] => 15/285711 [patent_app_country] => US [patent_app_date] => 2016-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 10491 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 348 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15285711 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/285711
Rotation detecting device Oct 4, 2016 Issued
Array ( [id] => 11572138 [patent_doc_number] => 20170110781 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-04-20 [patent_title] => 'SENSOR AND METHOD FOR MANUFACTURING THE SENSOR' [patent_app_type] => utility [patent_app_number] => 15/285253 [patent_app_country] => US [patent_app_date] => 2016-10-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 10926 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15285253 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/285253
SENSOR AND METHOD FOR MANUFACTURING THE SENSOR Oct 3, 2016 Abandoned
Array ( [id] => 14810223 [patent_doc_number] => 20190271721 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-09-05 [patent_title] => SELF ALIGNED SORT PROBE CARD FOR SI BRIDGE WAFER [patent_app_type] => utility [patent_app_number] => 16/322430 [patent_app_country] => US [patent_app_date] => 2016-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3990 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16322430 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/322430
SELF ALIGNED SORT PROBE CARD FOR SI BRIDGE WAFER Sep 29, 2016 Abandoned
Array ( [id] => 11543551 [patent_doc_number] => 20170097376 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-04-06 [patent_title] => 'SPRING PROBE HAVING OUTER SLEEVE AND PROBE DEVICE HAVING THE SAME' [patent_app_type] => utility [patent_app_number] => 15/282330 [patent_app_country] => US [patent_app_date] => 2016-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 6835 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15282330 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/282330
SPRING PROBE HAVING OUTER SLEEVE AND PROBE DEVICE HAVING THE SAME Sep 29, 2016 Abandoned
Array ( [id] => 11708021 [patent_doc_number] => 20170176520 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-06-22 [patent_title] => 'TUNABLE WAVELENGTH ELECTRO-OPTICAL ANALYZER' [patent_app_type] => utility [patent_app_number] => 15/269751 [patent_app_country] => US [patent_app_date] => 2016-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3647 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15269751 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/269751
TUNABLE WAVELENGTH ELECTRO-OPTICAL ANALYZER Sep 18, 2016 Abandoned
Array ( [id] => 15853061 [patent_doc_number] => 10641804 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2020-05-05 [patent_title] => Method for applying charge-based-capacitance-measurement with switches using only NMOS or only PMOS transistors [patent_app_type] => utility [patent_app_number] => 15/269843 [patent_app_country] => US [patent_app_date] => 2016-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1139 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 266 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15269843 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/269843
Method for applying charge-based-capacitance-measurement with switches using only NMOS or only PMOS transistors Sep 18, 2016 Issued
Array ( [id] => 13465279 [patent_doc_number] => 20180284182 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-10-04 [patent_title] => METHOD OF MEASURING FE CONCENTRATION IN P-TYPE SILICON WAFER [patent_app_type] => utility [patent_app_number] => 15/765792 [patent_app_country] => US [patent_app_date] => 2016-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5246 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => 0 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15765792 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/765792
Method of measuring Fe concentration in p-type silicon wafer Sep 4, 2016 Issued
Menu