Search

Richard V. Fisher

Examiner (ID: 12363)

Most Active Art Unit
1303
Art Unit(s)
1306, 1303
Total Applications
365
Issued Applications
292
Pending Applications
2
Abandoned Applications
71

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 923808 [patent_doc_number] => 07319528 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-01-15 [patent_title] => 'Surface texture measuring instrument' [patent_app_type] => utility [patent_app_number] => 11/263742 [patent_app_country] => US [patent_app_date] => 2005-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 6374 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/319/07319528.pdf [firstpage_image] =>[orig_patent_app_number] => 11263742 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/263742
Surface texture measuring instrument Oct 31, 2005 Issued
Array ( [id] => 830856 [patent_doc_number] => 07400414 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-07-15 [patent_title] => 'Hand-size structured-light three-dimensional metrology imaging system and method' [patent_app_type] => utility [patent_app_number] => 11/263600 [patent_app_country] => US [patent_app_date] => 2005-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 33 [patent_no_of_words] => 16243 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 350 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/400/07400414.pdf [firstpage_image] =>[orig_patent_app_number] => 11263600 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/263600
Hand-size structured-light three-dimensional metrology imaging system and method Oct 30, 2005 Issued
Array ( [id] => 5039039 [patent_doc_number] => 20070091321 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-26 [patent_title] => 'Methods and apparatus for inspecting an object' [patent_app_type] => utility [patent_app_number] => 11/257180 [patent_app_country] => US [patent_app_date] => 2005-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4093 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0091/20070091321.pdf [firstpage_image] =>[orig_patent_app_number] => 11257180 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/257180
Methods and apparatus for inspecting an object Oct 23, 2005 Issued
Array ( [id] => 905603 [patent_doc_number] => 07336374 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-02-26 [patent_title] => 'Methods and apparatus for generating a mask' [patent_app_type] => utility [patent_app_number] => 11/256885 [patent_app_country] => US [patent_app_date] => 2005-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3209 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/336/07336374.pdf [firstpage_image] =>[orig_patent_app_number] => 11256885 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/256885
Methods and apparatus for generating a mask Oct 23, 2005 Issued
Array ( [id] => 808164 [patent_doc_number] => 07420684 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-09-02 [patent_title] => 'Method and apparatus for measuring surface carrier recombination velocity and surface Fermi level' [patent_app_type] => utility [patent_app_number] => 11/256180 [patent_app_country] => US [patent_app_date] => 2005-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 23 [patent_no_of_words] => 9379 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/420/07420684.pdf [firstpage_image] =>[orig_patent_app_number] => 11256180 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/256180
Method and apparatus for measuring surface carrier recombination velocity and surface Fermi level Oct 23, 2005 Issued
Array ( [id] => 5090195 [patent_doc_number] => 20070229834 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-10-04 [patent_title] => 'System and method for high sensitivity optical detection of gases' [patent_app_type] => utility [patent_app_number] => 11/256377 [patent_app_country] => US [patent_app_date] => 2005-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9843 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0229/20070229834.pdf [firstpage_image] =>[orig_patent_app_number] => 11256377 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/256377
System and method for high sensitivity optical detection of gases Oct 20, 2005 Abandoned
Array ( [id] => 603265 [patent_doc_number] => 07433032 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-07 [patent_title] => 'Method and apparatus for inspecting defects in multiple regions with different parameters' [patent_app_type] => utility [patent_app_number] => 11/253028 [patent_app_country] => US [patent_app_date] => 2005-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 6631 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/433/07433032.pdf [firstpage_image] =>[orig_patent_app_number] => 11253028 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/253028
Method and apparatus for inspecting defects in multiple regions with different parameters Oct 16, 2005 Issued
Array ( [id] => 35722 [patent_doc_number] => 07787110 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-08-31 [patent_title] => 'Diffractive imaging system and method for the reading and analysis of skin topology' [patent_app_type] => utility [patent_app_number] => 11/251062 [patent_app_country] => US [patent_app_date] => 2005-10-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 10985 [patent_no_of_claims] => 45 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/787/07787110.pdf [firstpage_image] =>[orig_patent_app_number] => 11251062 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/251062
Diffractive imaging system and method for the reading and analysis of skin topology Oct 13, 2005 Issued
Array ( [id] => 894414 [patent_doc_number] => 07345773 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-18 [patent_title] => 'Movable-type flatness measurement apparatus' [patent_app_type] => utility [patent_app_number] => 11/247247 [patent_app_country] => US [patent_app_date] => 2005-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 4144 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/345/07345773.pdf [firstpage_image] =>[orig_patent_app_number] => 11247247 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/247247
Movable-type flatness measurement apparatus Oct 11, 2005 Issued
Array ( [id] => 854439 [patent_doc_number] => 07379194 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-05-27 [patent_title] => 'Method and system for determining mail piece dimensions using swept laser beam' [patent_app_type] => utility [patent_app_number] => 11/247718 [patent_app_country] => US [patent_app_date] => 2005-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 5000 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 247 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/379/07379194.pdf [firstpage_image] =>[orig_patent_app_number] => 11247718 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/247718
Method and system for determining mail piece dimensions using swept laser beam Oct 10, 2005 Issued
Array ( [id] => 5719333 [patent_doc_number] => 20060072106 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-06 [patent_title] => 'Image viewing method for microstructures and defect inspection system using it' [patent_app_type] => utility [patent_app_number] => 11/243188 [patent_app_country] => US [patent_app_date] => 2005-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5529 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20060072106.pdf [firstpage_image] =>[orig_patent_app_number] => 11243188 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/243188
Image viewing method for microstructures and defect inspection system using it Oct 4, 2005 Abandoned
Array ( [id] => 5746542 [patent_doc_number] => 20060109472 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-25 [patent_title] => 'Apparatus for assay in utilizing attenuated total reflection' [patent_app_type] => utility [patent_app_number] => 11/229562 [patent_app_country] => US [patent_app_date] => 2005-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7920 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20060109472.pdf [firstpage_image] =>[orig_patent_app_number] => 11229562 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/229562
Apparatus for assay in utilizing attenuated total reflection Sep 19, 2005 Abandoned
Array ( [id] => 4725224 [patent_doc_number] => 20080204765 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'Method for Contactless Dynamic Detection of the Profile of a Solid Body' [patent_app_type] => utility [patent_app_number] => 12/067400 [patent_app_country] => US [patent_app_date] => 2005-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5280 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0204/20080204765.pdf [firstpage_image] =>[orig_patent_app_number] => 12067400 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/067400
Method for Contactless Dynamic Detection of the Profile of a Solid Body Sep 18, 2005 Abandoned
Array ( [id] => 5691582 [patent_doc_number] => 20060151727 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-13 [patent_title] => 'System and method for detecting dropping amount of liquid crystal' [patent_app_type] => utility [patent_app_number] => 11/228952 [patent_app_country] => US [patent_app_date] => 2005-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3648 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0151/20060151727.pdf [firstpage_image] =>[orig_patent_app_number] => 11228952 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/228952
System and method for detecting dropping amount of liquid crystal Sep 15, 2005 Issued
Array ( [id] => 923812 [patent_doc_number] => 07319531 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-01-15 [patent_title] => 'Method for measuring a thickness of a coating' [patent_app_type] => utility [patent_app_number] => 11/227154 [patent_app_country] => US [patent_app_date] => 2005-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1557 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/319/07319531.pdf [firstpage_image] =>[orig_patent_app_number] => 11227154 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/227154
Method for measuring a thickness of a coating Sep 15, 2005 Issued
Array ( [id] => 5855800 [patent_doc_number] => 20060227309 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-10-12 [patent_title] => 'Lithographic apparatus and device manufacturing method' [patent_app_type] => utility [patent_app_number] => 11/224308 [patent_app_country] => US [patent_app_date] => 2005-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 8994 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0227/20060227309.pdf [firstpage_image] =>[orig_patent_app_number] => 11224308 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/224308
Lithographic apparatus and device manufacturing method Sep 12, 2005 Issued
Array ( [id] => 5196590 [patent_doc_number] => 20070295908 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'Method for Improving Optical Measurement of Gas Concentration' [patent_app_type] => utility [patent_app_number] => 11/662899 [patent_app_country] => US [patent_app_date] => 2005-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2211 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20070295908.pdf [firstpage_image] =>[orig_patent_app_number] => 11662899 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/662899
Method for measurement of gas concentration with modulated light at two absorption maxima Sep 6, 2005 Issued
Array ( [id] => 5617933 [patent_doc_number] => 20060187466 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-24 [patent_title] => 'Selecting unit cell configuration for repeating structures in optical metrology' [patent_app_type] => utility [patent_app_number] => 11/218884 [patent_app_country] => US [patent_app_date] => 2005-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 11507 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0187/20060187466.pdf [firstpage_image] =>[orig_patent_app_number] => 11218884 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/218884
Selecting unit cell configuration for repeating structures in optical metrology Sep 1, 2005 Abandoned
Array ( [id] => 5192673 [patent_doc_number] => 20070081155 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-12 [patent_title] => 'Lab in a cuvette' [patent_app_type] => utility [patent_app_number] => 11/214498 [patent_app_country] => US [patent_app_date] => 2005-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5199 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0081/20070081155.pdf [firstpage_image] =>[orig_patent_app_number] => 11214498 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/214498
Lab in a cuvette Aug 29, 2005 Issued
Array ( [id] => 5724058 [patent_doc_number] => 20060054818 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-16 [patent_title] => 'Scanning apparatus and scanning methods for inspecting a surface of a semiconductor wafer' [patent_app_type] => utility [patent_app_number] => 11/214319 [patent_app_country] => US [patent_app_date] => 2005-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2478 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20060054818.pdf [firstpage_image] =>[orig_patent_app_number] => 11214319 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/214319
Scanning apparatus and scanning methods for inspecting a surface of a semiconductor wafer Aug 28, 2005 Abandoned
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