
Robert H. Kim
Supervisory Patent Examiner (ID: 12136, Phone: (571)272-2293 , Office: P/2881 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2505, 2882, 2881, 2877, 2871 |
| Total Applications | 848 |
| Issued Applications | 640 |
| Pending Applications | 106 |
| Abandoned Applications | 102 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4032414
[patent_doc_number] => 05926280
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-07-20
[patent_title] => 'Fire detection system utilizing relationship of correspondence with regard to image overlap'
[patent_app_type] => 1
[patent_app_number] => 8/901074
[patent_app_country] => US
[patent_app_date] => 1997-07-28
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[pdf_file] => patents/05/926/05926280.pdf
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Array
(
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[patent_doc_number] => 05898501
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[patent_kind] => NA
[patent_issue_date] => 1999-04-27
[patent_title] => 'Apparatus and methods for measuring wavefront aberrations of a microlithography projection lens'
[patent_app_type] => 1
[patent_app_number] => 8/899688
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Array
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[patent_title] => 'Signal processing for in situ monitoring of the formation or removal of a transparent layer'
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Array
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[patent_issue_date] => 1998-11-10
[patent_title] => 'Moire interferometry system and method with extended imaging depth'
[patent_app_type] => 1
[patent_app_number] => 8/898647
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Array
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Array
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Array
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Array
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[patent_title] => 'Heterodyne interferometry method for measuring physical parameters of medium'
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Array
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Array
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[patent_title] => 'Compact fiber optic electronic laser speckle pattern interferometer'
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Array
(
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[patent_title] => 'Determination of light absorption pathlength in a vertical-beam photometer'
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Array
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[patent_title] => 'Method and apparatus for measuring the concentration of ions implanted in semiconductor materials'
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Array
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Array
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Array
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Array
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Array
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