Phillip A. Johnston

Array ( [id] => 14459563 [patent_doc_number] => 10325753 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-06-18 [patent_title] => Method and system for focus adjustment of a multi-beam scanning electron microscopy system [patent_app_type] => utility [patent_app_number] => 15/272194 [patent_app_country] => US [patent_app_date] => 2016-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 16 [patent_no_of_words] => 9690 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 278 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15272194 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 12953113 [patent_doc_number] => 09837177 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2017-12-05 [patent_title] => Vapor cells with a bidirectional solid-state charge-depletion capacitor for mobile ions [patent_app_type] => utility [patent_app_number] => 15/271353 [patent_app_country] => US [patent_app_date] => 2016-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 10223 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15271353 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14459563 [patent_doc_number] => 10325753 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-06-18 [patent_title] => Method and system for focus adjustment of a multi-beam scanning electron microscopy system [patent_app_type] => utility [patent_app_number] => 15/272194 [patent_app_country] => US [patent_app_date] => 2016-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 16 [patent_no_of_words] => 9690 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 278 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15272194 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14459563 [patent_doc_number] => 10325753 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-06-18 [patent_title] => Method and system for focus adjustment of a multi-beam scanning electron microscopy system [patent_app_type] => utility [patent_app_number] => 15/272194 [patent_app_country] => US [patent_app_date] => 2016-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 16 [patent_no_of_words] => 9690 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 278 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15272194 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14616709 [patent_doc_number] => 10361060 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-07-23 [patent_title] => Workpiece transport and positioning apparatus [patent_app_type] => utility [patent_app_number] => 15/254557 [patent_app_country] => US [patent_app_date] => 2016-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 41 [patent_figures_cnt] => 57 [patent_no_of_words] => 26769 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 238 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15254557 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13030511 [patent_doc_number] => 10037878 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-07-31 [patent_title] => Blanking out of pulses in pulsed lasers for LDI mass spectrometers [patent_app_type] => utility [patent_app_number] => 15/251138 [patent_app_country] => US [patent_app_date] => 2016-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 4912 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15251138 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 12482754 [patent_doc_number] => 09992856 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-06-05 [patent_title] => Solution for EUV power increment at wafer level [patent_app_type] => utility [patent_app_number] => 15/251609 [patent_app_country] => US [patent_app_date] => 2016-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 5447 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15251609 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11473214 [patent_doc_number] => 20170059997 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-02 [patent_title] => 'PARTICLE IRRADIATION APPARATUS, BEAM MODIFIER DEVICE, AND SEMICONDUCTOR DEVICE INCLUDING A JUNCTION TERMINATION EXTENSION ZONE' [patent_app_type] => utility [patent_app_number] => 15/249758 [patent_app_country] => US [patent_app_date] => 2016-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 9502 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15249758 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11472826 [patent_doc_number] => 20170059609 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-02 [patent_title] => 'SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD FOR SCANNING PROBE MICROSCOPE' [patent_app_type] => utility [patent_app_number] => 15/249474 [patent_app_country] => US [patent_app_date] => 2016-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7078 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15249474 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14090461 [patent_doc_number] => 10241131 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-03-26 [patent_title] => Method and apparatus for chemical and optical imaging with a broadband source [patent_app_type] => utility [patent_app_number] => 15/249433 [patent_app_country] => US [patent_app_date] => 2016-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 11719 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15249433 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14475533 [patent_doc_number] => 20190189414 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-06-20 [patent_title] => IMAGING MASS SPECTROMETRY DATA PROCESSING DEVICE AND IMAGING MASS SPECTROMETRY DATA PROCESSING METHOD [patent_app_type] => utility [patent_app_number] => 16/328122 [patent_app_country] => US [patent_app_date] => 2016-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10867 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 184 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16328122 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11630727 [patent_doc_number] => 20170140916 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-05-18 [patent_title] => 'Ion Trap with Spatially Extended Ion Trapping Region' [patent_app_type] => utility [patent_app_number] => 15/243200 [patent_app_country] => US [patent_app_date] => 2016-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8300 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15243200 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11323435 [patent_doc_number] => 20160354045 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-12-08 [patent_title] => 'MULTIPLE SCINTILLATION DETECTOR ARRAY IMAGING APPARATUS AND METHOD OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 15/240974 [patent_app_country] => US [patent_app_date] => 2016-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 29375 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15240974 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11273619 [patent_doc_number] => 20160336166 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-11-17 [patent_title] => 'ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER' [patent_app_type] => utility [patent_app_number] => 15/221340 [patent_app_country] => US [patent_app_date] => 2016-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8327 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15221340 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13828927 [patent_doc_number] => 20190017948 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-01-17 [patent_title] => Substitution Site Measuring Equipment and Substitution Site Measuring Method [patent_app_type] => utility [patent_app_number] => 16/066987 [patent_app_country] => US [patent_app_date] => 2016-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6956 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16066987 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13640497 [patent_doc_number] => 09847209 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-12-19 [patent_title] => Inspection of regions of interest using an electron beam system [patent_app_type] => utility [patent_app_number] => 15/207024 [patent_app_country] => US [patent_app_date] => 2016-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6264 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15207024 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13640497 [patent_doc_number] => 09847209 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-12-19 [patent_title] => Inspection of regions of interest using an electron beam system [patent_app_type] => utility [patent_app_number] => 15/207024 [patent_app_country] => US [patent_app_date] => 2016-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6264 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15207024 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13640497 [patent_doc_number] => 09847209 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-12-19 [patent_title] => Inspection of regions of interest using an electron beam system [patent_app_type] => utility [patent_app_number] => 15/207024 [patent_app_country] => US [patent_app_date] => 2016-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6264 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15207024 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13640497 [patent_doc_number] => 09847209 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-12-19 [patent_title] => Inspection of regions of interest using an electron beam system [patent_app_type] => utility [patent_app_number] => 15/207024 [patent_app_country] => US [patent_app_date] => 2016-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6264 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15207024 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11383905 [patent_doc_number] => 20170009961 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-01-12 [patent_title] => 'LED MODULE' [patent_app_type] => utility [patent_app_number] => 15/205938 [patent_app_country] => US [patent_app_date] => 2016-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3631 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15205938 [rel_patent_id] =>[rel_patent_doc_number] =>)