
Paul E. Patton
Examiner (ID: 16647, Phone: (571)272-9762 , Office: P/2822 )
| Most Active Art Unit | 2822 |
| Art Unit(s) | 2809, 2112, 2822 |
| Total Applications | 977 |
| Issued Applications | 886 |
| Pending Applications | 1 |
| Abandoned Applications | 94 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 18078784
[patent_doc_number] => 20220404396
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-12-22
[patent_title] => CIRCUIT SYSTEM FOR MEASURING AN ELECTRICAL VOLTAGE
[patent_app_type] => utility
[patent_app_number] => 17/837289
[patent_app_country] => US
[patent_app_date] => 2022-06-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2323
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 148
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17837289
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/837289 | Circuit system for measuring an electrical voltage | Jun 9, 2022 | Issued |
Array
(
[id] => 18667599
[patent_doc_number] => 11774491
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2023-10-03
[patent_title] => System and method for testing a semiconductor chip
[patent_app_type] => utility
[patent_app_number] => 17/835308
[patent_app_country] => US
[patent_app_date] => 2022-06-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 4841
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 171
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17835308
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/835308 | System and method for testing a semiconductor chip | Jun 7, 2022 | Issued |
Array
(
[id] => 18826120
[patent_doc_number] => 11841392
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-12-12
[patent_title] => Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
[patent_app_type] => utility
[patent_app_number] => 17/832348
[patent_app_country] => US
[patent_app_date] => 2022-06-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5320
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 96
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17832348
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/832348 | Integrated test cell using active thermal interposer (ATI) with parallel socket actuation | Jun 2, 2022 | Issued |
Array
(
[id] => 19061260
[patent_doc_number] => 11940486
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-03-26
[patent_title] => Probe station capable of maintaining stable and accurate contact to device under test
[patent_app_type] => utility
[patent_app_number] => 17/805027
[patent_app_country] => US
[patent_app_date] => 2022-06-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 3103
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 131
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17805027
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/805027 | Probe station capable of maintaining stable and accurate contact to device under test | May 31, 2022 | Issued |
Array
(
[id] => 19121937
[patent_doc_number] => 11965911
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-04-23
[patent_title] => Inspection apparatus having a contactor for inspecting electrical characteristics of an object, a contactor tip position adjusting unit, and a position adjusting method therefor
[patent_app_type] => utility
[patent_app_number] => 17/824171
[patent_app_country] => US
[patent_app_date] => 2022-05-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 11
[patent_no_of_words] => 5917
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 263
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17824171
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/824171 | Inspection apparatus having a contactor for inspecting electrical characteristics of an object, a contactor tip position adjusting unit, and a position adjusting method therefor | May 24, 2022 | Issued |
Array
(
[id] => 18103557
[patent_doc_number] => 11543439
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2023-01-03
[patent_title] => Power supply current detection circuit and its control method, device, amplifier and storage medium
[patent_app_type] => utility
[patent_app_number] => 17/824163
[patent_app_country] => US
[patent_app_date] => 2022-05-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 14528
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 207
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17824163
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/824163 | Power supply current detection circuit and its control method, device, amplifier and storage medium | May 24, 2022 | Issued |
Array
(
[id] => 17853165
[patent_doc_number] => 20220283207
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-09-08
[patent_title] => VOLTAGE MONITOR USING A CAPACITIVE DIGITAL-TO-ANALOG CONVERTER
[patent_app_type] => utility
[patent_app_number] => 17/824505
[patent_app_country] => US
[patent_app_date] => 2022-05-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5130
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 128
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17824505
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/824505 | Voltage monitor using a capacitive digital-to-analog converter | May 24, 2022 | Issued |
Array
(
[id] => 18772094
[patent_doc_number] => 20230366916
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-11-16
[patent_title] => MOTOR IDENTIFICATION BY FILTER DETERMINATION
[patent_app_type] => utility
[patent_app_number] => 17/743825
[patent_app_country] => US
[patent_app_date] => 2022-05-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7318
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17743825
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/743825 | Motor identification by filter determination | May 12, 2022 | Issued |
Array
(
[id] => 17831527
[patent_doc_number] => 20220268831
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-08-25
[patent_title] => ACTIVE THERMAL INTERPOSER DEVICE
[patent_app_type] => utility
[patent_app_number] => 17/744403
[patent_app_country] => US
[patent_app_date] => 2022-05-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10393
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -21
[patent_words_short_claim] => 140
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17744403
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/744403 | DUT placement and handling for active thermal interposer device | May 12, 2022 | Issued |
Array
(
[id] => 19918514
[patent_doc_number] => 12293890
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-05-06
[patent_title] => Contact monitoring apparatus for a three-pole changeover contact
[patent_app_type] => utility
[patent_app_number] => 18/559570
[patent_app_country] => US
[patent_app_date] => 2022-05-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5909
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 234
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18559570
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/559570 | Contact monitoring apparatus for a three-pole changeover contact | May 9, 2022 | Issued |
Array
(
[id] => 19492646
[patent_doc_number] => 12111350
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-10-08
[patent_title] => Method and apparatus for RF built-in test system for a beamforming module in a radar system
[patent_app_type] => utility
[patent_app_number] => 17/738812
[patent_app_country] => US
[patent_app_date] => 2022-05-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 4898
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 118
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17738812
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/738812 | Method and apparatus for RF built-in test system for a beamforming module in a radar system | May 5, 2022 | Issued |
Array
(
[id] => 19301943
[patent_doc_number] => 20240230515
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-11
[patent_title] => METHOD AND INSPECTION DEVICE FOR EXAMINING THE CATHODIC PROTECTION OF A, MORE PARTICULARLY FERROMAGNETIC, PIPELINE
[patent_app_type] => utility
[patent_app_number] => 18/559226
[patent_app_country] => US
[patent_app_date] => 2022-05-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7675
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -23
[patent_words_short_claim] => 143
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18559226
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/559226 | METHOD AND INSPECTION DEVICE FOR EXAMINING THE CATHODIC PROTECTION OF A, MORE PARTICULARLY FERROMAGNETIC, PIPELINE | May 5, 2022 | Pending |
Array
(
[id] => 18755350
[patent_doc_number] => 20230358783
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-11-09
[patent_title] => SYSTEMS, APPARATUSES, OR COMPONENTS FOR ELECTROLYTIC CORROSION PROTECTION OF ELECTRONIC ELEMENT TESTING APPARATUSES
[patent_app_type] => utility
[patent_app_number] => 17/737047
[patent_app_country] => US
[patent_app_date] => 2022-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12645
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17737047
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/737047 | Systems, apparatuses, or components for electrolytic corrosion protection of electronic element testing apparatuses | May 4, 2022 | Issued |
Array
(
[id] => 18006351
[patent_doc_number] => 20220365117
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-11-17
[patent_title] => AUTO RANGING AMMETER WITH ACCURATE MEASUREMENT DURING RANGE CHANGES
[patent_app_type] => utility
[patent_app_number] => 17/662168
[patent_app_country] => US
[patent_app_date] => 2022-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6635
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 237
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17662168
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/662168 | Auto ranging ammeter with accurate measurement during range changes | May 4, 2022 | Issued |
Array
(
[id] => 19266764
[patent_doc_number] => 20240210465
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-27
[patent_title] => METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS
[patent_app_type] => utility
[patent_app_number] => 18/556158
[patent_app_country] => US
[patent_app_date] => 2022-04-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3810
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18556158
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/556158 | METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS | Apr 28, 2022 | Pending |
Array
(
[id] => 17961389
[patent_doc_number] => 20220341970
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-10-27
[patent_title] => CLAMP SENSOR AND MEASURING DEVICE
[patent_app_type] => utility
[patent_app_number] => 17/725864
[patent_app_country] => US
[patent_app_date] => 2022-04-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11019
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 192
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17725864
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/725864 | Clamp sensor with a pair of clamp arms and electrical parameter measuring device | Apr 20, 2022 | Issued |
Array
(
[id] => 18997151
[patent_doc_number] => 11913987
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-02-27
[patent_title] => Automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback
[patent_app_type] => utility
[patent_app_number] => 17/720980
[patent_app_country] => US
[patent_app_date] => 2022-04-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 13
[patent_no_of_words] => 7901
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 269
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17720980
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/720980 | Automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback | Apr 13, 2022 | Issued |
Array
(
[id] => 18576754
[patent_doc_number] => 11733274
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2023-08-22
[patent_title] => Voltage sensing circuit
[patent_app_type] => utility
[patent_app_number] => 17/705819
[patent_app_country] => US
[patent_app_date] => 2022-03-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 6631
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17705819
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/705819 | Voltage sensing circuit | Mar 27, 2022 | Issued |
Array
(
[id] => 19204020
[patent_doc_number] => 20240175919
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-30
[patent_title] => INTEGRATED CIRCUIT TESTING
[patent_app_type] => utility
[patent_app_number] => 18/551920
[patent_app_country] => US
[patent_app_date] => 2022-03-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8856
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 134
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18551920
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/551920 | Integrated circuit testing method and system | Mar 24, 2022 | Issued |
Array
(
[id] => 18385495
[patent_doc_number] => 11656271
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-05-23
[patent_title] => Wafer inspection system
[patent_app_type] => utility
[patent_app_number] => 17/699610
[patent_app_country] => US
[patent_app_date] => 2022-03-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 9261
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 349
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17699610
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/699610 | Wafer inspection system | Mar 20, 2022 | Issued |