Search

Robert Chevalier

Examiner (ID: 17308, Phone: (571)272-7374 , Office: P/2484 )

Most Active Art Unit
2484
Art Unit(s)
2715, 2615, 2604, 2616, 2712, 2318, 2484, 2621, 2305
Total Applications
2466
Issued Applications
2139
Pending Applications
77
Abandoned Applications
264

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2927341 [patent_doc_number] => 05200693 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-04-06 [patent_title] => 'Method for determining characteristics of pn semiconductor structures' [patent_app_type] => 1 [patent_app_number] => 7/661019 [patent_app_country] => US [patent_app_date] => 1991-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 5517 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/200/05200693.pdf [firstpage_image] =>[orig_patent_app_number] => 661019 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/661019
Method for determining characteristics of pn semiconductor structures Feb 25, 1991 Issued
07/660014 IC TESTER Feb 24, 1991 Abandoned
Array ( [id] => 2787135 [patent_doc_number] => 05087877 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-02-11 [patent_title] => 'Test contact fixture using flexible circuit tape' [patent_app_type] => 1 [patent_app_number] => 7/659644 [patent_app_country] => US [patent_app_date] => 1991-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2928 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/087/05087877.pdf [firstpage_image] =>[orig_patent_app_number] => 659644 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/659644
Test contact fixture using flexible circuit tape Feb 24, 1991 Issued
Array ( [id] => 2793612 [patent_doc_number] => 05101150 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-03-31 [patent_title] => 'Automatic circuit tester with separate instrument and scanner buses' [patent_app_type] => 1 [patent_app_number] => 7/660289 [patent_app_country] => US [patent_app_date] => 1991-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 6130 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 293 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/101/05101150.pdf [firstpage_image] =>[orig_patent_app_number] => 660289 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/660289
Automatic circuit tester with separate instrument and scanner buses Feb 21, 1991 Issued
Array ( [id] => 2811369 [patent_doc_number] => 05157325 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-10-20 [patent_title] => 'Compact, wireless apparatus for electrically testing printed circuit boards' [patent_app_type] => 1 [patent_app_number] => 7/656578 [patent_app_country] => US [patent_app_date] => 1991-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 6787 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 398 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/157/05157325.pdf [firstpage_image] =>[orig_patent_app_number] => 656578 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/656578
Compact, wireless apparatus for electrically testing printed circuit boards Feb 14, 1991 Issued
Array ( [id] => 2864604 [patent_doc_number] => 05150043 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-09-22 [patent_title] => 'Apparatus and method for non-contact surface voltage probing by scanning photoelectron emission' [patent_app_type] => 1 [patent_app_number] => 7/653829 [patent_app_country] => US [patent_app_date] => 1991-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1972 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/150/05150043.pdf [firstpage_image] =>[orig_patent_app_number] => 653829 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/653829
Apparatus and method for non-contact surface voltage probing by scanning photoelectron emission Feb 10, 1991 Issued
Array ( [id] => 2809779 [patent_doc_number] => 05115189 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-05-19 [patent_title] => 'Anti-aliasing dithering method and apparatus for low frequency signal sampling' [patent_app_type] => 1 [patent_app_number] => 7/651694 [patent_app_country] => US [patent_app_date] => 1991-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 2822 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/115/05115189.pdf [firstpage_image] =>[orig_patent_app_number] => 651694 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/651694
Anti-aliasing dithering method and apparatus for low frequency signal sampling Feb 5, 1991 Issued
Array ( [id] => 2791834 [patent_doc_number] => 05155431 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-10-13 [patent_title] => 'Very fast autoscale topology for digitizing oscilloscopes' [patent_app_type] => 1 [patent_app_number] => 7/651674 [patent_app_country] => US [patent_app_date] => 1991-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2778 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/155/05155431.pdf [firstpage_image] =>[orig_patent_app_number] => 651674 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/651674
Very fast autoscale topology for digitizing oscilloscopes Feb 5, 1991 Issued
Array ( [id] => 2791466 [patent_doc_number] => 05130644 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-07-14 [patent_title] => 'Integrated circuit self-testing device and method' [patent_app_type] => 1 [patent_app_number] => 7/648329 [patent_app_country] => US [patent_app_date] => 1991-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2085 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/130/05130644.pdf [firstpage_image] =>[orig_patent_app_number] => 648329 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/648329
Integrated circuit self-testing device and method Jan 28, 1991 Issued
07/646268 TESTABILITY CIRCUIT FOR LOGIC CIRCUIT ARRAYS Jan 27, 1991 Abandoned
Array ( [id] => 2845617 [patent_doc_number] => 05172047 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-12-15 [patent_title] => 'Semiconductor test apparatus' [patent_app_type] => 1 [patent_app_number] => 7/644634 [patent_app_country] => US [patent_app_date] => 1991-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3608 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 245 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/172/05172047.pdf [firstpage_image] =>[orig_patent_app_number] => 644634 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/644634
Semiconductor test apparatus Jan 22, 1991 Issued
07/643599 METHOD TO REDUCE TEST VECTORS/TEST TIME IN DEVICES USING EQUIVALENT BLOCKS Jan 21, 1991 Abandoned
Array ( [id] => 2913319 [patent_doc_number] => 05216359 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-06-01 [patent_title] => 'Electro-optical method and apparatus for testing integrated circuits' [patent_app_type] => 1 [patent_app_number] => 7/644038 [patent_app_country] => US [patent_app_date] => 1991-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 23 [patent_no_of_words] => 4969 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/216/05216359.pdf [firstpage_image] =>[orig_patent_app_number] => 644038 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/644038
Electro-optical method and apparatus for testing integrated circuits Jan 17, 1991 Issued
Array ( [id] => 2841667 [patent_doc_number] => 05121052 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-06-09 [patent_title] => 'Automated handler for semiconductor devices' [patent_app_type] => 1 [patent_app_number] => 7/642774 [patent_app_country] => US [patent_app_date] => 1991-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2287 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/121/05121052.pdf [firstpage_image] =>[orig_patent_app_number] => 642774 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/642774
Automated handler for semiconductor devices Jan 17, 1991 Issued
07/641699 LSI TEST CIRCUIT Jan 15, 1991 Abandoned
07/640198 WAFER BURN-IN AND TEST SYSTEM Jan 10, 1991 Abandoned
Array ( [id] => 2878199 [patent_doc_number] => 05091692 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-02-25 [patent_title] => 'Probing test device' [patent_app_type] => 1 [patent_app_number] => 7/636094 [patent_app_country] => US [patent_app_date] => 1990-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 4511 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/091/05091692.pdf [firstpage_image] =>[orig_patent_app_number] => 636094 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/636094
Probing test device Dec 30, 1990 Issued
Array ( [id] => 2719524 [patent_doc_number] => 05053693 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-10-01 [patent_title] => 'Fibreoptical sensor' [patent_app_type] => 1 [patent_app_number] => 7/631439 [patent_app_country] => US [patent_app_date] => 1990-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 6696 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/053/05053693.pdf [firstpage_image] =>[orig_patent_app_number] => 631439 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/631439
Fibreoptical sensor Dec 20, 1990 Issued
Array ( [id] => 2713865 [patent_doc_number] => 05061894 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-10-29 [patent_title] => 'Probe device' [patent_app_type] => 1 [patent_app_number] => 7/633254 [patent_app_country] => US [patent_app_date] => 1990-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 4035 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 314 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/061/05061894.pdf [firstpage_image] =>[orig_patent_app_number] => 633254 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/633254
Probe device Dec 20, 1990 Issued
Array ( [id] => 2779553 [patent_doc_number] => 05132609 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-07-21 [patent_title] => 'Circuit for measuring the level of an electrical signal and including offset correction means, and application thereof to amplifiers having automatic gain control' [patent_app_type] => 1 [patent_app_number] => 7/629904 [patent_app_country] => US [patent_app_date] => 1990-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3911 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/132/05132609.pdf [firstpage_image] =>[orig_patent_app_number] => 629904 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/629904
Circuit for measuring the level of an electrical signal and including offset correction means, and application thereof to amplifiers having automatic gain control Dec 18, 1990 Issued
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