
Patrick J. Connolly
Examiner (ID: 16001)
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877 |
| Total Applications | 817 |
| Issued Applications | 697 |
| Pending Applications | 57 |
| Abandoned Applications | 63 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 502273
[patent_doc_number] => 07209240
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[patent_issue_date] => 2007-04-24
[patent_title] => 'System and apparatus for measuring displacements in electro-active materials'
[patent_app_type] => utility
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Array
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[patent_title] => 'System and apparatus for measuring displacements in electro-active materials'
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Array
(
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[patent_title] => 'Process, System And Software Arrangement For A Chromatic Dispersion Compensation Using Reflective Layers In Optical Coherence Tomography (OCT) Imaging'
[patent_app_type] => utility
[patent_app_number] => 11/569790
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/569790 | Process, system and software arrangement for a chromatic dispersion compensation using reflective layers in optical coherence tomography (OCT) imaging | Jul 22, 2004 | Issued |
Array
(
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[patent_issue_date] => 2004-12-23
[patent_title] => 'Wavefront measuring apparatus and wavefront measuring method'
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Array
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[patent_title] => 'Interferometer calibration methods and apparatus'
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Array
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[patent_title] => 'Object imaging system using changing frequency interferometry method'
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Array
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[patent_title] => 'High-speed, scanning phase-shifting profilometry using 2D CMOS sensor'
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Array
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[patent_title] => 'Reduction of thermal non-cyclic error effects in interferometers'
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Array
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[patent_title] => 'Method for determining the refractive index during interferometric length measurement and interferometric arrangement therefor'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/564449 | Method for determining the refractive index during interferometric length measurement and interferometric arrangement therefor | Jun 23, 2004 | Issued |
Array
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[patent_title] => 'Optical imaging apparatus'
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Array
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[patent_title] => 'Compensation for geometric effects of beam misalignments in plane mirror interferometer metrology systems'
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Array
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Array
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Array
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Array
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Array
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