
Robert H. Kim
Supervisory Patent Examiner (ID: 4443, Phone: (571)272-2293 , Office: P/2881 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2505, 2882, 2877, 2881, 2871 |
| Total Applications | 836 |
| Issued Applications | 633 |
| Pending Applications | 107 |
| Abandoned Applications | 102 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4214635
[patent_doc_number] => 06078392
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-06-20
[patent_title] => 'Direct-to-digital holography and holovision'
[patent_app_type] => 1
[patent_app_number] => 8/873252
[patent_app_country] => US
[patent_app_date] => 1997-06-11
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 7038
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/078/06078392.pdf
[firstpage_image] =>[orig_patent_app_number] => 873252
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/873252 | Direct-to-digital holography and holovision | Jun 10, 1997 | Issued |
Array
(
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[patent_doc_number] => 06122043
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[patent_kind] => NA
[patent_issue_date] => 2000-09-19
[patent_title] => 'Method and apparatus for electrically reducing coherence/polarization noise in reflectometers'
[patent_app_type] => 1
[patent_app_number] => 8/869333
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[patent_app_date] => 1997-06-05
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Array
(
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[patent_issue_date] => 2000-04-25
[patent_title] => 'Method and apparatus for using phase modulation to reduce coherence/polarization noise in reflectometers'
[patent_app_type] => 1
[patent_app_number] => 8/869340
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Array
(
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[patent_doc_number] => 05923414
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[patent_kind] => NA
[patent_issue_date] => 1999-07-13
[patent_title] => 'Method and apparatus for thermally reducing coherence/polarization noise in reflectometers'
[patent_app_type] => 1
[patent_app_number] => 8/869721
[patent_app_country] => US
[patent_app_date] => 1997-06-05
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[firstpage_image] =>[orig_patent_app_number] => 869721
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/869721 | Method and apparatus for thermally reducing coherence/polarization noise in reflectometers | Jun 4, 1997 | Issued |
Array
(
[id] => 3946960
[patent_doc_number] => 05872624
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[patent_kind] => NA
[patent_issue_date] => 1999-02-16
[patent_title] => 'Method and apparatus for retroreflectively reducing coherence/polarization noise in reflectometers'
[patent_app_type] => 1
[patent_app_number] => 8/869641
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Array
(
[id] => 4114888
[patent_doc_number] => 06100987
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[patent_kind] => NA
[patent_issue_date] => 2000-08-08
[patent_title] => 'Position detecting apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/869220
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[firstpage_image] =>[orig_patent_app_number] => 869220
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/869220 | Position detecting apparatus | Jun 3, 1997 | Issued |
Array
(
[id] => 4032249
[patent_doc_number] => 05926268
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[patent_kind] => NA
[patent_issue_date] => 1999-07-20
[patent_title] => 'System and method for stress detection in a molded container'
[patent_app_type] => 1
[patent_app_number] => 8/868715
[patent_app_country] => US
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[pdf_file] => patents/05/926/05926268.pdf
[firstpage_image] =>[orig_patent_app_number] => 868715
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/868715 | System and method for stress detection in a molded container | Jun 3, 1997 | Issued |
Array
(
[id] => 4052625
[patent_doc_number] => 05909282
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-06-01
[patent_title] => 'Interferometer for measuring thickness variations of semiconductor wafers'
[patent_app_type] => 1
[patent_app_number] => 8/866540
[patent_app_country] => US
[patent_app_date] => 1997-05-30
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[pdf_file] => patents/05/909/05909282.pdf
[firstpage_image] =>[orig_patent_app_number] => 866540
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/866540 | Interferometer for measuring thickness variations of semiconductor wafers | May 29, 1997 | Issued |
Array
(
[id] => 4152879
[patent_doc_number] => 06031609
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[patent_kind] => NA
[patent_issue_date] => 2000-02-29
[patent_title] => 'Fourier transform spectrometer using a multielement liquid crystal display'
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[firstpage_image] =>[orig_patent_app_number] => 865409
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/865409 | Fourier transform spectrometer using a multielement liquid crystal display | May 28, 1997 | Issued |
Array
(
[id] => 3885605
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[patent_issue_date] => 1998-06-09
[patent_title] => 'Electro-optical measuring device for absolute distances'
[patent_app_type] => 1
[patent_app_number] => 8/836878
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/836878 | Electro-optical measuring device for absolute distances | May 27, 1997 | Issued |
Array
(
[id] => 4249441
[patent_doc_number] => 06091484
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-07-18
[patent_title] => 'Oil quantity and quality indicator'
[patent_app_type] => 1
[patent_app_number] => 8/862679
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[pdf_file] => patents/06/091/06091484.pdf
[firstpage_image] =>[orig_patent_app_number] => 862679
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/862679 | Oil quantity and quality indicator | May 22, 1997 | Issued |
Array
(
[id] => 4076148
[patent_doc_number] => 06008892
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-12-28
[patent_title] => 'Optical substrate for enhanced detectability of fluorescence'
[patent_app_type] => 1
[patent_app_number] => 8/864363
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[firstpage_image] =>[orig_patent_app_number] => 864363
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/864363 | Optical substrate for enhanced detectability of fluorescence | May 22, 1997 | Issued |
| 08/854998 | INSTRUMENT FOR MEASURING HYDRODYNAMIC RADIUS OF MOLECULES | May 12, 1997 | Abandoned |
Array
(
[id] => 3824594
[patent_doc_number] => 05771096
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[patent_title] => 'Method of obtaining information'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/836609 | Method of obtaining information | May 12, 1997 | Issued |
Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/853562 | Interferometer having a micromirror | May 7, 1997 | Issued |
Array
(
[id] => 3912159
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Array
(
[id] => 4058843
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[patent_issue_date] => 1999-02-09
[patent_title] => 'Particle monitor and particle-free recessing system with particle monitor'
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Array
(
[id] => 3984880
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Array
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Array
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