Richard Isla

Array ( [id] => 8286334 [patent_doc_number] => 20120174656 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-07-12 [patent_title] => 'Zinc Oxide Sulfur Sensor Measurement System' [patent_app_type] => utility [patent_app_number] => 13/354821 [patent_app_country] => US [patent_app_date] => 2012-01-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5533 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13354821 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8287741 [patent_doc_number] => 20120176077 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-07-12 [patent_title] => 'SOLAR CELL MODULE HAVING WHITE BACK SHEET' [patent_app_type] => utility [patent_app_number] => 13/343416 [patent_app_country] => US [patent_app_date] => 2012-01-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2595 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13343416 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9609116 [patent_doc_number] => 08786290 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-07-22 [patent_title] => 'Corona effluent sensing device' [patent_app_type] => utility [patent_app_number] => 13/314880 [patent_app_country] => US [patent_app_date] => 2011-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3699 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13314880 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9312623 [patent_doc_number] => 08653845 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-02-18 [patent_title] => 'Test handler and method for operating the same for testing semiconductor devices' [patent_app_type] => utility [patent_app_number] => 13/296421 [patent_app_country] => US [patent_app_date] => 2011-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5353 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 291 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13296421 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 10864852 [patent_doc_number] => 08890560 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-11-18 [patent_title] => 'Crack sensors for semiconductor devices' [patent_app_type] => utility [patent_app_number] => 13/291185 [patent_app_country] => US [patent_app_date] => 2011-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 14 [patent_no_of_words] => 7821 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13291185 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7815644 [patent_doc_number] => 20120062264 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-03-15 [patent_title] => 'TEST DEVICE' [patent_app_type] => utility [patent_app_number] => 13/291053 [patent_app_country] => US [patent_app_date] => 2011-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3357 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0062/20120062264.pdf [firstpage_image] =>[orig_patent_app_number] => 13291053 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9402483 [patent_doc_number] => 08692541 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-04-08 [patent_title] => 'Position sensing head with redundancy' [patent_app_type] => utility [patent_app_number] => 13/253192 [patent_app_country] => US [patent_app_date] => 2011-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 4046 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13253192 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8742968 [patent_doc_number] => 20130082685 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-04-04 [patent_title] => 'FAST AC VOLTAGE DETECTOR' [patent_app_type] => utility [patent_app_number] => 13/248583 [patent_app_country] => US [patent_app_date] => 2011-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1753 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13248583 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8602710 [patent_doc_number] => 20130008022 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-01-10 [patent_title] => 'ELECTRICAL CURRENT SENSOR DEVICE' [patent_app_type] => utility [patent_app_number] => 13/245955 [patent_app_country] => US [patent_app_date] => 2011-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4083 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13245955 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8681493 [patent_doc_number] => 20130049777 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-02-28 [patent_title] => 'DEVICE IDENTIFICATION AND TEMPERATURE SENSOR CIRCUIT' [patent_app_type] => utility [patent_app_number] => 13/238010 [patent_app_country] => US [patent_app_date] => 2011-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6171 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13238010 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8345240 [patent_doc_number] => 20120206157 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-08-16 [patent_title] => 'Structure of burn-in oven' [patent_app_type] => utility [patent_app_number] => 13/137802 [patent_app_country] => US [patent_app_date] => 2011-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2420 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13137802 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 10893488 [patent_doc_number] => 08917104 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-12-23 [patent_title] => 'Analyzing EM performance during IC manufacturing' [patent_app_type] => utility [patent_app_number] => 13/222306 [patent_app_country] => US [patent_app_date] => 2011-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2644 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13222306 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9027306 [patent_doc_number] => 08536891 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-09-17 [patent_title] => 'Inspection method for inspecting electric characteristics of devices formed on target object' [patent_app_type] => utility [patent_app_number] => 13/218914 [patent_app_country] => US [patent_app_date] => 2011-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 5386 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 211 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13218914 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 10899009 [patent_doc_number] => 08922232 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-12-30 [patent_title] => 'Test-use individual substrate, probe, and semiconductor wafer testing apparatus' [patent_app_type] => utility [patent_app_number] => 13/212585 [patent_app_country] => US [patent_app_date] => 2011-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 6247 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13212585 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7773728 [patent_doc_number] => 20120038380 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-02-16 [patent_title] => 'ELECTRICAL TESTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/210750 [patent_app_country] => US [patent_app_date] => 2011-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2129 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0038/20120038380.pdf [firstpage_image] =>[orig_patent_app_number] => 13210750 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8881391 [patent_doc_number] => 20130154575 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-06-20 [patent_title] => 'CHARGING DEVICE' [patent_app_type] => utility [patent_app_number] => 13/819686 [patent_app_country] => US [patent_app_date] => 2011-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5909 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13819686 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9324284 [patent_doc_number] => 08659311 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-02-25 [patent_title] => 'Test apparatus and test method' [patent_app_type] => utility [patent_app_number] => 13/205646 [patent_app_country] => US [patent_app_date] => 2011-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 18 [patent_no_of_words] => 9391 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 279 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13205646 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9000782 [patent_doc_number] => 20130221906 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-08-29 [patent_title] => 'Lithium Polymer Battery Charger and Methods Therefor' [patent_app_type] => utility [patent_app_number] => 13/814720 [patent_app_country] => US [patent_app_date] => 2011-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3886 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13814720 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7559372 [patent_doc_number] => 20110273204 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-11-10 [patent_title] => 'PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 13/185895 [patent_app_country] => US [patent_app_date] => 2011-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7026 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0273/20110273204.pdf [firstpage_image] =>[orig_patent_app_number] => 13185895 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9609128 [patent_doc_number] => 08786302 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-07-22 [patent_title] => 'Test circuit for use in a semiconductor apparatus' [patent_app_type] => utility [patent_app_number] => 13/159178 [patent_app_country] => US [patent_app_date] => 2011-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 4793 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13159178 [rel_patent_id] =>[rel_patent_doc_number] =>)