Search

Rebecca Carole Bryant

Examiner (ID: 7910, Phone: (571)272-9787 , Office: P/2877 )

Most Active Art Unit
2877
Art Unit(s)
2112, 2877, 2809
Total Applications
755
Issued Applications
479
Pending Applications
81
Abandoned Applications
215

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 198496 [patent_doc_number] => 07639351 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-29 [patent_title] => 'Automated process control using optical metrology with a photonic nanojet' [patent_app_type] => utility [patent_app_number] => 11/726076 [patent_app_country] => US [patent_app_date] => 2007-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 16 [patent_no_of_words] => 8547 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/639/07639351.pdf [firstpage_image] =>[orig_patent_app_number] => 11726076 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/726076
Automated process control using optical metrology with a photonic nanojet Mar 19, 2007 Issued
Array ( [id] => 838135 [patent_doc_number] => 07394535 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-07-01 [patent_title] => 'Optical metrology using a photonic nanojet' [patent_app_type] => utility [patent_app_number] => 11/726083 [patent_app_country] => US [patent_app_date] => 2007-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 7456 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/394/07394535.pdf [firstpage_image] =>[orig_patent_app_number] => 11726083 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/726083
Optical metrology using a photonic nanojet Mar 19, 2007 Issued
Array ( [id] => 4819324 [patent_doc_number] => 20080226157 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-18 [patent_title] => 'Inspection methods and systems for lithographic masks' [patent_app_type] => utility [patent_app_number] => 11/724905 [patent_app_country] => US [patent_app_date] => 2007-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 9738 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0226/20080226157.pdf [firstpage_image] =>[orig_patent_app_number] => 11724905 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/724905
Inspection methods and systems for lithographic masks Mar 14, 2007 Issued
Array ( [id] => 5083894 [patent_doc_number] => 20070273945 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-29 [patent_title] => 'Wafer Inspection Using Short-Pulsed Continuous Broadband Illumination' [patent_app_type] => utility [patent_app_number] => 11/684191 [patent_app_country] => US [patent_app_date] => 2007-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 11146 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0273/20070273945.pdf [firstpage_image] =>[orig_patent_app_number] => 11684191 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/684191
Wafer inspection using short-pulsed continuous broadband illumination Mar 8, 2007 Issued
Array ( [id] => 186795 [patent_doc_number] => 07646478 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-12 [patent_title] => 'Apparatus and method for examining spectral characteristics of transmitted light through an object' [patent_app_type] => utility [patent_app_number] => 11/703095 [patent_app_country] => US [patent_app_date] => 2007-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 6968 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/646/07646478.pdf [firstpage_image] =>[orig_patent_app_number] => 11703095 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/703095
Apparatus and method for examining spectral characteristics of transmitted light through an object Feb 6, 2007 Issued
Array ( [id] => 4953669 [patent_doc_number] => 20080186693 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-07 [patent_title] => 'Container inspection machine' [patent_app_type] => utility [patent_app_number] => 11/701597 [patent_app_country] => US [patent_app_date] => 2007-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 537 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0186/20080186693.pdf [firstpage_image] =>[orig_patent_app_number] => 11701597 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/701597
Container inspection machine Feb 1, 2007 Abandoned
Array ( [id] => 5309288 [patent_doc_number] => 20090016569 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-15 [patent_title] => 'Method of Controlling the Flow of Adjuvant for the Casting of a Molten Metal' [patent_app_type] => utility [patent_app_number] => 12/223590 [patent_app_country] => US [patent_app_date] => 2007-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2627 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0016/20090016569.pdf [firstpage_image] =>[orig_patent_app_number] => 12223590 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/223590
Method of Controlling the Flow of Adjuvant for the Casting of a Molten Metal Feb 1, 2007 Abandoned
Array ( [id] => 5176083 [patent_doc_number] => 20070177141 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-02 [patent_title] => 'Optical spectrum analyzer' [patent_app_type] => utility [patent_app_number] => 11/699463 [patent_app_country] => US [patent_app_date] => 2007-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7646 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0177/20070177141.pdf [firstpage_image] =>[orig_patent_app_number] => 11699463 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/699463
Optical spectrum analyzer Jan 29, 2007 Abandoned
Array ( [id] => 5176101 [patent_doc_number] => 20070177159 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-02 [patent_title] => 'Method for measuring three-dimension shape' [patent_app_type] => utility [patent_app_number] => 11/656458 [patent_app_country] => US [patent_app_date] => 2007-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9767 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0177/20070177159.pdf [firstpage_image] =>[orig_patent_app_number] => 11656458 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/656458
Method for automated measurement of three-dimensional shape of circuit boards Jan 22, 2007 Issued
Array ( [id] => 206101 [patent_doc_number] => 07630086 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-08 [patent_title] => 'Surface finish roughness measurement' [patent_app_type] => utility [patent_app_number] => 11/623415 [patent_app_country] => US [patent_app_date] => 2007-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 34 [patent_figures_cnt] => 52 [patent_no_of_words] => 18208 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/630/07630086.pdf [firstpage_image] =>[orig_patent_app_number] => 11623415 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/623415
Surface finish roughness measurement Jan 15, 2007 Issued
Array ( [id] => 5093862 [patent_doc_number] => 20070115471 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-24 [patent_title] => 'WAFER, EXPOSURE MASK, METHOD OF DETECTING MARK AND METHOD OF EXPOSURE' [patent_app_type] => utility [patent_app_number] => 11/622534 [patent_app_country] => US [patent_app_date] => 2007-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3247 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0115/20070115471.pdf [firstpage_image] =>[orig_patent_app_number] => 11622534 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/622534
WAFER, EXPOSURE MASK, METHOD OF DETECTING MARK AND METHOD OF EXPOSURE Jan 11, 2007 Abandoned
Array ( [id] => 5176091 [patent_doc_number] => 20070177149 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-02 [patent_title] => 'Instrumentation and method for optical measurement of samples' [patent_app_type] => utility [patent_app_number] => 11/644865 [patent_app_country] => US [patent_app_date] => 2006-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7019 [patent_no_of_claims] => 62 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0177/20070177149.pdf [firstpage_image] =>[orig_patent_app_number] => 11644865 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/644865
Instrumentation and method for optical measurement of samples Dec 25, 2006 Abandoned
Array ( [id] => 5039045 [patent_doc_number] => 20070091327 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-26 [patent_title] => 'Spectroscopic Scatterometer System' [patent_app_type] => utility [patent_app_number] => 11/614315 [patent_app_country] => US [patent_app_date] => 2006-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6560 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0091/20070091327.pdf [firstpage_image] =>[orig_patent_app_number] => 11614315 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/614315
Spectroscopic scatterometer system Dec 20, 2006 Issued
Array ( [id] => 6625481 [patent_doc_number] => 20100225928 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-09 [patent_title] => 'DEVICE FOR MEASURING STRUCTURES OF AN OBJECT' [patent_app_type] => utility [patent_app_number] => 12/161491 [patent_app_country] => US [patent_app_date] => 2006-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2397 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0225/20100225928.pdf [firstpage_image] =>[orig_patent_app_number] => 12161491 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/161491
DEVICE FOR MEASURING STRUCTURES OF AN OBJECT Dec 19, 2006 Abandoned
Array ( [id] => 4986960 [patent_doc_number] => 20070153298 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-05 [patent_title] => 'Method and apparatus for measuring interfacial positions, method and apparatus for measuring layer thickness, and method and apparatus for manufacturing optical discs' [patent_app_type] => utility [patent_app_number] => 11/640907 [patent_app_country] => US [patent_app_date] => 2006-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 20442 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0153/20070153298.pdf [firstpage_image] =>[orig_patent_app_number] => 11640907 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/640907
Method and apparatus for measuring interfacial positions, method and apparatus for measuring layer thickness, and method and apparatus for manufacturing optical discs Dec 18, 2006 Issued
Array ( [id] => 5347357 [patent_doc_number] => 20090002718 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-01 [patent_title] => 'Optical Measurement Device' [patent_app_type] => utility [patent_app_number] => 12/158497 [patent_app_country] => US [patent_app_date] => 2006-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5960 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0002/20090002718.pdf [firstpage_image] =>[orig_patent_app_number] => 12158497 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/158497
Optical measurement device with reduced contact area Dec 17, 2006 Issued
Array ( [id] => 916275 [patent_doc_number] => 07327475 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-02-05 [patent_title] => 'Measuring a process parameter of a semiconductor fabrication process using optical metrology' [patent_app_type] => utility [patent_app_number] => 11/639515 [patent_app_country] => US [patent_app_date] => 2006-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3661 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/327/07327475.pdf [firstpage_image] =>[orig_patent_app_number] => 11639515 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/639515
Measuring a process parameter of a semiconductor fabrication process using optical metrology Dec 14, 2006 Issued
Array ( [id] => 4674458 [patent_doc_number] => 20080212086 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-04 [patent_title] => 'Packaging Material Inspection Machine' [patent_app_type] => utility [patent_app_number] => 11/566994 [patent_app_country] => US [patent_app_date] => 2006-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 1769 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20080212086.pdf [firstpage_image] =>[orig_patent_app_number] => 11566994 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/566994
Packaging Material Inspection Machine Dec 4, 2006 Abandoned
Array ( [id] => 5020752 [patent_doc_number] => 20070146718 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-28 [patent_title] => 'OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS USED FOR THE SAME' [patent_app_type] => utility [patent_app_number] => 11/565897 [patent_app_country] => US [patent_app_date] => 2006-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4440 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20070146718.pdf [firstpage_image] =>[orig_patent_app_number] => 11565897 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/565897
OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS USED FOR THE SAME Nov 30, 2006 Abandoned
Array ( [id] => 4825202 [patent_doc_number] => 20080124453 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-29 [patent_title] => 'IN-SITU DETECTION OF GAS-PHASE PARTICLE FORMATION IN NITRIDE FILM DEPOSITION' [patent_app_type] => utility [patent_app_number] => 11/564187 [patent_app_country] => US [patent_app_date] => 2006-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7308 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0124/20080124453.pdf [firstpage_image] =>[orig_patent_app_number] => 11564187 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/564187
IN-SITU DETECTION OF GAS-PHASE PARTICLE FORMATION IN NITRIDE FILM DEPOSITION Nov 27, 2006 Abandoned
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