| Application number | Title of the application | Filing Date | Status |
|---|
Array
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[patent_doc_number] => 05712707
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-01-27
[patent_title] => 'Edge overlay measurement target for sub-0.5 micron ground rules'
[patent_app_type] => 1
[patent_app_number] => 8/560720
[patent_app_country] => US
[patent_app_date] => 1995-11-20
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[pdf_file] => patents/05/712/05712707.pdf
[firstpage_image] =>[orig_patent_app_number] => 560720
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/560720 | Edge overlay measurement target for sub-0.5 micron ground rules | Nov 19, 1995 | Issued |
Array
(
[id] => 3610598
[patent_doc_number] => 05579111
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-11-26
[patent_title] => 'Encoding apparatus for making measurements of two-dimensional displacement of an object'
[patent_app_type] => 1
[patent_app_number] => 8/552167
[patent_app_country] => US
[patent_app_date] => 1995-11-02
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[pdf_file] => patents/05/579/05579111.pdf
[firstpage_image] =>[orig_patent_app_number] => 552167
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/552167 | Encoding apparatus for making measurements of two-dimensional displacement of an object | Nov 1, 1995 | Issued |
Array
(
[id] => 3631207
[patent_doc_number] => 05602644
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-11
[patent_title] => 'Alignment apparatus utilizing a plurality of wavelengths'
[patent_app_type] => 1
[patent_app_number] => 8/548626
[patent_app_country] => US
[patent_app_date] => 1995-10-26
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/602/05602644.pdf
[firstpage_image] =>[orig_patent_app_number] => 548626
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/548626 | Alignment apparatus utilizing a plurality of wavelengths | Oct 25, 1995 | Issued |
Array
(
[id] => 3725367
[patent_doc_number] => 05617210
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-04-01
[patent_title] => 'Method of detecting whether at least one die is centered about a thread held taught between two fixed points'
[patent_app_type] => 1
[patent_app_number] => 8/543108
[patent_app_country] => US
[patent_app_date] => 1995-10-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
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[pdf_file] => patents/05/617/05617210.pdf
[firstpage_image] =>[orig_patent_app_number] => 543108
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/543108 | Method of detecting whether at least one die is centered about a thread held taught between two fixed points | Oct 12, 1995 | Issued |
| 08/541100 | OPTICAL DISPLACEMENT MEASURING APPARATUS INCLUDING A LIGHT-EMITTING ELEMENT AND AN ADJACENT BALL LENS | Oct 10, 1995 | Abandoned |
Array
(
[id] => 3835367
[patent_doc_number] => 05784160
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-07-21
[patent_title] => 'Non-contact interferometric sizing of stochastic particles'
[patent_app_type] => 1
[patent_app_number] => 8/541577
[patent_app_country] => US
[patent_app_date] => 1995-10-10
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 541577
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/541577 | Non-contact interferometric sizing of stochastic particles | Oct 9, 1995 | Issued |
Array
(
[id] => 3524284
[patent_doc_number] => 05576834
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-11-19
[patent_title] => 'Optical wavemeter utilizing numerical fraction difference of pulses for determining absolute wave length'
[patent_app_type] => 1
[patent_app_number] => 8/529638
[patent_app_country] => US
[patent_app_date] => 1995-09-18
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[firstpage_image] =>[orig_patent_app_number] => 529638
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/529638 | Optical wavemeter utilizing numerical fraction difference of pulses for determining absolute wave length | Sep 17, 1995 | Issued |
Array
(
[id] => 3730457
[patent_doc_number] => 05682239
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-10-28
[patent_title] => 'Apparatus for detecting positional deviation of diffraction gratings on a substrate by utilizing optical heterodyne interference of light beams incident on the gratings from first and second light emitters'
[patent_app_type] => 1
[patent_app_number] => 8/528817
[patent_app_country] => US
[patent_app_date] => 1995-09-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 21
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[patent_no_of_words] => 12667
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[pdf_file] => patents/05/682/05682239.pdf
[firstpage_image] =>[orig_patent_app_number] => 528817
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/528817 | Apparatus for detecting positional deviation of diffraction gratings on a substrate by utilizing optical heterodyne interference of light beams incident on the gratings from first and second light emitters | Sep 14, 1995 | Issued |
| 08/530386 | INTERFEROMETRY USING A SINGLE OPTICAL SOURCE WITH COMBINED FREQUENCY AND AMPLITUDE MODULATION (AS AMENDED) | Sep 13, 1995 | Abandoned |
Array
(
[id] => 4095039
[patent_doc_number] => 06025910
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-02-15
[patent_title] => 'Object inspection method utilizing a corrected image to find unknown characteristic'
[patent_app_type] => 1
[patent_app_number] => 8/526897
[patent_app_country] => US
[patent_app_date] => 1995-09-12
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[pdf_file] => patents/06/025/06025910.pdf
[firstpage_image] =>[orig_patent_app_number] => 526897
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/526897 | Object inspection method utilizing a corrected image to find unknown characteristic | Sep 11, 1995 | Issued |
Array
(
[id] => 3696122
[patent_doc_number] => 05663793
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-09-02
[patent_title] => 'Homodyne interferometric receiver and calibration method having improved accuracy and functionality'
[patent_app_type] => 1
[patent_app_number] => 8/523559
[patent_app_country] => US
[patent_app_date] => 1995-09-05
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[firstpage_image] =>[orig_patent_app_number] => 523559
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/523559 | Homodyne interferometric receiver and calibration method having improved accuracy and functionality | Sep 4, 1995 | Issued |
Array
(
[id] => 3689642
[patent_doc_number] => 05633712
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-27
[patent_title] => 'Method and apparatus for determining the thickness and index of refraction of a film using low coherence reflectometry and a reference surfaces'
[patent_app_type] => 1
[patent_app_number] => 8/520198
[patent_app_country] => US
[patent_app_date] => 1995-08-28
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[pdf_file] => patents/05/633/05633712.pdf
[firstpage_image] =>[orig_patent_app_number] => 520198
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/520198 | Method and apparatus for determining the thickness and index of refraction of a film using low coherence reflectometry and a reference surfaces | Aug 27, 1995 | Issued |
Array
(
[id] => 3642495
[patent_doc_number] => 05610716
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-03-11
[patent_title] => 'Method and apparatus for measuring film thickness utilizing the slope of the phase of the Fourier transform of an autocorrelator signal'
[patent_app_type] => 1
[patent_app_number] => 8/520029
[patent_app_country] => US
[patent_app_date] => 1995-08-28
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/610/05610716.pdf
[firstpage_image] =>[orig_patent_app_number] => 520029
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/520029 | Method and apparatus for measuring film thickness utilizing the slope of the phase of the Fourier transform of an autocorrelator signal | Aug 27, 1995 | Issued |
| 08/519188 | STAGE APPARATUS UTILIZING A MATHEMATICAL MODEL FOR DRIVING ACTUATORS | Aug 24, 1995 | Abandoned |
Array
(
[id] => 3620684
[patent_doc_number] => 05565989
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-10-15
[patent_title] => 'Photoreceiver having multiple functions'
[patent_app_type] => 1
[patent_app_number] => 8/517416
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 517416
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/517416 | Photoreceiver having multiple functions | Aug 20, 1995 | Issued |
Array
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[id] => 3702745
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[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-01-21
[patent_title] => 'Sub-micron through-the-lens positioning utilizing out of phase segmented gratings'
[patent_app_type] => 1
[patent_app_number] => 8/516368
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[firstpage_image] =>[orig_patent_app_number] => 516368
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/516368 | Sub-micron through-the-lens positioning utilizing out of phase segmented gratings | Aug 16, 1995 | Issued |
Array
(
[id] => 3655056
[patent_doc_number] => 05629757
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-13
[patent_title] => 'Multicomponent laser strainmeter using Fabry-Perot interferometers'
[patent_app_type] => 1
[patent_app_number] => 8/513637
[patent_app_country] => US
[patent_app_date] => 1995-08-10
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[firstpage_image] =>[orig_patent_app_number] => 513637
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/513637 | Multicomponent laser strainmeter using Fabry-Perot interferometers | Aug 9, 1995 | Issued |
Array
(
[id] => 3629215
[patent_doc_number] => 05689339
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-11-18
[patent_title] => 'Alignment apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/506132
[patent_app_country] => US
[patent_app_date] => 1995-07-24
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[firstpage_image] =>[orig_patent_app_number] => 506132
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/506132 | Alignment apparatus | Jul 23, 1995 | Issued |
| 08/503707 | MOIRE INTERFEROMETRY SYSTEM AND METHOD WITH EXTENDED IMAGING DEPTH | Jul 17, 1995 | Abandoned |
Array
(
[id] => 4075030
[patent_doc_number] => 05867271
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-02-02
[patent_title] => 'Michelson interferometer including a non-polarizing beam splitter'
[patent_app_type] => 1
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[firstpage_image] =>[orig_patent_app_number] => 491907
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/491907 | Michelson interferometer including a non-polarizing beam splitter | Jul 13, 1995 | Issued |