
Roberto Velez
Examiner (ID: 2101)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2829, 2662, 2858, 3600 |
| Total Applications | 491 |
| Issued Applications | 304 |
| Pending Applications | 69 |
| Abandoned Applications | 135 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 8399100
[patent_doc_number] => 08269481
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-09-18
[patent_title] => 'Automatic capture and storage of measurements in digital multimeter'
[patent_app_type] => utility
[patent_app_number] => 12/192108
[patent_app_country] => US
[patent_app_date] => 2008-08-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 10951
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 138
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12192108
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/192108 | Automatic capture and storage of measurements in digital multimeter | Aug 13, 2008 | Issued |
Array
(
[id] => 6452073
[patent_doc_number] => 20100039133
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-02-18
[patent_title] => 'PROBE HEAD CONTROLLING MECHANISM FOR PROBE CARD ASSEMBLIES'
[patent_app_type] => utility
[patent_app_number] => 12/191083
[patent_app_country] => US
[patent_app_date] => 2008-08-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 7760
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0039/20100039133.pdf
[firstpage_image] =>[orig_patent_app_number] => 12191083
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/191083 | PROBE HEAD CONTROLLING MECHANISM FOR PROBE CARD ASSEMBLIES | Aug 12, 2008 | Abandoned |
Array
(
[id] => 5519094
[patent_doc_number] => 20090027075
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-29
[patent_title] => 'System And Method of Digitally Testing An Analog Driver Circuit'
[patent_app_type] => utility
[patent_app_number] => 12/189226
[patent_app_country] => US
[patent_app_date] => 2008-08-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 6324
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0027/20090027075.pdf
[firstpage_image] =>[orig_patent_app_number] => 12189226
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/189226 | System and method of digitally testing an analog driver circuit | Aug 10, 2008 | Issued |
Array
(
[id] => 4789915
[patent_doc_number] => 20080290888
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-11-27
[patent_title] => 'PROBE SUBSTRATE FOR TEST AND MANUFACTURING METHOD THEREOF'
[patent_app_type] => utility
[patent_app_number] => 12/187583
[patent_app_country] => US
[patent_app_date] => 2008-08-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 5470
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0290/20080290888.pdf
[firstpage_image] =>[orig_patent_app_number] => 12187583
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/187583 | PROBE SUBSTRATE FOR TEST AND MANUFACTURING METHOD THEREOF | Aug 6, 2008 | Abandoned |
Array
(
[id] => 7703507
[patent_doc_number] => 08089266
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-01-03
[patent_title] => 'Measuring induced currents on a CAN bus'
[patent_app_type] => utility
[patent_app_number] => 12/187075
[patent_app_country] => US
[patent_app_date] => 2008-08-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 9
[patent_no_of_words] => 5862
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 127
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/089/08089266.pdf
[firstpage_image] =>[orig_patent_app_number] => 12187075
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/187075 | Measuring induced currents on a CAN bus | Aug 5, 2008 | Issued |
Array
(
[id] => 8147326
[patent_doc_number] => 08164337
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-24
[patent_title] => 'Assembly with a vibration-isolated cover'
[patent_app_type] => utility
[patent_app_number] => 12/221666
[patent_app_country] => US
[patent_app_date] => 2008-08-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 4025
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 90
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/164/08164337.pdf
[firstpage_image] =>[orig_patent_app_number] => 12221666
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/221666 | Assembly with a vibration-isolated cover | Aug 4, 2008 | Issued |
Array
(
[id] => 5512503
[patent_doc_number] => 20090212807
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-27
[patent_title] => 'PROBE OF CANTILEVER PROBE CARD'
[patent_app_type] => utility
[patent_app_number] => 12/182784
[patent_app_country] => US
[patent_app_date] => 2008-07-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2518
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0212/20090212807.pdf
[firstpage_image] =>[orig_patent_app_number] => 12182784
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/182784 | PROBE OF CANTILEVER PROBE CARD | Jul 29, 2008 | Abandoned |
Array
(
[id] => 5358558
[patent_doc_number] => 20090033352
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-05
[patent_title] => 'HANDLER AND PROCESS FOR TESTING A SEMICONDUCTOR CHIPS USING THE HANDLER'
[patent_app_type] => utility
[patent_app_number] => 12/182681
[patent_app_country] => US
[patent_app_date] => 2008-07-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 8575
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0033/20090033352.pdf
[firstpage_image] =>[orig_patent_app_number] => 12182681
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/182681 | Handler and process for testing a semiconductor chips using the handler | Jul 29, 2008 | Issued |
Array
(
[id] => 4554585
[patent_doc_number] => 07960994
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-06-14
[patent_title] => 'Test circuit for use in a semiconductor apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/178484
[patent_app_country] => US
[patent_app_date] => 2008-07-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 4780
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 75
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/960/07960994.pdf
[firstpage_image] =>[orig_patent_app_number] => 12178484
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/178484 | Test circuit for use in a semiconductor apparatus | Jul 22, 2008 | Issued |
Array
(
[id] => 6467517
[patent_doc_number] => 20100007370
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-14
[patent_title] => 'APPARATUS, SYSTEM, AND METHOD FOR ERROR DETECTION IN A STAND ALONE POWER SUPPLY'
[patent_app_type] => utility
[patent_app_number] => 12/171461
[patent_app_country] => US
[patent_app_date] => 2008-07-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 5854
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0007/20100007370.pdf
[firstpage_image] =>[orig_patent_app_number] => 12171461
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/171461 | Apparatus, system, and method for error detection in a stand alone power supply | Jul 10, 2008 | Issued |
Array
(
[id] => 4857024
[patent_doc_number] => 20080265874
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-10-30
[patent_title] => 'TEST HANDLER'
[patent_app_type] => utility
[patent_app_number] => 12/170680
[patent_app_country] => US
[patent_app_date] => 2008-07-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 6536
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0265/20080265874.pdf
[firstpage_image] =>[orig_patent_app_number] => 12170680
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/170680 | Test handler | Jul 9, 2008 | Issued |
Array
(
[id] => 169895
[patent_doc_number] => 07667453
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-02-23
[patent_title] => 'Test tray for test handler'
[patent_app_type] => utility
[patent_app_number] => 12/170648
[patent_app_country] => US
[patent_app_date] => 2008-07-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 5171
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 87
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/667/07667453.pdf
[firstpage_image] =>[orig_patent_app_number] => 12170648
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/170648 | Test tray for test handler | Jul 9, 2008 | Issued |
Array
(
[id] => 5444577
[patent_doc_number] => 20090045803
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-19
[patent_title] => 'System and Method for Premises Power Parameter and Power-Factor Reporting and Management'
[patent_app_type] => utility
[patent_app_number] => 12/168775
[patent_app_country] => US
[patent_app_date] => 2008-07-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4103
[patent_no_of_claims] => 32
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0045/20090045803.pdf
[firstpage_image] =>[orig_patent_app_number] => 12168775
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/168775 | System and Method for Premises Power Parameter and Power-Factor Reporting and Management | Jul 6, 2008 | Abandoned |
Array
(
[id] => 5346601
[patent_doc_number] => 20090001962
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-01
[patent_title] => 'CURRENT SENSOR WITH RESET CIRCUIT'
[patent_app_type] => utility
[patent_app_number] => 12/167692
[patent_app_country] => US
[patent_app_date] => 2008-07-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5207
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0001/20090001962.pdf
[firstpage_image] =>[orig_patent_app_number] => 12167692
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/167692 | Current sensor including an integrated circuit die including a first and second coil | Jul 2, 2008 | Issued |
Array
(
[id] => 4466161
[patent_doc_number] => 07936164
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-05-03
[patent_title] => 'Folding current sensor'
[patent_app_type] => utility
[patent_app_number] => 12/167681
[patent_app_country] => US
[patent_app_date] => 2008-07-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 22
[patent_no_of_words] => 6262
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 195
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/936/07936164.pdf
[firstpage_image] =>[orig_patent_app_number] => 12167681
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/167681 | Folding current sensor | Jul 2, 2008 | Issued |
Array
(
[id] => 5462166
[patent_doc_number] => 20090322366
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-12-31
[patent_title] => 'Integrated Tester Chip Using Die Packaging Technologies'
[patent_app_type] => utility
[patent_app_number] => 12/147918
[patent_app_country] => US
[patent_app_date] => 2008-06-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2412
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0322/20090322366.pdf
[firstpage_image] =>[orig_patent_app_number] => 12147918
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/147918 | Integrated Tester Chip Using Die Packaging Technologies | Jun 26, 2008 | Abandoned |
Array
(
[id] => 5294347
[patent_doc_number] => 20090009273
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-08
[patent_title] => 'Hall Effect Switching Circuit and Controlling Method for same'
[patent_app_type] => utility
[patent_app_number] => 12/146815
[patent_app_country] => US
[patent_app_date] => 2008-06-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3810
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0009/20090009273.pdf
[firstpage_image] =>[orig_patent_app_number] => 12146815
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/146815 | Hall Effect Switching Circuit and Controlling Method for same | Jun 25, 2008 | Abandoned |
Array
(
[id] => 5307999
[patent_doc_number] => 20090015280
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-15
[patent_title] => 'METHOD FOR CORRECTING DISPLACEMENT OF MULTI CARD AND METHOD FOR TESTING CIRCUIT ELEMENT'
[patent_app_type] => utility
[patent_app_number] => 12/145580
[patent_app_country] => US
[patent_app_date] => 2008-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4107
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0015/20090015280.pdf
[firstpage_image] =>[orig_patent_app_number] => 12145580
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/145580 | METHOD FOR CORRECTING DISPLACEMENT OF MULTI CARD AND METHOD FOR TESTING CIRCUIT ELEMENT | Jun 24, 2008 | Abandoned |
Array
(
[id] => 5320456
[patent_doc_number] => 20090058446
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-05
[patent_title] => 'INSPECTION APPARATUS AND INSPECTION METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/146081
[patent_app_country] => US
[patent_app_date] => 2008-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5344
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0058/20090058446.pdf
[firstpage_image] =>[orig_patent_app_number] => 12146081
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/146081 | Inspection apparatus and method for inspecting electric characteristics of devices formed on target object | Jun 24, 2008 | Issued |
Array
(
[id] => 5470478
[patent_doc_number] => 20090243644
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-01
[patent_title] => ' SOCKET, TEST DEVICE AND TEST METHOD FOR TESTING ELECTRONIC ELEMENT PACKAGES WITH LEADS'
[patent_app_type] => utility
[patent_app_number] => 12/142675
[patent_app_country] => US
[patent_app_date] => 2008-06-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4474
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0243/20090243644.pdf
[firstpage_image] =>[orig_patent_app_number] => 12142675
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/142675 | SOCKET, TEST DEVICE AND TEST METHOD FOR TESTING ELECTRONIC ELEMENT PACKAGES WITH LEADS | Jun 18, 2008 | Abandoned |