
Richard V. Fisher
Examiner (ID: 12363)
| Most Active Art Unit | 1303 |
| Art Unit(s) | 1306, 1303 |
| Total Applications | 365 |
| Issued Applications | 292 |
| Pending Applications | 2 |
| Abandoned Applications | 71 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4580778
[patent_doc_number] => 07830507
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-11-09
[patent_title] => 'Spatially patterned substrates for chemical and biological sensing'
[patent_app_type] => utility
[patent_app_number] => 11/352298
[patent_app_country] => US
[patent_app_date] => 2006-02-13
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[pdf_file] => patents/07/830/07830507.pdf
[firstpage_image] =>[orig_patent_app_number] => 11352298
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/352298 | Spatially patterned substrates for chemical and biological sensing | Feb 12, 2006 | Issued |
Array
(
[id] => 5537742
[patent_doc_number] => 20090219547
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-09-03
[patent_title] => 'Method and Device for Position Sensing in an Imaging System'
[patent_app_type] => utility
[patent_app_number] => 12/223497
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[patent_app_date] => 2006-02-06
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[firstpage_image] =>[orig_patent_app_number] => 12223497
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/223497 | Method and Device for Position Sensing in an Imaging System | Feb 5, 2006 | Abandoned |
Array
(
[id] => 5099693
[patent_doc_number] => 20070182953
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-09
[patent_title] => 'Inspection apparatus for conveyor system'
[patent_app_type] => utility
[patent_app_number] => 11/348492
[patent_app_country] => US
[patent_app_date] => 2006-02-06
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[patent_drawing_sheets_cnt] => 5
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[pdf_file] => publications/A1/0182/20070182953.pdf
[firstpage_image] =>[orig_patent_app_number] => 11348492
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/348492 | Inspection apparatus for conveyor system | Feb 5, 2006 | Abandoned |
Array
(
[id] => 5169920
[patent_doc_number] => 20070070351
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-03-29
[patent_title] => 'Optical measuring device and image forming apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/346150
[patent_app_country] => US
[patent_app_date] => 2006-02-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
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[patent_no_of_words] => 7169
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[firstpage_image] =>[orig_patent_app_number] => 11346150
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/346150 | Optical measuring device and image forming apparatus | Feb 2, 2006 | Abandoned |
Array
(
[id] => 5174226
[patent_doc_number] => 20070175283
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[patent_kind] => A1
[patent_issue_date] => 2007-08-02
[patent_title] => 'Systems and Methods for Remote Monitoring of Vibrations in Machines'
[patent_app_type] => utility
[patent_app_number] => 11/307334
[patent_app_country] => US
[patent_app_date] => 2006-02-01
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[patent_drawing_sheets_cnt] => 6
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[firstpage_image] =>[orig_patent_app_number] => 11307334
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/307334 | Systems and methods for remote monitoring of vibrations in machines | Jan 31, 2006 | Issued |
Array
(
[id] => 5176092
[patent_doc_number] => 20070177150
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[patent_kind] => A1
[patent_issue_date] => 2007-08-02
[patent_title] => 'Surface plasmon resonance biosensor using coupled surface plasmons to decrease width of reflectivity dip'
[patent_app_type] => utility
[patent_app_number] => 11/340541
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/340541 | Surface plasmon resonance biosensor using coupled surface plasmons to decrease width of reflectivity dip | Jan 26, 2006 | Abandoned |
Array
(
[id] => 5160968
[patent_doc_number] => 20070174012
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[patent_issue_date] => 2007-07-26
[patent_title] => 'Method Of Determining Photomask Inspection Capabilities'
[patent_app_type] => utility
[patent_app_number] => 11/275695
[patent_app_country] => US
[patent_app_date] => 2006-01-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 4815
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[pdf_file] => publications/A1/0174/20070174012.pdf
[firstpage_image] =>[orig_patent_app_number] => 11275695
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/275695 | Method Of Determining Photomask Inspection Capabilities | Jan 24, 2006 | Abandoned |
Array
(
[id] => 870425
[patent_doc_number] => 07365845
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-04-29
[patent_title] => 'Optical spectrum analyzer'
[patent_app_type] => utility
[patent_app_number] => 11/338276
[patent_app_country] => US
[patent_app_date] => 2006-01-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
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[pdf_file] => patents/07/365/07365845.pdf
[firstpage_image] =>[orig_patent_app_number] => 11338276
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/338276 | Optical spectrum analyzer | Jan 23, 2006 | Issued |
Array
(
[id] => 323485
[patent_doc_number] => 07518724
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-04-14
[patent_title] => 'Image acquisition, processing, and display'
[patent_app_type] => utility
[patent_app_number] => 11/321168
[patent_app_country] => US
[patent_app_date] => 2005-12-29
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[pdf_file] => patents/07/518/07518724.pdf
[firstpage_image] =>[orig_patent_app_number] => 11321168
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/321168 | Image acquisition, processing, and display | Dec 28, 2005 | Issued |
Array
(
[id] => 308242
[patent_doc_number] => 07532317
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-05-12
[patent_title] => 'Scatterometry method with characteristic signatures matching'
[patent_app_type] => utility
[patent_app_number] => 11/319677
[patent_app_country] => US
[patent_app_date] => 2005-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[pdf_file] => patents/07/532/07532317.pdf
[firstpage_image] =>[orig_patent_app_number] => 11319677
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/319677 | Scatterometry method with characteristic signatures matching | Dec 27, 2005 | Issued |
Array
(
[id] => 5020726
[patent_doc_number] => 20070146692
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-06-28
[patent_title] => 'Fiber optic specular surface flaw detection'
[patent_app_type] => utility
[patent_app_number] => 11/318306
[patent_app_country] => US
[patent_app_date] => 2005-12-23
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0146/20070146692.pdf
[firstpage_image] =>[orig_patent_app_number] => 11318306
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/318306 | Fiber optic specular surface flaw detection | Dec 22, 2005 | Abandoned |
Array
(
[id] => 5647053
[patent_doc_number] => 20060132785
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-06-22
[patent_title] => 'Apparatus and method for detecting moisture in a printing plate exposer'
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[firstpage_image] =>[orig_patent_app_number] => 11313127
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/313127 | Apparatus and method for detecting moisture in a printing plate exposer | Dec 19, 2005 | Issued |
Array
(
[id] => 212316
[patent_doc_number] => 07623227
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[patent_issue_date] => 2009-11-24
[patent_title] => 'System and method for inspecting a workpiece surface using polarization of scattered light'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/311907 | System and method for inspecting a workpiece surface using polarization of scattered light | Dec 16, 2005 | Issued |
Array
(
[id] => 5152843
[patent_doc_number] => 20070035725
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[patent_title] => 'Defect inspection apparatus, sensitivity calibration method for the same, substrate for defect detection sensitivity calibration, and manufacturing method thereof'
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Array
(
[id] => 1077800
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[patent_title] => 'Reflectometer and associated light source for use in a chemical analyzer'
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Array
(
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[patent_title] => 'Methods and apparatus for making images including depth information'
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Array
(
[id] => 590556
[patent_doc_number] => 07450251
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[patent_issue_date] => 2008-11-11
[patent_title] => 'Fanned laser beam metrology system'
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[patent_app_number] => 11/270000
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/270000 | Fanned laser beam metrology system | Nov 8, 2005 | Issued |
Array
(
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Array
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Array
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