Search

Richemond Dorvil

Supervisory Patent Examiner (ID: 554, Phone: (571)272-7602 , Office: P/2658 )

Most Active Art Unit
2741
Art Unit(s)
2787, 2308, 2654, 2626, 2641, 2697, 2741, 2658
Total Applications
809
Issued Applications
596
Pending Applications
90
Abandoned Applications
123

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4739834 [patent_doc_number] => 20080233487 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-25 [patent_title] => 'Method and System for Optimizing Lithography Focus and/or Energy Using a Specially-Designed Optical Critical Dimension Pattern' [patent_app_type] => utility [patent_app_number] => 11/689396 [patent_app_country] => US [patent_app_date] => 2007-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2285 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0233/20080233487.pdf [firstpage_image] =>[orig_patent_app_number] => 11689396 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/689396
Method and System for Optimizing Lithography Focus and/or Energy Using a Specially-Designed Optical Critical Dimension Pattern Mar 20, 2007 Abandoned
Array ( [id] => 198496 [patent_doc_number] => 07639351 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-29 [patent_title] => 'Automated process control using optical metrology with a photonic nanojet' [patent_app_type] => utility [patent_app_number] => 11/726076 [patent_app_country] => US [patent_app_date] => 2007-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 16 [patent_no_of_words] => 8547 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/639/07639351.pdf [firstpage_image] =>[orig_patent_app_number] => 11726076 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/726076
Automated process control using optical metrology with a photonic nanojet Mar 19, 2007 Issued
Array ( [id] => 838135 [patent_doc_number] => 07394535 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-07-01 [patent_title] => 'Optical metrology using a photonic nanojet' [patent_app_type] => utility [patent_app_number] => 11/726083 [patent_app_country] => US [patent_app_date] => 2007-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 7456 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/394/07394535.pdf [firstpage_image] =>[orig_patent_app_number] => 11726083 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/726083
Optical metrology using a photonic nanojet Mar 19, 2007 Issued
Array ( [id] => 4819324 [patent_doc_number] => 20080226157 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-18 [patent_title] => 'Inspection methods and systems for lithographic masks' [patent_app_type] => utility [patent_app_number] => 11/724905 [patent_app_country] => US [patent_app_date] => 2007-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 9738 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0226/20080226157.pdf [firstpage_image] =>[orig_patent_app_number] => 11724905 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/724905
Inspection methods and systems for lithographic masks Mar 14, 2007 Issued
Array ( [id] => 5083894 [patent_doc_number] => 20070273945 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-29 [patent_title] => 'Wafer Inspection Using Short-Pulsed Continuous Broadband Illumination' [patent_app_type] => utility [patent_app_number] => 11/684191 [patent_app_country] => US [patent_app_date] => 2007-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 11146 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0273/20070273945.pdf [firstpage_image] =>[orig_patent_app_number] => 11684191 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/684191
Wafer inspection using short-pulsed continuous broadband illumination Mar 8, 2007 Issued
Array ( [id] => 186795 [patent_doc_number] => 07646478 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-12 [patent_title] => 'Apparatus and method for examining spectral characteristics of transmitted light through an object' [patent_app_type] => utility [patent_app_number] => 11/703095 [patent_app_country] => US [patent_app_date] => 2007-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 6968 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/646/07646478.pdf [firstpage_image] =>[orig_patent_app_number] => 11703095 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/703095
Apparatus and method for examining spectral characteristics of transmitted light through an object Feb 6, 2007 Issued
Array ( [id] => 5309288 [patent_doc_number] => 20090016569 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-15 [patent_title] => 'Method of Controlling the Flow of Adjuvant for the Casting of a Molten Metal' [patent_app_type] => utility [patent_app_number] => 12/223590 [patent_app_country] => US [patent_app_date] => 2007-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2627 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0016/20090016569.pdf [firstpage_image] =>[orig_patent_app_number] => 12223590 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/223590
Method of Controlling the Flow of Adjuvant for the Casting of a Molten Metal Feb 1, 2007 Abandoned
Array ( [id] => 4953669 [patent_doc_number] => 20080186693 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-07 [patent_title] => 'Container inspection machine' [patent_app_type] => utility [patent_app_number] => 11/701597 [patent_app_country] => US [patent_app_date] => 2007-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 537 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0186/20080186693.pdf [firstpage_image] =>[orig_patent_app_number] => 11701597 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/701597
Container inspection machine Feb 1, 2007 Abandoned
Array ( [id] => 5176083 [patent_doc_number] => 20070177141 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-02 [patent_title] => 'Optical spectrum analyzer' [patent_app_type] => utility [patent_app_number] => 11/699463 [patent_app_country] => US [patent_app_date] => 2007-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7646 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0177/20070177141.pdf [firstpage_image] =>[orig_patent_app_number] => 11699463 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/699463
Optical spectrum analyzer Jan 29, 2007 Abandoned
Array ( [id] => 5176101 [patent_doc_number] => 20070177159 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-02 [patent_title] => 'Method for measuring three-dimension shape' [patent_app_type] => utility [patent_app_number] => 11/656458 [patent_app_country] => US [patent_app_date] => 2007-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9767 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0177/20070177159.pdf [firstpage_image] =>[orig_patent_app_number] => 11656458 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/656458
Method for automated measurement of three-dimensional shape of circuit boards Jan 22, 2007 Issued
Array ( [id] => 206101 [patent_doc_number] => 07630086 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-08 [patent_title] => 'Surface finish roughness measurement' [patent_app_type] => utility [patent_app_number] => 11/623415 [patent_app_country] => US [patent_app_date] => 2007-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 34 [patent_figures_cnt] => 52 [patent_no_of_words] => 18208 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/630/07630086.pdf [firstpage_image] =>[orig_patent_app_number] => 11623415 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/623415
Surface finish roughness measurement Jan 15, 2007 Issued
Array ( [id] => 5093862 [patent_doc_number] => 20070115471 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-24 [patent_title] => 'WAFER, EXPOSURE MASK, METHOD OF DETECTING MARK AND METHOD OF EXPOSURE' [patent_app_type] => utility [patent_app_number] => 11/622534 [patent_app_country] => US [patent_app_date] => 2007-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3247 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0115/20070115471.pdf [firstpage_image] =>[orig_patent_app_number] => 11622534 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/622534
WAFER, EXPOSURE MASK, METHOD OF DETECTING MARK AND METHOD OF EXPOSURE Jan 11, 2007 Abandoned
Array ( [id] => 5176091 [patent_doc_number] => 20070177149 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-02 [patent_title] => 'Instrumentation and method for optical measurement of samples' [patent_app_type] => utility [patent_app_number] => 11/644865 [patent_app_country] => US [patent_app_date] => 2006-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7019 [patent_no_of_claims] => 62 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0177/20070177149.pdf [firstpage_image] =>[orig_patent_app_number] => 11644865 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/644865
Instrumentation and method for optical measurement of samples Dec 25, 2006 Abandoned
Array ( [id] => 5039045 [patent_doc_number] => 20070091327 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-26 [patent_title] => 'Spectroscopic Scatterometer System' [patent_app_type] => utility [patent_app_number] => 11/614315 [patent_app_country] => US [patent_app_date] => 2006-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6560 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0091/20070091327.pdf [firstpage_image] =>[orig_patent_app_number] => 11614315 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/614315
Spectroscopic scatterometer system Dec 20, 2006 Issued
Array ( [id] => 6625481 [patent_doc_number] => 20100225928 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-09 [patent_title] => 'DEVICE FOR MEASURING STRUCTURES OF AN OBJECT' [patent_app_type] => utility [patent_app_number] => 12/161491 [patent_app_country] => US [patent_app_date] => 2006-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2397 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0225/20100225928.pdf [firstpage_image] =>[orig_patent_app_number] => 12161491 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/161491
DEVICE FOR MEASURING STRUCTURES OF AN OBJECT Dec 19, 2006 Abandoned
Array ( [id] => 4986960 [patent_doc_number] => 20070153298 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-05 [patent_title] => 'Method and apparatus for measuring interfacial positions, method and apparatus for measuring layer thickness, and method and apparatus for manufacturing optical discs' [patent_app_type] => utility [patent_app_number] => 11/640907 [patent_app_country] => US [patent_app_date] => 2006-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 20442 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0153/20070153298.pdf [firstpage_image] =>[orig_patent_app_number] => 11640907 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/640907
Method and apparatus for measuring interfacial positions, method and apparatus for measuring layer thickness, and method and apparatus for manufacturing optical discs Dec 18, 2006 Issued
Array ( [id] => 5347357 [patent_doc_number] => 20090002718 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-01 [patent_title] => 'Optical Measurement Device' [patent_app_type] => utility [patent_app_number] => 12/158497 [patent_app_country] => US [patent_app_date] => 2006-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5960 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0002/20090002718.pdf [firstpage_image] =>[orig_patent_app_number] => 12158497 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/158497
Optical measurement device with reduced contact area Dec 17, 2006 Issued
Array ( [id] => 916275 [patent_doc_number] => 07327475 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-02-05 [patent_title] => 'Measuring a process parameter of a semiconductor fabrication process using optical metrology' [patent_app_type] => utility [patent_app_number] => 11/639515 [patent_app_country] => US [patent_app_date] => 2006-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3661 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/327/07327475.pdf [firstpage_image] =>[orig_patent_app_number] => 11639515 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/639515
Measuring a process parameter of a semiconductor fabrication process using optical metrology Dec 14, 2006 Issued
Array ( [id] => 4674458 [patent_doc_number] => 20080212086 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-04 [patent_title] => 'Packaging Material Inspection Machine' [patent_app_type] => utility [patent_app_number] => 11/566994 [patent_app_country] => US [patent_app_date] => 2006-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 1769 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20080212086.pdf [firstpage_image] =>[orig_patent_app_number] => 11566994 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/566994
Packaging Material Inspection Machine Dec 4, 2006 Abandoned
Array ( [id] => 5020752 [patent_doc_number] => 20070146718 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-28 [patent_title] => 'OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS USED FOR THE SAME' [patent_app_type] => utility [patent_app_number] => 11/565897 [patent_app_country] => US [patent_app_date] => 2006-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4440 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20070146718.pdf [firstpage_image] =>[orig_patent_app_number] => 11565897 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/565897
OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS USED FOR THE SAME Nov 30, 2006 Abandoned
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