Search

Robert Chevalier

Examiner (ID: 17308, Phone: (571)272-7374 , Office: P/2484 )

Most Active Art Unit
2484
Art Unit(s)
2715, 2615, 2604, 2616, 2712, 2318, 2484, 2621, 2305
Total Applications
2466
Issued Applications
2139
Pending Applications
77
Abandoned Applications
264

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2980706 [patent_doc_number] => 05208530 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-05-04 [patent_title] => 'Testability architecture and techniques for programmable interconnect architecture' [patent_app_type] => 1 [patent_app_number] => 7/889838 [patent_app_country] => US [patent_app_date] => 1992-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 8648 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 256 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/208/05208530.pdf [firstpage_image] =>[orig_patent_app_number] => 889838 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/889838
Testability architecture and techniques for programmable interconnect architecture May 25, 1992 Issued
Array ( [id] => 2951804 [patent_doc_number] => 05180974 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-01-19 [patent_title] => 'Semiconductor testing and shipping system' [patent_app_type] => 1 [patent_app_number] => 7/888779 [patent_app_country] => US [patent_app_date] => 1992-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 1779 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 481 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/180/05180974.pdf [firstpage_image] =>[orig_patent_app_number] => 888779 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/888779
Semiconductor testing and shipping system May 25, 1992 Issued
Array ( [id] => 2927363 [patent_doc_number] => 05200694 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-04-06 [patent_title] => 'Head assembly for printed circuit board test fixture' [patent_app_type] => 1 [patent_app_number] => 7/884909 [patent_app_country] => US [patent_app_date] => 1992-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3290 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 334 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/200/05200694.pdf [firstpage_image] =>[orig_patent_app_number] => 884909 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/884909
Head assembly for printed circuit board test fixture May 17, 1992 Issued
Array ( [id] => 2788697 [patent_doc_number] => 05164665 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-11-17 [patent_title] => 'IC tester' [patent_app_type] => 1 [patent_app_number] => 7/874213 [patent_app_country] => US [patent_app_date] => 1992-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2570 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/164/05164665.pdf [firstpage_image] =>[orig_patent_app_number] => 874213 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/874213
IC tester Apr 26, 1992 Issued
Array ( [id] => 2882034 [patent_doc_number] => 05159267 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-10-27 [patent_title] => 'Pneumatic energy fluxmeter' [patent_app_type] => 1 [patent_app_number] => 7/864155 [patent_app_country] => US [patent_app_date] => 1992-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3518 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/159/05159267.pdf [firstpage_image] =>[orig_patent_app_number] => 864155 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/864155
Pneumatic energy fluxmeter Apr 1, 1992 Issued
Array ( [id] => 2947386 [patent_doc_number] => 05223789 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-06-29 [patent_title] => 'AC/DC current detecting method' [patent_app_type] => 1 [patent_app_number] => 7/861170 [patent_app_country] => US [patent_app_date] => 1992-03-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 24 [patent_no_of_words] => 7365 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/223/05223789.pdf [firstpage_image] =>[orig_patent_app_number] => 861170 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/861170
AC/DC current detecting method Mar 26, 1992 Issued
Array ( [id] => 2829113 [patent_doc_number] => 05170117 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-12-08 [patent_title] => 'Socket for testing a plug-in type semiconductor' [patent_app_type] => 1 [patent_app_number] => 7/857668 [patent_app_country] => US [patent_app_date] => 1992-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 1670 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 403 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/170/05170117.pdf [firstpage_image] =>[orig_patent_app_number] => 857668 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/857668
Socket for testing a plug-in type semiconductor Mar 25, 1992 Issued
Array ( [id] => 2965139 [patent_doc_number] => 05198751 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-03-30 [patent_title] => 'Reactive volt-ampere-hour meter' [patent_app_type] => 1 [patent_app_number] => 7/855288 [patent_app_country] => US [patent_app_date] => 1992-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4163 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 225 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/198/05198751.pdf [firstpage_image] =>[orig_patent_app_number] => 855288 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/855288
Reactive volt-ampere-hour meter Mar 22, 1992 Issued
Array ( [id] => 2900230 [patent_doc_number] => 05184063 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-02-02 [patent_title] => 'Three phase reversal detection system' [patent_app_type] => 1 [patent_app_number] => 7/834748 [patent_app_country] => US [patent_app_date] => 1992-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 1634 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 299 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/184/05184063.pdf [firstpage_image] =>[orig_patent_app_number] => 834748 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/834748
Three phase reversal detection system Feb 12, 1992 Issued
Array ( [id] => 2900296 [patent_doc_number] => 05184067 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-02-02 [patent_title] => 'Signature compression circuit' [patent_app_type] => 1 [patent_app_number] => 7/799719 [patent_app_country] => US [patent_app_date] => 1991-11-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 3877 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 279 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/184/05184067.pdf [firstpage_image] =>[orig_patent_app_number] => 799719 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/799719
Signature compression circuit Nov 25, 1991 Issued
Array ( [id] => 2864750 [patent_doc_number] => 05166608 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-11-24 [patent_title] => 'Arrangement for high speed testing of field-effect transistors and memory cells employing the same' [patent_app_type] => 1 [patent_app_number] => 7/788819 [patent_app_country] => US [patent_app_date] => 1991-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 5247 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/166/05166608.pdf [firstpage_image] =>[orig_patent_app_number] => 788819 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/788819
Arrangement for high speed testing of field-effect transistors and memory cells employing the same Nov 6, 1991 Issued
Array ( [id] => 2981631 [patent_doc_number] => 05225771 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-07-06 [patent_title] => 'Making and testing an integrated circuit using high density probe points' [patent_app_type] => 1 [patent_app_number] => 7/775324 [patent_app_country] => US [patent_app_date] => 1991-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 32 [patent_figures_cnt] => 85 [patent_no_of_words] => 17761 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/225/05225771.pdf [firstpage_image] =>[orig_patent_app_number] => 775324 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/775324
Making and testing an integrated circuit using high density probe points Oct 10, 1991 Issued
Array ( [id] => 2892048 [patent_doc_number] => 05214372 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-05-25 [patent_title] => 'Linearizing circuit for dectection of a RF-power sensor' [patent_app_type] => 1 [patent_app_number] => 7/777453 [patent_app_country] => US [patent_app_date] => 1991-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1324 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 207 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/214/05214372.pdf [firstpage_image] =>[orig_patent_app_number] => 777453 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/777453
Linearizing circuit for dectection of a RF-power sensor Oct 10, 1991 Issued
Array ( [id] => 2836653 [patent_doc_number] => 05175493 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-12-29 [patent_title] => 'Shielded electrical contact spring probe assembly' [patent_app_type] => 1 [patent_app_number] => 7/775714 [patent_app_country] => US [patent_app_date] => 1991-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 3599 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 243 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/175/05175493.pdf [firstpage_image] =>[orig_patent_app_number] => 775714 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/775714
Shielded electrical contact spring probe assembly Oct 10, 1991 Issued
Array ( [id] => 2881981 [patent_doc_number] => 05159264 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-10-27 [patent_title] => 'Pneumatic energy fluxmeter' [patent_app_type] => 1 [patent_app_number] => 7/771071 [patent_app_country] => US [patent_app_date] => 1991-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3518 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 457 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/159/05159264.pdf [firstpage_image] =>[orig_patent_app_number] => 771071 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/771071
Pneumatic energy fluxmeter Oct 1, 1991 Issued
Array ( [id] => 2864574 [patent_doc_number] => 05166600 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-11-24 [patent_title] => 'Measuring device having an auxiliary electrode for a gas-insulated encased high-voltage conductor' [patent_app_type] => 1 [patent_app_number] => 7/761988 [patent_app_country] => US [patent_app_date] => 1991-09-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2359 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 299 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/166/05166600.pdf [firstpage_image] =>[orig_patent_app_number] => 761988 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/761988
Measuring device having an auxiliary electrode for a gas-insulated encased high-voltage conductor Sep 22, 1991 Issued
Array ( [id] => 2965216 [patent_doc_number] => 05198755 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-03-30 [patent_title] => 'Probe apparatus' [patent_app_type] => 1 [patent_app_number] => 7/753078 [patent_app_country] => US [patent_app_date] => 1991-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 2718 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/198/05198755.pdf [firstpage_image] =>[orig_patent_app_number] => 753078 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/753078
Probe apparatus Aug 29, 1991 Issued
Array ( [id] => 2899094 [patent_doc_number] => 05177439 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-01-05 [patent_title] => 'Probe card for testing unencapsulated semiconductor devices' [patent_app_type] => 1 [patent_app_number] => 7/752799 [patent_app_country] => US [patent_app_date] => 1991-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3508 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/177/05177439.pdf [firstpage_image] =>[orig_patent_app_number] => 752799 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/752799
Probe card for testing unencapsulated semiconductor devices Aug 29, 1991 Issued
Array ( [id] => 2974707 [patent_doc_number] => 05258704 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-11-02 [patent_title] => 'Electronic watthour meter' [patent_app_type] => 1 [patent_app_number] => 7/750724 [patent_app_country] => US [patent_app_date] => 1991-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 25 [patent_no_of_words] => 21721 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/258/05258704.pdf [firstpage_image] =>[orig_patent_app_number] => 750724 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/750724
Electronic watthour meter Aug 20, 1991 Issued
Array ( [id] => 2924095 [patent_doc_number] => 05206583 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-04-27 [patent_title] => 'Latch assisted fuse testing for customized integrated circuits' [patent_app_type] => 1 [patent_app_number] => 7/747848 [patent_app_country] => US [patent_app_date] => 1991-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3300 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/206/05206583.pdf [firstpage_image] =>[orig_patent_app_number] => 747848 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/747848
Latch assisted fuse testing for customized integrated circuits Aug 19, 1991 Issued
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