
Robert H. Kim
Supervisory Patent Examiner (ID: 3371, Phone: (571)272-2293 , Office: P/2881 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2882, 2877, 2871, 2505, 2881 |
| Total Applications | 847 |
| Issued Applications | 638 |
| Pending Applications | 107 |
| Abandoned Applications | 102 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4370540
[patent_doc_number] => 06191855
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-20
[patent_title] => 'Apparatus and method for the determination of grain size in thin films'
[patent_app_type] => 1
[patent_app_number] => 9/524034
[patent_app_country] => US
[patent_app_date] => 2000-03-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 14
[patent_no_of_words] => 9957
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 180
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/191/06191855.pdf
[firstpage_image] =>[orig_patent_app_number] => 524034
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/524034 | Apparatus and method for the determination of grain size in thin films | Mar 12, 2000 | Issued |
Array
(
[id] => 4370661
[patent_doc_number] => 06191864
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-20
[patent_title] => 'Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers'
[patent_app_type] => 1
[patent_app_number] => 9/505822
[patent_app_country] => US
[patent_app_date] => 2000-02-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 4813
[patent_no_of_claims] => 32
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 106
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/191/06191864.pdf
[firstpage_image] =>[orig_patent_app_number] => 505822
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/505822 | Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers | Feb 28, 2000 | Issued |
Array
(
[id] => 4425191
[patent_doc_number] => 06195168
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-27
[patent_title] => 'Infrared scanning interferometry apparatus and method'
[patent_app_type] => 1
[patent_app_number] => 9/514215
[patent_app_country] => US
[patent_app_date] => 2000-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 15
[patent_no_of_words] => 8097
[patent_no_of_claims] => 51
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 48
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/195/06195168.pdf
[firstpage_image] =>[orig_patent_app_number] => 514215
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/514215 | Infrared scanning interferometry apparatus and method | Feb 24, 2000 | Issued |
Array
(
[id] => 4143128
[patent_doc_number] => 06147758
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-11-14
[patent_title] => 'Projection measuring instrument'
[patent_app_type] => 1
[patent_app_number] => 9/490780
[patent_app_country] => US
[patent_app_date] => 2000-01-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 2717
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 101
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/147/06147758.pdf
[firstpage_image] =>[orig_patent_app_number] => 490780
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/490780 | Projection measuring instrument | Jan 23, 2000 | Issued |
Array
(
[id] => 4425155
[patent_doc_number] => 06177990
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-23
[patent_title] => 'Optical substrate for enhanced detectability of fluorescence'
[patent_app_type] => 1
[patent_app_number] => 9/468750
[patent_app_country] => US
[patent_app_date] => 1999-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 6
[patent_no_of_words] => 4089
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 121
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/177/06177990.pdf
[firstpage_image] =>[orig_patent_app_number] => 468750
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/468750 | Optical substrate for enhanced detectability of fluorescence | Dec 20, 1999 | Issued |
Array
(
[id] => 4402215
[patent_doc_number] => 06264814
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-24
[patent_title] => 'Apparatus and method for isolating and/or analyzing charged molecules'
[patent_app_type] => 1
[patent_app_number] => 9/445447
[patent_app_country] => US
[patent_app_date] => 1999-12-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 27
[patent_figures_cnt] => 28
[patent_no_of_words] => 15706
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 229
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/264/06264814.pdf
[firstpage_image] =>[orig_patent_app_number] => 445447
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/445447 | Apparatus and method for isolating and/or analyzing charged molecules | Dec 13, 1999 | Issued |
Array
(
[id] => 4263833
[patent_doc_number] => 06208417
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-03-27
[patent_title] => 'Method and apparatus for detecting minute irregularities on the surface of an object'
[patent_app_type] => 1
[patent_app_number] => 9/450949
[patent_app_country] => US
[patent_app_date] => 1999-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
[patent_figures_cnt] => 41
[patent_no_of_words] => 11984
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 100
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/208/06208417.pdf
[firstpage_image] =>[orig_patent_app_number] => 450949
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/450949 | Method and apparatus for detecting minute irregularities on the surface of an object | Nov 28, 1999 | Issued |
Array
(
[id] => 4307656
[patent_doc_number] => 06184994
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-06
[patent_title] => 'Method and apparatus for absolutely measuring flat and sperical surfaces with high spatal resolution'
[patent_app_type] => 1
[patent_app_number] => 9/421636
[patent_app_country] => US
[patent_app_date] => 1999-10-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 10
[patent_no_of_words] => 7451
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 249
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/184/06184994.pdf
[firstpage_image] =>[orig_patent_app_number] => 421636
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/421636 | Method and apparatus for absolutely measuring flat and sperical surfaces with high spatal resolution | Oct 19, 1999 | Issued |
Array
(
[id] => 4425190
[patent_doc_number] => 06178001
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-23
[patent_title] => 'Method and apparatus for optical frequency modulation characterization of laser sources'
[patent_app_type] => 1
[patent_app_number] => 9/390214
[patent_app_country] => US
[patent_app_date] => 1999-09-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 9
[patent_no_of_words] => 5827
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/178/06178001.pdf
[firstpage_image] =>[orig_patent_app_number] => 390214
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/390214 | Method and apparatus for optical frequency modulation characterization of laser sources | Sep 7, 1999 | Issued |
Array
(
[id] => 4315015
[patent_doc_number] => 06188480
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-13
[patent_title] => 'Interferometric measurement of positions, position changes, and physical quantities derived therefrom'
[patent_app_type] => 1
[patent_app_number] => 9/319454
[patent_app_country] => US
[patent_app_date] => 1999-09-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 4
[patent_no_of_words] => 2053
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 195
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/188/06188480.pdf
[firstpage_image] =>[orig_patent_app_number] => 319454
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/319454 | Interferometric measurement of positions, position changes, and physical quantities derived therefrom | Sep 2, 1999 | Issued |
Array
(
[id] => 4202672
[patent_doc_number] => 06043886
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-03-28
[patent_title] => 'Interferometric method of measuring toric surfaces at grazing incidence with phase shifting'
[patent_app_type] => 1
[patent_app_number] => 9/388873
[patent_app_country] => US
[patent_app_date] => 1999-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 3784
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 144
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/043/06043886.pdf
[firstpage_image] =>[orig_patent_app_number] => 388873
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/388873 | Interferometric method of measuring toric surfaces at grazing incidence with phase shifting | Sep 1, 1999 | Issued |
Array
(
[id] => 4282849
[patent_doc_number] => 06246480
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-06-12
[patent_title] => 'Stepped etalon'
[patent_app_type] => 1
[patent_app_number] => 9/388345
[patent_app_country] => US
[patent_app_date] => 1999-09-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 13
[patent_no_of_words] => 2661
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/246/06246480.pdf
[firstpage_image] =>[orig_patent_app_number] => 388345
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/388345 | Stepped etalon | Aug 31, 1999 | Issued |
Array
(
[id] => 4249852
[patent_doc_number] => 06166812
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-12-26
[patent_title] => 'Stage apparatus'
[patent_app_type] => 1
[patent_app_number] => 9/385965
[patent_app_country] => US
[patent_app_date] => 1999-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 16
[patent_no_of_words] => 9906
[patent_no_of_claims] => 39
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/166/06166812.pdf
[firstpage_image] =>[orig_patent_app_number] => 385965
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/385965 | Stage apparatus | Aug 29, 1999 | Issued |
Array
(
[id] => 4248743
[patent_doc_number] => 06081333
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-06-27
[patent_title] => 'Bi-lateral shearing interferometer with beam convergence/divergence indication'
[patent_app_type] => 1
[patent_app_number] => 9/384884
[patent_app_country] => US
[patent_app_date] => 1999-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 16
[patent_no_of_words] => 2406
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 232
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/081/06081333.pdf
[firstpage_image] =>[orig_patent_app_number] => 384884
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/384884 | Bi-lateral shearing interferometer with beam convergence/divergence indication | Aug 26, 1999 | Issued |
Array
(
[id] => 4366798
[patent_doc_number] => 06175416
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-16
[patent_title] => 'Optical stress generator and detector'
[patent_app_type] => 1
[patent_app_number] => 9/382251
[patent_app_country] => US
[patent_app_date] => 1999-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 32
[patent_no_of_words] => 26742
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 150
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/175/06175416.pdf
[firstpage_image] =>[orig_patent_app_number] => 382251
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/382251 | Optical stress generator and detector | Aug 23, 1999 | Issued |
Array
(
[id] => 4145714
[patent_doc_number] => 06122057
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-09-19
[patent_title] => 'Four step discrete phase shift demodulation method for fiber optic sensor arrays'
[patent_app_type] => 1
[patent_app_number] => 9/364396
[patent_app_country] => US
[patent_app_date] => 1999-07-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 12
[patent_no_of_words] => 3880
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 107
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/122/06122057.pdf
[firstpage_image] =>[orig_patent_app_number] => 364396
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/364396 | Four step discrete phase shift demodulation method for fiber optic sensor arrays | Jul 29, 1999 | Issued |
Array
(
[id] => 4292076
[patent_doc_number] => 06186937
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-13
[patent_title] => 'Method and device for obtaining a desired phase of optical characteristic of a fabry-perot etalon'
[patent_app_type] => 1
[patent_app_number] => 9/365085
[patent_app_country] => US
[patent_app_date] => 1999-07-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3754
[patent_no_of_claims] => 35
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 108
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/186/06186937.pdf
[firstpage_image] =>[orig_patent_app_number] => 365085
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/365085 | Method and device for obtaining a desired phase of optical characteristic of a fabry-perot etalon | Jul 29, 1999 | Issued |
Array
(
[id] => 4138005
[patent_doc_number] => 06128082
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-10-03
[patent_title] => 'Technique and apparatus for performing electronic speckle pattern interferometry'
[patent_app_type] => 1
[patent_app_number] => 9/363495
[patent_app_country] => US
[patent_app_date] => 1999-07-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 3149
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/128/06128082.pdf
[firstpage_image] =>[orig_patent_app_number] => 363495
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/363495 | Technique and apparatus for performing electronic speckle pattern interferometry | Jul 28, 1999 | Issued |
Array
(
[id] => 4315040
[patent_doc_number] => 06188482
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-13
[patent_title] => 'Apparatus for electronic speckle pattern interferometry'
[patent_app_type] => 1
[patent_app_number] => 9/363494
[patent_app_country] => US
[patent_app_date] => 1999-07-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 3065
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 232
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/188/06188482.pdf
[firstpage_image] =>[orig_patent_app_number] => 363494
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/363494 | Apparatus for electronic speckle pattern interferometry | Jul 28, 1999 | Issued |
Array
(
[id] => 4108053
[patent_doc_number] => 06097487
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-08-01
[patent_title] => 'Device for measurement of optical wavelengths'
[patent_app_type] => 1
[patent_app_number] => 9/341708
[patent_app_country] => US
[patent_app_date] => 1999-07-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 13
[patent_no_of_words] => 5043
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 302
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/097/06097487.pdf
[firstpage_image] =>[orig_patent_app_number] => 341708
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/341708 | Device for measurement of optical wavelengths | Jul 28, 1999 | Issued |