Paul Heyrana

Array ( [id] => 18310724 [patent_doc_number] => 20230114624 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-04-13 [patent_title] => DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN [patent_app_type] => utility [patent_app_number] => 17/496616 [patent_app_country] => US [patent_app_date] => 2021-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9632 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17496616 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18533212 [patent_doc_number] => 20230238288 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-07-27 [patent_title] => GIS-BASED METHOD FOR PRODUCING SPATIAL WAFER MAP, AND METHOD FOR PROVIDING WAFER TEST RESULTS USING SAME [patent_app_type] => utility [patent_app_number] => 17/926185 [patent_app_country] => US [patent_app_date] => 2021-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6353 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17926185 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18735221 [patent_doc_number] => 11803961 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-10-31 [patent_title] => Die-to-multi-die wafer inspection [patent_app_type] => utility [patent_app_number] => 17/495493 [patent_app_country] => US [patent_app_date] => 2021-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 25 [patent_no_of_words] => 15908 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17495493 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19046110 [patent_doc_number] => 11935227 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-19 [patent_title] => Notch detecting method [patent_app_type] => utility [patent_app_number] => 17/449834 [patent_app_country] => US [patent_app_date] => 2021-10-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 18 [patent_no_of_words] => 10191 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17449834 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19962672 [patent_doc_number] => 12332163 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2025-06-17 [patent_title] => System for, and calibration and testing of directed beam ellipsometer systems [patent_app_type] => utility [patent_app_number] => 17/300687 [patent_app_country] => US [patent_app_date] => 2021-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 1003 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17300687 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17344763 [patent_doc_number] => 20220011094 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-01-13 [patent_title] => METHODS AND APPARATUS FOR OFDR INTERROGATOR MONITORING AND OPTIMIZATION [patent_app_type] => utility [patent_app_number] => 17/486596 [patent_app_country] => US [patent_app_date] => 2021-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9360 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17486596 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17527919 [patent_doc_number] => 11300599 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-04-12 [patent_title] => Vapor cells having an array of cavities therein [patent_app_type] => utility [patent_app_number] => 17/480448 [patent_app_country] => US [patent_app_date] => 2021-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 16 [patent_no_of_words] => 21162 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17480448 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19616336 [patent_doc_number] => 20240402016 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-05 [patent_title] => IMAGE POLARIMETER USING A MICRO-ELECTRO-MECHANICAL SYSTEM (MEMS) MICRO-MIRROR ARRAY (MMA) [patent_app_type] => utility [patent_app_number] => 17/479927 [patent_app_country] => US [patent_app_date] => 2021-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3351 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 209 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17479927 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17402857 [patent_doc_number] => 20220044948 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-10 [patent_title] => MONITORING WAFER AND MONITORING SYSTEM [patent_app_type] => utility [patent_app_number] => 17/474331 [patent_app_country] => US [patent_app_date] => 2021-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4810 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17474331 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19014130 [patent_doc_number] => 11921054 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-05 [patent_title] => Cleaved semiconductor wafer camera system [patent_app_type] => utility [patent_app_number] => 17/447519 [patent_app_country] => US [patent_app_date] => 2021-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 9553 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17447519 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17315893 [patent_doc_number] => 20210404941 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-12-30 [patent_title] => LIGHT SCATTERING DETECTORS AND METHODS FOR THE SAME [patent_app_type] => utility [patent_app_number] => 17/470280 [patent_app_country] => US [patent_app_date] => 2021-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13323 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17470280 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17461561 [patent_doc_number] => 20220074866 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-10 [patent_title] => MACRO AND MICRO INSPECTION APPARATUS AND INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 17/469273 [patent_app_country] => US [patent_app_date] => 2021-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6078 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17469273 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17463100 [patent_doc_number] => 20220076406 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-10 [patent_title] => UNSUPERVISED PATTERN SYNONYM DETECTION USING IMAGE HASHING [patent_app_type] => utility [patent_app_number] => 17/464638 [patent_app_country] => US [patent_app_date] => 2021-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6381 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17464638 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17445265 [patent_doc_number] => 20220065770 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-03 [patent_title] => MEASUREMENT METHOD, MEASURING DEVICE, AND MEASUREMENT PROGRAM [patent_app_type] => utility [patent_app_number] => 17/459810 [patent_app_country] => US [patent_app_date] => 2021-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7463 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17459810 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18221563 [patent_doc_number] => 20230060557 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => INSPECTION LAYER TO IMPROVE THE DETECTION OF DEFECTS THROUGH OPTICAL SYSTEMS AND METHODS OF INSPECTING SEMICONDUCTOR DEVICE FOR DEFECTS [patent_app_type] => utility [patent_app_number] => 17/412380 [patent_app_country] => US [patent_app_date] => 2021-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6371 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17412380 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17521411 [patent_doc_number] => 20220107260 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-07 [patent_title] => METHOD FOR PROCESSING AND DISPLAYING MULTI-CHANNEL SPECTRAL HISTOGRAMS AND SYSTEMS FOR SAME [patent_app_type] => utility [patent_app_number] => 17/406944 [patent_app_country] => US [patent_app_date] => 2021-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 32929 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17406944 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17445294 [patent_doc_number] => 20220065799 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-03 [patent_title] => IMAGE ACQUIRING METHOD, IMAGE ACQUIRING APPARATUS AND WAFER INSPECTION APPARATUS [patent_app_type] => utility [patent_app_number] => 17/406784 [patent_app_country] => US [patent_app_date] => 2021-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4234 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17406784 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19029446 [patent_doc_number] => 11928808 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-12 [patent_title] => Wafer detection method, device, apparatus, and storage medium [patent_app_type] => utility [patent_app_number] => 17/401595 [patent_app_country] => US [patent_app_date] => 2021-08-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 6944 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17401595 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18546185 [patent_doc_number] => 11719532 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-08 [patent_title] => Electronic device and method for reconstructing shape of a deformable object from captured images [patent_app_type] => utility [patent_app_number] => 17/399063 [patent_app_country] => US [patent_app_date] => 2021-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 9307 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17399063 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18465405 [patent_doc_number] => 11689711 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-06-27 [patent_title] => Configurable camera stimulation and metrology apparatus and method therefor [patent_app_type] => utility [patent_app_number] => 17/398751 [patent_app_country] => US [patent_app_date] => 2021-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 26 [patent_no_of_words] => 17679 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17398751 [rel_patent_id] =>[rel_patent_doc_number] =>)