Richard V. Fisher

Array ( [id] => 5321226 [patent_doc_number] => 20090059216 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-05 [patent_title] => 'DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/136799 [patent_app_country] => US [patent_app_date] => 2008-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7117 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0059/20090059216.pdf [firstpage_image] =>[orig_patent_app_number] => 12136799 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4615084 [patent_doc_number] => 07990531 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-08-02 [patent_title] => 'Multi-imaging automated inspection methods and systems for wet ophthalmic lenses' [patent_app_type] => utility [patent_app_number] => 12/133596 [patent_app_country] => US [patent_app_date] => 2008-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 15 [patent_no_of_words] => 13093 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 431 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/990/07990531.pdf [firstpage_image] =>[orig_patent_app_number] => 12133596 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4447158 [patent_doc_number] => 07864323 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-04 [patent_title] => 'Method for measuring the concentration of a gas component in a measuring gas' [patent_app_type] => utility [patent_app_number] => 12/156596 [patent_app_country] => US [patent_app_date] => 2008-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2771 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/864/07864323.pdf [firstpage_image] =>[orig_patent_app_number] => 12156596 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4709260 [patent_doc_number] => 20080297786 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-04 [patent_title] => 'INSPECTING DEVICE AND INSPECTING METHOD' [patent_app_type] => utility [patent_app_number] => 12/130597 [patent_app_country] => US [patent_app_date] => 2008-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8005 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0297/20080297786.pdf [firstpage_image] =>[orig_patent_app_number] => 12130597 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5264011 [patent_doc_number] => 20090116696 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-07 [patent_title] => 'SYSTEM, METHOD AND MACHINE-READABLE MEDIUM FOR CHARACTERIZING NANOTUBE MATERIALS' [patent_app_type] => utility [patent_app_number] => 12/126821 [patent_app_country] => US [patent_app_date] => 2008-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2701 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20090116696.pdf [firstpage_image] =>[orig_patent_app_number] => 12126821 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4818027 [patent_doc_number] => 20080225286 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-18 [patent_title] => 'Method And Apparatus For Detecting Defects' [patent_app_type] => utility [patent_app_number] => 12/124653 [patent_app_country] => US [patent_app_date] => 2008-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 13835 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0225/20080225286.pdf [firstpage_image] =>[orig_patent_app_number] => 12124653 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4790496 [patent_doc_number] => 20080291469 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-27 [patent_title] => 'Optoelectronic Device and Resilient Member Therefor' [patent_app_type] => utility [patent_app_number] => 12/121396 [patent_app_country] => US [patent_app_date] => 2008-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 6166 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0291/20080291469.pdf [firstpage_image] =>[orig_patent_app_number] => 12121396 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5484011 [patent_doc_number] => 20090273776 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-11-05 [patent_title] => 'DEVICE FOR MONITORING A TURRET IN A CRYOMAGNET' [patent_app_type] => utility [patent_app_number] => 12/113996 [patent_app_country] => US [patent_app_date] => 2008-05-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3996 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0273/20090273776.pdf [firstpage_image] =>[orig_patent_app_number] => 12113996 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4814711 [patent_doc_number] => 20080195342 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-14 [patent_title] => 'OPTICAL METROLOGY MODEL OPTIMIZATION FOR REPETITIVE STRUCTURES' [patent_app_type] => utility [patent_app_number] => 12/099735 [patent_app_country] => US [patent_app_date] => 2008-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7509 [patent_no_of_claims] => 49 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0195/20080195342.pdf [firstpage_image] =>[orig_patent_app_number] => 12099735 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4716769 [patent_doc_number] => 20080239291 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'Inspection apparatus and inspection method' [patent_app_type] => utility [patent_app_number] => 12/078096 [patent_app_country] => US [patent_app_date] => 2008-03-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5272 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0239/20080239291.pdf [firstpage_image] =>[orig_patent_app_number] => 12078096 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9087567 [patent_doc_number] => 08558999 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-15 [patent_title] => 'Defect inspection apparatus and method utilizing multiple inspection conditions' [patent_app_type] => utility [patent_app_number] => 12/078097 [patent_app_country] => US [patent_app_date] => 2008-03-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 8189 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12078097 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4738213 [patent_doc_number] => 20080231865 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-25 [patent_title] => ' DETERMINATION OF SURFACE PROPERTIES' [patent_app_type] => utility [patent_app_number] => 12/053497 [patent_app_country] => US [patent_app_date] => 2008-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5453 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0231/20080231865.pdf [firstpage_image] =>[orig_patent_app_number] => 12053497 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6561195 [patent_doc_number] => 20100045996 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-25 [patent_title] => 'SENSING APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/528491 [patent_app_country] => US [patent_app_date] => 2008-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7676 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20100045996.pdf [firstpage_image] =>[orig_patent_app_number] => 12528491 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4818036 [patent_doc_number] => 20080225295 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-18 [patent_title] => 'DEVICE FOR MULTIPLE TESTS FROM A SINGLE SAMPLE' [patent_app_type] => utility [patent_app_number] => 12/046792 [patent_app_country] => US [patent_app_date] => 2008-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5971 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0225/20080225295.pdf [firstpage_image] =>[orig_patent_app_number] => 12046792 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 133651 [patent_doc_number] => 07701567 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-20 [patent_title] => 'Optoelectronic distance sensor' [patent_app_type] => utility [patent_app_number] => 12/043800 [patent_app_country] => US [patent_app_date] => 2008-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 17 [patent_no_of_words] => 5736 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/701/07701567.pdf [firstpage_image] =>[orig_patent_app_number] => 12043800 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4696567 [patent_doc_number] => 20080218751 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-11 [patent_title] => 'Inspection device and inspection method of an object to be inspected' [patent_app_type] => utility [patent_app_number] => 12/073295 [patent_app_country] => US [patent_app_date] => 2008-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 13252 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0218/20080218751.pdf [firstpage_image] =>[orig_patent_app_number] => 12073295 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 133647 [patent_doc_number] => 07701563 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-20 [patent_title] => 'Apparatus for measuring decenter error of a lens' [patent_app_type] => utility [patent_app_number] => 12/038999 [patent_app_country] => US [patent_app_date] => 2008-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2133 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/701/07701563.pdf [firstpage_image] =>[orig_patent_app_number] => 12038999 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4674445 [patent_doc_number] => 20080212073 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-04 [patent_title] => 'POLYMERIC DEVICE SUITABLE FOR ULTRAVIOLET DETECTION' [patent_app_type] => utility [patent_app_number] => 12/032197 [patent_app_country] => US [patent_app_date] => 2008-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5136 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20080212073.pdf [firstpage_image] =>[orig_patent_app_number] => 12032197 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 319579 [patent_doc_number] => 07522294 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-04-21 [patent_title] => 'Measuring a process parameter of a semiconductor fabrication process using optical metrology' [patent_app_type] => utility [patent_app_number] => 12/026485 [patent_app_country] => US [patent_app_date] => 2008-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3693 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/522/07522294.pdf [firstpage_image] =>[orig_patent_app_number] => 12026485 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4783749 [patent_doc_number] => 20080137078 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-12 [patent_title] => 'MEASURING A DAMAGED STRUCTURE FORMED ON A WAFER USING OPTICAL METROLOGY' [patent_app_type] => utility [patent_app_number] => 12/021172 [patent_app_country] => US [patent_app_date] => 2008-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 26138 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0137/20080137078.pdf [firstpage_image] =>[orig_patent_app_number] => 12021172 [rel_patent_id] =>[rel_patent_doc_number] =>)