Search

Robert Chevalier

Examiner (ID: 17308, Phone: (571)272-7374 , Office: P/2484 )

Most Active Art Unit
2484
Art Unit(s)
2715, 2615, 2604, 2616, 2712, 2318, 2484, 2621, 2305
Total Applications
2466
Issued Applications
2139
Pending Applications
77
Abandoned Applications
264

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2985119 [patent_doc_number] => 05204614 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-04-20 [patent_title] => 'Broad-band microwave power sensor using diodes above their resonant frequency' [patent_app_type] => 1 [patent_app_number] => 7/744858 [patent_app_country] => US [patent_app_date] => 1991-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 24 [patent_no_of_words] => 6858 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 231 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/204/05204614.pdf [firstpage_image] =>[orig_patent_app_number] => 744858 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/744858
Broad-band microwave power sensor using diodes above their resonant frequency Aug 13, 1991 Issued
Array ( [id] => 2853179 [patent_doc_number] => 05111136 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-05-05 [patent_title] => 'Semiconductor circuit' [patent_app_type] => 1 [patent_app_number] => 7/746148 [patent_app_country] => US [patent_app_date] => 1991-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2682 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/111/05111136.pdf [firstpage_image] =>[orig_patent_app_number] => 746148 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/746148
Semiconductor circuit Aug 13, 1991 Issued
Array ( [id] => 2965157 [patent_doc_number] => 05198752 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-03-30 [patent_title] => 'Electric probing-test machine having a cooling system' [patent_app_type] => 1 [patent_app_number] => 7/738304 [patent_app_country] => US [patent_app_date] => 1991-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 25 [patent_no_of_words] => 8855 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/198/05198752.pdf [firstpage_image] =>[orig_patent_app_number] => 738304 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/738304
Electric probing-test machine having a cooling system Jul 30, 1991 Issued
Array ( [id] => 2898051 [patent_doc_number] => 05210485 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-05-11 [patent_title] => 'Probe for wafer burn-in test system' [patent_app_type] => 1 [patent_app_number] => 7/736899 [patent_app_country] => US [patent_app_date] => 1991-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4748 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/210/05210485.pdf [firstpage_image] =>[orig_patent_app_number] => 736899 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/736899
Probe for wafer burn-in test system Jul 25, 1991 Issued
Array ( [id] => 2913344 [patent_doc_number] => 05216361 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-06-01 [patent_title] => 'Modular board test system having wireless receiver' [patent_app_type] => 1 [patent_app_number] => 7/727278 [patent_app_country] => US [patent_app_date] => 1991-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 15 [patent_no_of_words] => 5283 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/216/05216361.pdf [firstpage_image] =>[orig_patent_app_number] => 727278 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/727278
Modular board test system having wireless receiver Jul 9, 1991 Issued
Array ( [id] => 2980687 [patent_doc_number] => 05208529 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-05-04 [patent_title] => 'Electric device contact assembly' [patent_app_type] => 1 [patent_app_number] => 7/725334 [patent_app_country] => US [patent_app_date] => 1991-07-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 11 [patent_no_of_words] => 4336 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/208/05208529.pdf [firstpage_image] =>[orig_patent_app_number] => 725334 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/725334
Electric device contact assembly Jul 2, 1991 Issued
Array ( [id] => 2845727 [patent_doc_number] => 05172053 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-12-15 [patent_title] => 'Prober apparatus' [patent_app_type] => 1 [patent_app_number] => 7/726725 [patent_app_country] => US [patent_app_date] => 1991-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 18 [patent_no_of_words] => 4744 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 303 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/172/05172053.pdf [firstpage_image] =>[orig_patent_app_number] => 726725 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/726725
Prober apparatus Jun 30, 1991 Issued
Array ( [id] => 2932927 [patent_doc_number] => 05187431 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-02-16 [patent_title] => 'Universal multicontact connection between an EWS probe card and a test card of a \"test-on-wafer\" station' [patent_app_type] => 1 [patent_app_number] => 7/716704 [patent_app_country] => US [patent_app_date] => 1991-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2780 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/187/05187431.pdf [firstpage_image] =>[orig_patent_app_number] => 716704 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/716704
Universal multicontact connection between an EWS probe card and a test card of a "test-on-wafer" station Jun 17, 1991 Issued
Array ( [id] => 2898088 [patent_doc_number] => 05210487 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-05-11 [patent_title] => 'Double-gated integrating scheme for electron beam tester' [patent_app_type] => 1 [patent_app_number] => 7/710768 [patent_app_country] => US [patent_app_date] => 1991-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 7610 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 229 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/210/05210487.pdf [firstpage_image] =>[orig_patent_app_number] => 710768 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/710768
Double-gated integrating scheme for electron beam tester Jun 3, 1991 Issued
07/707844 APPARATUS AND METHOD FOR TESTING ELECTRONIC DEVICES May 29, 1991 Abandoned
Array ( [id] => 2828447 [patent_doc_number] => 05095267 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-03-10 [patent_title] => 'Method of screening A.C. performance characteristics during D.C. parametric test operation' [patent_app_type] => 1 [patent_app_number] => 7/706788 [patent_app_country] => US [patent_app_date] => 1991-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4715 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/095/05095267.pdf [firstpage_image] =>[orig_patent_app_number] => 706788 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/706788
Method of screening A.C. performance characteristics during D.C. parametric test operation May 28, 1991 Issued
Array ( [id] => 2899041 [patent_doc_number] => 05177436 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-01-05 [patent_title] => 'Contactor for testing integrated circuit chips mounted in molded carrier rings' [patent_app_type] => 1 [patent_app_number] => 7/703604 [patent_app_country] => US [patent_app_date] => 1991-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 3932 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 235 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/177/05177436.pdf [firstpage_image] =>[orig_patent_app_number] => 703604 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/703604
Contactor for testing integrated circuit chips mounted in molded carrier rings May 20, 1991 Issued
Array ( [id] => 2853086 [patent_doc_number] => 05107206 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-04-21 [patent_title] => 'Printed circuit board inspection apparatus' [patent_app_type] => 1 [patent_app_number] => 7/702858 [patent_app_country] => US [patent_app_date] => 1991-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 23 [patent_no_of_words] => 4765 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 219 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/107/05107206.pdf [firstpage_image] =>[orig_patent_app_number] => 702858 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/702858
Printed circuit board inspection apparatus May 19, 1991 Issued
07/702218 ELECTRONIC WATTHOUR METER May 16, 1991 Abandoned
Array ( [id] => 2825564 [patent_doc_number] => 05168217 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-12-01 [patent_title] => 'Method of detecting floated lead of electrical component' [patent_app_type] => 1 [patent_app_number] => 7/696388 [patent_app_country] => US [patent_app_date] => 1991-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 1467 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/168/05168217.pdf [firstpage_image] =>[orig_patent_app_number] => 696388 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/696388
Method of detecting floated lead of electrical component May 5, 1991 Issued
Array ( [id] => 2800166 [patent_doc_number] => 05144228 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-09-01 [patent_title] => 'Probe interface assembly' [patent_app_type] => 1 [patent_app_number] => 7/690404 [patent_app_country] => US [patent_app_date] => 1991-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 7156 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 285 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/144/05144228.pdf [firstpage_image] =>[orig_patent_app_number] => 690404 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/690404
Probe interface assembly Apr 22, 1991 Issued
Array ( [id] => 2860260 [patent_doc_number] => 05113130 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-05-12 [patent_title] => 'Testing operation of electric energy meter optics system' [patent_app_type] => 1 [patent_app_number] => 7/687788 [patent_app_country] => US [patent_app_date] => 1991-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3540 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/113/05113130.pdf [firstpage_image] =>[orig_patent_app_number] => 687788 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/687788
Testing operation of electric energy meter optics system Apr 21, 1991 Issued
07/685878 ACTIVE PROBE CARD Apr 14, 1991 Abandoned
Array ( [id] => 2939915 [patent_doc_number] => 05196784 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-03-23 [patent_title] => 'Isolated current monitoring circuit for measuring direct and high duty factor currents' [patent_app_type] => 1 [patent_app_number] => 7/670664 [patent_app_country] => US [patent_app_date] => 1991-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 29 [patent_no_of_words] => 8529 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 319 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/196/05196784.pdf [firstpage_image] =>[orig_patent_app_number] => 670664 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/670664
Isolated current monitoring circuit for measuring direct and high duty factor currents Mar 17, 1991 Issued
Array ( [id] => 2779607 [patent_doc_number] => 05132612 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-07-21 [patent_title] => 'Apparatus for electrostatic discharge (ESD) stress/testing' [patent_app_type] => 1 [patent_app_number] => 7/669254 [patent_app_country] => US [patent_app_date] => 1991-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 1927 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/132/05132612.pdf [firstpage_image] =>[orig_patent_app_number] => 669254 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/669254
Apparatus for electrostatic discharge (ESD) stress/testing Mar 13, 1991 Issued
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