Rei Tsang Shiao
Examiner (ID: 5077, Phone: (571)272-0707 , Office: P/1628 )
Most Active Art Unit | 1628 |
Art Unit(s) | 1629, 1626, 1628 |
Total Applications | 2870 |
Issued Applications | 2055 |
Pending Applications | 163 |
Abandoned Applications | 652 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 1589328
[patent_doc_number] => 06490804
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-12-10
[patent_title] => 'Comparison gauge for automotive starters'
[patent_app_type] => B1
[patent_app_number] => 09/580925
[patent_app_country] => US
[patent_app_date] => 2000-05-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 11
[patent_no_of_words] => 1337
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 116
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/490/06490804.pdf
[firstpage_image] =>[orig_patent_app_number] => 09580925
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/580925 | Comparison gauge for automotive starters | May 25, 2000 | Issued |
Array
(
[id] => 4287837
[patent_doc_number] => 06250801
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-06-26
[patent_title] => 'Probed for measuring physical parameters of a fluid flow'
[patent_app_type] => 1
[patent_app_number] => 9/555178
[patent_app_country] => US
[patent_app_date] => 2000-05-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 8
[patent_no_of_words] => 2923
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 73
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/250/06250801.pdf
[firstpage_image] =>[orig_patent_app_number] => 555178
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/555178 | Probed for measuring physical parameters of a fluid flow | May 23, 2000 | Issued |
Array
(
[id] => 1221197
[patent_doc_number] => 06698920
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-03-02
[patent_title] => 'Temperature measuring system and optical switch used therein'
[patent_app_type] => B1
[patent_app_number] => 09/566942
[patent_app_country] => US
[patent_app_date] => 2000-05-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 3338
[patent_no_of_claims] => 35
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 71
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/698/06698920.pdf
[firstpage_image] =>[orig_patent_app_number] => 09566942
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/566942 | Temperature measuring system and optical switch used therein | May 7, 2000 | Issued |
Array
(
[id] => 7966589
[patent_doc_number] => 06679627
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-01-20
[patent_title] => 'Self-floating device for measuring the temperature of liquids'
[patent_app_type] => B1
[patent_app_number] => 09/529426
[patent_app_country] => US
[patent_app_date] => 2000-05-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5406
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/679/06679627.pdf
[firstpage_image] =>[orig_patent_app_number] => 09529426
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/529426 | Self-floating device for measuring the temperature of liquids | May 2, 2000 | Issued |
Array
(
[id] => 1455376
[patent_doc_number] => 06390671
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-05-21
[patent_title] => 'Probe cover with film insert'
[patent_app_type] => B1
[patent_app_number] => 09/562238
[patent_app_country] => US
[patent_app_date] => 2000-04-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 2384
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 93
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/390/06390671.pdf
[firstpage_image] =>[orig_patent_app_number] => 09562238
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/562238 | Probe cover with film insert | Apr 27, 2000 | Issued |
Array
(
[id] => 1529082
[patent_doc_number] => 06409380
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-06-25
[patent_title] => 'Dew formation prediction method and apparatus, environment air temperature estimating method and apparatus and recording and/or reproducing apparatus'
[patent_app_type] => B1
[patent_app_number] => 09/558737
[patent_app_country] => US
[patent_app_date] => 2000-04-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3571
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/409/06409380.pdf
[firstpage_image] =>[orig_patent_app_number] => 09558737
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/558737 | Dew formation prediction method and apparatus, environment air temperature estimating method and apparatus and recording and/or reproducing apparatus | Apr 25, 2000 | Issued |
Array
(
[id] => 1474625
[patent_doc_number] => 06450683
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-09-17
[patent_title] => 'Optical temperature measurement as an in situ monitor of etch rate'
[patent_app_type] => B1
[patent_app_number] => 09/557125
[patent_app_country] => US
[patent_app_date] => 2000-04-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 2982
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 76
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/450/06450683.pdf
[firstpage_image] =>[orig_patent_app_number] => 09557125
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/557125 | Optical temperature measurement as an in situ monitor of etch rate | Apr 24, 2000 | Issued |
Array
(
[id] => 1524754
[patent_doc_number] => 06353210
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-03-05
[patent_title] => 'Correction of wafer temperature drift in a plasma reactor based upon continuous wafer temperature measurements using and in-situ wafer temperature optical probe'
[patent_app_type] => B1
[patent_app_number] => 09/547359
[patent_app_country] => US
[patent_app_date] => 2000-04-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 9
[patent_no_of_words] => 4414
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 118
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/353/06353210.pdf
[firstpage_image] =>[orig_patent_app_number] => 09547359
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/547359 | Correction of wafer temperature drift in a plasma reactor based upon continuous wafer temperature measurements using and in-situ wafer temperature optical probe | Apr 10, 2000 | Issued |
Array
(
[id] => 1577854
[patent_doc_number] => 06422743
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-07-23
[patent_title] => 'Method for determining heat transfer performance of an internally cooled structure'
[patent_app_type] => B1
[patent_app_number] => 09/535468
[patent_app_country] => US
[patent_app_date] => 2000-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 10
[patent_no_of_words] => 3884
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 110
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/422/06422743.pdf
[firstpage_image] =>[orig_patent_app_number] => 09535468
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/535468 | Method for determining heat transfer performance of an internally cooled structure | Mar 25, 2000 | Issued |
Array
(
[id] => 946188
[patent_doc_number] => 06964518
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-11-15
[patent_title] => 'Device and system for monitoring internal temperature of inaccessible or moving parts'
[patent_app_type] => utility
[patent_app_number] => 09/937304
[patent_app_country] => US
[patent_app_date] => 2000-03-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3712
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 159
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/964/06964518.pdf
[firstpage_image] =>[orig_patent_app_number] => 09937304
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/937304 | Device and system for monitoring internal temperature of inaccessible or moving parts | Mar 22, 2000 | Issued |
09/533949 | Heat flux differential scanning calorimeter sensor | Mar 22, 2000 | Abandoned |
Array
(
[id] => 6273400
[patent_doc_number] => 20020106000
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-08-08
[patent_title] => 'VIRTUAL BLACKBODY RADIATION SYSTEM AND RADIATION TEMPERATURE MEASURING SYSTEM'
[patent_app_type] => new
[patent_app_number] => 09/527239
[patent_app_country] => US
[patent_app_date] => 2000-03-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3456
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 85
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0106/20020106000.pdf
[firstpage_image] =>[orig_patent_app_number] => 09527239
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/527239 | Virtual blackbody radiation system and radiation temperature measuring system | Mar 15, 2000 | Issued |
Array
(
[id] => 1290023
[patent_doc_number] => 06622392
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-09-23
[patent_title] => 'Target with diffractive elements for use with laser beam generating devices'
[patent_app_type] => B1
[patent_app_number] => 09/527372
[patent_app_country] => US
[patent_app_date] => 2000-03-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 16
[patent_no_of_words] => 4875
[patent_no_of_claims] => 39
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 117
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/622/06622392.pdf
[firstpage_image] =>[orig_patent_app_number] => 09527372
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/527372 | Target with diffractive elements for use with laser beam generating devices | Mar 15, 2000 | Issued |
Array
(
[id] => 1072956
[patent_doc_number] => 06837618
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-01-04
[patent_title] => 'Electronic thermometer'
[patent_app_type] => utility
[patent_app_number] => 09/700449
[patent_app_country] => US
[patent_app_date] => 2000-03-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 25
[patent_no_of_words] => 8914
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 163
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/837/06837618.pdf
[firstpage_image] =>[orig_patent_app_number] => 09700449
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/700449 | Electronic thermometer | Mar 9, 2000 | Issued |
Array
(
[id] => 1467385
[patent_doc_number] => 06406181
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-06-18
[patent_title] => 'Temperature sensor'
[patent_app_type] => B1
[patent_app_number] => 09/522539
[patent_app_country] => US
[patent_app_date] => 2000-03-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 3
[patent_no_of_words] => 1242
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 45
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/406/06406181.pdf
[firstpage_image] =>[orig_patent_app_number] => 09522539
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/522539 | Temperature sensor | Mar 9, 2000 | Issued |
Array
(
[id] => 1484965
[patent_doc_number] => 06428202
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-08-06
[patent_title] => 'Method for inspecting connection state of electronic part and a substrate, and apparatus for the same'
[patent_app_type] => B1
[patent_app_number] => 09/523000
[patent_app_country] => US
[patent_app_date] => 2000-03-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 6513
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 120
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/428/06428202.pdf
[firstpage_image] =>[orig_patent_app_number] => 09523000
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/523000 | Method for inspecting connection state of electronic part and a substrate, and apparatus for the same | Mar 8, 2000 | Issued |
Array
(
[id] => 1531832
[patent_doc_number] => 06488405
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-12-03
[patent_title] => 'Flip chip defect analysis using liquid crystal'
[patent_app_type] => B1
[patent_app_number] => 09/520597
[patent_app_country] => US
[patent_app_date] => 2000-03-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 11
[patent_no_of_words] => 7195
[patent_no_of_claims] => 36
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 66
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/488/06488405.pdf
[firstpage_image] =>[orig_patent_app_number] => 09520597
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/520597 | Flip chip defect analysis using liquid crystal | Mar 7, 2000 | Issued |
Array
(
[id] => 4396881
[patent_doc_number] => 06299346
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-10-09
[patent_title] => 'Active pyrometry with emissivity extrapolation and compensation'
[patent_app_type] => 1
[patent_app_number] => 9/521113
[patent_app_country] => US
[patent_app_date] => 2000-03-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 10413
[patent_no_of_claims] => 35
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/299/06299346.pdf
[firstpage_image] =>[orig_patent_app_number] => 521113
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/521113 | Active pyrometry with emissivity extrapolation and compensation | Mar 6, 2000 | Issued |
Array
(
[id] => 758575
[patent_doc_number] => 07011445
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-03-14
[patent_title] => 'Maximum/minimum thermometer'
[patent_app_type] => utility
[patent_app_number] => 09/936387
[patent_app_country] => US
[patent_app_date] => 2000-03-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 4960
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 163
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/011/07011445.pdf
[firstpage_image] =>[orig_patent_app_number] => 09936387
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/936387 | Maximum/minimum thermometer | Mar 6, 2000 | Issued |
Array
(
[id] => 1585331
[patent_doc_number] => 06481886
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-11-19
[patent_title] => 'Apparatus for measuring pedestal and substrate temperature in a semiconductor wafer processing system'
[patent_app_type] => B1
[patent_app_number] => 09/513726
[patent_app_country] => US
[patent_app_date] => 2000-02-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 2921
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 61
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/481/06481886.pdf
[firstpage_image] =>[orig_patent_app_number] => 09513726
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/513726 | Apparatus for measuring pedestal and substrate temperature in a semiconductor wafer processing system | Feb 23, 2000 | Issued |