Search

Richemond Dorvil

Supervisory Patent Examiner (ID: 554, Phone: (571)272-7602 , Office: P/2658 )

Most Active Art Unit
2741
Art Unit(s)
2787, 2308, 2654, 2626, 2641, 2697, 2741, 2658
Total Applications
809
Issued Applications
596
Pending Applications
90
Abandoned Applications
123

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5196590 [patent_doc_number] => 20070295908 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'Method for Improving Optical Measurement of Gas Concentration' [patent_app_type] => utility [patent_app_number] => 11/662899 [patent_app_country] => US [patent_app_date] => 2005-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2211 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20070295908.pdf [firstpage_image] =>[orig_patent_app_number] => 11662899 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/662899
Method for measurement of gas concentration with modulated light at two absorption maxima Sep 6, 2005 Issued
Array ( [id] => 5617933 [patent_doc_number] => 20060187466 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-24 [patent_title] => 'Selecting unit cell configuration for repeating structures in optical metrology' [patent_app_type] => utility [patent_app_number] => 11/218884 [patent_app_country] => US [patent_app_date] => 2005-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 11507 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0187/20060187466.pdf [firstpage_image] =>[orig_patent_app_number] => 11218884 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/218884
Selecting unit cell configuration for repeating structures in optical metrology Sep 1, 2005 Abandoned
Array ( [id] => 5192673 [patent_doc_number] => 20070081155 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-12 [patent_title] => 'Lab in a cuvette' [patent_app_type] => utility [patent_app_number] => 11/214498 [patent_app_country] => US [patent_app_date] => 2005-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5199 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0081/20070081155.pdf [firstpage_image] =>[orig_patent_app_number] => 11214498 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/214498
Lab in a cuvette Aug 29, 2005 Issued
Array ( [id] => 5724058 [patent_doc_number] => 20060054818 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-16 [patent_title] => 'Scanning apparatus and scanning methods for inspecting a surface of a semiconductor wafer' [patent_app_type] => utility [patent_app_number] => 11/214319 [patent_app_country] => US [patent_app_date] => 2005-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2478 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20060054818.pdf [firstpage_image] =>[orig_patent_app_number] => 11214319 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/214319
Scanning apparatus and scanning methods for inspecting a surface of a semiconductor wafer Aug 28, 2005 Abandoned
Array ( [id] => 247859 [patent_doc_number] => 07586614 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-09-08 [patent_title] => 'System and method for self-referenced SPR measurements' [patent_app_type] => utility [patent_app_number] => 11/210633 [patent_app_country] => US [patent_app_date] => 2005-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5450 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/586/07586614.pdf [firstpage_image] =>[orig_patent_app_number] => 11210633 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/210633
System and method for self-referenced SPR measurements Aug 23, 2005 Issued
Array ( [id] => 5192686 [patent_doc_number] => 20070081168 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-12 [patent_title] => 'Distance determination in a scanned beam image capture device' [patent_app_type] => utility [patent_app_number] => 11/210465 [patent_app_country] => US [patent_app_date] => 2005-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7348 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0081/20070081168.pdf [firstpage_image] =>[orig_patent_app_number] => 11210465 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/210465
Distance determination in a scanned beam image capture device Aug 22, 2005 Issued
Array ( [id] => 5698494 [patent_doc_number] => 20060215178 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-09-28 [patent_title] => 'Position measurement system' [patent_app_type] => utility [patent_app_number] => 11/206974 [patent_app_country] => US [patent_app_date] => 2005-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5545 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0215/20060215178.pdf [firstpage_image] =>[orig_patent_app_number] => 11206974 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/206974
Position measurement system Aug 18, 2005 Issued
Array ( [id] => 5661398 [patent_doc_number] => 20060251994 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-09 [patent_title] => 'Apparatus and method for characterizing an image system in lithography projection tool' [patent_app_type] => utility [patent_app_number] => 11/203331 [patent_app_country] => US [patent_app_date] => 2005-08-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6965 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0251/20060251994.pdf [firstpage_image] =>[orig_patent_app_number] => 11203331 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/203331
Apparatus and method for characterizing an image system in lithography projection tool Aug 12, 2005 Issued
Array ( [id] => 8631840 [patent_doc_number] => 08363924 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-29 [patent_title] => 'Electronic device testing apparatus' [patent_app_type] => utility [patent_app_number] => 11/996000 [patent_app_country] => US [patent_app_date] => 2005-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7788 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 306 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11996000 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/996000
Electronic device testing apparatus Aug 10, 2005 Issued
Array ( [id] => 5440108 [patent_doc_number] => 20090091747 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-09 [patent_title] => 'Edge flaw detection device' [patent_app_type] => utility [patent_app_number] => 11/989596 [patent_app_country] => US [patent_app_date] => 2005-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2849 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0091/20090091747.pdf [firstpage_image] =>[orig_patent_app_number] => 11989596 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/989596
Edge flaw detection device Aug 9, 2005 Abandoned
Array ( [id] => 212341 [patent_doc_number] => 07623252 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-11-24 [patent_title] => 'Methods, apparatus and computer program products for controlling a volume of liquid in semiconductor processing based on reflected optical radiation' [patent_app_type] => utility [patent_app_number] => 11/194183 [patent_app_country] => US [patent_app_date] => 2005-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 18 [patent_no_of_words] => 7839 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/623/07623252.pdf [firstpage_image] =>[orig_patent_app_number] => 11194183 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/194183
Methods, apparatus and computer program products for controlling a volume of liquid in semiconductor processing based on reflected optical radiation Jul 31, 2005 Issued
Array ( [id] => 5766065 [patent_doc_number] => 20050264001 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-01 [patent_title] => 'Identification particles and system and method for retrospective identification using spectral codes' [patent_app_type] => utility [patent_app_number] => 11/195499 [patent_app_country] => US [patent_app_date] => 2005-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4728 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0264/20050264001.pdf [firstpage_image] =>[orig_patent_app_number] => 11195499 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/195499
Identification particles and system and method for retrospective identification using spectral codes Jul 31, 2005 Abandoned
Array ( [id] => 8216254 [patent_doc_number] => 08194242 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-06-05 [patent_title] => 'Substrate distortion measurement' [patent_app_type] => utility [patent_app_number] => 11/192400 [patent_app_country] => US [patent_app_date] => 2005-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 9480 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/194/08194242.pdf [firstpage_image] =>[orig_patent_app_number] => 11192400 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/192400
Substrate distortion measurement Jul 28, 2005 Issued
Array ( [id] => 5073925 [patent_doc_number] => 20070013900 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-18 [patent_title] => 'WAFER DEFECT DETECTION METHODS AND SYSTEMS' [patent_app_type] => utility [patent_app_number] => 11/182798 [patent_app_country] => US [patent_app_date] => 2005-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1724 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0013/20070013900.pdf [firstpage_image] =>[orig_patent_app_number] => 11182798 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/182798
Wafer defect detection methods and systems Jul 17, 2005 Issued
Array ( [id] => 5806055 [patent_doc_number] => 20060092408 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-04 [patent_title] => 'Process and station for inspecting the painting of motor vehicle bodywork parts' [patent_app_type] => utility [patent_app_number] => 11/184256 [patent_app_country] => US [patent_app_date] => 2005-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1151 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0092/20060092408.pdf [firstpage_image] =>[orig_patent_app_number] => 11184256 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/184256
Process and station for inspecting the painting of motor vehicle bodywork parts Jul 17, 2005 Issued
Array ( [id] => 5797513 [patent_doc_number] => 20060033935 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-16 [patent_title] => 'Laser sheet generator' [patent_app_type] => utility [patent_app_number] => 11/182506 [patent_app_country] => US [patent_app_date] => 2005-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3140 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0033/20060033935.pdf [firstpage_image] =>[orig_patent_app_number] => 11182506 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/182506
Laser sheet generator Jul 13, 2005 Abandoned
Array ( [id] => 4993181 [patent_doc_number] => 20070008526 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-11 [patent_title] => 'Apparatus and method for non-contact assessment of a constituent in semiconductor workpieces' [patent_app_type] => utility [patent_app_number] => 11/177735 [patent_app_country] => US [patent_app_date] => 2005-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3793 [patent_no_of_claims] => 52 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0008/20070008526.pdf [firstpage_image] =>[orig_patent_app_number] => 11177735 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/177735
Apparatus and method for non-contact assessment of a constituent in semiconductor workpieces Jul 7, 2005 Abandoned
Array ( [id] => 5764651 [patent_doc_number] => 20060017959 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-01-26 [patent_title] => 'Document classification and authentication' [patent_app_type] => utility [patent_app_number] => 11/176780 [patent_app_country] => US [patent_app_date] => 2005-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7996 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0017/20060017959.pdf [firstpage_image] =>[orig_patent_app_number] => 11176780 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/176780
Document classification and authentication Jul 5, 2005 Abandoned
Array ( [id] => 5792110 [patent_doc_number] => 20060012791 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-01-19 [patent_title] => 'Wafer inspection system' [patent_app_type] => utility [patent_app_number] => 11/158733 [patent_app_country] => US [patent_app_date] => 2005-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 9403 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20060012791.pdf [firstpage_image] =>[orig_patent_app_number] => 11158733 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/158733
Wafer inspection system Jun 20, 2005 Abandoned
Array ( [id] => 586694 [patent_doc_number] => 07456970 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-11-25 [patent_title] => 'Pulse finding apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/156150 [patent_app_country] => US [patent_app_date] => 2005-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 17 [patent_no_of_words] => 5809 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/456/07456970.pdf [firstpage_image] =>[orig_patent_app_number] => 11156150 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/156150
Pulse finding apparatus and method Jun 16, 2005 Issued
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