
Robert H. Kim
Supervisory Patent Examiner (ID: 12136, Phone: (571)272-2293 , Office: P/2881 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2505, 2882, 2881, 2877, 2871 |
| Total Applications | 848 |
| Issued Applications | 640 |
| Pending Applications | 106 |
| Abandoned Applications | 102 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4008081
[patent_doc_number] => 05923426
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-07-13
[patent_title] => 'Bi-lateral shearing interferometer'
[patent_app_type] => 1
[patent_app_number] => 9/121985
[patent_app_country] => US
[patent_app_date] => 1998-07-24
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[pdf_file] => patents/05/923/05923426.pdf
[firstpage_image] =>[orig_patent_app_number] => 121985
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/121985 | Bi-lateral shearing interferometer | Jul 23, 1998 | Issued |
Array
(
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[patent_doc_number] => 06020964
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[patent_issue_date] => 2000-02-01
[patent_title] => 'Interferometer system and lithograph apparatus including an interferometer system'
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Array
(
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[patent_title] => 'Inspection system simultaneously utilizing monochromatic darkfield and broadband brightfield illumination sources'
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Array
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[patent_issue_date] => 1999-12-07
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[patent_app_type] => 1
[patent_app_number] => 9/113668
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Array
(
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Array
(
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[patent_issue_date] => 2000-03-14
[patent_title] => 'Apparatus and method for the determination of grain size in thin films'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/110886 | Apparatus and method for the determination of grain size in thin films | Jul 6, 1998 | Issued |
Array
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[patent_title] => 'Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers'
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[patent_app_number] => 9/107353
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Array
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[patent_title] => 'Three-dimensional light absorption spectroscopic imaging'
[patent_app_type] => 1
[patent_app_number] => 9/106247
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/106247 | Three-dimensional light absorption spectroscopic imaging | Jun 28, 1998 | Issued |
Array
(
[id] => 4118474
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[patent_title] => 'Two piece mirror arrangement for interferometrically controlled stage'
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Array
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[patent_title] => 'Alignment device and lithographic apparatus comprising such a device'
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Array
(
[id] => 3934812
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[patent_title] => 'Interference removal'
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Array
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Array
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Array
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| 09/077566 | MIRROR ANGLE DETECTOR AND DETECTION METHOD | May 31, 1998 | Abandoned |
Array
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Array
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Array
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