Search

Robert Chevalier

Examiner (ID: 17308, Phone: (571)272-7374 , Office: P/2484 )

Most Active Art Unit
2484
Art Unit(s)
2715, 2615, 2604, 2616, 2712, 2318, 2484, 2621, 2305
Total Applications
2466
Issued Applications
2139
Pending Applications
77
Abandoned Applications
264

Applications

Application numberTitle of the applicationFiling DateStatus
07/628133 TESTING OPERATION OF ELECTRIC ENERGY METER DEVICE SYSTEM Dec 16, 1990 Abandoned
07/625246 ELECTRONIC WATTHOUR METER Dec 9, 1990 Abandoned
Array ( [id] => 2875038 [patent_doc_number] => 05162727 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-11-10 [patent_title] => 'Method and apparatus of determining the stator flux estimate of an electric machine' [patent_app_type] => 1 [patent_app_number] => 7/623699 [patent_app_country] => US [patent_app_date] => 1990-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2422 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/162/05162727.pdf [firstpage_image] =>[orig_patent_app_number] => 623699 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/623699
Method and apparatus of determining the stator flux estimate of an electric machine Dec 6, 1990 Issued
Array ( [id] => 2711386 [patent_doc_number] => 05068598 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-11-26 [patent_title] => 'Tension potential measuring circuit with selected time constant' [patent_app_type] => 1 [patent_app_number] => 7/620798 [patent_app_country] => US [patent_app_date] => 1990-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1600 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/068/05068598.pdf [firstpage_image] =>[orig_patent_app_number] => 620798 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/620798
Tension potential measuring circuit with selected time constant Dec 2, 1990 Issued
Array ( [id] => 2764505 [patent_doc_number] => 05059893 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-10-22 [patent_title] => 'AC evaluation equipment for an IC tester' [patent_app_type] => 1 [patent_app_number] => 7/620788 [patent_app_country] => US [patent_app_date] => 1990-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 3820 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 316 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/059/05059893.pdf [firstpage_image] =>[orig_patent_app_number] => 620788 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/620788
AC evaluation equipment for an IC tester Dec 2, 1990 Issued
Array ( [id] => 2787156 [patent_doc_number] => 05087878 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-02-11 [patent_title] => 'Top-accessible system, and related methods, for simultaneously testing the opposite sides of printed circuit board' [patent_app_type] => 1 [patent_app_number] => 7/621324 [patent_app_country] => US [patent_app_date] => 1990-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 6992 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 275 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/087/05087878.pdf [firstpage_image] =>[orig_patent_app_number] => 621324 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/621324
Top-accessible system, and related methods, for simultaneously testing the opposite sides of printed circuit board Nov 29, 1990 Issued
Array ( [id] => 2807353 [patent_doc_number] => 05124624 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-06-23 [patent_title] => 'Arrangement for electrical measurement' [patent_app_type] => 1 [patent_app_number] => 7/618478 [patent_app_country] => US [patent_app_date] => 1990-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5413 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/124/05124624.pdf [firstpage_image] =>[orig_patent_app_number] => 618478 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/618478
Arrangement for electrical measurement Nov 26, 1990 Issued
Array ( [id] => 2789868 [patent_doc_number] => 05142221 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-08-25 [patent_title] => 'Automatic function selecting multimeter' [patent_app_type] => 1 [patent_app_number] => 7/615169 [patent_app_country] => US [patent_app_date] => 1990-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5336 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/142/05142221.pdf [firstpage_image] =>[orig_patent_app_number] => 615169 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/615169
Automatic function selecting multimeter Nov 22, 1990 Issued
Array ( [id] => 2873353 [patent_doc_number] => 05153507 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-10-06 [patent_title] => 'Multi-purpose bond pad test die' [patent_app_type] => 1 [patent_app_number] => 7/614404 [patent_app_country] => US [patent_app_date] => 1990-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 4159 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/153/05153507.pdf [firstpage_image] =>[orig_patent_app_number] => 614404 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/614404
Multi-purpose bond pad test die Nov 15, 1990 Issued
Array ( [id] => 2951822 [patent_doc_number] => 05180975 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-01-19 [patent_title] => 'Positioning device and IC conveyor utilizing the same' [patent_app_type] => 1 [patent_app_number] => 7/612434 [patent_app_country] => US [patent_app_date] => 1990-11-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 3668 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/180/05180975.pdf [firstpage_image] =>[orig_patent_app_number] => 612434 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/612434
Positioning device and IC conveyor utilizing the same Nov 13, 1990 Issued
Array ( [id] => 2864657 [patent_doc_number] => 05166604 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-11-24 [patent_title] => 'Methods and apparatus for facilitating scan testing of asynchronous logic circuitry' [patent_app_type] => 1 [patent_app_number] => 7/611974 [patent_app_country] => US [patent_app_date] => 1990-11-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2889 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/166/05166604.pdf [firstpage_image] =>[orig_patent_app_number] => 611974 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/611974
Methods and apparatus for facilitating scan testing of asynchronous logic circuitry Nov 12, 1990 Issued
Array ( [id] => 2853194 [patent_doc_number] => 05111137 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-05-05 [patent_title] => 'Method and apparatus for the detection of leakage current' [patent_app_type] => 1 [patent_app_number] => 7/605289 [patent_app_country] => US [patent_app_date] => 1990-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 3015 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/111/05111137.pdf [firstpage_image] =>[orig_patent_app_number] => 605289 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/605289
Method and apparatus for the detection of leakage current Oct 28, 1990 Issued
07/600384 PSEUDO-RANDOM SCAN TEST APPARATUS Oct 18, 1990 Abandoned
07/598889 METHOD FOR MEASURING DC CURRENT/VOLTAGE CHARACTERISTIC OF SEMICONDUCTOR DEVICE Oct 18, 1990 Abandoned
Array ( [id] => 2853068 [patent_doc_number] => 05107205 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-04-21 [patent_title] => 'Semiconductor device tester with a test waveform monitoring circuit' [patent_app_type] => 1 [patent_app_number] => 7/599839 [patent_app_country] => US [patent_app_date] => 1990-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 2748 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/107/05107205.pdf [firstpage_image] =>[orig_patent_app_number] => 599839 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/599839
Semiconductor device tester with a test waveform monitoring circuit Oct 18, 1990 Issued
Array ( [id] => 2857888 [patent_doc_number] => 05126661 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-06-30 [patent_title] => 'Optical probing method and apparatus' [patent_app_type] => 1 [patent_app_number] => 7/599579 [patent_app_country] => US [patent_app_date] => 1990-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 3293 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/126/05126661.pdf [firstpage_image] =>[orig_patent_app_number] => 599579 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/599579
Optical probing method and apparatus Oct 17, 1990 Issued
Array ( [id] => 2779533 [patent_doc_number] => 05132608 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-07-21 [patent_title] => 'Current measuring method and apparatus therefor' [patent_app_type] => 1 [patent_app_number] => 7/598918 [patent_app_country] => US [patent_app_date] => 1990-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 2472 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 207 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/132/05132608.pdf [firstpage_image] =>[orig_patent_app_number] => 598918 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/598918
Current measuring method and apparatus therefor Oct 14, 1990 Issued
07/596229 METHOD AND APPARATUS FOR MAPPING TEST SIGNALS OF AN INTEGRATED CIRCUIT Oct 11, 1990 Abandoned
07/590198 PNEUMATIC ENERGY FLUXMETER Sep 27, 1990 Abandoned
Array ( [id] => 2781237 [patent_doc_number] => 05151652 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-09-29 [patent_title] => 'Measuring position for microwave components' [patent_app_type] => 1 [patent_app_number] => 7/589214 [patent_app_country] => US [patent_app_date] => 1990-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 4768 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/151/05151652.pdf [firstpage_image] =>[orig_patent_app_number] => 589214 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/589214
Measuring position for microwave components Sep 27, 1990 Issued
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