Search

Patrick R. Holecek

Examiner (ID: 18755, Phone: (571)272-3932 , Office: P/2845 )

Most Active Art Unit
2845
Art Unit(s)
2845, 2821
Total Applications
435
Issued Applications
285
Pending Applications
1
Abandoned Applications
150

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18455453 [patent_doc_number] => 20230196734 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-22 [patent_title] => METHOD AND SYSTEMS FOR PROVIDING SYNTHETIC LABELED TRAINING DATASETS AND APPLICATIONS THEREOF [patent_app_type] => utility [patent_app_number] => 17/927839 [patent_app_country] => US [patent_app_date] => 2021-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4979 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17927839 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/927839
Method and systems for providing synthetic labeled training datasets and applications thereof May 13, 2021 Issued
Array ( [id] => 17277323 [patent_doc_number] => 20210383521 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-12-09 [patent_title] => QUALITY DEFECT MARKING SYSTEMS AND METHODS IN PACKAGING PRODUCT MANUFACTURING [patent_app_type] => utility [patent_app_number] => 17/313220 [patent_app_country] => US [patent_app_date] => 2021-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8410 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -24 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17313220 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/313220
Quality defect marking systems and methods in packaging product manufacturing May 5, 2021 Issued
Array ( [id] => 18023552 [patent_doc_number] => 20220375051 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-24 [patent_title] => DEEP GENERATIVE MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS [patent_app_type] => utility [patent_app_number] => 17/308878 [patent_app_country] => US [patent_app_date] => 2021-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15067 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17308878 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/308878
Deep generative model-based alignment for semiconductor applications May 4, 2021 Issued
Array ( [id] => 18493807 [patent_doc_number] => 11699228 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-07-11 [patent_title] => Arrangement detector for plate-shaped object and load port including same [patent_app_type] => utility [patent_app_number] => 17/239223 [patent_app_country] => US [patent_app_date] => 2021-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 30 [patent_no_of_words] => 9062 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 230 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17239223 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/239223
Arrangement detector for plate-shaped object and load port including same Apr 22, 2021 Issued
Array ( [id] => 17187684 [patent_doc_number] => 20210334569 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-28 [patent_title] => IMAGE DEPTH DETERMINING METHOD AND LIVING BODY IDENTIFICATION METHOD, CIRCUIT, DEVICE, AND MEDIUM [patent_app_type] => utility [patent_app_number] => 17/239302 [patent_app_country] => US [patent_app_date] => 2021-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11180 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 255 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17239302 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/239302
Image depth determining method and living body identification method, circuit, device, and medium Apr 22, 2021 Issued
Array ( [id] => 17962898 [patent_doc_number] => 20220343479 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-27 [patent_title] => IMAGE PROCESSING METHOD AND SYSTEM, AND NON-TRANSITORY COMPUTER READABLE MEDIUM [patent_app_type] => utility [patent_app_number] => 17/237642 [patent_app_country] => US [patent_app_date] => 2021-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10963 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17237642 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/237642
Image processing method and system, and non-transitory computer readable medium Apr 21, 2021 Issued
Array ( [id] => 17261943 [patent_doc_number] => 20210374928 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-12-02 [patent_title] => DEFECT DETECTION METHOD AND APPARATUS [patent_app_type] => utility [patent_app_number] => 17/232765 [patent_app_country] => US [patent_app_date] => 2021-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11818 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 262 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17232765 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/232765
Defect detection method and apparatus Apr 15, 2021 Issued
Array ( [id] => 19153277 [patent_doc_number] => 11978194 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-05-07 [patent_title] => Data analysis system, data analysis method, and non-transitory computer-readable medium [patent_app_type] => utility [patent_app_number] => 17/231494 [patent_app_country] => US [patent_app_date] => 2021-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 6560 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17231494 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/231494
Data analysis system, data analysis method, and non-transitory computer-readable medium Apr 14, 2021 Issued
Array ( [id] => 18472136 [patent_doc_number] => 20230206422 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-29 [patent_title] => SEMICONDUCTOR INSPECTING METHOD AND SEMICONDUCTOR INSPECTING DEVICE [patent_app_type] => utility [patent_app_number] => 17/925625 [patent_app_country] => US [patent_app_date] => 2021-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12053 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17925625 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/925625
Semiconductor inspecting method and semiconductor inspecting device Mar 30, 2021 Issued
Array ( [id] => 19260384 [patent_doc_number] => 12020445 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-06-25 [patent_title] => Method and computing device using a neural network to localize an overlap between two thermal images respectively generated by two infrared sensors [patent_app_type] => utility [patent_app_number] => 17/217610 [patent_app_country] => US [patent_app_date] => 2021-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 12398 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 240 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17217610 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/217610
Method and computing device using a neural network to localize an overlap between two thermal images respectively generated by two infrared sensors Mar 29, 2021 Issued
Array ( [id] => 17325914 [patent_doc_number] => 11216932 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-01-04 [patent_title] => Electronic substrate defect detection [patent_app_type] => utility [patent_app_number] => 17/214491 [patent_app_country] => US [patent_app_date] => 2021-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 14 [patent_no_of_words] => 12053 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17214491 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/214491
Electronic substrate defect detection Mar 25, 2021 Issued
Array ( [id] => 17121468 [patent_doc_number] => 11132607 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2021-09-28 [patent_title] => Method for explainable active learning, to be used for object detector, by using deep encoder and active learning device using the same [patent_app_type] => utility [patent_app_number] => 17/211123 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8003 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 410 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17211123 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/211123
Method for explainable active learning, to be used for object detector, by using deep encoder and active learning device using the same Mar 23, 2021 Issued
Array ( [id] => 18408401 [patent_doc_number] => 20230169754 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-01 [patent_title] => INFORMATION PROCESSING DEVICE AND PROGRAM [patent_app_type] => utility [patent_app_number] => 17/920276 [patent_app_country] => US [patent_app_date] => 2021-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9330 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17920276 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/920276
Information processing device and program Mar 17, 2021 Issued
Array ( [id] => 18573661 [patent_doc_number] => 11730162 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-22 [patent_title] => Methods and systems for crop pest management utilizing geospatial images and microclimate data [patent_app_type] => utility [patent_app_number] => 17/202910 [patent_app_country] => US [patent_app_date] => 2021-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 16 [patent_no_of_words] => 17387 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17202910 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/202910
Methods and systems for crop pest management utilizing geospatial images and microclimate data Mar 15, 2021 Issued
Array ( [id] => 17144877 [patent_doc_number] => 20210312890 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-07 [patent_title] => ELECTRONIC DISPLAY OF SERIAL TEXT USING OPTIMAL RECOGNITION POSITIONS [patent_app_type] => utility [patent_app_number] => 17/202218 [patent_app_country] => US [patent_app_date] => 2021-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7934 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17202218 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/202218
ELECTRONIC DISPLAY OF SERIAL TEXT USING OPTIMAL RECOGNITION POSITIONS Mar 14, 2021 Abandoned
Array ( [id] => 18371304 [patent_doc_number] => 11651484 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-16 [patent_title] => Quality control of a laser machining process using machine learning [patent_app_type] => utility [patent_app_number] => 17/906801 [patent_app_country] => US [patent_app_date] => 2021-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 17 [patent_no_of_words] => 10876 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 40 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17906801 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/906801
Quality control of a laser machining process using machine learning Mar 2, 2021 Issued
Array ( [id] => 17463098 [patent_doc_number] => 20220076404 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-10 [patent_title] => DEFECT MANAGEMENT APPARATUS, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM [patent_app_type] => utility [patent_app_number] => 17/186402 [patent_app_country] => US [patent_app_date] => 2021-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11744 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17186402 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/186402
Defect management apparatus, method and non-transitory computer readable medium Feb 25, 2021 Issued
Array ( [id] => 19260407 [patent_doc_number] => 12020468 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-06-25 [patent_title] => Defect inspection apparatus, method and program [patent_app_type] => utility [patent_app_number] => 17/187031 [patent_app_country] => US [patent_app_date] => 2021-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 8419 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17187031 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/187031
Defect inspection apparatus, method and program Feb 25, 2021 Issued
Array ( [id] => 18228032 [patent_doc_number] => 20230067026 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => AUTOMATED DATA ANALYTICS METHODS FOR NON-TABULAR DATA, AND RELATED SYSTEMS AND APPARATUS [patent_app_type] => utility [patent_app_number] => 17/800173 [patent_app_country] => US [patent_app_date] => 2021-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 36611 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17800173 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/800173
AUTOMATED DATA ANALYTICS METHODS FOR NON-TABULAR DATA, AND RELATED SYSTEMS AND APPARATUS Feb 16, 2021 Pending
Array ( [id] => 17186340 [patent_doc_number] => 20210333225 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-28 [patent_title] => INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICES USING CHARGED PARTICLES [patent_app_type] => utility [patent_app_number] => 17/175173 [patent_app_country] => US [patent_app_date] => 2021-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13127 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17175173 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/175173
Inspection apparatus for inspecting semiconductor devices using charged particles Feb 11, 2021 Issued
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