Search

Rei Tsang Shiao

Examiner (ID: 5077, Phone: (571)272-0707 , Office: P/1628 )

Most Active Art Unit
1628
Art Unit(s)
1629, 1626, 1628
Total Applications
2870
Issued Applications
2055
Pending Applications
163
Abandoned Applications
652

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1589328 [patent_doc_number] => 06490804 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-10 [patent_title] => 'Comparison gauge for automotive starters' [patent_app_type] => B1 [patent_app_number] => 09/580925 [patent_app_country] => US [patent_app_date] => 2000-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 1337 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/490/06490804.pdf [firstpage_image] =>[orig_patent_app_number] => 09580925 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/580925
Comparison gauge for automotive starters May 25, 2000 Issued
Array ( [id] => 4287837 [patent_doc_number] => 06250801 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-26 [patent_title] => 'Probed for measuring physical parameters of a fluid flow' [patent_app_type] => 1 [patent_app_number] => 9/555178 [patent_app_country] => US [patent_app_date] => 2000-05-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 8 [patent_no_of_words] => 2923 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/250/06250801.pdf [firstpage_image] =>[orig_patent_app_number] => 555178 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/555178
Probed for measuring physical parameters of a fluid flow May 23, 2000 Issued
Array ( [id] => 1221197 [patent_doc_number] => 06698920 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-03-02 [patent_title] => 'Temperature measuring system and optical switch used therein' [patent_app_type] => B1 [patent_app_number] => 09/566942 [patent_app_country] => US [patent_app_date] => 2000-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3338 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/698/06698920.pdf [firstpage_image] =>[orig_patent_app_number] => 09566942 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/566942
Temperature measuring system and optical switch used therein May 7, 2000 Issued
Array ( [id] => 7966589 [patent_doc_number] => 06679627 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-01-20 [patent_title] => 'Self-floating device for measuring the temperature of liquids' [patent_app_type] => B1 [patent_app_number] => 09/529426 [patent_app_country] => US [patent_app_date] => 2000-05-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5406 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/679/06679627.pdf [firstpage_image] =>[orig_patent_app_number] => 09529426 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/529426
Self-floating device for measuring the temperature of liquids May 2, 2000 Issued
Array ( [id] => 1455376 [patent_doc_number] => 06390671 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-21 [patent_title] => 'Probe cover with film insert' [patent_app_type] => B1 [patent_app_number] => 09/562238 [patent_app_country] => US [patent_app_date] => 2000-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2384 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/390/06390671.pdf [firstpage_image] =>[orig_patent_app_number] => 09562238 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/562238
Probe cover with film insert Apr 27, 2000 Issued
Array ( [id] => 1529082 [patent_doc_number] => 06409380 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-25 [patent_title] => 'Dew formation prediction method and apparatus, environment air temperature estimating method and apparatus and recording and/or reproducing apparatus' [patent_app_type] => B1 [patent_app_number] => 09/558737 [patent_app_country] => US [patent_app_date] => 2000-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3571 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/409/06409380.pdf [firstpage_image] =>[orig_patent_app_number] => 09558737 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/558737
Dew formation prediction method and apparatus, environment air temperature estimating method and apparatus and recording and/or reproducing apparatus Apr 25, 2000 Issued
Array ( [id] => 1474625 [patent_doc_number] => 06450683 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-17 [patent_title] => 'Optical temperature measurement as an in situ monitor of etch rate' [patent_app_type] => B1 [patent_app_number] => 09/557125 [patent_app_country] => US [patent_app_date] => 2000-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 2982 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/450/06450683.pdf [firstpage_image] =>[orig_patent_app_number] => 09557125 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/557125
Optical temperature measurement as an in situ monitor of etch rate Apr 24, 2000 Issued
Array ( [id] => 1524754 [patent_doc_number] => 06353210 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-05 [patent_title] => 'Correction of wafer temperature drift in a plasma reactor based upon continuous wafer temperature measurements using and in-situ wafer temperature optical probe' [patent_app_type] => B1 [patent_app_number] => 09/547359 [patent_app_country] => US [patent_app_date] => 2000-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 4414 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/353/06353210.pdf [firstpage_image] =>[orig_patent_app_number] => 09547359 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/547359
Correction of wafer temperature drift in a plasma reactor based upon continuous wafer temperature measurements using and in-situ wafer temperature optical probe Apr 10, 2000 Issued
Array ( [id] => 1577854 [patent_doc_number] => 06422743 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-23 [patent_title] => 'Method for determining heat transfer performance of an internally cooled structure' [patent_app_type] => B1 [patent_app_number] => 09/535468 [patent_app_country] => US [patent_app_date] => 2000-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 3884 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/422/06422743.pdf [firstpage_image] =>[orig_patent_app_number] => 09535468 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/535468
Method for determining heat transfer performance of an internally cooled structure Mar 25, 2000 Issued
Array ( [id] => 946188 [patent_doc_number] => 06964518 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-11-15 [patent_title] => 'Device and system for monitoring internal temperature of inaccessible or moving parts' [patent_app_type] => utility [patent_app_number] => 09/937304 [patent_app_country] => US [patent_app_date] => 2000-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3712 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/964/06964518.pdf [firstpage_image] =>[orig_patent_app_number] => 09937304 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/937304
Device and system for monitoring internal temperature of inaccessible or moving parts Mar 22, 2000 Issued
09/533949 Heat flux differential scanning calorimeter sensor Mar 22, 2000 Abandoned
Array ( [id] => 6273400 [patent_doc_number] => 20020106000 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-08-08 [patent_title] => 'VIRTUAL BLACKBODY RADIATION SYSTEM AND RADIATION TEMPERATURE MEASURING SYSTEM' [patent_app_type] => new [patent_app_number] => 09/527239 [patent_app_country] => US [patent_app_date] => 2000-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3456 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0106/20020106000.pdf [firstpage_image] =>[orig_patent_app_number] => 09527239 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/527239
Virtual blackbody radiation system and radiation temperature measuring system Mar 15, 2000 Issued
Array ( [id] => 1290023 [patent_doc_number] => 06622392 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-23 [patent_title] => 'Target with diffractive elements for use with laser beam generating devices' [patent_app_type] => B1 [patent_app_number] => 09/527372 [patent_app_country] => US [patent_app_date] => 2000-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 16 [patent_no_of_words] => 4875 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/622/06622392.pdf [firstpage_image] =>[orig_patent_app_number] => 09527372 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/527372
Target with diffractive elements for use with laser beam generating devices Mar 15, 2000 Issued
Array ( [id] => 1072956 [patent_doc_number] => 06837618 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-01-04 [patent_title] => 'Electronic thermometer' [patent_app_type] => utility [patent_app_number] => 09/700449 [patent_app_country] => US [patent_app_date] => 2000-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 25 [patent_no_of_words] => 8914 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/837/06837618.pdf [firstpage_image] =>[orig_patent_app_number] => 09700449 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/700449
Electronic thermometer Mar 9, 2000 Issued
Array ( [id] => 1467385 [patent_doc_number] => 06406181 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-18 [patent_title] => 'Temperature sensor' [patent_app_type] => B1 [patent_app_number] => 09/522539 [patent_app_country] => US [patent_app_date] => 2000-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 1242 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/406/06406181.pdf [firstpage_image] =>[orig_patent_app_number] => 09522539 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/522539
Temperature sensor Mar 9, 2000 Issued
Array ( [id] => 1484965 [patent_doc_number] => 06428202 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-06 [patent_title] => 'Method for inspecting connection state of electronic part and a substrate, and apparatus for the same' [patent_app_type] => B1 [patent_app_number] => 09/523000 [patent_app_country] => US [patent_app_date] => 2000-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6513 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/428/06428202.pdf [firstpage_image] =>[orig_patent_app_number] => 09523000 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/523000
Method for inspecting connection state of electronic part and a substrate, and apparatus for the same Mar 8, 2000 Issued
Array ( [id] => 1531832 [patent_doc_number] => 06488405 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-03 [patent_title] => 'Flip chip defect analysis using liquid crystal' [patent_app_type] => B1 [patent_app_number] => 09/520597 [patent_app_country] => US [patent_app_date] => 2000-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 7195 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/488/06488405.pdf [firstpage_image] =>[orig_patent_app_number] => 09520597 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/520597
Flip chip defect analysis using liquid crystal Mar 7, 2000 Issued
Array ( [id] => 4396881 [patent_doc_number] => 06299346 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-09 [patent_title] => 'Active pyrometry with emissivity extrapolation and compensation' [patent_app_type] => 1 [patent_app_number] => 9/521113 [patent_app_country] => US [patent_app_date] => 2000-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 10413 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/299/06299346.pdf [firstpage_image] =>[orig_patent_app_number] => 521113 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/521113
Active pyrometry with emissivity extrapolation and compensation Mar 6, 2000 Issued
Array ( [id] => 758575 [patent_doc_number] => 07011445 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-03-14 [patent_title] => 'Maximum/minimum thermometer' [patent_app_type] => utility [patent_app_number] => 09/936387 [patent_app_country] => US [patent_app_date] => 2000-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4960 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/011/07011445.pdf [firstpage_image] =>[orig_patent_app_number] => 09936387 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/936387
Maximum/minimum thermometer Mar 6, 2000 Issued
Array ( [id] => 1585331 [patent_doc_number] => 06481886 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-11-19 [patent_title] => 'Apparatus for measuring pedestal and substrate temperature in a semiconductor wafer processing system' [patent_app_type] => B1 [patent_app_number] => 09/513726 [patent_app_country] => US [patent_app_date] => 2000-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2921 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/481/06481886.pdf [firstpage_image] =>[orig_patent_app_number] => 09513726 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/513726
Apparatus for measuring pedestal and substrate temperature in a semiconductor wafer processing system Feb 23, 2000 Issued
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