Search

Robert Chevalier

Examiner (ID: 17308, Phone: (571)272-7374 , Office: P/2484 )

Most Active Art Unit
2484
Art Unit(s)
2715, 2615, 2604, 2616, 2712, 2318, 2484, 2621, 2305
Total Applications
2466
Issued Applications
2139
Pending Applications
77
Abandoned Applications
264

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2878236 [patent_doc_number] => 05091694 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-02-25 [patent_title] => 'Quartz probe apparatus' [patent_app_type] => 1 [patent_app_number] => 7/472228 [patent_app_country] => US [patent_app_date] => 1990-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 4036 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/091/05091694.pdf [firstpage_image] =>[orig_patent_app_number] => 472228 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/472228
Quartz probe apparatus Jan 29, 1990 Issued
Array ( [id] => 2638896 [patent_doc_number] => 04952871 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-08-28 [patent_title] => 'Method and apparatus of testing printed circuit boards and assembly employable therewith' [patent_app_type] => 1 [patent_app_number] => 7/469717 [patent_app_country] => US [patent_app_date] => 1990-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 5178 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 242 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/952/04952871.pdf [firstpage_image] =>[orig_patent_app_number] => 469717 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/469717
Method and apparatus of testing printed circuit boards and assembly employable therewith Jan 23, 1990 Issued
Array ( [id] => 2722072 [patent_doc_number] => 05008618 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-04-16 [patent_title] => 'Scan test apparatus for asynchronous circuitry' [patent_app_type] => 1 [patent_app_number] => 7/468534 [patent_app_country] => US [patent_app_date] => 1990-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 3026 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/008/05008618.pdf [firstpage_image] =>[orig_patent_app_number] => 468534 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/468534
Scan test apparatus for asynchronous circuitry Jan 22, 1990 Issued
Array ( [id] => 2687045 [patent_doc_number] => 05045782 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-09-03 [patent_title] => 'Negative feedback high current driver for in-circuit tester' [patent_app_type] => 1 [patent_app_number] => 7/469668 [patent_app_country] => US [patent_app_date] => 1990-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2557 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/045/05045782.pdf [firstpage_image] =>[orig_patent_app_number] => 469668 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/469668
Negative feedback high current driver for in-circuit tester Jan 22, 1990 Issued
Array ( [id] => 2754067 [patent_doc_number] => 05030908 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-07-09 [patent_title] => 'Method of testing semiconductor elements and apparatus for testing the same' [patent_app_type] => 1 [patent_app_number] => 7/468934 [patent_app_country] => US [patent_app_date] => 1990-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 12 [patent_no_of_words] => 5002 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/030/05030908.pdf [firstpage_image] =>[orig_patent_app_number] => 468934 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/468934
Method of testing semiconductor elements and apparatus for testing the same Jan 22, 1990 Issued
Array ( [id] => 2713885 [patent_doc_number] => 05061895 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-10-29 [patent_title] => 'System for detecting and correcting misalignment of semiconductor package leads' [patent_app_type] => 1 [patent_app_number] => 7/467714 [patent_app_country] => US [patent_app_date] => 1990-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3419 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/061/05061895.pdf [firstpage_image] =>[orig_patent_app_number] => 467714 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/467714
System for detecting and correcting misalignment of semiconductor package leads Jan 18, 1990 Issued
Array ( [id] => 2674758 [patent_doc_number] => 05047709 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-09-10 [patent_title] => 'Calibrated voltage cursors' [patent_app_type] => 1 [patent_app_number] => 7/465859 [patent_app_country] => US [patent_app_date] => 1990-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 858 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/047/05047709.pdf [firstpage_image] =>[orig_patent_app_number] => 465859 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/465859
Calibrated voltage cursors Jan 15, 1990 Issued
Array ( [id] => 2817401 [patent_doc_number] => 05086271 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-02-04 [patent_title] => 'Driver system and distributed transmission line network for driving devices under test' [patent_app_type] => 1 [patent_app_number] => 7/464404 [patent_app_country] => US [patent_app_date] => 1990-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 5034 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/086/05086271.pdf [firstpage_image] =>[orig_patent_app_number] => 464404 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/464404
Driver system and distributed transmission line network for driving devices under test Jan 11, 1990 Issued
Array ( [id] => 2754645 [patent_doc_number] => 05021733 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-06-04 [patent_title] => 'Burn-in apparatus' [patent_app_type] => 1 [patent_app_number] => 7/463544 [patent_app_country] => US [patent_app_date] => 1990-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 1953 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/021/05021733.pdf [firstpage_image] =>[orig_patent_app_number] => 463544 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/463544
Burn-in apparatus Jan 10, 1990 Issued
Array ( [id] => 2600818 [patent_doc_number] => 04975637 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-12-04 [patent_title] => 'Method and apparatus for integrated circuit device testing' [patent_app_type] => 1 [patent_app_number] => 7/459088 [patent_app_country] => US [patent_app_date] => 1989-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2635 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/975/04975637.pdf [firstpage_image] =>[orig_patent_app_number] => 459088 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/459088
Method and apparatus for integrated circuit device testing Dec 28, 1989 Issued
Array ( [id] => 2740277 [patent_doc_number] => 05077521 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-12-31 [patent_title] => 'Supply connection integrity monitor' [patent_app_type] => 1 [patent_app_number] => 7/456759 [patent_app_country] => US [patent_app_date] => 1989-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4565 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/077/05077521.pdf [firstpage_image] =>[orig_patent_app_number] => 456759 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/456759
Supply connection integrity monitor Dec 25, 1989 Issued
Array ( [id] => 2853104 [patent_doc_number] => 05107207 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-04-21 [patent_title] => 'Method and an apparatus for testing AC characteristics of an integrated circuit' [patent_app_type] => 1 [patent_app_number] => 7/451878 [patent_app_country] => US [patent_app_date] => 1989-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 15 [patent_no_of_words] => 4400 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/107/05107207.pdf [firstpage_image] =>[orig_patent_app_number] => 451878 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/451878
Method and an apparatus for testing AC characteristics of an integrated circuit Dec 17, 1989 Issued
Array ( [id] => 2711739 [patent_doc_number] => 05001419 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-03-19 [patent_title] => 'Method of deriving an AC waveform from two phase shifted electrical signals' [patent_app_type] => 1 [patent_app_number] => 7/450974 [patent_app_country] => US [patent_app_date] => 1989-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 6693 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/001/05001419.pdf [firstpage_image] =>[orig_patent_app_number] => 450974 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/450974
Method of deriving an AC waveform from two phase shifted electrical signals Dec 14, 1989 Issued
Array ( [id] => 2738374 [patent_doc_number] => 05039936 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-08-13 [patent_title] => 'Voltage rotation indicator mounting apparatus' [patent_app_type] => 1 [patent_app_number] => 7/450289 [patent_app_country] => US [patent_app_date] => 1989-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2209 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/039/05039936.pdf [firstpage_image] =>[orig_patent_app_number] => 450289 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/450289
Voltage rotation indicator mounting apparatus Dec 12, 1989 Issued
Array ( [id] => 2764585 [patent_doc_number] => 05059897 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-10-22 [patent_title] => 'Method and apparatus for testing passive substrates for integrated circuit mounting' [patent_app_type] => 1 [patent_app_number] => 7/447328 [patent_app_country] => US [patent_app_date] => 1989-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2965 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/059/05059897.pdf [firstpage_image] =>[orig_patent_app_number] => 447328 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/447328
Method and apparatus for testing passive substrates for integrated circuit mounting Dec 6, 1989 Issued
Array ( [id] => 2675428 [patent_doc_number] => 05034681 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-07-23 [patent_title] => 'Voltage detection' [patent_app_type] => 1 [patent_app_number] => 7/447099 [patent_app_country] => US [patent_app_date] => 1989-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1422 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/034/05034681.pdf [firstpage_image] =>[orig_patent_app_number] => 447099 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/447099
Voltage detection Dec 5, 1989 Issued
Array ( [id] => 2687008 [patent_doc_number] => 05045780 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-09-03 [patent_title] => 'Electrical test probe contact tip' [patent_app_type] => 1 [patent_app_number] => 7/445979 [patent_app_country] => US [patent_app_date] => 1989-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 5 [patent_no_of_words] => 3131 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 284 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/045/05045780.pdf [firstpage_image] =>[orig_patent_app_number] => 445979 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/445979
Electrical test probe contact tip Dec 3, 1989 Issued
Array ( [id] => 2677102 [patent_doc_number] => 04983909 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-01-08 [patent_title] => 'Repetitive-switching' [patent_app_type] => 1 [patent_app_number] => 7/442289 [patent_app_country] => US [patent_app_date] => 1989-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 5 [patent_no_of_words] => 4296 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 268 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/983/04983909.pdf [firstpage_image] =>[orig_patent_app_number] => 442289 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/442289
Repetitive-switching Nov 27, 1989 Issued
Array ( [id] => 2672947 [patent_doc_number] => 04935696 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-06-19 [patent_title] => 'Test pin assembly for circuit board tester' [patent_app_type] => 1 [patent_app_number] => 7/438734 [patent_app_country] => US [patent_app_date] => 1989-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 4456 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 19 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/935/04935696.pdf [firstpage_image] =>[orig_patent_app_number] => 438734 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/438734
Test pin assembly for circuit board tester Nov 16, 1989 Issued
Array ( [id] => 2796180 [patent_doc_number] => 05103169 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-04-07 [patent_title] => 'Relayless interconnections in high performance signal paths' [patent_app_type] => 1 [patent_app_number] => 7/436844 [patent_app_country] => US [patent_app_date] => 1989-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2416 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/103/05103169.pdf [firstpage_image] =>[orig_patent_app_number] => 436844 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/436844
Relayless interconnections in high performance signal paths Nov 14, 1989 Issued
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