
Patrick J. Connolly
Examiner (ID: 16001)
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877 |
| Total Applications | 817 |
| Issued Applications | 697 |
| Pending Applications | 57 |
| Abandoned Applications | 63 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
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[patent_title] => 'Method and apparatus for measuring holding distortion'
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Array
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[patent_title] => 'Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method'
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[patent_title] => 'Scatterometry by phase sensitive reflectometer'
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[patent_title] => 'Precompensation of polarization errors in heterodyne interferometry'
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[patent_title] => 'Method for correcting disturbances in a level sensor light path'
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[patent_title] => 'Compensation for effects of beam misalignments in interferometer metrology systems'
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Array
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Array
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[patent_title] => 'Method and instrument for collecting fourier transform (FT) Raman spectra for imaging applications'
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Array
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Array
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Array
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