
Randall L. Green
Examiner (ID: 9821)
| Most Active Art Unit | 3405 |
| Art Unit(s) | 3401, 2899, 2401, 3308, 1106, 3404, 3405, 2602, 3402, 3734 |
| Total Applications | 761 |
| Issued Applications | 670 |
| Pending Applications | 0 |
| Abandoned Applications | 91 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 12243141
[patent_doc_number] => 20180076004
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-03-15
[patent_title] => 'Charged Particle Beam Device and Sample Observation Method'
[patent_app_type] => utility
[patent_app_number] => 15/560286
[patent_app_country] => US
[patent_app_date] => 2015-04-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 6429
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15560286
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/560286 | Charged particle beam device for moving an aperture having plurality of openings and sample observation method | Apr 13, 2015 | Issued |
Array
(
[id] => 12588957
[patent_doc_number] => 20180088148
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-03-29
[patent_title] => SCANNING PROBE MICROSCOPE
[patent_app_type] => utility
[patent_app_number] => 15/566164
[patent_app_country] => US
[patent_app_date] => 2015-04-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7476
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15566164
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/566164 | Scanning probe microscope using gradual increases and decreases in relative speed when shifting and reciprocating the scanned probe across a sample | Apr 13, 2015 | Issued |
Array
(
[id] => 11424804
[patent_doc_number] => 20170032950
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-02-02
[patent_title] => 'Device and Method for Ion Cyclotron Resonance Mass Spectrometry'
[patent_app_type] => utility
[patent_app_number] => 15/303226
[patent_app_country] => US
[patent_app_date] => 2015-04-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 26
[patent_figures_cnt] => 26
[patent_no_of_words] => 13382
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15303226
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/303226 | Device and method for ion cyclotron resonance mass spectrometry | Apr 13, 2015 | Issued |
Array
(
[id] => 12263632
[patent_doc_number] => 20180082828
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-03-22
[patent_title] => 'ACCELERATOR MASS SPECTROMETRY DEVICE FOR SIMULTANEOUSLY MEASURING ISOTOPES'
[patent_app_type] => utility
[patent_app_number] => 15/562892
[patent_app_country] => US
[patent_app_date] => 2015-04-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2712
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15562892
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/562892 | Accelerator mass spectrometry device for simultaneously measuring isotopes | Mar 31, 2015 | Issued |
Array
(
[id] => 13256957
[patent_doc_number] => 10141172
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-11-27
[patent_title] => Synchronised variation of source conditions of an atmospheric pressure chemical ionisation mass spectrometer coupled to a gas chromatograph to improve stability during analysis
[patent_app_type] => utility
[patent_app_number] => 15/128293
[patent_app_country] => US
[patent_app_date] => 2015-03-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 11
[patent_no_of_words] => 7298
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 96
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15128293
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/128293 | Synchronised variation of source conditions of an atmospheric pressure chemical ionisation mass spectrometer coupled to a gas chromatograph to improve stability during analysis | Mar 26, 2015 | Issued |
Array
(
[id] => 11559030
[patent_doc_number] => 20170105276
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-04-13
[patent_title] => 'Controlled Atom Source'
[patent_app_type] => utility
[patent_app_number] => 15/128731
[patent_app_country] => US
[patent_app_date] => 2015-03-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4243
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 14
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15128731
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/128731 | Controlled laser irradiation atom source | Mar 23, 2015 | Issued |
Array
(
[id] => 12195456
[patent_doc_number] => 09899190
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-02-20
[patent_title] => 'Method and apparatus for transferring pixel data for electron beam lithography'
[patent_app_type] => utility
[patent_app_number] => 14/639786
[patent_app_country] => US
[patent_app_date] => 2015-03-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 7220
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 173
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14639786
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/639786 | Method and apparatus for transferring pixel data for electron beam lithography | Mar 4, 2015 | Issued |
Array
(
[id] => 12953305
[patent_doc_number] => 09837244
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-12-05
[patent_title] => Sample holding device for studying light-driven reactions and sample analysis method using the same
[patent_app_type] => utility
[patent_app_number] => 14/583442
[patent_app_country] => US
[patent_app_date] => 2014-12-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 10
[patent_no_of_words] => 3625
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14583442
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/583442 | Sample holding device for studying light-driven reactions and sample analysis method using the same | Dec 25, 2014 | Issued |
Array
(
[id] => 10302540
[patent_doc_number] => 20150187540
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-07-02
[patent_title] => 'DRAWING APPARATUS AND METHOD OF MANUFACTURING ARTICLE'
[patent_app_type] => utility
[patent_app_number] => 14/580060
[patent_app_country] => US
[patent_app_date] => 2014-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5848
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14580060
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/580060 | DRAWING APPARATUS AND METHOD OF MANUFACTURING ARTICLE | Dec 21, 2014 | Abandoned |
Array
(
[id] => 10212124
[patent_doc_number] => 20150097116
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-04-09
[patent_title] => 'INSPECTION APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 14/571594
[patent_app_country] => US
[patent_app_date] => 2014-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 43
[patent_figures_cnt] => 43
[patent_no_of_words] => 36547
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14571594
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/571594 | INSPECTION APPARATUS | Dec 15, 2014 | Abandoned |
Array
(
[id] => 11524393
[patent_doc_number] => 09607802
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-03-28
[patent_title] => 'Apparatus and methods for aberration correction in electron beam based system'
[patent_app_type] => utility
[patent_app_number] => 14/567785
[patent_app_country] => US
[patent_app_date] => 2014-12-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 3807
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 138
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14567785
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/567785 | Apparatus and methods for aberration correction in electron beam based system | Dec 10, 2014 | Issued |
Array
(
[id] => 9893055
[patent_doc_number] => 20150048254
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-02-19
[patent_title] => 'HYBRID ELECTROSTATIC LENS WITH INCREASED NATURAL FREQUENCY'
[patent_app_type] => utility
[patent_app_number] => 14/531480
[patent_app_country] => US
[patent_app_date] => 2014-11-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5114
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14531480
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/531480 | HYBRID ELECTROSTATIC LENS WITH INCREASED NATURAL FREQUENCY | Nov 2, 2014 | Abandoned |
Array
(
[id] => 10300249
[patent_doc_number] => 20150185249
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-07-02
[patent_title] => 'PROBE CONFIGURATION AND METHOD OF FABRICATION THEREOF'
[patent_app_type] => utility
[patent_app_number] => 14/527526
[patent_app_country] => US
[patent_app_date] => 2014-10-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 11204
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14527526
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/527526 | Probe configuration and method of fabrication thereof | Oct 28, 2014 | Issued |
Array
(
[id] => 11898046
[patent_doc_number] => 09767985
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-09-19
[patent_title] => 'Device and method for optimizing diffusion section of electron beam'
[patent_app_type] => utility
[patent_app_number] => 14/895708
[patent_app_country] => US
[patent_app_date] => 2014-10-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 9
[patent_no_of_words] => 4527
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 597
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14895708
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/895708 | Device and method for optimizing diffusion section of electron beam | Oct 16, 2014 | Issued |
Array
(
[id] => 10223354
[patent_doc_number] => 20150108347
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-04-23
[patent_title] => 'METHOD AND APPARATUS TO DESOLVATE IONS AT HIGH PRESSURE AND TO IMPROVE TRANSMISSION AND CONTAMINATION IN THE COUPLING OF MASS SPECTROMETERS AND MOBILITY SPECTROMETERS WITH IONIZERS'
[patent_app_type] => utility
[patent_app_number] => 14/516803
[patent_app_country] => US
[patent_app_date] => 2014-10-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 12338
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14516803
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/516803 | METHOD AND APPARATUS TO DESOLVATE IONS AT HIGH PRESSURE AND TO IMPROVE TRANSMISSION AND CONTAMINATION IN THE COUPLING OF MASS SPECTROMETERS AND MOBILITY SPECTROMETERS WITH IONIZERS | Oct 16, 2014 | Abandoned |
Array
(
[id] => 11921777
[patent_doc_number] => 09789340
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-10-17
[patent_title] => 'Filter and neutron beam source including the same'
[patent_app_type] => utility
[patent_app_number] => 14/511937
[patent_app_country] => US
[patent_app_date] => 2014-10-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4610
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 101
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14511937
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/511937 | Filter and neutron beam source including the same | Oct 9, 2014 | Issued |
Array
(
[id] => 10356364
[patent_doc_number] => 20150241369
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-08-27
[patent_title] => 'CHARGED PARTICLE BEAM APPARATUS, IMAGE ACQUIRING METHOD AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM'
[patent_app_type] => utility
[patent_app_number] => 14/510210
[patent_app_country] => US
[patent_app_date] => 2014-10-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5311
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14510210
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/510210 | CHARGED PARTICLE BEAM APPARATUS, IMAGE ACQUIRING METHOD AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM | Oct 8, 2014 | Abandoned |
Array
(
[id] => 10358475
[patent_doc_number] => 20150243480
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-08-27
[patent_title] => 'CHARGED PARTICLE BEAM EXPOSURE APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE'
[patent_app_type] => utility
[patent_app_number] => 14/502709
[patent_app_country] => US
[patent_app_date] => 2014-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 9953
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14502709
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/502709 | Charged particle beam exposure apparatus and method of manufacturing semiconductor device | Sep 29, 2014 | Issued |
Array
(
[id] => 14637421
[patent_doc_number] => 10363439
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2019-07-30
[patent_title] => Ion acceleration complex for the treatment of atrial fibrillations
[patent_app_type] => utility
[patent_app_number] => 14/464148
[patent_app_country] => US
[patent_app_date] => 2014-08-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 3746
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 297
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14464148
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/464148 | Ion acceleration complex for the treatment of atrial fibrillations | Aug 19, 2014 | Issued |
Array
(
[id] => 9774885
[patent_doc_number] => 20140298548
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-10-02
[patent_title] => 'SCANNING PROBE MICROSCOPE'
[patent_app_type] => utility
[patent_app_number] => 14/304362
[patent_app_country] => US
[patent_app_date] => 2014-06-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 27
[patent_figures_cnt] => 27
[patent_no_of_words] => 12628
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14304362
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/304362 | SCANNING PROBE MICROSCOPE | Jun 12, 2014 | Abandoned |