Search

Robert H. Kim

Supervisory Patent Examiner (ID: 3371, Phone: (571)272-2293 , Office: P/2881 )

Most Active Art Unit
2877
Art Unit(s)
2882, 2877, 2871, 2505, 2881
Total Applications
847
Issued Applications
638
Pending Applications
107
Abandoned Applications
102

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4195354 [patent_doc_number] => 06160627 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-12 [patent_title] => 'Optical fiber Mach-Zehnder interferometer filter' [patent_app_type] => 1 [patent_app_number] => 9/315998 [patent_app_country] => US [patent_app_date] => 1999-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2368 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/160/06160627.pdf [firstpage_image] =>[orig_patent_app_number] => 315998 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/315998
Optical fiber Mach-Zehnder interferometer filter May 20, 1999 Issued
Array ( [id] => 4263957 [patent_doc_number] => 06208425 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-27 [patent_title] => 'Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers' [patent_app_type] => 1 [patent_app_number] => 9/314594 [patent_app_country] => US [patent_app_date] => 1999-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2817 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/208/06208425.pdf [firstpage_image] =>[orig_patent_app_number] => 314594 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/314594
Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers May 18, 1999 Issued
Array ( [id] => 4244100 [patent_doc_number] => 06075601 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-13 [patent_title] => 'Optical probe calibration apparatus and method' [patent_app_type] => 1 [patent_app_number] => 9/309998 [patent_app_country] => US [patent_app_date] => 1999-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 19 [patent_no_of_words] => 6898 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/075/06075601.pdf [firstpage_image] =>[orig_patent_app_number] => 309998 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/309998
Optical probe calibration apparatus and method May 10, 1999 Issued
Array ( [id] => 4314974 [patent_doc_number] => 06188477 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-13 [patent_title] => 'Optical polarization sensing apparatus and method' [patent_app_type] => 1 [patent_app_number] => 9/305116 [patent_app_country] => US [patent_app_date] => 1999-05-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4295 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/188/06188477.pdf [firstpage_image] =>[orig_patent_app_number] => 305116 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/305116
Optical polarization sensing apparatus and method May 3, 1999 Issued
Array ( [id] => 4114758 [patent_doc_number] => 06100978 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-08 [patent_title] => 'Dual-domain point diffraction interferometer' [patent_app_type] => 1 [patent_app_number] => 9/300539 [patent_app_country] => US [patent_app_date] => 1999-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 18 [patent_no_of_words] => 8609 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/100/06100978.pdf [firstpage_image] =>[orig_patent_app_number] => 300539 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/300539
Dual-domain point diffraction interferometer Apr 26, 1999 Issued
Array ( [id] => 4115042 [patent_doc_number] => 06023334 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-08 [patent_title] => 'Method and apparatus for detecting minute irregularities on the surface of an object' [patent_app_type] => 1 [patent_app_number] => 9/299762 [patent_app_country] => US [patent_app_date] => 1999-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 42 [patent_no_of_words] => 12223 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/023/06023334.pdf [firstpage_image] =>[orig_patent_app_number] => 299762 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/299762
Method and apparatus for detecting minute irregularities on the surface of an object Apr 26, 1999 Issued
Array ( [id] => 4214706 [patent_doc_number] => 06078397 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-20 [patent_title] => 'Method and apparatus for mapping the wall thickness of tubes during production' [patent_app_type] => 1 [patent_app_number] => 9/294208 [patent_app_country] => US [patent_app_date] => 1999-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 4791 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/078/06078397.pdf [firstpage_image] =>[orig_patent_app_number] => 294208 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/294208
Method and apparatus for mapping the wall thickness of tubes during production Apr 19, 1999 Issued
Array ( [id] => 4315030 [patent_doc_number] => 06188481 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-13 [patent_title] => 'Spatial interferometry' [patent_app_type] => 1 [patent_app_number] => 9/202947 [patent_app_country] => US [patent_app_date] => 1999-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 12 [patent_no_of_words] => 5519 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/188/06188481.pdf [firstpage_image] =>[orig_patent_app_number] => 202947 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/202947
Spatial interferometry Apr 15, 1999 Issued
Array ( [id] => 4084626 [patent_doc_number] => 05966215 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-12 [patent_title] => 'Line width insensitive wafer target detection in two directions' [patent_app_type] => 1 [patent_app_number] => 9/290217 [patent_app_country] => US [patent_app_date] => 1999-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 15 [patent_no_of_words] => 4027 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/966/05966215.pdf [firstpage_image] =>[orig_patent_app_number] => 290217 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/290217
Line width insensitive wafer target detection in two directions Apr 12, 1999 Issued
Array ( [id] => 4138019 [patent_doc_number] => 06128083 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-03 [patent_title] => 'Displacement measuring apparatus' [patent_app_type] => 1 [patent_app_number] => 9/287046 [patent_app_country] => US [patent_app_date] => 1999-04-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5909 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 289 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/128/06128083.pdf [firstpage_image] =>[orig_patent_app_number] => 287046 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/287046
Displacement measuring apparatus Apr 5, 1999 Issued
Array ( [id] => 4185853 [patent_doc_number] => 06084679 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-04 [patent_title] => 'Universal alignment marks for semiconductor defect capture and analysis' [patent_app_type] => 1 [patent_app_number] => 9/285430 [patent_app_country] => US [patent_app_date] => 1999-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 3126 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/084/06084679.pdf [firstpage_image] =>[orig_patent_app_number] => 285430 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/285430
Universal alignment marks for semiconductor defect capture and analysis Apr 1, 1999 Issued
Array ( [id] => 4143089 [patent_doc_number] => 06147755 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-14 [patent_title] => 'Dynamic optical phase state detector' [patent_app_type] => 1 [patent_app_number] => 9/282946 [patent_app_country] => US [patent_app_date] => 1999-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 3898 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/147/06147755.pdf [firstpage_image] =>[orig_patent_app_number] => 282946 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/282946
Dynamic optical phase state detector Mar 31, 1999 Issued
Array ( [id] => 4228726 [patent_doc_number] => 06088088 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-11 [patent_title] => 'Chromatic dispersion measurement scheme having high frequency resolution' [patent_app_type] => 1 [patent_app_number] => 9/283372 [patent_app_country] => US [patent_app_date] => 1999-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 6845 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 309 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/088/06088088.pdf [firstpage_image] =>[orig_patent_app_number] => 283372 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/283372
Chromatic dispersion measurement scheme having high frequency resolution Mar 30, 1999 Issued
Array ( [id] => 4105884 [patent_doc_number] => 06134369 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-17 [patent_title] => 'Compact optical waveguide' [patent_app_type] => 1 [patent_app_number] => 9/282723 [patent_app_country] => US [patent_app_date] => 1999-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2405 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/134/06134369.pdf [firstpage_image] =>[orig_patent_app_number] => 282723 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/282723
Compact optical waveguide Mar 30, 1999 Issued
Array ( [id] => 4244087 [patent_doc_number] => 06075600 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-13 [patent_title] => 'Signal formation apparatus for use in interference measurement' [patent_app_type] => 1 [patent_app_number] => 9/274306 [patent_app_country] => US [patent_app_date] => 1999-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 7064 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/075/06075600.pdf [firstpage_image] =>[orig_patent_app_number] => 274306 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/274306
Signal formation apparatus for use in interference measurement Mar 22, 1999 Issued
Array ( [id] => 4244037 [patent_doc_number] => 06075597 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-13 [patent_title] => 'Method for coupling narrow-band, Fabry-Perot, etalon-type interference filters to two-mirror and catadioptric telescopes' [patent_app_type] => 1 [patent_app_number] => 9/270795 [patent_app_country] => US [patent_app_date] => 1999-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 34 [patent_no_of_words] => 10666 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/075/06075597.pdf [firstpage_image] =>[orig_patent_app_number] => 270795 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/270795
Method for coupling narrow-band, Fabry-Perot, etalon-type interference filters to two-mirror and catadioptric telescopes Mar 16, 1999 Issued
Array ( [id] => 4076286 [patent_doc_number] => 06008902 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-28 [patent_title] => 'Method and device for heterodyne interferometer error correction' [patent_app_type] => 1 [patent_app_number] => 9/147838 [patent_app_country] => US [patent_app_date] => 1999-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3464 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/008/06008902.pdf [firstpage_image] =>[orig_patent_app_number] => 147838 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/147838
Method and device for heterodyne interferometer error correction Mar 16, 1999 Issued
Array ( [id] => 3959451 [patent_doc_number] => 05999267 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-07 [patent_title] => 'Nondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer films' [patent_app_type] => 1 [patent_app_number] => 9/263543 [patent_app_country] => US [patent_app_date] => 1999-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 3312 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/999/05999267.pdf [firstpage_image] =>[orig_patent_app_number] => 263543 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/263543
Nondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer films Mar 7, 1999 Issued
Array ( [id] => 4319850 [patent_doc_number] => 06188810 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-13 [patent_title] => 'Reversible ring coupler for optical networks' [patent_app_type] => 1 [patent_app_number] => 9/262128 [patent_app_country] => US [patent_app_date] => 1999-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4386 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 262 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/188/06188810.pdf [firstpage_image] =>[orig_patent_app_number] => 262128 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/262128
Reversible ring coupler for optical networks Mar 2, 1999 Issued
Array ( [id] => 4183051 [patent_doc_number] => 06141108 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-31 [patent_title] => 'Position control method in exposure apparatus' [patent_app_type] => 1 [patent_app_number] => 9/258146 [patent_app_country] => US [patent_app_date] => 1999-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 6905 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/141/06141108.pdf [firstpage_image] =>[orig_patent_app_number] => 258146 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/258146
Position control method in exposure apparatus Feb 25, 1999 Issued
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