Richemond Dorvil
Supervisory Patent Examiner (ID: 554, Phone: (571)272-7602 , Office: P/2658 )
Most Active Art Unit | 2741 |
Art Unit(s) | 2787, 2308, 2654, 2626, 2641, 2697, 2741, 2658 |
Total Applications | 809 |
Issued Applications | 596 |
Pending Applications | 90 |
Abandoned Applications | 123 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 133647
[patent_doc_number] => 07701563
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-04-20
[patent_title] => 'Apparatus for measuring decenter error of a lens'
[patent_app_type] => utility
[patent_app_number] => 12/038999
[patent_app_country] => US
[patent_app_date] => 2008-02-28
[patent_effective_date] => 0000-00-00
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/701/07701563.pdf
[firstpage_image] =>[orig_patent_app_number] => 12038999
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/038999 | Apparatus for measuring decenter error of a lens | Feb 27, 2008 | Issued |
Array
(
[id] => 4674445
[patent_doc_number] => 20080212073
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-09-04
[patent_title] => 'POLYMERIC DEVICE SUITABLE FOR ULTRAVIOLET DETECTION'
[patent_app_type] => utility
[patent_app_number] => 12/032197
[patent_app_country] => US
[patent_app_date] => 2008-02-15
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0212/20080212073.pdf
[firstpage_image] =>[orig_patent_app_number] => 12032197
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/032197 | POLYMERIC DEVICE SUITABLE FOR ULTRAVIOLET DETECTION | Feb 14, 2008 | Abandoned |
Array
(
[id] => 319579
[patent_doc_number] => 07522294
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-04-21
[patent_title] => 'Measuring a process parameter of a semiconductor fabrication process using optical metrology'
[patent_app_type] => utility
[patent_app_number] => 12/026485
[patent_app_country] => US
[patent_app_date] => 2008-02-05
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/522/07522294.pdf
[firstpage_image] =>[orig_patent_app_number] => 12026485
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/026485 | Measuring a process parameter of a semiconductor fabrication process using optical metrology | Feb 4, 2008 | Issued |
Array
(
[id] => 4783749
[patent_doc_number] => 20080137078
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-12
[patent_title] => 'MEASURING A DAMAGED STRUCTURE FORMED ON A WAFER USING OPTICAL METROLOGY'
[patent_app_type] => utility
[patent_app_number] => 12/021172
[patent_app_country] => US
[patent_app_date] => 2008-01-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
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[pdf_file] => publications/A1/0137/20080137078.pdf
[firstpage_image] =>[orig_patent_app_number] => 12021172
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/021172 | MEASURING A DAMAGED STRUCTURE FORMED ON A WAFER USING OPTICAL METROLOGY | Jan 27, 2008 | Abandoned |
Array
(
[id] => 6304162
[patent_doc_number] => 20100068673
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-03-18
[patent_title] => 'LASER PROCESSING DEVICE AND ITS PROCESSING METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/523290
[patent_app_country] => US
[patent_app_date] => 2008-01-16
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0068/20100068673.pdf
[firstpage_image] =>[orig_patent_app_number] => 12523290
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/523290 | LASER PROCESSING DEVICE AND ITS PROCESSING METHOD | Jan 15, 2008 | Abandoned |
Array
(
[id] => 6315404
[patent_doc_number] => 20100195115
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-08-05
[patent_title] => 'DEFECT DETECTOR FOR CORRUGATED CARDBOARD FLUTES'
[patent_app_type] => utility
[patent_app_number] => 12/676990
[patent_app_country] => US
[patent_app_date] => 2007-12-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 4785
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[pdf_file] => publications/A1/0195/20100195115.pdf
[firstpage_image] =>[orig_patent_app_number] => 12676990
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/676990 | Defect detector for corrugated cardboard flutes | Dec 10, 2007 | Issued |
Array
(
[id] => 4864948
[patent_doc_number] => 20080144007
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-19
[patent_title] => 'Thermal lens spectroscopy for ultra-sensitive absorption measurement'
[patent_app_type] => utility
[patent_app_number] => 11/998495
[patent_app_country] => US
[patent_app_date] => 2007-11-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[patent_no_of_words] => 6040
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[pdf_file] => publications/A1/0144/20080144007.pdf
[firstpage_image] =>[orig_patent_app_number] => 11998495
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/998495 | Thermal lens spectroscopy for ultra-sensitive absorption measurement | Nov 29, 2007 | Abandoned |
Array
(
[id] => 4748549
[patent_doc_number] => 20080156619
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-03
[patent_title] => 'RANGE FINDER'
[patent_app_type] => utility
[patent_app_number] => 11/945397
[patent_app_country] => US
[patent_app_date] => 2007-11-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 22
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[patent_no_of_words] => 10102
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[pdf_file] => publications/A1/0156/20080156619.pdf
[firstpage_image] =>[orig_patent_app_number] => 11945397
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/945397 | RANGE FINDER | Nov 26, 2007 | Abandoned |
Array
(
[id] => 4914017
[patent_doc_number] => 20080094616
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-24
[patent_title] => 'Surface defect inspection apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/986699
[patent_app_country] => US
[patent_app_date] => 2007-11-26
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11986699
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/986699 | Surface defect inspection apparatus | Nov 25, 2007 | Abandoned |
Array
(
[id] => 9027775
[patent_doc_number] => 08537363
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[patent_kind] => B2
[patent_issue_date] => 2013-09-17
[patent_title] => 'Picosecond ultrasonic system incorporating an optical cavity'
[patent_app_type] => utility
[patent_app_number] => 12/312692
[patent_app_country] => US
[patent_app_date] => 2007-11-19
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/312692 | Picosecond ultrasonic system incorporating an optical cavity | Nov 18, 2007 | Issued |
Array
(
[id] => 5531806
[patent_doc_number] => 20090231594
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-09-17
[patent_title] => 'COMPONENT MOUNTING IN MOVEMENT-SENSITIVE EQUIPMENT'
[patent_app_type] => utility
[patent_app_number] => 12/513796
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[firstpage_image] =>[orig_patent_app_number] => 12513796
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/513796 | COMPONENT MOUNTING IN MOVEMENT-SENSITIVE EQUIPMENT | Nov 7, 2007 | Abandoned |
Array
(
[id] => 10150001
[patent_doc_number] => 09182282
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[patent_issue_date] => 2015-11-10
[patent_title] => 'Multi-analyte optical computing system'
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[patent_app_number] => 12/447591
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/447591 | Multi-analyte optical computing system | Oct 31, 2007 | Issued |
Array
(
[id] => 6132657
[patent_doc_number] => 20110007320
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[patent_issue_date] => 2011-01-13
[patent_title] => 'LIGHT TRANSMITTER, LIGHT RECEIVER AND MEASURING DEVICE FOR MEASURING OPTICAL PROPERTIES OF TRANSPARENT SUBSTRATES'
[patent_app_type] => utility
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[firstpage_image] =>[orig_patent_app_number] => 12297893
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/297893 | Measuring device for measuring optical properties of transparent substrates | Oct 29, 2007 | Issued |
Array
(
[id] => 4897804
[patent_doc_number] => 20080117417
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-22
[patent_title] => 'Optical spectrum analyzer'
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[pdf_file] => publications/A1/0117/20080117417.pdf
[firstpage_image] =>[orig_patent_app_number] => 11979029
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/979029 | Optical spectrum analyzer | Oct 29, 2007 | Abandoned |
Array
(
[id] => 6437254
[patent_doc_number] => 20100104149
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[patent_kind] => A1
[patent_issue_date] => 2010-04-29
[patent_title] => 'IMAGING OF A TURBID MEDIUM'
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[firstpage_image] =>[orig_patent_app_number] => 12444694
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/444694 | IMAGING OF A TURBID MEDIUM | Oct 7, 2007 | Abandoned |
Array
(
[id] => 5440120
[patent_doc_number] => 20090091759
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-09
[patent_title] => 'Multiple Wavelength Optical Analyzer Device'
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[patent_app_number] => 11/867956
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[firstpage_image] =>[orig_patent_app_number] => 11867956
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/867956 | Multiple wavelength optical analyzer device | Oct 4, 2007 | Issued |
Array
(
[id] => 5321206
[patent_doc_number] => 20090059196
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[patent_issue_date] => 2009-03-05
[patent_title] => 'Systems and Methods for In-Situ Reflectivity Degradation Monitoring of Optical Collectors Used in Extreme Ultraviolet (EUV) Lithography Processes'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/849797 | Systems and methods for in-situ reflectivity degradation monitoring of optical collectors used in extreme ultraviolet (EUV) lithography processes | Sep 3, 2007 | Issued |
Array
(
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/837359 | SPECTROSCOPIC SYSTEM | Aug 9, 2007 | Abandoned |
Array
(
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11831100
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/831100 | Method and system for aerial imaging of a reticle | Jul 30, 2007 | Issued |