Search

Rahul Maini

Examiner (ID: 16023, Phone: (571)270-1099 , Office: P/2866 )

Most Active Art Unit
2866
Art Unit(s)
2858, 2866
Total Applications
480
Issued Applications
361
Pending Applications
25
Abandoned Applications
100

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 10400846 [patent_doc_number] => 20150285855 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-10-08 [patent_title] => 'SYSTEM WITH DUAL FUNCTION LOAD BOARD' [patent_app_type] => utility [patent_app_number] => 14/288198 [patent_app_country] => US [patent_app_date] => 2014-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 3149 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14288198 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/288198
SYSTEM WITH DUAL FUNCTION LOAD BOARD May 26, 2014 Abandoned
Array ( [id] => 10972265 [patent_doc_number] => 20140375300 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-12-25 [patent_title] => 'PRINTED CIRCUIT BOARD, ELECTRONIC APPARATUS AND COMPONENT DETECTION METHOD' [patent_app_type] => utility [patent_app_number] => 14/286160 [patent_app_country] => US [patent_app_date] => 2014-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 16540 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14286160 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/286160
PRINTED CIRCUIT BOARD, ELECTRONIC APPARATUS AND COMPONENT DETECTION METHOD May 22, 2014 Abandoned
Array ( [id] => 10453433 [patent_doc_number] => 20150338448 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-11-26 [patent_title] => 'NOISE DETECTION DEVICE, SYSTEM AND METHOD' [patent_app_type] => utility [patent_app_number] => 14/285604 [patent_app_country] => US [patent_app_date] => 2014-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3916 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14285604 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/285604
NOISE DETECTION DEVICE, SYSTEM AND METHOD May 21, 2014 Abandoned
Array ( [id] => 11562976 [patent_doc_number] => 09625557 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-04-18 [patent_title] => 'Work function calibration of a non-contact voltage sensor' [patent_app_type] => utility [patent_app_number] => 14/285059 [patent_app_country] => US [patent_app_date] => 2014-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5735 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14285059 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/285059
Work function calibration of a non-contact voltage sensor May 21, 2014 Issued
Array ( [id] => 10951303 [patent_doc_number] => 20140354324 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-12-04 [patent_title] => 'METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE HAVING A PACKAGE ON PACKAGE (POP) DESIGN' [patent_app_type] => utility [patent_app_number] => 14/284241 [patent_app_country] => US [patent_app_date] => 2014-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2969 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14284241 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/284241
Method and apparatus for testing a semiconductor package having a package on package (PoP) design May 20, 2014 Issued
Array ( [id] => 10349000 [patent_doc_number] => 20150234005 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-20 [patent_title] => 'MEMORY PACKAGE TEST JIG HAVING HARSH CONDITION CREATING STRUCTURE' [patent_app_type] => utility [patent_app_number] => 14/283665 [patent_app_country] => US [patent_app_date] => 2014-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8173 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14283665 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/283665
MEMORY PACKAGE TEST JIG HAVING HARSH CONDITION CREATING STRUCTURE May 20, 2014 Abandoned
Array ( [id] => 10944068 [patent_doc_number] => 20140347089 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-11-27 [patent_title] => 'Testing of Thru-Silicon Vias' [patent_app_type] => utility [patent_app_number] => 14/283116 [patent_app_country] => US [patent_app_date] => 2014-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4282 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14283116 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/283116
Testing of thru-silicon vias May 19, 2014 Issued
Array ( [id] => 12045701 [patent_doc_number] => 09823294 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2017-11-21 [patent_title] => 'Negative voltage testing methodology and tester' [patent_app_type] => utility [patent_app_number] => 14/278957 [patent_app_country] => US [patent_app_date] => 2014-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5318 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 242 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14278957 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/278957
Negative voltage testing methodology and tester May 14, 2014 Issued
Array ( [id] => 11628682 [patent_doc_number] => 20170138871 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-05-18 [patent_title] => 'Estimating Subterranean Fluid Viscosity Based on Nuclear Magnetic Resonance (NMR) Data' [patent_app_type] => utility [patent_app_number] => 14/429254 [patent_app_country] => US [patent_app_date] => 2014-04-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6802 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14429254 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/429254
Estimating Subterranean Fluid Viscosity Based on Nuclear Magnetic Resonance (NMR) Data Apr 9, 2014 Abandoned
Array ( [id] => 11326210 [patent_doc_number] => 20160356822 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-12-08 [patent_title] => 'STRAY MAGNETIC FIELD REJECTION FOR IN-HOLE CURRENT-MEASUREMENT SYSTEMS' [patent_app_type] => utility [patent_app_number] => 14/913931 [patent_app_country] => US [patent_app_date] => 2014-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 10052 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14913931 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/913931
Stray magnetic field rejection for in-hole current-measurement systems Mar 25, 2014 Issued
Array ( [id] => 10348968 [patent_doc_number] => 20150233973 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-20 [patent_title] => 'Method of Manufacturing a Test Socket Body of an Impedance-Matched Test Socket' [patent_app_type] => utility [patent_app_number] => 14/199011 [patent_app_country] => US [patent_app_date] => 2014-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5487 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14199011 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/199011
Method of Manufacturing a Test Socket Body of an Impedance-Matched Test Socket Mar 5, 2014 Abandoned
Array ( [id] => 13638455 [patent_doc_number] => 09846185 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-12-19 [patent_title] => Capacitive sensing [patent_app_type] => utility [patent_app_number] => 14/189447 [patent_app_country] => US [patent_app_date] => 2014-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 11 [patent_no_of_words] => 3276 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14189447 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/189447
Capacitive sensing Feb 24, 2014 Issued
Array ( [id] => 10275257 [patent_doc_number] => 20150160254 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-06-11 [patent_title] => 'INDUCTIVE ROTATIONAL SPEED SENSORS' [patent_app_type] => utility [patent_app_number] => 14/188720 [patent_app_country] => US [patent_app_date] => 2014-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2510 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14188720 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/188720
Inductive rotational speed sensors Feb 24, 2014 Issued
Array ( [id] => 10356469 [patent_doc_number] => 20150241474 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-27 [patent_title] => 'INTEGRATED CIRCUIT (IC) TEST SOCKET USING KELVIN BRIDGE' [patent_app_type] => utility [patent_app_number] => 14/189787 [patent_app_country] => US [patent_app_date] => 2014-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3162 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14189787 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/189787
Integrated circuit (IC) test socket using Kelvin bridge Feb 24, 2014 Issued
Array ( [id] => 9683214 [patent_doc_number] => 20140239977 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-08-28 [patent_title] => 'CAPACITIVE SENSING' [patent_app_type] => utility [patent_app_number] => 14/189461 [patent_app_country] => US [patent_app_date] => 2014-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3498 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14189461 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/189461
Capacitive sensing Feb 24, 2014 Issued
Array ( [id] => 10356506 [patent_doc_number] => 20150241511 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-27 [patent_title] => 'SYSTEM AND METHOD FOR MANAGING SEMICONDUCTOR MANUFACTURING DEFECTS' [patent_app_type] => utility [patent_app_number] => 14/187783 [patent_app_country] => US [patent_app_date] => 2014-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 8854 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14187783 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/187783
System and method for managing semiconductor manufacturing defects Feb 23, 2014 Issued
Array ( [id] => 11390506 [patent_doc_number] => 09551745 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-01-24 [patent_title] => 'Semiconductor device assessment apparatus' [patent_app_type] => utility [patent_app_number] => 14/188503 [patent_app_country] => US [patent_app_date] => 2014-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 6877 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 238 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14188503 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/188503
Semiconductor device assessment apparatus Feb 23, 2014 Issued
Array ( [id] => 11481602 [patent_doc_number] => 09588140 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-03-07 [patent_title] => 'Inspection probe and an IC socket with the same' [patent_app_type] => utility [patent_app_number] => 14/188272 [patent_app_country] => US [patent_app_date] => 2014-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 21 [patent_no_of_words] => 11084 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 226 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14188272 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/188272
Inspection probe and an IC socket with the same Feb 23, 2014 Issued
Array ( [id] => 10356473 [patent_doc_number] => 20150241478 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-27 [patent_title] => 'PACKAGE ON PACKAGE THERMAL FORCING DEVICE' [patent_app_type] => utility [patent_app_number] => 14/186733 [patent_app_country] => US [patent_app_date] => 2014-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1879 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14186733 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/186733
Package on package thermal forcing device Feb 20, 2014 Issued
Array ( [id] => 9683208 [patent_doc_number] => 20140239971 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-08-28 [patent_title] => 'DEBUGGING CIRCUIT AND CIRCUIT BOARD USING SAME' [patent_app_type] => utility [patent_app_number] => 14/185017 [patent_app_country] => US [patent_app_date] => 2014-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1433 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14185017 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/185017
DEBUGGING CIRCUIT AND CIRCUIT BOARD USING SAME Feb 19, 2014 Abandoned
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