Search

Patrick J. Connolly

Examiner (ID: 16001)

Most Active Art Unit
2877
Art Unit(s)
2877
Total Applications
817
Issued Applications
697
Pending Applications
57
Abandoned Applications
63

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 897264 [patent_doc_number] => 07342666 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-11 [patent_title] => 'Method and apparatus for measuring holding distortion' [patent_app_type] => utility [patent_app_number] => 11/258955 [patent_app_country] => US [patent_app_date] => 2005-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 16 [patent_no_of_words] => 9523 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 328 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/342/07342666.pdf [firstpage_image] =>[orig_patent_app_number] => 11258955 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/258955
Method and apparatus for measuring holding distortion Oct 26, 2005 Issued
Array ( [id] => 475185 [patent_doc_number] => 07230720 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-06-12 [patent_title] => 'Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method' [patent_app_type] => utility [patent_app_number] => 11/256967 [patent_app_country] => US [patent_app_date] => 2005-10-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 26 [patent_no_of_words] => 10427 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/230/07230720.pdf [firstpage_image] =>[orig_patent_app_number] => 11256967 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/256967
Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method Oct 24, 2005 Issued
Array ( [id] => 5797510 [patent_doc_number] => 20060033932 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-16 [patent_title] => 'Scatterometry by phase sensitive reflectometer' [patent_app_type] => utility [patent_app_number] => 11/256764 [patent_app_country] => US [patent_app_date] => 2005-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3528 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0033/20060033932.pdf [firstpage_image] =>[orig_patent_app_number] => 11256764 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/256764
Scatterometry by phase sensitive reflectometer Oct 23, 2005 Issued
Array ( [id] => 5741933 [patent_doc_number] => 20060087657 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-27 [patent_title] => 'Precompensation of polarization errors in heterodyne interferometry' [patent_app_type] => utility [patent_app_number] => 11/255766 [patent_app_country] => US [patent_app_date] => 2005-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9279 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0087/20060087657.pdf [firstpage_image] =>[orig_patent_app_number] => 11255766 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/255766
Precompensation of polarization errors in heterodyne interferometry Oct 20, 2005 Issued
Array ( [id] => 5612540 [patent_doc_number] => 20060114468 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-01 [patent_title] => 'Interferometer system, signal processing method in interferometer system, and stage using signal processing' [patent_app_type] => utility [patent_app_number] => 11/252752 [patent_app_country] => US [patent_app_date] => 2005-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 19951 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0114/20060114468.pdf [firstpage_image] =>[orig_patent_app_number] => 11252752 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/252752
Interferometer system, signal processing method in interferometer system, and stage using signal processing Oct 18, 2005 Issued
Array ( [id] => 5885820 [patent_doc_number] => 20060274324 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-07 [patent_title] => 'Method for correcting disturbances in a level sensor light path' [patent_app_type] => utility [patent_app_number] => 11/252254 [patent_app_country] => US [patent_app_date] => 2005-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7854 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0274/20060274324.pdf [firstpage_image] =>[orig_patent_app_number] => 11252254 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/252254
Method for correcting disturbances in a level sensor light path Oct 17, 2005 Issued
Array ( [id] => 405385 [patent_doc_number] => 07289220 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-10-30 [patent_title] => 'Broadband cavity spectrometer apparatus and method for determining the path length of an optical structure' [patent_app_type] => utility [patent_app_number] => 11/250954 [patent_app_country] => US [patent_app_date] => 2005-10-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3662 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/289/07289220.pdf [firstpage_image] =>[orig_patent_app_number] => 11250954 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/250954
Broadband cavity spectrometer apparatus and method for determining the path length of an optical structure Oct 13, 2005 Issued
Array ( [id] => 916248 [patent_doc_number] => 07327465 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-02-05 [patent_title] => 'Compensation for effects of beam misalignments in interferometer metrology systems' [patent_app_type] => utility [patent_app_number] => 11/250116 [patent_app_country] => US [patent_app_date] => 2005-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 20 [patent_no_of_words] => 24229 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/327/07327465.pdf [firstpage_image] =>[orig_patent_app_number] => 11250116 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/250116
Compensation for effects of beam misalignments in interferometer metrology systems Oct 12, 2005 Issued
Array ( [id] => 5134588 [patent_doc_number] => 20070076217 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-05 [patent_title] => 'Optical coherence tomography for eye-length measurement' [patent_app_type] => utility [patent_app_number] => 11/243665 [patent_app_country] => US [patent_app_date] => 2005-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7663 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0076/20070076217.pdf [firstpage_image] =>[orig_patent_app_number] => 11243665 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/243665
Optical coherence tomography for eye-length measurement Oct 4, 2005 Issued
Array ( [id] => 5134579 [patent_doc_number] => 20070076208 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-05 [patent_title] => 'Method and instrument for collecting fourier transform (FT) Raman spectra for imaging applications' [patent_app_type] => utility [patent_app_number] => 11/239118 [patent_app_country] => US [patent_app_date] => 2005-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 13936 [patent_no_of_claims] => 58 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0076/20070076208.pdf [firstpage_image] =>[orig_patent_app_number] => 11239118 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/239118
Method and instrument for collecting fourier transform (FT) Raman spectra for imaging applications Sep 29, 2005 Issued
Array ( [id] => 5714037 [patent_doc_number] => 20060077400 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-13 [patent_title] => 'Systems and methods for measuring sample surface flatness of continuously moving samples' [patent_app_type] => utility [patent_app_number] => 11/241318 [patent_app_country] => US [patent_app_date] => 2005-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 10855 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0077/20060077400.pdf [firstpage_image] =>[orig_patent_app_number] => 11241318 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/241318
Systems and methods for measuring sample surface flatness of continuously moving samples Sep 29, 2005 Issued
Array ( [id] => 133680 [patent_doc_number] => 07701583 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-20 [patent_title] => 'Coherence spectrometry devices' [patent_app_type] => utility [patent_app_number] => 11/664244 [patent_app_country] => US [patent_app_date] => 2005-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2505 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/701/07701583.pdf [firstpage_image] =>[orig_patent_app_number] => 11664244 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/664244
Coherence spectrometry devices Sep 29, 2005 Issued
Array ( [id] => 370587 [patent_doc_number] => 07477362 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-13 [patent_title] => 'Moiré interferometric strain sensor' [patent_app_type] => utility [patent_app_number] => 11/235077 [patent_app_country] => US [patent_app_date] => 2005-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 15 [patent_no_of_words] => 3644 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/477/07477362.pdf [firstpage_image] =>[orig_patent_app_number] => 11235077 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/235077
Moiré interferometric strain sensor Sep 26, 2005 Issued
Array ( [id] => 5719431 [patent_doc_number] => 20060072204 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-06 [patent_title] => 'Catoptric and catadioptric imaging systems with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces' [patent_app_type] => utility [patent_app_number] => 11/231544 [patent_app_country] => US [patent_app_date] => 2005-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 36 [patent_figures_cnt] => 36 [patent_no_of_words] => 26131 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20060072204.pdf [firstpage_image] =>[orig_patent_app_number] => 11231544 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/231544
Catoptric and catadioptric imaging systems with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces Sep 20, 2005 Issued
Array ( [id] => 5714033 [patent_doc_number] => 20060077396 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-13 [patent_title] => 'Interferometer systems for measuring displacement and exposure systems using the same' [patent_app_type] => utility [patent_app_number] => 11/217168 [patent_app_country] => US [patent_app_date] => 2005-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 8094 [patent_no_of_claims] => 52 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0077/20060077396.pdf [firstpage_image] =>[orig_patent_app_number] => 11217168 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/217168
Interferometer systems for measuring displacement and exposure systems using the same Aug 31, 2005 Issued
Array ( [id] => 5009159 [patent_doc_number] => 20070279636 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-06 [patent_title] => 'All-fiber spectroscopic optical sensor' [patent_app_type] => utility [patent_app_number] => 11/212112 [patent_app_country] => US [patent_app_date] => 2005-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3263 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0279/20070279636.pdf [firstpage_image] =>[orig_patent_app_number] => 11212112 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/212112
All-fiber spectroscopic optical sensor Aug 25, 2005 Issued
Array ( [id] => 5708939 [patent_doc_number] => 20060050283 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-09 [patent_title] => 'Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers' [patent_app_type] => utility [patent_app_number] => 11/208424 [patent_app_country] => US [patent_app_date] => 2005-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 23045 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20060050283.pdf [firstpage_image] =>[orig_patent_app_number] => 11208424 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/208424
Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers Aug 18, 2005 Issued
Array ( [id] => 5797483 [patent_doc_number] => 20060033924 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-16 [patent_title] => 'Apparatus and method for joint and time delayed measurements of components of conjugated quadratures of fields of reflected/scattered and transmitted/scattered beams by an object in interferometry' [patent_app_type] => utility [patent_app_number] => 11/204758 [patent_app_country] => US [patent_app_date] => 2005-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 24052 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0033/20060033924.pdf [firstpage_image] =>[orig_patent_app_number] => 11204758 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/204758
Apparatus and method for joint and time delayed measurements of components of conjugated quadratures of fields of reflected/scattered and transmitted/scattered beams by an object in interferometry Aug 15, 2005 Issued
Array ( [id] => 7234997 [patent_doc_number] => 20050270539 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-08 [patent_title] => 'Method of generating interferometric information' [patent_app_type] => utility [patent_app_number] => 11/204278 [patent_app_country] => US [patent_app_date] => 2005-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9795 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0270/20050270539.pdf [firstpage_image] =>[orig_patent_app_number] => 11204278 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/204278
Method of generating interferometric information Aug 14, 2005 Issued
Array ( [id] => 5653918 [patent_doc_number] => 20060139653 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-29 [patent_title] => 'Sensor for optically sensing air borne acoustic waves' [patent_app_type] => utility [patent_app_number] => 11/195584 [patent_app_country] => US [patent_app_date] => 2005-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5588 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0139/20060139653.pdf [firstpage_image] =>[orig_patent_app_number] => 11195584 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/195584
Sensor for optically sensing air borne acoustic waves Aug 1, 2005 Abandoned
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