Search

Rahul Maini

Examiner (ID: 17000, Phone: (571)270-1099 , Office: P/2866 )

Most Active Art Unit
2866
Art Unit(s)
2866, 2858
Total Applications
466
Issued Applications
343
Pending Applications
30
Abandoned Applications
100

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 10951303 [patent_doc_number] => 20140354324 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-12-04 [patent_title] => 'METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE HAVING A PACKAGE ON PACKAGE (POP) DESIGN' [patent_app_type] => utility [patent_app_number] => 14/284241 [patent_app_country] => US [patent_app_date] => 2014-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2969 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14284241 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/284241
Method and apparatus for testing a semiconductor package having a package on package (PoP) design May 20, 2014 Issued
Array ( [id] => 10944068 [patent_doc_number] => 20140347089 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-11-27 [patent_title] => 'Testing of Thru-Silicon Vias' [patent_app_type] => utility [patent_app_number] => 14/283116 [patent_app_country] => US [patent_app_date] => 2014-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4282 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14283116 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/283116
Testing of thru-silicon vias May 19, 2014 Issued
Array ( [id] => 12045701 [patent_doc_number] => 09823294 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2017-11-21 [patent_title] => 'Negative voltage testing methodology and tester' [patent_app_type] => utility [patent_app_number] => 14/278957 [patent_app_country] => US [patent_app_date] => 2014-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5318 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 242 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14278957 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/278957
Negative voltage testing methodology and tester May 14, 2014 Issued
Array ( [id] => 11628682 [patent_doc_number] => 20170138871 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-05-18 [patent_title] => 'Estimating Subterranean Fluid Viscosity Based on Nuclear Magnetic Resonance (NMR) Data' [patent_app_type] => utility [patent_app_number] => 14/429254 [patent_app_country] => US [patent_app_date] => 2014-04-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6802 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14429254 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/429254
Estimating Subterranean Fluid Viscosity Based on Nuclear Magnetic Resonance (NMR) Data Apr 9, 2014 Abandoned
Array ( [id] => 11326210 [patent_doc_number] => 20160356822 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-12-08 [patent_title] => 'STRAY MAGNETIC FIELD REJECTION FOR IN-HOLE CURRENT-MEASUREMENT SYSTEMS' [patent_app_type] => utility [patent_app_number] => 14/913931 [patent_app_country] => US [patent_app_date] => 2014-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 10052 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14913931 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/913931
Stray magnetic field rejection for in-hole current-measurement systems Mar 25, 2014 Issued
Array ( [id] => 10348968 [patent_doc_number] => 20150233973 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-20 [patent_title] => 'Method of Manufacturing a Test Socket Body of an Impedance-Matched Test Socket' [patent_app_type] => utility [patent_app_number] => 14/199011 [patent_app_country] => US [patent_app_date] => 2014-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5487 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14199011 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/199011
Method of Manufacturing a Test Socket Body of an Impedance-Matched Test Socket Mar 5, 2014 Abandoned
Array ( [id] => 13638455 [patent_doc_number] => 09846185 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-12-19 [patent_title] => Capacitive sensing [patent_app_type] => utility [patent_app_number] => 14/189447 [patent_app_country] => US [patent_app_date] => 2014-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 11 [patent_no_of_words] => 3276 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14189447 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/189447
Capacitive sensing Feb 24, 2014 Issued
Array ( [id] => 9683214 [patent_doc_number] => 20140239977 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-08-28 [patent_title] => 'CAPACITIVE SENSING' [patent_app_type] => utility [patent_app_number] => 14/189461 [patent_app_country] => US [patent_app_date] => 2014-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3498 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14189461 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/189461
Capacitive sensing Feb 24, 2014 Issued
Array ( [id] => 10356469 [patent_doc_number] => 20150241474 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-27 [patent_title] => 'INTEGRATED CIRCUIT (IC) TEST SOCKET USING KELVIN BRIDGE' [patent_app_type] => utility [patent_app_number] => 14/189787 [patent_app_country] => US [patent_app_date] => 2014-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3162 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14189787 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/189787
Integrated circuit (IC) test socket using Kelvin bridge Feb 24, 2014 Issued
Array ( [id] => 10275257 [patent_doc_number] => 20150160254 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-06-11 [patent_title] => 'INDUCTIVE ROTATIONAL SPEED SENSORS' [patent_app_type] => utility [patent_app_number] => 14/188720 [patent_app_country] => US [patent_app_date] => 2014-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2510 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14188720 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/188720
Inductive rotational speed sensors Feb 24, 2014 Issued
Array ( [id] => 11481602 [patent_doc_number] => 09588140 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-03-07 [patent_title] => 'Inspection probe and an IC socket with the same' [patent_app_type] => utility [patent_app_number] => 14/188272 [patent_app_country] => US [patent_app_date] => 2014-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 21 [patent_no_of_words] => 11084 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 226 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14188272 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/188272
Inspection probe and an IC socket with the same Feb 23, 2014 Issued
Array ( [id] => 11390506 [patent_doc_number] => 09551745 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-01-24 [patent_title] => 'Semiconductor device assessment apparatus' [patent_app_type] => utility [patent_app_number] => 14/188503 [patent_app_country] => US [patent_app_date] => 2014-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 6877 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 238 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14188503 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/188503
Semiconductor device assessment apparatus Feb 23, 2014 Issued
Array ( [id] => 10356506 [patent_doc_number] => 20150241511 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-27 [patent_title] => 'SYSTEM AND METHOD FOR MANAGING SEMICONDUCTOR MANUFACTURING DEFECTS' [patent_app_type] => utility [patent_app_number] => 14/187783 [patent_app_country] => US [patent_app_date] => 2014-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 8854 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14187783 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/187783
System and method for managing semiconductor manufacturing defects Feb 23, 2014 Issued
Array ( [id] => 10356473 [patent_doc_number] => 20150241478 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-27 [patent_title] => 'PACKAGE ON PACKAGE THERMAL FORCING DEVICE' [patent_app_type] => utility [patent_app_number] => 14/186733 [patent_app_country] => US [patent_app_date] => 2014-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1879 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14186733 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/186733
Package on package thermal forcing device Feb 20, 2014 Issued
Array ( [id] => 9683208 [patent_doc_number] => 20140239971 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-08-28 [patent_title] => 'DEBUGGING CIRCUIT AND CIRCUIT BOARD USING SAME' [patent_app_type] => utility [patent_app_number] => 14/185017 [patent_app_country] => US [patent_app_date] => 2014-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1433 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14185017 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/185017
DEBUGGING CIRCUIT AND CIRCUIT BOARD USING SAME Feb 19, 2014 Abandoned
Array ( [id] => 13129233 [patent_doc_number] => 10082544 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-09-25 [patent_title] => Sensor configuration for a latch assembly [patent_app_type] => utility [patent_app_number] => 14/768671 [patent_app_country] => US [patent_app_date] => 2014-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 9585 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 303 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14768671 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/768671
Sensor configuration for a latch assembly Feb 18, 2014 Issued
Array ( [id] => 11284855 [patent_doc_number] => 09500704 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-11-22 [patent_title] => 'Semiconductor device which can detect abnormality' [patent_app_type] => utility [patent_app_number] => 14/184230 [patent_app_country] => US [patent_app_date] => 2014-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 9870 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14184230 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/184230
Semiconductor device which can detect abnormality Feb 18, 2014 Issued
Array ( [id] => 10348992 [patent_doc_number] => 20150233997 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-20 [patent_title] => 'TRANSFORMER EVALUATION' [patent_app_type] => utility [patent_app_number] => 14/182761 [patent_app_country] => US [patent_app_date] => 2014-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6062 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14182761 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/182761
Transformer evaluation Feb 17, 2014 Issued
Array ( [id] => 10283452 [patent_doc_number] => 20150168450 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-06-18 [patent_title] => 'Coaxial Impedance-Matched Test Socket' [patent_app_type] => utility [patent_app_number] => 14/181943 [patent_app_country] => US [patent_app_date] => 2014-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4234 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14181943 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/181943
Coaxial Impedance-Matched Test Socket Feb 16, 2014 Abandoned
Array ( [id] => 9654621 [patent_doc_number] => 20140225626 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-08-14 [patent_title] => 'Systems and Methods to Detect Poorly Damped Oscillation Modes' [patent_app_type] => utility [patent_app_number] => 14/180631 [patent_app_country] => US [patent_app_date] => 2014-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7336 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14180631 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/180631
Systems and methods to detect poorly damped oscillation modes Feb 13, 2014 Issued
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