
Ricky Ngoc Pham
Examiner (ID: 13487, Phone: (571)272-2321 , Office: P/2913 )
| Most Active Art Unit | 2913 |
| Art Unit(s) | 2913 |
| Total Applications | 7072 |
| Issued Applications | 7014 |
| Pending Applications | 23 |
| Abandoned Applications | 53 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6455935
[patent_doc_number] => 20020177958
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-11-28
[patent_title] => 'System, method and computer implemented process for assaying coagulation in fluid samples'
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[patent_app_number] => 10/189729
[patent_app_country] => US
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[pdf_file] => publications/A1/0177/20020177958.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/189729 | System, method and computer implemented process for assaying coagulation in fluid samples | Jul 7, 2002 | Abandoned |
Array
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[patent_doc_number] => 06751578
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[patent_issue_date] => 2004-06-15
[patent_title] => 'Method and apparatus for evaluating a digital information signal'
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Array
(
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[patent_issue_date] => 2003-01-23
[patent_title] => 'Device, computer program product and method for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis'
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[patent_app_number] => 10/158165
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Array
(
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[patent_issue_date] => 2004-02-03
[patent_title] => 'Processing system for a wiring harness, a method for testing an electrical connection of a wiring harness, computer-readable storage medium and a wire connection assisting system'
[patent_app_type] => B2
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Array
(
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[patent_title] => ' Waveform analysis'
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Array
(
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[patent_title] => 'Methods and apparatus for semiconductor testing'
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Array
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[patent_title] => 'Slave unit, node unit, controllers and network system'
[patent_app_type] => new
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/147911 | Slave unit, node unit, controllers and network system | May 19, 2002 | Issued |
Array
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[patent_issue_date] => 2004-03-02
[patent_title] => 'Method and system for analyzing the effect of inflow and infiltration on a sewer system'
[patent_app_type] => B2
[patent_app_number] => 10/146815
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/146815 | Method and system for analyzing the effect of inflow and infiltration on a sewer system | May 16, 2002 | Issued |
Array
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[patent_title] => 'System for a non-invasive online continuous measurement of phrase levels in converters or pyrometallurgical furnaces'
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Array
(
[id] => 1257774
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[patent_title] => 'Modular monitoring and protection system with automatic device programming'
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Array
(
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Array
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Array
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Array
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Array
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Array
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Array
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