Richemond Dorvil
Supervisory Patent Examiner (ID: 554, Phone: (571)272-7602 , Office: P/2658 )
Most Active Art Unit | 2741 |
Art Unit(s) | 2787, 2308, 2654, 2626, 2641, 2697, 2741, 2658 |
Total Applications | 809 |
Issued Applications | 596 |
Pending Applications | 90 |
Abandoned Applications | 123 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 4739834
[patent_doc_number] => 20080233487
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-09-25
[patent_title] => 'Method and System for Optimizing Lithography Focus and/or Energy Using a Specially-Designed Optical Critical Dimension Pattern'
[patent_app_type] => utility
[patent_app_number] => 11/689396
[patent_app_country] => US
[patent_app_date] => 2007-03-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 2285
[patent_no_of_claims] => 25
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[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0233/20080233487.pdf
[firstpage_image] =>[orig_patent_app_number] => 11689396
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/689396 | Method and System for Optimizing Lithography Focus and/or Energy Using a Specially-Designed Optical Critical Dimension Pattern | Mar 20, 2007 | Abandoned |
Array
(
[id] => 198496
[patent_doc_number] => 07639351
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-12-29
[patent_title] => 'Automated process control using optical metrology with a photonic nanojet'
[patent_app_type] => utility
[patent_app_number] => 11/726076
[patent_app_country] => US
[patent_app_date] => 2007-03-20
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 8547
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/639/07639351.pdf
[firstpage_image] =>[orig_patent_app_number] => 11726076
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/726076 | Automated process control using optical metrology with a photonic nanojet | Mar 19, 2007 | Issued |
Array
(
[id] => 838135
[patent_doc_number] => 07394535
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2008-07-01
[patent_title] => 'Optical metrology using a photonic nanojet'
[patent_app_type] => utility
[patent_app_number] => 11/726083
[patent_app_country] => US
[patent_app_date] => 2007-03-20
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[pdf_file] => patents/07/394/07394535.pdf
[firstpage_image] =>[orig_patent_app_number] => 11726083
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/726083 | Optical metrology using a photonic nanojet | Mar 19, 2007 | Issued |
Array
(
[id] => 4819324
[patent_doc_number] => 20080226157
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-09-18
[patent_title] => 'Inspection methods and systems for lithographic masks'
[patent_app_type] => utility
[patent_app_number] => 11/724905
[patent_app_country] => US
[patent_app_date] => 2007-03-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 9738
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[pdf_file] => publications/A1/0226/20080226157.pdf
[firstpage_image] =>[orig_patent_app_number] => 11724905
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/724905 | Inspection methods and systems for lithographic masks | Mar 14, 2007 | Issued |
Array
(
[id] => 5083894
[patent_doc_number] => 20070273945
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-11-29
[patent_title] => 'Wafer Inspection Using Short-Pulsed Continuous Broadband Illumination'
[patent_app_type] => utility
[patent_app_number] => 11/684191
[patent_app_country] => US
[patent_app_date] => 2007-03-09
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 11146
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[pdf_file] => publications/A1/0273/20070273945.pdf
[firstpage_image] =>[orig_patent_app_number] => 11684191
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/684191 | Wafer inspection using short-pulsed continuous broadband illumination | Mar 8, 2007 | Issued |
Array
(
[id] => 186795
[patent_doc_number] => 07646478
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-01-12
[patent_title] => 'Apparatus and method for examining spectral characteristics of transmitted light through an object'
[patent_app_type] => utility
[patent_app_number] => 11/703095
[patent_app_country] => US
[patent_app_date] => 2007-02-07
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[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 6968
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[pdf_file] => patents/07/646/07646478.pdf
[firstpage_image] =>[orig_patent_app_number] => 11703095
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/703095 | Apparatus and method for examining spectral characteristics of transmitted light through an object | Feb 6, 2007 | Issued |
Array
(
[id] => 5309288
[patent_doc_number] => 20090016569
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-15
[patent_title] => 'Method of Controlling the Flow of Adjuvant for the Casting of a Molten Metal'
[patent_app_type] => utility
[patent_app_number] => 12/223590
[patent_app_country] => US
[patent_app_date] => 2007-02-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 2627
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[pdf_file] => publications/A1/0016/20090016569.pdf
[firstpage_image] =>[orig_patent_app_number] => 12223590
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/223590 | Method of Controlling the Flow of Adjuvant for the Casting of a Molten Metal | Feb 1, 2007 | Abandoned |
Array
(
[id] => 4953669
[patent_doc_number] => 20080186693
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-08-07
[patent_title] => 'Container inspection machine'
[patent_app_type] => utility
[patent_app_number] => 11/701597
[patent_app_country] => US
[patent_app_date] => 2007-02-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => publications/A1/0186/20080186693.pdf
[firstpage_image] =>[orig_patent_app_number] => 11701597
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/701597 | Container inspection machine | Feb 1, 2007 | Abandoned |
Array
(
[id] => 5176083
[patent_doc_number] => 20070177141
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-02
[patent_title] => 'Optical spectrum analyzer'
[patent_app_type] => utility
[patent_app_number] => 11/699463
[patent_app_country] => US
[patent_app_date] => 2007-01-30
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[firstpage_image] =>[orig_patent_app_number] => 11699463
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/699463 | Optical spectrum analyzer | Jan 29, 2007 | Abandoned |
Array
(
[id] => 5176101
[patent_doc_number] => 20070177159
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-02
[patent_title] => 'Method for measuring three-dimension shape'
[patent_app_type] => utility
[patent_app_number] => 11/656458
[patent_app_country] => US
[patent_app_date] => 2007-01-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
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[patent_no_of_words] => 9767
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[pdf_file] => publications/A1/0177/20070177159.pdf
[firstpage_image] =>[orig_patent_app_number] => 11656458
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/656458 | Method for automated measurement of three-dimensional shape of circuit boards | Jan 22, 2007 | Issued |
Array
(
[id] => 206101
[patent_doc_number] => 07630086
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-12-08
[patent_title] => 'Surface finish roughness measurement'
[patent_app_type] => utility
[patent_app_number] => 11/623415
[patent_app_country] => US
[patent_app_date] => 2007-01-16
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/630/07630086.pdf
[firstpage_image] =>[orig_patent_app_number] => 11623415
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/623415 | Surface finish roughness measurement | Jan 15, 2007 | Issued |
Array
(
[id] => 5093862
[patent_doc_number] => 20070115471
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-24
[patent_title] => 'WAFER, EXPOSURE MASK, METHOD OF DETECTING MARK AND METHOD OF EXPOSURE'
[patent_app_type] => utility
[patent_app_number] => 11/622534
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[pdf_file] => publications/A1/0115/20070115471.pdf
[firstpage_image] =>[orig_patent_app_number] => 11622534
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/622534 | WAFER, EXPOSURE MASK, METHOD OF DETECTING MARK AND METHOD OF EXPOSURE | Jan 11, 2007 | Abandoned |
Array
(
[id] => 5176091
[patent_doc_number] => 20070177149
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[patent_issue_date] => 2007-08-02
[patent_title] => 'Instrumentation and method for optical measurement of samples'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/644865 | Instrumentation and method for optical measurement of samples | Dec 25, 2006 | Abandoned |
Array
(
[id] => 5039045
[patent_doc_number] => 20070091327
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[patent_kind] => A1
[patent_issue_date] => 2007-04-26
[patent_title] => 'Spectroscopic Scatterometer System'
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[patent_app_number] => 11/614315
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[firstpage_image] =>[orig_patent_app_number] => 11614315
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/614315 | Spectroscopic scatterometer system | Dec 20, 2006 | Issued |
Array
(
[id] => 6625481
[patent_doc_number] => 20100225928
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-09
[patent_title] => 'DEVICE FOR MEASURING STRUCTURES OF AN OBJECT'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/161491 | DEVICE FOR MEASURING STRUCTURES OF AN OBJECT | Dec 19, 2006 | Abandoned |
Array
(
[id] => 4986960
[patent_doc_number] => 20070153298
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[patent_title] => 'Method and apparatus for measuring interfacial positions, method and apparatus for measuring layer thickness, and method and apparatus for manufacturing optical discs'
[patent_app_type] => utility
[patent_app_number] => 11/640907
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[pdf_file] => publications/A1/0153/20070153298.pdf
[firstpage_image] =>[orig_patent_app_number] => 11640907
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/640907 | Method and apparatus for measuring interfacial positions, method and apparatus for measuring layer thickness, and method and apparatus for manufacturing optical discs | Dec 18, 2006 | Issued |
Array
(
[id] => 5347357
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[patent_title] => 'Optical Measurement Device'
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[firstpage_image] =>[orig_patent_app_number] => 12158497
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/158497 | Optical measurement device with reduced contact area | Dec 17, 2006 | Issued |
Array
(
[id] => 916275
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[patent_title] => 'Measuring a process parameter of a semiconductor fabrication process using optical metrology'
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Array
(
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[patent_title] => 'Packaging Material Inspection Machine'
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[firstpage_image] =>[orig_patent_app_number] => 11566994
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/566994 | Packaging Material Inspection Machine | Dec 4, 2006 | Abandoned |
Array
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[patent_title] => 'OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS USED FOR THE SAME'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/565897 | OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS USED FOR THE SAME | Nov 30, 2006 | Abandoned |