
Patrick J. Connolly
Examiner (ID: 16001)
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877 |
| Total Applications | 817 |
| Issued Applications | 697 |
| Pending Applications | 57 |
| Abandoned Applications | 63 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1398352
[patent_doc_number] => 06560255
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-05-06
[patent_title] => 'Method and apparatus for characterizing laser modules'
[patent_app_type] => B1
[patent_app_number] => 09/535417
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/535417 | Method and apparatus for characterizing laser modules | Mar 23, 2000 | Issued |
Array
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[patent_issue_date] => 2003-04-08
[patent_title] => 'Method for measuring a thickness profile and a refractive index using white-light scanning interferometry and recording medium therefor'
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Array
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[patent_issue_date] => 2003-09-02
[patent_title] => 'Exposure apparatus with interferometer'
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Array
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[patent_issue_date] => 2003-09-02
[patent_title] => 'Spectroscopic image input system'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/528245 | Spectroscopic image input system | Mar 16, 2000 | Issued |
Array
(
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[patent_doc_number] => 06515751
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[patent_issue_date] => 2003-02-04
[patent_title] => 'Mechanically resonant nanostructures'
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Array
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[patent_title] => 'Method for processing low coherence interferometric data'
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Array
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[patent_doc_number] => 06624895
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[patent_title] => 'Method and apparatus for measuring aspherical shape and method for manufacturing optical element using them'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/518220 | Method and apparatus for measuring aspherical shape and method for manufacturing optical element using them | Mar 2, 2000 | Issued |
Array
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[id] => 1275012
[patent_doc_number] => 06654129
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[patent_issue_date] => 2003-11-25
[patent_title] => 'Film thickness testing apparatus and method'
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[patent_app_number] => 09/516039
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/516039 | Film thickness testing apparatus and method | Feb 29, 2000 | Issued |
Array
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[patent_title] => 'Measuring device for absolute measurement of displacement'
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Array
(
[id] => 1426513
[patent_doc_number] => 06519035
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[patent_issue_date] => 2003-02-11
[patent_title] => 'Efficient auto-alignment method for cylindrical laser optical resonators'
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Array
(
[id] => 1394600
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[patent_title] => 'Pulsed source scanning interferometer'
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Array
(
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[patent_title] => 'Method of determining structural features of test pieces having a randomly scattering surface'
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Array
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Array
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Array
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Array
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Array
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Array
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