Search

Robert W. Gibson

Examiner (ID: 1904)

Most Active Art Unit
3505
Art Unit(s)
3623, 2899, 3634, 3505
Total Applications
2629
Issued Applications
2460
Pending Applications
61
Abandoned Applications
108

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 15184723 [patent_doc_number] => 20190362953 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-11-28 [patent_title] => HARMONIC LINE NOISE CORRECTION FOR ELECTRON ENERGY LOSS SPECTROMETER [patent_app_type] => utility [patent_app_number] => 16/480379 [patent_app_country] => US [patent_app_date] => 2018-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3915 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16480379 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/480379
Harmonic line noise correction for electron energy loss spectrometer Jan 31, 2018 Issued
Array ( [id] => 17150536 [patent_doc_number] => 11143606 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-10-12 [patent_title] => Particle measuring device and particle measuring method [patent_app_type] => utility [patent_app_number] => 16/965228 [patent_app_country] => US [patent_app_date] => 2018-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 23 [patent_no_of_words] => 10891 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16965228 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/965228
Particle measuring device and particle measuring method Jan 31, 2018 Issued
Array ( [id] => 12848929 [patent_doc_number] => 20180174816 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-06-21 [patent_title] => Multi-Reflecting Mass Spectrometer with High Throughput [patent_app_type] => utility [patent_app_number] => 15/884154 [patent_app_country] => US [patent_app_date] => 2018-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14251 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15884154 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/884154
Multi-reflecting mass spectrometer with high throughput Jan 29, 2018 Issued
Array ( [id] => 16812018 [patent_doc_number] => 20210134573 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-05-06 [patent_title] => Fourier Transform Mass Spectrometer [patent_app_type] => utility [patent_app_number] => 16/482476 [patent_app_country] => US [patent_app_date] => 2018-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7771 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16482476 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/482476
Fourier transform mass spectrometer based on use of a fringing field to convert radial oscillations of excited ions to axial oscillations Jan 28, 2018 Issued
Array ( [id] => 16430636 [patent_doc_number] => 10830715 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-11-10 [patent_title] => Cross sectional depth composition generation utilizing scanning electron microscopy [patent_app_type] => utility [patent_app_number] => 15/880126 [patent_app_country] => US [patent_app_date] => 2018-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4672 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15880126 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/880126
Cross sectional depth composition generation utilizing scanning electron microscopy Jan 24, 2018 Issued
Array ( [id] => 12800440 [patent_doc_number] => 20180158649 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-06-07 [patent_title] => CROSS SECTIONAL DEPTH COMPOSITION GENERATION UTILIZING SCANNING ELECTRON MICROSCOPY [patent_app_type] => utility [patent_app_number] => 15/880097 [patent_app_country] => US [patent_app_date] => 2018-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4671 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15880097 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/880097
Cross sectional depth composition generation utilizing scanning electron microscopy Jan 24, 2018 Issued
Array ( [id] => 12725044 [patent_doc_number] => 20180133515 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-05-17 [patent_title] => TREATMENT DELIVERY CONTROL SYSTEM AND METHOD OF OPERATION THEREOF [patent_app_type] => utility [patent_app_number] => 15/868897 [patent_app_country] => US [patent_app_date] => 2018-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 38712 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15868897 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/868897
TREATMENT DELIVERY CONTROL SYSTEM AND METHOD OF OPERATION THEREOF Jan 10, 2018 Abandoned
Array ( [id] => 13228467 [patent_doc_number] => 10128012 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-11-13 [patent_title] => Method of using a modular container system for radioactive waste [patent_app_type] => utility [patent_app_number] => 15/864088 [patent_app_country] => US [patent_app_date] => 2018-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 54 [patent_figures_cnt] => 131 [patent_no_of_words] => 24855 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15864088 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/864088
Method of using a modular container system for radioactive waste Jan 7, 2018 Issued
Array ( [id] => 12754159 [patent_doc_number] => 20180143220 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-05-24 [patent_title] => ATOMIC FORCE MICROSCOPE AND CONTROL METHOD OF THE SAME [patent_app_type] => utility [patent_app_number] => 15/863023 [patent_app_country] => US [patent_app_date] => 2018-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4772 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15863023 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/863023
Atomic force microscope and control method of the same Jan 4, 2018 Issued
Array ( [id] => 16170740 [patent_doc_number] => 10712296 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-07-14 [patent_title] => Handheld material analyser [patent_app_type] => utility [patent_app_number] => 16/471199 [patent_app_country] => US [patent_app_date] => 2017-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4534 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16471199 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/471199
Handheld material analyser Dec 21, 2017 Issued
Array ( [id] => 15148789 [patent_doc_number] => 20190352872 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-11-21 [patent_title] => LOAD ARRANGEMENT FOR POWERING A LOAD [patent_app_type] => utility [patent_app_number] => 16/469998 [patent_app_country] => US [patent_app_date] => 2017-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7417 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16469998 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/469998
Load arrangement for powering a load Dec 13, 2017 Issued
Array ( [id] => 16643424 [patent_doc_number] => 10921269 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-02-16 [patent_title] => Method for characterisation by CD-SEM scanning electronic microscopy [patent_app_type] => utility [patent_app_number] => 16/469956 [patent_app_country] => US [patent_app_date] => 2017-12-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 10 [patent_no_of_words] => 7859 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16469956 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/469956
Method for characterisation by CD-SEM scanning electronic microscopy Dec 11, 2017 Issued
Array ( [id] => 15274149 [patent_doc_number] => 20190385809 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-19 [patent_title] => Electron Source and Electron Beam Device Using the Same [patent_app_type] => utility [patent_app_number] => 16/480405 [patent_app_country] => US [patent_app_date] => 2017-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8770 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16480405 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/480405
Electron source and electron beam device using the same Dec 7, 2017 Issued
Array ( [id] => 12823246 [patent_doc_number] => 20180166254 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-06-14 [patent_title] => MULTI CHARGED PARTICLE BEAM EXPOSURE METHOD AND MULTI CHARGED PARTICLE BEAM EXPOSURE APPARATUS [patent_app_type] => utility [patent_app_number] => 15/831729 [patent_app_country] => US [patent_app_date] => 2017-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14111 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 221 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15831729 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/831729
Multi charged particle beam exposure method and multi charged particle beam exposure apparatus Dec 4, 2017 Issued
Array ( [id] => 12800482 [patent_doc_number] => 20180158663 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-06-07 [patent_title] => Sheathless Interface for Capillary Electrophoresis/Electrospray Ionization-Mass Spectrometry [patent_app_type] => utility [patent_app_number] => 15/832016 [patent_app_country] => US [patent_app_date] => 2017-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6798 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15832016 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/832016
Sheathless interface for capillary electrophoresis/electrospray ionization-mass spectrometry Dec 4, 2017 Issued
Array ( [id] => 16645448 [patent_doc_number] => 10923314 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-02-16 [patent_title] => Method of image acquisition and electron microscope [patent_app_type] => utility [patent_app_number] => 15/830304 [patent_app_country] => US [patent_app_date] => 2017-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 19 [patent_no_of_words] => 10427 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15830304 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/830304
Method of image acquisition and electron microscope Dec 3, 2017 Issued
Array ( [id] => 16210330 [patent_doc_number] => 20200243320 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-07-30 [patent_title] => TIME-OF-FLIGHT MASS SPECTROMETER [patent_app_type] => utility [patent_app_number] => 16/755949 [patent_app_country] => US [patent_app_date] => 2017-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3242 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 29 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16755949 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/755949
Time-of-flight mass spectrometer Dec 3, 2017 Issued
Array ( [id] => 13084793 [patent_doc_number] => 10062468 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2018-08-28 [patent_title] => Beam diffuser selector apparatus and system for a particle accelerator and method of use thereof [patent_app_type] => utility [patent_app_number] => 15/830668 [patent_app_country] => US [patent_app_date] => 2017-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3497 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15830668 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/830668
Beam diffuser selector apparatus and system for a particle accelerator and method of use thereof Dec 3, 2017 Issued
Array ( [id] => 17876600 [patent_doc_number] => 11448607 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-09-20 [patent_title] => Charged particle beam inspection of ungrounded samples [patent_app_type] => utility [patent_app_number] => 16/470928 [patent_app_country] => US [patent_app_date] => 2017-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 16 [patent_no_of_words] => 4481 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16470928 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/470928
Charged particle beam inspection of ungrounded samples Dec 3, 2017 Issued
Array ( [id] => 12609834 [patent_doc_number] => 20180095108 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-04-05 [patent_title] => PROBE SYSTEM AND METHOD FOR RECEIVING A PROBE OF A SCANNING PROBE MICROSCOPE [patent_app_type] => utility [patent_app_number] => 15/828529 [patent_app_country] => US [patent_app_date] => 2017-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10612 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15828529 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/828529
Probe system and method for receiving a probe of a scanning probe microscope Nov 30, 2017 Issued
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