Search

Robert H. Kim

Supervisory Patent Examiner (ID: 3371, Phone: (571)272-2293 , Office: P/2881 )

Most Active Art Unit
2877
Art Unit(s)
2882, 2877, 2871, 2505, 2881
Total Applications
847
Issued Applications
638
Pending Applications
107
Abandoned Applications
102

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4370540 [patent_doc_number] => 06191855 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-20 [patent_title] => 'Apparatus and method for the determination of grain size in thin films' [patent_app_type] => 1 [patent_app_number] => 9/524034 [patent_app_country] => US [patent_app_date] => 2000-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 14 [patent_no_of_words] => 9957 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/191/06191855.pdf [firstpage_image] =>[orig_patent_app_number] => 524034 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/524034
Apparatus and method for the determination of grain size in thin films Mar 12, 2000 Issued
Array ( [id] => 4370661 [patent_doc_number] => 06191864 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-20 [patent_title] => 'Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers' [patent_app_type] => 1 [patent_app_number] => 9/505822 [patent_app_country] => US [patent_app_date] => 2000-02-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 4813 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/191/06191864.pdf [firstpage_image] =>[orig_patent_app_number] => 505822 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/505822
Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers Feb 28, 2000 Issued
Array ( [id] => 4425191 [patent_doc_number] => 06195168 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-27 [patent_title] => 'Infrared scanning interferometry apparatus and method' [patent_app_type] => 1 [patent_app_number] => 9/514215 [patent_app_country] => US [patent_app_date] => 2000-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 15 [patent_no_of_words] => 8097 [patent_no_of_claims] => 51 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/195/06195168.pdf [firstpage_image] =>[orig_patent_app_number] => 514215 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/514215
Infrared scanning interferometry apparatus and method Feb 24, 2000 Issued
Array ( [id] => 4143128 [patent_doc_number] => 06147758 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-14 [patent_title] => 'Projection measuring instrument' [patent_app_type] => 1 [patent_app_number] => 9/490780 [patent_app_country] => US [patent_app_date] => 2000-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 2717 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/147/06147758.pdf [firstpage_image] =>[orig_patent_app_number] => 490780 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/490780
Projection measuring instrument Jan 23, 2000 Issued
Array ( [id] => 4425155 [patent_doc_number] => 06177990 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-23 [patent_title] => 'Optical substrate for enhanced detectability of fluorescence' [patent_app_type] => 1 [patent_app_number] => 9/468750 [patent_app_country] => US [patent_app_date] => 1999-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 4089 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/177/06177990.pdf [firstpage_image] =>[orig_patent_app_number] => 468750 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/468750
Optical substrate for enhanced detectability of fluorescence Dec 20, 1999 Issued
Array ( [id] => 4402215 [patent_doc_number] => 06264814 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Apparatus and method for isolating and/or analyzing charged molecules' [patent_app_type] => 1 [patent_app_number] => 9/445447 [patent_app_country] => US [patent_app_date] => 1999-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 28 [patent_no_of_words] => 15706 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 229 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/264/06264814.pdf [firstpage_image] =>[orig_patent_app_number] => 445447 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/445447
Apparatus and method for isolating and/or analyzing charged molecules Dec 13, 1999 Issued
Array ( [id] => 4263833 [patent_doc_number] => 06208417 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-27 [patent_title] => 'Method and apparatus for detecting minute irregularities on the surface of an object' [patent_app_type] => 1 [patent_app_number] => 9/450949 [patent_app_country] => US [patent_app_date] => 1999-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 41 [patent_no_of_words] => 11984 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/208/06208417.pdf [firstpage_image] =>[orig_patent_app_number] => 450949 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/450949
Method and apparatus for detecting minute irregularities on the surface of an object Nov 28, 1999 Issued
Array ( [id] => 4307656 [patent_doc_number] => 06184994 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-06 [patent_title] => 'Method and apparatus for absolutely measuring flat and sperical surfaces with high spatal resolution' [patent_app_type] => 1 [patent_app_number] => 9/421636 [patent_app_country] => US [patent_app_date] => 1999-10-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 7451 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 249 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/184/06184994.pdf [firstpage_image] =>[orig_patent_app_number] => 421636 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/421636
Method and apparatus for absolutely measuring flat and sperical surfaces with high spatal resolution Oct 19, 1999 Issued
Array ( [id] => 4425190 [patent_doc_number] => 06178001 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-23 [patent_title] => 'Method and apparatus for optical frequency modulation characterization of laser sources' [patent_app_type] => 1 [patent_app_number] => 9/390214 [patent_app_country] => US [patent_app_date] => 1999-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5827 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/178/06178001.pdf [firstpage_image] =>[orig_patent_app_number] => 390214 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/390214
Method and apparatus for optical frequency modulation characterization of laser sources Sep 7, 1999 Issued
Array ( [id] => 4315015 [patent_doc_number] => 06188480 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-13 [patent_title] => 'Interferometric measurement of positions, position changes, and physical quantities derived therefrom' [patent_app_type] => 1 [patent_app_number] => 9/319454 [patent_app_country] => US [patent_app_date] => 1999-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 2053 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/188/06188480.pdf [firstpage_image] =>[orig_patent_app_number] => 319454 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/319454
Interferometric measurement of positions, position changes, and physical quantities derived therefrom Sep 2, 1999 Issued
Array ( [id] => 4202672 [patent_doc_number] => 06043886 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-03-28 [patent_title] => 'Interferometric method of measuring toric surfaces at grazing incidence with phase shifting' [patent_app_type] => 1 [patent_app_number] => 9/388873 [patent_app_country] => US [patent_app_date] => 1999-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 3784 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/043/06043886.pdf [firstpage_image] =>[orig_patent_app_number] => 388873 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/388873
Interferometric method of measuring toric surfaces at grazing incidence with phase shifting Sep 1, 1999 Issued
Array ( [id] => 4282849 [patent_doc_number] => 06246480 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-12 [patent_title] => 'Stepped etalon' [patent_app_type] => 1 [patent_app_number] => 9/388345 [patent_app_country] => US [patent_app_date] => 1999-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 2661 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/246/06246480.pdf [firstpage_image] =>[orig_patent_app_number] => 388345 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/388345
Stepped etalon Aug 31, 1999 Issued
Array ( [id] => 4249852 [patent_doc_number] => 06166812 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-26 [patent_title] => 'Stage apparatus' [patent_app_type] => 1 [patent_app_number] => 9/385965 [patent_app_country] => US [patent_app_date] => 1999-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 16 [patent_no_of_words] => 9906 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/166/06166812.pdf [firstpage_image] =>[orig_patent_app_number] => 385965 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/385965
Stage apparatus Aug 29, 1999 Issued
Array ( [id] => 4248743 [patent_doc_number] => 06081333 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-27 [patent_title] => 'Bi-lateral shearing interferometer with beam convergence/divergence indication' [patent_app_type] => 1 [patent_app_number] => 9/384884 [patent_app_country] => US [patent_app_date] => 1999-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 16 [patent_no_of_words] => 2406 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/081/06081333.pdf [firstpage_image] =>[orig_patent_app_number] => 384884 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/384884
Bi-lateral shearing interferometer with beam convergence/divergence indication Aug 26, 1999 Issued
Array ( [id] => 4366798 [patent_doc_number] => 06175416 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-16 [patent_title] => 'Optical stress generator and detector' [patent_app_type] => 1 [patent_app_number] => 9/382251 [patent_app_country] => US [patent_app_date] => 1999-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 32 [patent_no_of_words] => 26742 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/175/06175416.pdf [firstpage_image] =>[orig_patent_app_number] => 382251 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/382251
Optical stress generator and detector Aug 23, 1999 Issued
Array ( [id] => 4145714 [patent_doc_number] => 06122057 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-19 [patent_title] => 'Four step discrete phase shift demodulation method for fiber optic sensor arrays' [patent_app_type] => 1 [patent_app_number] => 9/364396 [patent_app_country] => US [patent_app_date] => 1999-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 3880 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/122/06122057.pdf [firstpage_image] =>[orig_patent_app_number] => 364396 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/364396
Four step discrete phase shift demodulation method for fiber optic sensor arrays Jul 29, 1999 Issued
Array ( [id] => 4292076 [patent_doc_number] => 06186937 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-13 [patent_title] => 'Method and device for obtaining a desired phase of optical characteristic of a fabry-perot etalon' [patent_app_type] => 1 [patent_app_number] => 9/365085 [patent_app_country] => US [patent_app_date] => 1999-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3754 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/186/06186937.pdf [firstpage_image] =>[orig_patent_app_number] => 365085 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/365085
Method and device for obtaining a desired phase of optical characteristic of a fabry-perot etalon Jul 29, 1999 Issued
Array ( [id] => 4138005 [patent_doc_number] => 06128082 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-03 [patent_title] => 'Technique and apparatus for performing electronic speckle pattern interferometry' [patent_app_type] => 1 [patent_app_number] => 9/363495 [patent_app_country] => US [patent_app_date] => 1999-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 3149 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/128/06128082.pdf [firstpage_image] =>[orig_patent_app_number] => 363495 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/363495
Technique and apparatus for performing electronic speckle pattern interferometry Jul 28, 1999 Issued
Array ( [id] => 4315040 [patent_doc_number] => 06188482 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-13 [patent_title] => 'Apparatus for electronic speckle pattern interferometry' [patent_app_type] => 1 [patent_app_number] => 9/363494 [patent_app_country] => US [patent_app_date] => 1999-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3065 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/188/06188482.pdf [firstpage_image] =>[orig_patent_app_number] => 363494 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/363494
Apparatus for electronic speckle pattern interferometry Jul 28, 1999 Issued
Array ( [id] => 4108053 [patent_doc_number] => 06097487 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-01 [patent_title] => 'Device for measurement of optical wavelengths' [patent_app_type] => 1 [patent_app_number] => 9/341708 [patent_app_country] => US [patent_app_date] => 1999-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 5043 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 302 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/097/06097487.pdf [firstpage_image] =>[orig_patent_app_number] => 341708 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/341708
Device for measurement of optical wavelengths Jul 28, 1999 Issued
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