Richemond Dorvil
Supervisory Patent Examiner (ID: 554, Phone: (571)272-7602 , Office: P/2658 )
Most Active Art Unit | 2741 |
Art Unit(s) | 2787, 2308, 2654, 2626, 2641, 2697, 2741, 2658 |
Total Applications | 809 |
Issued Applications | 596 |
Pending Applications | 90 |
Abandoned Applications | 123 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 5196590
[patent_doc_number] => 20070295908
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-12-27
[patent_title] => 'Method for Improving Optical Measurement of Gas Concentration'
[patent_app_type] => utility
[patent_app_number] => 11/662899
[patent_app_country] => US
[patent_app_date] => 2005-09-07
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 2211
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[patent_maintenance] => 1
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[pdf_file] => publications/A1/0295/20070295908.pdf
[firstpage_image] =>[orig_patent_app_number] => 11662899
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/662899 | Method for measurement of gas concentration with modulated light at two absorption maxima | Sep 6, 2005 | Issued |
Array
(
[id] => 5617933
[patent_doc_number] => 20060187466
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-24
[patent_title] => 'Selecting unit cell configuration for repeating structures in optical metrology'
[patent_app_type] => utility
[patent_app_number] => 11/218884
[patent_app_country] => US
[patent_app_date] => 2005-09-02
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0187/20060187466.pdf
[firstpage_image] =>[orig_patent_app_number] => 11218884
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/218884 | Selecting unit cell configuration for repeating structures in optical metrology | Sep 1, 2005 | Abandoned |
Array
(
[id] => 5192673
[patent_doc_number] => 20070081155
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-04-12
[patent_title] => 'Lab in a cuvette'
[patent_app_type] => utility
[patent_app_number] => 11/214498
[patent_app_country] => US
[patent_app_date] => 2005-08-30
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[pdf_file] => publications/A1/0081/20070081155.pdf
[firstpage_image] =>[orig_patent_app_number] => 11214498
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/214498 | Lab in a cuvette | Aug 29, 2005 | Issued |
Array
(
[id] => 5724058
[patent_doc_number] => 20060054818
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-03-16
[patent_title] => 'Scanning apparatus and scanning methods for inspecting a surface of a semiconductor wafer'
[patent_app_type] => utility
[patent_app_number] => 11/214319
[patent_app_country] => US
[patent_app_date] => 2005-08-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[pdf_file] => publications/A1/0054/20060054818.pdf
[firstpage_image] =>[orig_patent_app_number] => 11214319
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/214319 | Scanning apparatus and scanning methods for inspecting a surface of a semiconductor wafer | Aug 28, 2005 | Abandoned |
Array
(
[id] => 247859
[patent_doc_number] => 07586614
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-09-08
[patent_title] => 'System and method for self-referenced SPR measurements'
[patent_app_type] => utility
[patent_app_number] => 11/210633
[patent_app_country] => US
[patent_app_date] => 2005-08-24
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/586/07586614.pdf
[firstpage_image] =>[orig_patent_app_number] => 11210633
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/210633 | System and method for self-referenced SPR measurements | Aug 23, 2005 | Issued |
Array
(
[id] => 5192686
[patent_doc_number] => 20070081168
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-04-12
[patent_title] => 'Distance determination in a scanned beam image capture device'
[patent_app_type] => utility
[patent_app_number] => 11/210465
[patent_app_country] => US
[patent_app_date] => 2005-08-23
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0081/20070081168.pdf
[firstpage_image] =>[orig_patent_app_number] => 11210465
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/210465 | Distance determination in a scanned beam image capture device | Aug 22, 2005 | Issued |
Array
(
[id] => 5698494
[patent_doc_number] => 20060215178
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-09-28
[patent_title] => 'Position measurement system'
[patent_app_type] => utility
[patent_app_number] => 11/206974
[patent_app_country] => US
[patent_app_date] => 2005-08-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
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[patent_no_of_words] => 5545
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[pdf_file] => publications/A1/0215/20060215178.pdf
[firstpage_image] =>[orig_patent_app_number] => 11206974
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/206974 | Position measurement system | Aug 18, 2005 | Issued |
Array
(
[id] => 5661398
[patent_doc_number] => 20060251994
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-09
[patent_title] => 'Apparatus and method for characterizing an image system in lithography projection tool'
[patent_app_type] => utility
[patent_app_number] => 11/203331
[patent_app_country] => US
[patent_app_date] => 2005-08-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 6965
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[pdf_file] => publications/A1/0251/20060251994.pdf
[firstpage_image] =>[orig_patent_app_number] => 11203331
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/203331 | Apparatus and method for characterizing an image system in lithography projection tool | Aug 12, 2005 | Issued |
Array
(
[id] => 8631840
[patent_doc_number] => 08363924
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-01-29
[patent_title] => 'Electronic device testing apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/996000
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[patent_app_date] => 2005-08-11
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/996000 | Electronic device testing apparatus | Aug 10, 2005 | Issued |
Array
(
[id] => 5440108
[patent_doc_number] => 20090091747
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-09
[patent_title] => 'Edge flaw detection device'
[patent_app_type] => utility
[patent_app_number] => 11/989596
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[patent_app_date] => 2005-08-10
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0091/20090091747.pdf
[firstpage_image] =>[orig_patent_app_number] => 11989596
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/989596 | Edge flaw detection device | Aug 9, 2005 | Abandoned |
Array
(
[id] => 212341
[patent_doc_number] => 07623252
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[patent_kind] => B2
[patent_issue_date] => 2009-11-24
[patent_title] => 'Methods, apparatus and computer program products for controlling a volume of liquid in semiconductor processing based on reflected optical radiation'
[patent_app_type] => utility
[patent_app_number] => 11/194183
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[pdf_file] => patents/07/623/07623252.pdf
[firstpage_image] =>[orig_patent_app_number] => 11194183
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/194183 | Methods, apparatus and computer program products for controlling a volume of liquid in semiconductor processing based on reflected optical radiation | Jul 31, 2005 | Issued |
Array
(
[id] => 5766065
[patent_doc_number] => 20050264001
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[patent_issue_date] => 2005-12-01
[patent_title] => 'Identification particles and system and method for retrospective identification using spectral codes'
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[firstpage_image] =>[orig_patent_app_number] => 11195499
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/195499 | Identification particles and system and method for retrospective identification using spectral codes | Jul 31, 2005 | Abandoned |
Array
(
[id] => 8216254
[patent_doc_number] => 08194242
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[patent_kind] => B2
[patent_issue_date] => 2012-06-05
[patent_title] => 'Substrate distortion measurement'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/192400 | Substrate distortion measurement | Jul 28, 2005 | Issued |
Array
(
[id] => 5073925
[patent_doc_number] => 20070013900
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[patent_title] => 'WAFER DEFECT DETECTION METHODS AND SYSTEMS'
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[pdf_file] => publications/A1/0013/20070013900.pdf
[firstpage_image] =>[orig_patent_app_number] => 11182798
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/182798 | Wafer defect detection methods and systems | Jul 17, 2005 | Issued |
Array
(
[id] => 5806055
[patent_doc_number] => 20060092408
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-05-04
[patent_title] => 'Process and station for inspecting the painting of motor vehicle bodywork parts'
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[firstpage_image] =>[orig_patent_app_number] => 11184256
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/184256 | Process and station for inspecting the painting of motor vehicle bodywork parts | Jul 17, 2005 | Issued |
Array
(
[id] => 5797513
[patent_doc_number] => 20060033935
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-16
[patent_title] => 'Laser sheet generator'
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[firstpage_image] =>[orig_patent_app_number] => 11182506
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/182506 | Laser sheet generator | Jul 13, 2005 | Abandoned |
Array
(
[id] => 4993181
[patent_doc_number] => 20070008526
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[patent_title] => 'Apparatus and method for non-contact assessment of a constituent in semiconductor workpieces'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/177735 | Apparatus and method for non-contact assessment of a constituent in semiconductor workpieces | Jul 7, 2005 | Abandoned |
Array
(
[id] => 5764651
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Array
(
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Array
(
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[firstpage_image] =>[orig_patent_app_number] => 11156150
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/156150 | Pulse finding apparatus and method | Jun 16, 2005 | Issued |