
Rahul Maini
Examiner (ID: 17000, Phone: (571)270-1099 , Office: P/2866 )
| Most Active Art Unit | 2866 |
| Art Unit(s) | 2866, 2858 |
| Total Applications | 466 |
| Issued Applications | 343 |
| Pending Applications | 30 |
| Abandoned Applications | 100 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 10951303
[patent_doc_number] => 20140354324
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-12-04
[patent_title] => 'METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE HAVING A PACKAGE ON PACKAGE (POP) DESIGN'
[patent_app_type] => utility
[patent_app_number] => 14/284241
[patent_app_country] => US
[patent_app_date] => 2014-05-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2969
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14284241
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/284241 | Method and apparatus for testing a semiconductor package having a package on package (PoP) design | May 20, 2014 | Issued |
Array
(
[id] => 10944068
[patent_doc_number] => 20140347089
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-11-27
[patent_title] => 'Testing of Thru-Silicon Vias'
[patent_app_type] => utility
[patent_app_number] => 14/283116
[patent_app_country] => US
[patent_app_date] => 2014-05-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 4282
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14283116
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/283116 | Testing of thru-silicon vias | May 19, 2014 | Issued |
Array
(
[id] => 12045701
[patent_doc_number] => 09823294
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2017-11-21
[patent_title] => 'Negative voltage testing methodology and tester'
[patent_app_type] => utility
[patent_app_number] => 14/278957
[patent_app_country] => US
[patent_app_date] => 2014-05-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5318
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 242
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14278957
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/278957 | Negative voltage testing methodology and tester | May 14, 2014 | Issued |
Array
(
[id] => 11628682
[patent_doc_number] => 20170138871
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-05-18
[patent_title] => 'Estimating Subterranean Fluid Viscosity Based on Nuclear Magnetic Resonance (NMR) Data'
[patent_app_type] => utility
[patent_app_number] => 14/429254
[patent_app_country] => US
[patent_app_date] => 2014-04-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 6802
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14429254
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/429254 | Estimating Subterranean Fluid Viscosity Based on Nuclear Magnetic Resonance (NMR) Data | Apr 9, 2014 | Abandoned |
Array
(
[id] => 11326210
[patent_doc_number] => 20160356822
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-12-08
[patent_title] => 'STRAY MAGNETIC FIELD REJECTION FOR IN-HOLE CURRENT-MEASUREMENT SYSTEMS'
[patent_app_type] => utility
[patent_app_number] => 14/913931
[patent_app_country] => US
[patent_app_date] => 2014-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 10052
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14913931
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/913931 | Stray magnetic field rejection for in-hole current-measurement systems | Mar 25, 2014 | Issued |
Array
(
[id] => 10348968
[patent_doc_number] => 20150233973
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-08-20
[patent_title] => 'Method of Manufacturing a Test Socket Body of an Impedance-Matched Test Socket'
[patent_app_type] => utility
[patent_app_number] => 14/199011
[patent_app_country] => US
[patent_app_date] => 2014-03-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5487
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14199011
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/199011 | Method of Manufacturing a Test Socket Body of an Impedance-Matched Test Socket | Mar 5, 2014 | Abandoned |
Array
(
[id] => 13638455
[patent_doc_number] => 09846185
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-12-19
[patent_title] => Capacitive sensing
[patent_app_type] => utility
[patent_app_number] => 14/189447
[patent_app_country] => US
[patent_app_date] => 2014-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 11
[patent_no_of_words] => 3276
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 99
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14189447
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/189447 | Capacitive sensing | Feb 24, 2014 | Issued |
Array
(
[id] => 9683214
[patent_doc_number] => 20140239977
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-08-28
[patent_title] => 'CAPACITIVE SENSING'
[patent_app_type] => utility
[patent_app_number] => 14/189461
[patent_app_country] => US
[patent_app_date] => 2014-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3498
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14189461
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/189461 | Capacitive sensing | Feb 24, 2014 | Issued |
Array
(
[id] => 10356469
[patent_doc_number] => 20150241474
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-08-27
[patent_title] => 'INTEGRATED CIRCUIT (IC) TEST SOCKET USING KELVIN BRIDGE'
[patent_app_type] => utility
[patent_app_number] => 14/189787
[patent_app_country] => US
[patent_app_date] => 2014-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3162
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14189787
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/189787 | Integrated circuit (IC) test socket using Kelvin bridge | Feb 24, 2014 | Issued |
Array
(
[id] => 10275257
[patent_doc_number] => 20150160254
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-06-11
[patent_title] => 'INDUCTIVE ROTATIONAL SPEED SENSORS'
[patent_app_type] => utility
[patent_app_number] => 14/188720
[patent_app_country] => US
[patent_app_date] => 2014-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2510
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14188720
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/188720 | Inductive rotational speed sensors | Feb 24, 2014 | Issued |
Array
(
[id] => 11481602
[patent_doc_number] => 09588140
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-03-07
[patent_title] => 'Inspection probe and an IC socket with the same'
[patent_app_type] => utility
[patent_app_number] => 14/188272
[patent_app_country] => US
[patent_app_date] => 2014-02-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 21
[patent_no_of_words] => 11084
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 226
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14188272
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/188272 | Inspection probe and an IC socket with the same | Feb 23, 2014 | Issued |
Array
(
[id] => 11390506
[patent_doc_number] => 09551745
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-01-24
[patent_title] => 'Semiconductor device assessment apparatus'
[patent_app_type] => utility
[patent_app_number] => 14/188503
[patent_app_country] => US
[patent_app_date] => 2014-02-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 9
[patent_no_of_words] => 6877
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 238
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14188503
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/188503 | Semiconductor device assessment apparatus | Feb 23, 2014 | Issued |
Array
(
[id] => 10356506
[patent_doc_number] => 20150241511
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-08-27
[patent_title] => 'SYSTEM AND METHOD FOR MANAGING SEMICONDUCTOR MANUFACTURING DEFECTS'
[patent_app_type] => utility
[patent_app_number] => 14/187783
[patent_app_country] => US
[patent_app_date] => 2014-02-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 8854
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14187783
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/187783 | System and method for managing semiconductor manufacturing defects | Feb 23, 2014 | Issued |
Array
(
[id] => 10356473
[patent_doc_number] => 20150241478
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-08-27
[patent_title] => 'PACKAGE ON PACKAGE THERMAL FORCING DEVICE'
[patent_app_type] => utility
[patent_app_number] => 14/186733
[patent_app_country] => US
[patent_app_date] => 2014-02-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1879
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14186733
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/186733 | Package on package thermal forcing device | Feb 20, 2014 | Issued |
Array
(
[id] => 9683208
[patent_doc_number] => 20140239971
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-08-28
[patent_title] => 'DEBUGGING CIRCUIT AND CIRCUIT BOARD USING SAME'
[patent_app_type] => utility
[patent_app_number] => 14/185017
[patent_app_country] => US
[patent_app_date] => 2014-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 1433
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14185017
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/185017 | DEBUGGING CIRCUIT AND CIRCUIT BOARD USING SAME | Feb 19, 2014 | Abandoned |
Array
(
[id] => 13129233
[patent_doc_number] => 10082544
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-09-25
[patent_title] => Sensor configuration for a latch assembly
[patent_app_type] => utility
[patent_app_number] => 14/768671
[patent_app_country] => US
[patent_app_date] => 2014-02-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 19
[patent_no_of_words] => 9585
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 303
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14768671
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/768671 | Sensor configuration for a latch assembly | Feb 18, 2014 | Issued |
Array
(
[id] => 11284855
[patent_doc_number] => 09500704
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-11-22
[patent_title] => 'Semiconductor device which can detect abnormality'
[patent_app_type] => utility
[patent_app_number] => 14/184230
[patent_app_country] => US
[patent_app_date] => 2014-02-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 9870
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14184230
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/184230 | Semiconductor device which can detect abnormality | Feb 18, 2014 | Issued |
Array
(
[id] => 10348992
[patent_doc_number] => 20150233997
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-08-20
[patent_title] => 'TRANSFORMER EVALUATION'
[patent_app_type] => utility
[patent_app_number] => 14/182761
[patent_app_country] => US
[patent_app_date] => 2014-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 6062
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14182761
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/182761 | Transformer evaluation | Feb 17, 2014 | Issued |
Array
(
[id] => 10283452
[patent_doc_number] => 20150168450
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-06-18
[patent_title] => 'Coaxial Impedance-Matched Test Socket'
[patent_app_type] => utility
[patent_app_number] => 14/181943
[patent_app_country] => US
[patent_app_date] => 2014-02-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4234
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14181943
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/181943 | Coaxial Impedance-Matched Test Socket | Feb 16, 2014 | Abandoned |
Array
(
[id] => 9654621
[patent_doc_number] => 20140225626
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-08-14
[patent_title] => 'Systems and Methods to Detect Poorly Damped Oscillation Modes'
[patent_app_type] => utility
[patent_app_number] => 14/180631
[patent_app_country] => US
[patent_app_date] => 2014-02-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 7336
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14180631
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/180631 | Systems and methods to detect poorly damped oscillation modes | Feb 13, 2014 | Issued |