Search

Patrick J. Connolly

Examiner (ID: 16001)

Most Active Art Unit
2877
Art Unit(s)
2877
Total Applications
817
Issued Applications
697
Pending Applications
57
Abandoned Applications
63

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6989620 [patent_doc_number] => 20050088657 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-28 [patent_title] => 'Optical measurment device and spectroscopic device' [patent_app_type] => utility [patent_app_number] => 10/790796 [patent_app_country] => US [patent_app_date] => 2004-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3390 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20050088657.pdf [firstpage_image] =>[orig_patent_app_number] => 10790796 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/790796
Optical measurment device and spectroscopic device Mar 2, 2004 Abandoned
Array ( [id] => 7397142 [patent_doc_number] => 20040174533 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-09 [patent_title] => 'Wavefront aberration measuring apparatus' [patent_app_type] => new [patent_app_number] => 10/793492 [patent_app_country] => US [patent_app_date] => 2004-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8423 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20040174533.pdf [firstpage_image] =>[orig_patent_app_number] => 10793492 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/793492
Wavefront aberration measuring apparatus Mar 2, 2004 Abandoned
Array ( [id] => 674042 [patent_doc_number] => 07092100 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-15 [patent_title] => 'Quadrature phase shift interferometer (QPSI) decoder and method of decoding' [patent_app_type] => utility [patent_app_number] => 10/782875 [patent_app_country] => US [patent_app_date] => 2004-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4641 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/092/07092100.pdf [firstpage_image] =>[orig_patent_app_number] => 10782875 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/782875
Quadrature phase shift interferometer (QPSI) decoder and method of decoding Feb 22, 2004 Issued
Array ( [id] => 7177776 [patent_doc_number] => 20040201855 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-14 [patent_title] => 'Method and apparatus for dark field interferometric confocal microscopy' [patent_app_type] => new [patent_app_number] => 10/782058 [patent_app_country] => US [patent_app_date] => 2004-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 21489 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 260 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20040201855.pdf [firstpage_image] =>[orig_patent_app_number] => 10782058 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/782058
Method and apparatus for dark field interferometric confocal microscopy Feb 18, 2004 Issued
Array ( [id] => 7177767 [patent_doc_number] => 20040201854 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-14 [patent_title] => 'Longitudinal differential interferometric confocal microscopy' [patent_app_type] => new [patent_app_number] => 10/782057 [patent_app_country] => US [patent_app_date] => 2004-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 21994 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20040201854.pdf [firstpage_image] =>[orig_patent_app_number] => 10782057 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/782057
Longitudinal differential interferometric confocal microscopy Feb 18, 2004 Issued
Array ( [id] => 300684 [patent_doc_number] => 07538889 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-05-26 [patent_title] => 'Calibration feedback-control circuit for diffraction light devices' [patent_app_type] => utility [patent_app_number] => 10/782488 [patent_app_country] => US [patent_app_date] => 2004-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4695 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/538/07538889.pdf [firstpage_image] =>[orig_patent_app_number] => 10782488 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/782488
Calibration feedback-control circuit for diffraction light devices Feb 17, 2004 Issued
Array ( [id] => 660780 [patent_doc_number] => 07106448 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-09-12 [patent_title] => 'Integrated resonant micro-optical gyroscope and method of fabrication' [patent_app_type] => utility [patent_app_number] => 10/780799 [patent_app_country] => US [patent_app_date] => 2004-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 9217 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/106/07106448.pdf [firstpage_image] =>[orig_patent_app_number] => 10780799 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/780799
Integrated resonant micro-optical gyroscope and method of fabrication Feb 16, 2004 Issued
Array ( [id] => 5647058 [patent_doc_number] => 20060132790 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-22 [patent_title] => 'Optical coherence tomography with 3d coherence scanning' [patent_app_type] => utility [patent_app_number] => 10/546421 [patent_app_country] => US [patent_app_date] => 2004-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 17175 [patent_no_of_claims] => 116 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20060132790.pdf [firstpage_image] =>[orig_patent_app_number] => 10546421 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/546421
Optical coherence tomography with 3d coherence scanning Feb 16, 2004 Issued
Array ( [id] => 7337212 [patent_doc_number] => 20040190001 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-30 [patent_title] => 'Three dimensional imaging by projecting interference fringes and evaluating absolute phase mapping' [patent_app_type] => new [patent_app_number] => 10/486397 [patent_app_country] => US [patent_app_date] => 2004-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5895 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0190/20040190001.pdf [firstpage_image] =>[orig_patent_app_number] => 10486397 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/486397
Three dimensional imaging by projecting interference fringes and evaluating absolute phase mapping Feb 5, 2004 Abandoned
Array ( [id] => 693031 [patent_doc_number] => 07075659 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-07-11 [patent_title] => 'Heterodyne optical network analysis that utilizes signal modulation' [patent_app_type] => utility [patent_app_number] => 10/772808 [patent_app_country] => US [patent_app_date] => 2004-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 8768 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/075/07075659.pdf [firstpage_image] =>[orig_patent_app_number] => 10772808 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/772808
Heterodyne optical network analysis that utilizes signal modulation Feb 4, 2004 Issued
Array ( [id] => 7224681 [patent_doc_number] => 20040156085 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-08-12 [patent_title] => 'Method and system for optical measurement via a resonator having a non-uniform phase profile' [patent_app_type] => new [patent_app_number] => 10/770866 [patent_app_country] => US [patent_app_date] => 2004-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2956 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0156/20040156085.pdf [firstpage_image] =>[orig_patent_app_number] => 10770866 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/770866
Method and system for optical measurement via a resonator having a non-uniform phase profile Feb 1, 2004 Issued
Array ( [id] => 768091 [patent_doc_number] => 07009712 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-07 [patent_title] => 'Leaky guided wave modes used in interferometric confocal microscopy to measure properties of trenches' [patent_app_type] => utility [patent_app_number] => 10/765254 [patent_app_country] => US [patent_app_date] => 2004-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 16354 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/009/07009712.pdf [firstpage_image] =>[orig_patent_app_number] => 10765254 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/765254
Leaky guided wave modes used in interferometric confocal microscopy to measure properties of trenches Jan 26, 2004 Issued
Array ( [id] => 7341514 [patent_doc_number] => 20040246486 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-09 [patent_title] => 'Interferometric confocal microscopy incorporating a pinhole array beam-splitter' [patent_app_type] => new [patent_app_number] => 10/765229 [patent_app_country] => US [patent_app_date] => 2004-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 15935 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0246/20040246486.pdf [firstpage_image] =>[orig_patent_app_number] => 10765229 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/765229
Interferometric confocal microscopy incorporating a pinhole array beam-splitter Jan 26, 2004 Issued
Array ( [id] => 5600593 [patent_doc_number] => 20060290938 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'Array and method for the spectrally resolving detection of a sample' [patent_app_type] => utility [patent_app_number] => 10/544043 [patent_app_country] => US [patent_app_date] => 2004-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7010 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 16 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20060290938.pdf [firstpage_image] =>[orig_patent_app_number] => 10544043 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/544043
Device and method for spectrally resolving detection of a sample Jan 25, 2004 Issued
Array ( [id] => 7187759 [patent_doc_number] => 20050162658 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-28 [patent_title] => 'Terahertz modulation spectrometer' [patent_app_type] => utility [patent_app_number] => 10/764036 [patent_app_country] => US [patent_app_date] => 2004-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4311 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0162/20050162658.pdf [firstpage_image] =>[orig_patent_app_number] => 10764036 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/764036
Terahertz modulation spectrometer Jan 22, 2004 Issued
Array ( [id] => 5918931 [patent_doc_number] => 20060238774 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-10-26 [patent_title] => 'Interferometric measuring device' [patent_app_type] => utility [patent_app_number] => 10/542743 [patent_app_country] => US [patent_app_date] => 2004-01-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3283 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0238/20060238774.pdf [firstpage_image] =>[orig_patent_app_number] => 10542743 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/542743
Interferometric measuring device Jan 19, 2004 Issued
Array ( [id] => 7676837 [patent_doc_number] => 20040152989 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-08-05 [patent_title] => 'Speckle pattern analysis method and system' [patent_app_type] => new [patent_app_number] => 10/751159 [patent_app_country] => US [patent_app_date] => 2004-01-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4443 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0152/20040152989.pdf [firstpage_image] =>[orig_patent_app_number] => 10751159 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/751159
Speckle pattern analysis method and system Jan 1, 2004 Issued
Array ( [id] => 524121 [patent_doc_number] => 07193722 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-03-20 [patent_title] => 'Lithographic apparatus with disturbance correction system and device manufacturing method' [patent_app_type] => utility [patent_app_number] => 10/747617 [patent_app_country] => US [patent_app_date] => 2003-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 11702 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/193/07193722.pdf [firstpage_image] =>[orig_patent_app_number] => 10747617 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/747617
Lithographic apparatus with disturbance correction system and device manufacturing method Dec 29, 2003 Issued
Array ( [id] => 890699 [patent_doc_number] => 07349101 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-25 [patent_title] => 'Lithographic apparatus, overlay detector, device manufacturing method, and device manufactured thereby' [patent_app_type] => utility [patent_app_number] => 10/747654 [patent_app_country] => US [patent_app_date] => 2003-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 17 [patent_no_of_words] => 11836 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/349/07349101.pdf [firstpage_image] =>[orig_patent_app_number] => 10747654 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/747654
Lithographic apparatus, overlay detector, device manufacturing method, and device manufactured thereby Dec 29, 2003 Issued
Array ( [id] => 784250 [patent_doc_number] => 06992779 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-01-31 [patent_title] => 'Interferometer apparatus for both low and high coherence measurement and method thereof' [patent_app_type] => utility [patent_app_number] => 10/745707 [patent_app_country] => US [patent_app_date] => 2003-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 10815 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 220 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/992/06992779.pdf [firstpage_image] =>[orig_patent_app_number] => 10745707 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/745707
Interferometer apparatus for both low and high coherence measurement and method thereof Dec 28, 2003 Issued
Menu