Search

Roberto Velez

Examiner (ID: 2101)

Most Active Art Unit
2829
Art Unit(s)
2829, 2662, 2858, 3600
Total Applications
491
Issued Applications
304
Pending Applications
69
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8399100 [patent_doc_number] => 08269481 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-18 [patent_title] => 'Automatic capture and storage of measurements in digital multimeter' [patent_app_type] => utility [patent_app_number] => 12/192108 [patent_app_country] => US [patent_app_date] => 2008-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 10951 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12192108 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/192108
Automatic capture and storage of measurements in digital multimeter Aug 13, 2008 Issued
Array ( [id] => 6452073 [patent_doc_number] => 20100039133 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-18 [patent_title] => 'PROBE HEAD CONTROLLING MECHANISM FOR PROBE CARD ASSEMBLIES' [patent_app_type] => utility [patent_app_number] => 12/191083 [patent_app_country] => US [patent_app_date] => 2008-08-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7760 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0039/20100039133.pdf [firstpage_image] =>[orig_patent_app_number] => 12191083 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/191083
PROBE HEAD CONTROLLING MECHANISM FOR PROBE CARD ASSEMBLIES Aug 12, 2008 Abandoned
Array ( [id] => 5519094 [patent_doc_number] => 20090027075 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-29 [patent_title] => 'System And Method of Digitally Testing An Analog Driver Circuit' [patent_app_type] => utility [patent_app_number] => 12/189226 [patent_app_country] => US [patent_app_date] => 2008-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6324 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0027/20090027075.pdf [firstpage_image] =>[orig_patent_app_number] => 12189226 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/189226
System and method of digitally testing an analog driver circuit Aug 10, 2008 Issued
Array ( [id] => 4789915 [patent_doc_number] => 20080290888 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-27 [patent_title] => 'PROBE SUBSTRATE FOR TEST AND MANUFACTURING METHOD THEREOF' [patent_app_type] => utility [patent_app_number] => 12/187583 [patent_app_country] => US [patent_app_date] => 2008-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 5470 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20080290888.pdf [firstpage_image] =>[orig_patent_app_number] => 12187583 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/187583
PROBE SUBSTRATE FOR TEST AND MANUFACTURING METHOD THEREOF Aug 6, 2008 Abandoned
Array ( [id] => 7703507 [patent_doc_number] => 08089266 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-01-03 [patent_title] => 'Measuring induced currents on a CAN bus' [patent_app_type] => utility [patent_app_number] => 12/187075 [patent_app_country] => US [patent_app_date] => 2008-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5862 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/089/08089266.pdf [firstpage_image] =>[orig_patent_app_number] => 12187075 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/187075
Measuring induced currents on a CAN bus Aug 5, 2008 Issued
Array ( [id] => 8147326 [patent_doc_number] => 08164337 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-04-24 [patent_title] => 'Assembly with a vibration-isolated cover' [patent_app_type] => utility [patent_app_number] => 12/221666 [patent_app_country] => US [patent_app_date] => 2008-08-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4025 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/164/08164337.pdf [firstpage_image] =>[orig_patent_app_number] => 12221666 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/221666
Assembly with a vibration-isolated cover Aug 4, 2008 Issued
Array ( [id] => 5512503 [patent_doc_number] => 20090212807 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-08-27 [patent_title] => 'PROBE OF CANTILEVER PROBE CARD' [patent_app_type] => utility [patent_app_number] => 12/182784 [patent_app_country] => US [patent_app_date] => 2008-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2518 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20090212807.pdf [firstpage_image] =>[orig_patent_app_number] => 12182784 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/182784
PROBE OF CANTILEVER PROBE CARD Jul 29, 2008 Abandoned
Array ( [id] => 5358558 [patent_doc_number] => 20090033352 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-05 [patent_title] => 'HANDLER AND PROCESS FOR TESTING A SEMICONDUCTOR CHIPS USING THE HANDLER' [patent_app_type] => utility [patent_app_number] => 12/182681 [patent_app_country] => US [patent_app_date] => 2008-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 8575 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0033/20090033352.pdf [firstpage_image] =>[orig_patent_app_number] => 12182681 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/182681
Handler and process for testing a semiconductor chips using the handler Jul 29, 2008 Issued
Array ( [id] => 4554585 [patent_doc_number] => 07960994 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-06-14 [patent_title] => 'Test circuit for use in a semiconductor apparatus' [patent_app_type] => utility [patent_app_number] => 12/178484 [patent_app_country] => US [patent_app_date] => 2008-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 4780 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/960/07960994.pdf [firstpage_image] =>[orig_patent_app_number] => 12178484 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/178484
Test circuit for use in a semiconductor apparatus Jul 22, 2008 Issued
Array ( [id] => 6467517 [patent_doc_number] => 20100007370 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-14 [patent_title] => 'APPARATUS, SYSTEM, AND METHOD FOR ERROR DETECTION IN A STAND ALONE POWER SUPPLY' [patent_app_type] => utility [patent_app_number] => 12/171461 [patent_app_country] => US [patent_app_date] => 2008-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5854 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20100007370.pdf [firstpage_image] =>[orig_patent_app_number] => 12171461 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/171461
Apparatus, system, and method for error detection in a stand alone power supply Jul 10, 2008 Issued
Array ( [id] => 4857024 [patent_doc_number] => 20080265874 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-30 [patent_title] => 'TEST HANDLER' [patent_app_type] => utility [patent_app_number] => 12/170680 [patent_app_country] => US [patent_app_date] => 2008-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 6536 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0265/20080265874.pdf [firstpage_image] =>[orig_patent_app_number] => 12170680 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/170680
Test handler Jul 9, 2008 Issued
Array ( [id] => 169895 [patent_doc_number] => 07667453 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-02-23 [patent_title] => 'Test tray for test handler' [patent_app_type] => utility [patent_app_number] => 12/170648 [patent_app_country] => US [patent_app_date] => 2008-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5171 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/667/07667453.pdf [firstpage_image] =>[orig_patent_app_number] => 12170648 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/170648
Test tray for test handler Jul 9, 2008 Issued
Array ( [id] => 5444577 [patent_doc_number] => 20090045803 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-19 [patent_title] => 'System and Method for Premises Power Parameter and Power-Factor Reporting and Management' [patent_app_type] => utility [patent_app_number] => 12/168775 [patent_app_country] => US [patent_app_date] => 2008-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4103 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20090045803.pdf [firstpage_image] =>[orig_patent_app_number] => 12168775 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/168775
System and Method for Premises Power Parameter and Power-Factor Reporting and Management Jul 6, 2008 Abandoned
Array ( [id] => 5346601 [patent_doc_number] => 20090001962 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-01 [patent_title] => 'CURRENT SENSOR WITH RESET CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/167692 [patent_app_country] => US [patent_app_date] => 2008-07-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5207 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20090001962.pdf [firstpage_image] =>[orig_patent_app_number] => 12167692 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/167692
Current sensor including an integrated circuit die including a first and second coil Jul 2, 2008 Issued
Array ( [id] => 4466161 [patent_doc_number] => 07936164 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-03 [patent_title] => 'Folding current sensor' [patent_app_type] => utility [patent_app_number] => 12/167681 [patent_app_country] => US [patent_app_date] => 2008-07-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 22 [patent_no_of_words] => 6262 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/936/07936164.pdf [firstpage_image] =>[orig_patent_app_number] => 12167681 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/167681
Folding current sensor Jul 2, 2008 Issued
Array ( [id] => 5462166 [patent_doc_number] => 20090322366 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-31 [patent_title] => 'Integrated Tester Chip Using Die Packaging Technologies' [patent_app_type] => utility [patent_app_number] => 12/147918 [patent_app_country] => US [patent_app_date] => 2008-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2412 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0322/20090322366.pdf [firstpage_image] =>[orig_patent_app_number] => 12147918 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/147918
Integrated Tester Chip Using Die Packaging Technologies Jun 26, 2008 Abandoned
Array ( [id] => 5294347 [patent_doc_number] => 20090009273 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-08 [patent_title] => 'Hall Effect Switching Circuit and Controlling Method for same' [patent_app_type] => utility [patent_app_number] => 12/146815 [patent_app_country] => US [patent_app_date] => 2008-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3810 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0009/20090009273.pdf [firstpage_image] =>[orig_patent_app_number] => 12146815 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/146815
Hall Effect Switching Circuit and Controlling Method for same Jun 25, 2008 Abandoned
Array ( [id] => 5307999 [patent_doc_number] => 20090015280 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-15 [patent_title] => 'METHOD FOR CORRECTING DISPLACEMENT OF MULTI CARD AND METHOD FOR TESTING CIRCUIT ELEMENT' [patent_app_type] => utility [patent_app_number] => 12/145580 [patent_app_country] => US [patent_app_date] => 2008-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4107 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0015/20090015280.pdf [firstpage_image] =>[orig_patent_app_number] => 12145580 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/145580
METHOD FOR CORRECTING DISPLACEMENT OF MULTI CARD AND METHOD FOR TESTING CIRCUIT ELEMENT Jun 24, 2008 Abandoned
Array ( [id] => 5320456 [patent_doc_number] => 20090058446 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-05 [patent_title] => 'INSPECTION APPARATUS AND INSPECTION METHOD' [patent_app_type] => utility [patent_app_number] => 12/146081 [patent_app_country] => US [patent_app_date] => 2008-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5344 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0058/20090058446.pdf [firstpage_image] =>[orig_patent_app_number] => 12146081 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/146081
Inspection apparatus and method for inspecting electric characteristics of devices formed on target object Jun 24, 2008 Issued
Array ( [id] => 5470478 [patent_doc_number] => 20090243644 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-01 [patent_title] => ' SOCKET, TEST DEVICE AND TEST METHOD FOR TESTING ELECTRONIC ELEMENT PACKAGES WITH LEADS' [patent_app_type] => utility [patent_app_number] => 12/142675 [patent_app_country] => US [patent_app_date] => 2008-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4474 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0243/20090243644.pdf [firstpage_image] =>[orig_patent_app_number] => 12142675 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/142675
SOCKET, TEST DEVICE AND TEST METHOD FOR TESTING ELECTRONIC ELEMENT PACKAGES WITH LEADS Jun 18, 2008 Abandoned
Menu