
Peniel M. Gumedzoe
Examiner (ID: 13833, Phone: (571)270-3041 , Office: P/2899 )
| Most Active Art Unit | 2899 |
| Art Unit(s) | 2891, 2899 |
| Total Applications | 1568 |
| Issued Applications | 1276 |
| Pending Applications | 94 |
| Abandoned Applications | 248 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3732066
[patent_doc_number] => 05701176
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-12-23
[patent_title] => 'High temperature light scattering measurement device comprising a rigid extension tube'
[patent_app_type] => 1
[patent_app_number] => 8/508592
[patent_app_country] => US
[patent_app_date] => 1995-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 2189
[patent_no_of_claims] => 14
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[patent_words_short_claim] => 163
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/701/05701176.pdf
[firstpage_image] =>[orig_patent_app_number] => 508592
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/508592 | High temperature light scattering measurement device comprising a rigid extension tube | Jul 27, 1995 | Issued |
Array
(
[id] => 3739191
[patent_doc_number] => 05636029
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-06-03
[patent_title] => 'Elliptical laser probe for shadow mask'
[patent_app_type] => 1
[patent_app_number] => 8/505071
[patent_app_country] => US
[patent_app_date] => 1995-07-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 6098
[patent_no_of_claims] => 21
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[patent_words_short_claim] => 135
[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/636/05636029.pdf
[firstpage_image] =>[orig_patent_app_number] => 505071
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/505071 | Elliptical laser probe for shadow mask | Jul 20, 1995 | Issued |
Array
(
[id] => 3655156
[patent_doc_number] => 05629764
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-13
[patent_title] => 'Prism fingerprint sensor using a holographic optical element'
[patent_app_type] => 1
[patent_app_number] => 8/499673
[patent_app_country] => US
[patent_app_date] => 1995-07-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[patent_no_of_words] => 4417
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/629/05629764.pdf
[firstpage_image] =>[orig_patent_app_number] => 499673
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/499673 | Prism fingerprint sensor using a holographic optical element | Jul 6, 1995 | Issued |
Array
(
[id] => 3628443
[patent_doc_number] => 05615013
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-03-25
[patent_title] => 'Galvanometer and camera system'
[patent_app_type] => 1
[patent_app_number] => 8/495190
[patent_app_country] => US
[patent_app_date] => 1995-06-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 3
[patent_no_of_words] => 2722
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/615/05615013.pdf
[firstpage_image] =>[orig_patent_app_number] => 495190
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/495190 | Galvanometer and camera system | Jun 26, 1995 | Issued |
Array
(
[id] => 3589733
[patent_doc_number] => 05581354
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-03
[patent_title] => 'Method and device for thickness assessment'
[patent_app_type] => 1
[patent_app_number] => 8/495079
[patent_app_country] => US
[patent_app_date] => 1995-06-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 3441
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/581/05581354.pdf
[firstpage_image] =>[orig_patent_app_number] => 495079
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/495079 | Method and device for thickness assessment | Jun 26, 1995 | Issued |
Array
(
[id] => 3701467
[patent_doc_number] => 05650847
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-07-22
[patent_title] => 'Method and device for determination of parameters of individual microparticles'
[patent_app_type] => 1
[patent_app_number] => 8/490454
[patent_app_country] => US
[patent_app_date] => 1995-06-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
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[patent_no_of_words] => 6552
[patent_no_of_claims] => 5
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/650/05650847.pdf
[firstpage_image] =>[orig_patent_app_number] => 490454
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/490454 | Method and device for determination of parameters of individual microparticles | Jun 13, 1995 | Issued |
| 08/474609 | INTERFEROMETER HAVING A MICROMIRROR | Jun 6, 1995 | Abandoned |
Array
(
[id] => 3697486
[patent_doc_number] => 05604592
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-18
[patent_title] => 'Laser ultrasonics-based material analysis system and method using matched filter processing'
[patent_app_type] => 1
[patent_app_number] => 8/482782
[patent_app_country] => US
[patent_app_date] => 1995-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 30
[patent_no_of_words] => 10809
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 178
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/604/05604592.pdf
[firstpage_image] =>[orig_patent_app_number] => 482782
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/482782 | Laser ultrasonics-based material analysis system and method using matched filter processing | Jun 6, 1995 | Issued |
Array
(
[id] => 3714025
[patent_doc_number] => 05654798
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-05
[patent_title] => 'Interferometric measurement of surfaces with diffractive optics at grazing incidence'
[patent_app_type] => 1
[patent_app_number] => 8/483737
[patent_app_country] => US
[patent_app_date] => 1995-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 5241
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 128
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/654/05654798.pdf
[firstpage_image] =>[orig_patent_app_number] => 483737
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/483737 | Interferometric measurement of surfaces with diffractive optics at grazing incidence | Jun 6, 1995 | Issued |
Array
(
[id] => 3770161
[patent_doc_number] => 05742393
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-04-21
[patent_title] => 'Optical position calibration system'
[patent_app_type] => 1
[patent_app_number] => 8/474027
[patent_app_country] => US
[patent_app_date] => 1995-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 15
[patent_no_of_words] => 3157
[patent_no_of_claims] => 18
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[patent_words_short_claim] => 89
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/742/05742393.pdf
[firstpage_image] =>[orig_patent_app_number] => 474027
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/474027 | Optical position calibration system | Jun 6, 1995 | Issued |
| 08/475261 | INTERFEROMETER HAVING A MICROMIRROR | Jun 6, 1995 | Abandoned |
Array
(
[id] => 3886390
[patent_doc_number] => 05825490
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-10-20
[patent_title] => 'Interferometer comprising translation assemblies for moving a first optical member relative to a second optical member'
[patent_app_type] => 1
[patent_app_number] => 8/473059
[patent_app_country] => US
[patent_app_date] => 1995-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 5
[patent_no_of_words] => 5739
[patent_no_of_claims] => 3
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[patent_words_short_claim] => 211
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[pdf_file] => patents/05/825/05825490.pdf
[firstpage_image] =>[orig_patent_app_number] => 473059
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/473059 | Interferometer comprising translation assemblies for moving a first optical member relative to a second optical member | Jun 6, 1995 | Issued |
Array
(
[id] => 3589685
[patent_doc_number] => 05581350
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-03
[patent_title] => 'Method and system for calibrating an ellipsometer'
[patent_app_type] => 1
[patent_app_number] => 8/471997
[patent_app_country] => US
[patent_app_date] => 1995-06-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 13311
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[pdf_file] => patents/05/581/05581350.pdf
[firstpage_image] =>[orig_patent_app_number] => 471997
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/471997 | Method and system for calibrating an ellipsometer | Jun 5, 1995 | Issued |
Array
(
[id] => 3699019
[patent_doc_number] => 05604695
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-18
[patent_title] => 'Analog high resolution laser irradiation detector (HARLID)'
[patent_app_type] => 1
[patent_app_number] => 8/462065
[patent_app_country] => US
[patent_app_date] => 1995-06-05
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/604/05604695.pdf
[firstpage_image] =>[orig_patent_app_number] => 462065
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/462065 | Analog high resolution laser irradiation detector (HARLID) | Jun 4, 1995 | Issued |
Array
(
[id] => 3655226
[patent_doc_number] => 05629769
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-13
[patent_title] => 'Apparatus and method for the measurement of grain in images'
[patent_app_type] => 1
[patent_app_number] => 8/456845
[patent_app_country] => US
[patent_app_date] => 1995-06-01
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/629/05629769.pdf
[firstpage_image] =>[orig_patent_app_number] => 456845
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/456845 | Apparatus and method for the measurement of grain in images | May 31, 1995 | Issued |
Array
(
[id] => 3634156
[patent_doc_number] => 05621526
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-04-15
[patent_title] => 'Interferometer to eliminate the influence of clouds'
[patent_app_type] => 1
[patent_app_number] => 8/452989
[patent_app_country] => US
[patent_app_date] => 1995-05-30
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[pdf_file] => patents/05/621/05621526.pdf
[firstpage_image] =>[orig_patent_app_number] => 452989
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/452989 | Interferometer to eliminate the influence of clouds | May 29, 1995 | Issued |
Array
(
[id] => 3656227
[patent_doc_number] => 05640245
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-06-17
[patent_title] => 'Spectroscopic method with double modulation'
[patent_app_type] => 1
[patent_app_number] => 8/448633
[patent_app_country] => US
[patent_app_date] => 1995-05-23
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/640/05640245.pdf
[firstpage_image] =>[orig_patent_app_number] => 448633
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/448633 | Spectroscopic method with double modulation | May 22, 1995 | Issued |
Array
(
[id] => 3561259
[patent_doc_number] => 05574557
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-11-12
[patent_title] => 'Apparatus and method for performing sub-poissonian interference measurements using an intensity-squeezed state'
[patent_app_type] => 1
[patent_app_number] => 8/436579
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[patent_app_date] => 1995-05-08
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[pdf_file] => patents/05/574/05574557.pdf
[firstpage_image] =>[orig_patent_app_number] => 436579
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/436579 | Apparatus and method for performing sub-poissonian interference measurements using an intensity-squeezed state | May 7, 1995 | Issued |
Array
(
[id] => 3695924
[patent_doc_number] => 05691810
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-11-25
[patent_title] => 'Dual-bed scanner with reduced transport time'
[patent_app_type] => 1
[patent_app_number] => 8/435821
[patent_app_country] => US
[patent_app_date] => 1995-05-05
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/691/05691810.pdf
[firstpage_image] =>[orig_patent_app_number] => 435821
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/435821 | Dual-bed scanner with reduced transport time | May 4, 1995 | Issued |
Array
(
[id] => 3820826
[patent_doc_number] => 05710629
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-01-20
[patent_title] => 'Interferometric measuring device forming a spacial interference pattern'
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[pdf_file] => patents/05/710/05710629.pdf
[firstpage_image] =>[orig_patent_app_number] => 432118
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/432118 | Interferometric measuring device forming a spacial interference pattern | May 4, 1995 | Issued |