
Richard Sukyoon Woo
Examiner (ID: 19431)
| Most Active Art Unit | 3745 |
| Art Unit(s) | 3745, 3629, 3639 |
| Total Applications | 372 |
| Issued Applications | 301 |
| Pending Applications | 50 |
| Abandoned Applications | 21 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
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[patent_doc_number] => 08581285
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[patent_kind] => B2
[patent_issue_date] => 2013-11-12
[patent_title] => 'Semiconductor light-emitting element for flip-chip mounting'
[patent_app_type] => utility
[patent_app_number] => 13/117555
[patent_app_country] => US
[patent_app_date] => 2011-05-27
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13117555
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Array
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[patent_issue_date] => 2014-11-11
[patent_title] => 'Memory semiconductor device having aligned side surfaces'
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Array
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[patent_title] => 'MICROELECTRONIC MEMORY DEVICES HAVING FLAT STOPPER LAYERS AND METHODS OF FABRICATING THE SAME'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/117743 | Methods of fabricating microelectronic memory devices having flat stopper layers | May 26, 2011 | Issued |
Array
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[patent_issue_date] => 2011-12-01
[patent_title] => 'SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME'
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[patent_app_number] => 13/117575
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[patent_title] => 'STRUCTURE DESIGNS AND METHODS FOR INTEGRATED CIRCUIT ALIGNMENT'
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Array
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[patent_title] => 'Light emitting device package including a current regulator and different inclination angles'
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Array
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Array
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[patent_issue_date] => 2013-01-10
[patent_title] => 'LIGHT-EMITTING DEVICE WITH HETEROPHASE BOUNDARIES'
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[patent_app_number] => 13/635136
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/635136 | Light-emitting device with heterophase boundaries | Mar 14, 2011 | Issued |
Array
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[id] => 8649188
[patent_doc_number] => 20130034918
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[patent_issue_date] => 2013-02-07
[patent_title] => 'MONITORING APPARATUS AND METHOD FOR IN-SITU MEASUREMENT OF WAFER THICKNESSES FOR MONITORING THE THINNING OF SEMICONDUCTOR WAFERS AND THINNING APPARATUS COMPRISING A WET ETCHING APPARATUS AND A MONITORING APPARATUS'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/521736 | Monitoring apparatus and method for in-situ measurement of wafer thicknesses for monitoring the thinning of semiconductor wafers and thinning apparatus comprising a wet etching apparatus and a monitoring apparatus | Jan 9, 2011 | Issued |
Array
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[id] => 5980089
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[patent_title] => 'SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING SAME'
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Array
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[patent_title] => 'Lateral Power MOSFET With Integrated Schottky Diode'
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Array
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Array
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Array
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Array
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Array
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