
Ponnathapura N. Achutamurthy
Examiner (ID: 13736)
| Most Active Art Unit | 1106 |
| Art Unit(s) | 1106, 1811, 1818, 1652, 1815, 1648, 1816, 1618 |
| Total Applications | 837 |
| Issued Applications | 550 |
| Pending Applications | 109 |
| Abandoned Applications | 178 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 20208246
[patent_doc_number] => 20250277966
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-09-04
[patent_title] => METHOD AND DEVICE OF FOURIER SPACE ABERRATION CORRECTION FOR HIGH RESOLUTION REFRACTIVE INDEX IMAGING USING INCOHERENT LIGHT
[patent_app_type] => utility
[patent_app_number] => 19/011668
[patent_app_country] => US
[patent_app_date] => 2025-01-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2199
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 19011668
[rel_patent_id] =>[rel_patent_doc_number] =>) 19/011668 | METHOD AND DEVICE OF FOURIER SPACE ABERRATION CORRECTION FOR HIGH RESOLUTION REFRACTIVE INDEX IMAGING USING INCOHERENT LIGHT | Jan 6, 2025 | Pending |
Array
(
[id] => 20165990
[patent_doc_number] => 20250258037
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-08-14
[patent_title] => PULSED LIGHT MEASUREMENT METHOD, NON-TRANSITORY COMPUTER READABLE MEDIUM, AND OPTICAL SPECTRUM ANALYZER
[patent_app_type] => utility
[patent_app_number] => 18/978395
[patent_app_country] => US
[patent_app_date] => 2024-12-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4729
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 97
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18978395
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/978395 | PULSED LIGHT MEASUREMENT METHOD, NON-TRANSITORY COMPUTER READABLE MEDIUM, AND OPTICAL SPECTRUM ANALYZER | Dec 11, 2024 | Pending |
Array
(
[id] => 20026170
[patent_doc_number] => 20250164392
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-05-22
[patent_title] => Tunable laser spectroscopy system with gas line resolution
[patent_app_type] => utility
[patent_app_number] => 18/947498
[patent_app_country] => US
[patent_app_date] => 2024-11-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 0
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18947498
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/947498 | Tunable laser spectroscopy system with gas line resolution | Nov 13, 2024 | Pending |
Array
(
[id] => 20544186
[patent_doc_number] => 20260051078
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2026-02-19
[patent_title] => METHOD OF CAMERA CALIBRATION USING ACTIVE LASER PROJECTION
[patent_app_type] => utility
[patent_app_number] => 18/922766
[patent_app_country] => US
[patent_app_date] => 2024-10-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 599
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -5
[patent_words_short_claim] => 99
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18922766
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/922766 | METHOD OF CAMERA CALIBRATION USING ACTIVE LASER PROJECTION | Oct 21, 2024 | Pending |
Array
(
[id] => 20658599
[patent_doc_number] => 20260110640
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2026-04-23
[patent_title] => OPTICAL ABERRATION COMPENSATION USING A DEFORMABLE MIRROR
[patent_app_type] => utility
[patent_app_number] => 18/922345
[patent_app_country] => US
[patent_app_date] => 2024-10-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 0
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 191
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18922345
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/922345 | OPTICAL ABERRATION COMPENSATION USING A DEFORMABLE MIRROR | Oct 20, 2024 | Pending |
Array
(
[id] => 20688521
[patent_doc_number] => 12618663
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-05-05
[patent_title] => Torsion compensation system and compensation method for fiber Bragg grating curvature sensor
[patent_app_type] => utility
[patent_app_number] => 18/890810
[patent_app_country] => US
[patent_app_date] => 2024-09-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 1368
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 269
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18890810
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/890810 | Torsion compensation system and compensation method for fiber Bragg grating curvature sensor | Sep 19, 2024 | Issued |
Array
(
[id] => 19757305
[patent_doc_number] => 20250045870
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-02-06
[patent_title] => IMAGE MEASUREMENT DEVICE AND METHOD THEREOF
[patent_app_type] => utility
[patent_app_number] => 18/766740
[patent_app_country] => US
[patent_app_date] => 2024-07-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5131
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 67
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18766740
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/766740 | IMAGE MEASUREMENT DEVICE AND METHOD THEREOF | Jul 8, 2024 | Pending |
Array
(
[id] => 19755657
[patent_doc_number] => 20250044222
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-02-06
[patent_title] => IMAGE MEASUREMENT DEVICE AND METHOD THEREOF
[patent_app_type] => utility
[patent_app_number] => 18/767486
[patent_app_country] => US
[patent_app_date] => 2024-07-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5134
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 67
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18767486
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/767486 | IMAGE MEASUREMENT DEVICE AND METHOD THEREOF | Jul 8, 2024 | Pending |
Array
(
[id] => 19746998
[patent_doc_number] => 20250035563
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-01-30
[patent_title] => SEMICONDUCTOR MEASUREMENT DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/764677
[patent_app_country] => US
[patent_app_date] => 2024-07-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 13197
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18764677
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/764677 | SEMICONDUCTOR MEASUREMENT DEVICE | Jul 4, 2024 | Pending |
Array
(
[id] => 19513138
[patent_doc_number] => 20240344824
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-17
[patent_title] => SINGLE PATTERN SHIFT PROJECTION OPTICAL SYSTEM FOR 3D SCANNER
[patent_app_type] => utility
[patent_app_number] => 18/754134
[patent_app_country] => US
[patent_app_date] => 2024-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5435
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 75
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18754134
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/754134 | SINGLE PATTERN SHIFT PROJECTION OPTICAL SYSTEM FOR 3D SCANNER | Jun 24, 2024 | Pending |
Array
(
[id] => 19498517
[patent_doc_number] => 20240337535
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-10
[patent_title] => POLARIZATION INTELLIGENT SENSING SYSTEM AND POLARIZATION INTELLIGENT SENSING METHOD
[patent_app_type] => utility
[patent_app_number] => 18/749966
[patent_app_country] => US
[patent_app_date] => 2024-06-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6415
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -7
[patent_words_short_claim] => 272
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18749966
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/749966 | POLARIZATION INTELLIGENT SENSING SYSTEM AND POLARIZATION INTELLIGENT SENSING METHOD | Jun 20, 2024 | Pending |
Array
(
[id] => 20310458
[patent_doc_number] => 20250328087
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-10-23
[patent_title] => SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING TARGET USING MULTIPLE WAVELENGTHS
[patent_app_type] => utility
[patent_app_number] => 18/642417
[patent_app_country] => US
[patent_app_date] => 2024-04-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6292
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -25
[patent_words_short_claim] => 213
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18642417
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/642417 | SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING TARGET USING MULTIPLE WAVELENGTHS | Apr 21, 2024 | Pending |
Array
(
[id] => 19498542
[patent_doc_number] => 20240337560
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-10
[patent_title] => MEASURING DEVICE, MEASURING METHOD, AND COMPUTER-READABLE RECORDING MEDIUM
[patent_app_type] => utility
[patent_app_number] => 18/624829
[patent_app_country] => US
[patent_app_date] => 2024-04-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 25049
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -5
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18624829
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/624829 | MEASURING DEVICE, MEASURING METHOD, AND COMPUTER-READABLE RECORDING MEDIUM | Apr 1, 2024 | Pending |
Array
(
[id] => 19237318
[patent_doc_number] => 20240194513
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-13
[patent_title] => WAFER NOTCH POSITIONING DETECTION
[patent_app_type] => utility
[patent_app_number] => 18/581722
[patent_app_country] => US
[patent_app_date] => 2024-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6190
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 89
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18581722
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/581722 | WAFER NOTCH POSITIONING DETECTION | Feb 19, 2024 | Pending |
Array
(
[id] => 19382130
[patent_doc_number] => 20240272000
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-08-15
[patent_title] => WAVELENGTH-RESOLVED PHOTONIC LANTERN WAVEFRONT SENSOR
[patent_app_type] => utility
[patent_app_number] => 18/441765
[patent_app_country] => US
[patent_app_date] => 2024-02-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11812
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -21
[patent_words_short_claim] => 135
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18441765
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/441765 | WAVELENGTH-RESOLVED PHOTONIC LANTERN WAVEFRONT SENSOR | Feb 13, 2024 | Pending |
Array
(
[id] => 19346311
[patent_doc_number] => 20240255274
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-08-01
[patent_title] => COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/425830
[patent_app_country] => US
[patent_app_date] => 2024-01-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5741
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 133
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18425830
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/425830 | COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME | Jan 28, 2024 | Pending |
Array
(
[id] => 19319508
[patent_doc_number] => 20240241051
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-18
[patent_title] => SPECTROSCOPIC MEASUREMENT METHOD, SPECTROMETER, AND SPECTROSCOPIC MEASUREMENT PROGRAM
[patent_app_type] => utility
[patent_app_number] => 18/414769
[patent_app_country] => US
[patent_app_date] => 2024-01-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9108
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -4
[patent_words_short_claim] => 207
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18414769
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/414769 | SPECTROSCOPIC MEASUREMENT METHOD, SPECTROMETER, AND SPECTROSCOPIC MEASUREMENT PROGRAM | Jan 16, 2024 | Pending |
Array
(
[id] => 19746997
[patent_doc_number] => 20250035562
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-01-30
[patent_title] => METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES
[patent_app_type] => utility
[patent_app_number] => 18/408588
[patent_app_country] => US
[patent_app_date] => 2024-01-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9169
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 106
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18408588
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/408588 | METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES | Jan 9, 2024 | Pending |
Array
(
[id] => 20344346
[patent_doc_number] => 12468074
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-11-11
[patent_title] => Plasmonic borophene nanoribbon metal-insulator-metal structure for quantum imaging
[patent_app_type] => utility
[patent_app_number] => 18/389925
[patent_app_country] => US
[patent_app_date] => 2023-12-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 0
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18389925
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/389925 | Plasmonic borophene nanoribbon metal-insulator-metal structure for quantum imaging | Dec 19, 2023 | Issued |
Array
(
[id] => 20086319
[patent_doc_number] => 20250216255
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-03
[patent_title] => APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CALCULATION AND RECONSTRUCTION
[patent_app_type] => utility
[patent_app_number] => 18/848332
[patent_app_country] => US
[patent_app_date] => 2023-12-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 0
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -5
[patent_words_short_claim] => 98
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18848332
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/848332 | APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CALCULATION AND RECONSTRUCTION | Dec 11, 2023 | Pending |