
Roberto Velez
Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2829, 2662, 2858, 3600 |
| Total Applications | 504 |
| Issued Applications | 309 |
| Pending Applications | 75 |
| Abandoned Applications | 135 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6507680
[patent_doc_number] => 20100013508
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-21
[patent_title] => 'PROBE CARD CASSETTE AND PROBE CARD'
[patent_app_type] => utility
[patent_app_number] => 11/995081
[patent_app_country] => US
[patent_app_date] => 2007-07-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4788
[patent_no_of_claims] => 7
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[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0013/20100013508.pdf
[firstpage_image] =>[orig_patent_app_number] => 11995081
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/995081 | PROBE CARD CASSETTE AND PROBE CARD | Jul 22, 2007 | Abandoned |
Array
(
[id] => 6403796
[patent_doc_number] => 20100148813
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-17
[patent_title] => 'APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q-V, AND I-V TESTING OF SEMICONDUCTOR MATERIALS'
[patent_app_type] => utility
[patent_app_number] => 11/779282
[patent_app_country] => US
[patent_app_date] => 2007-07-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 18
[patent_no_of_words] => 9500
[patent_no_of_claims] => 30
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0148/20100148813.pdf
[firstpage_image] =>[orig_patent_app_number] => 11779282
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/779282 | APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q-V, AND I-V TESTING OF SEMICONDUCTOR MATERIALS | Jul 17, 2007 | Abandoned |
Array
(
[id] => 5297821
[patent_doc_number] => 20090012747
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-08
[patent_title] => 'Multiple Line Width Electromigration Test Structure and Method'
[patent_app_type] => utility
[patent_app_number] => 11/772310
[patent_app_country] => US
[patent_app_date] => 2007-07-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4118
[patent_no_of_claims] => 32
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0012/20090012747.pdf
[firstpage_image] =>[orig_patent_app_number] => 11772310
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/772310 | Multiple line width electromigration test structure and method | Jul 1, 2007 | Issued |
Array
(
[id] => 5395486
[patent_doc_number] => 20090315549
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-12-24
[patent_title] => 'METHOD FOR PROCESSING SENSOR SIGNALS SUBJECT TO AN OFFSET AND SENSOR ARRANGEMENT DESIGNED TO CARRY OUT THE METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/305425
[patent_app_country] => US
[patent_app_date] => 2007-06-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => publications/A1/0315/20090315549.pdf
[firstpage_image] =>[orig_patent_app_number] => 12305425
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/305425 | Method for processing sensor signals subject to an offset and sensor arrangement designed to carry out the method | Jun 28, 2007 | Issued |
Array
(
[id] => 4763121
[patent_doc_number] => 20080174331
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-24
[patent_title] => 'Structure of test area for a semiconductor tester'
[patent_app_type] => utility
[patent_app_number] => 11/819084
[patent_app_country] => US
[patent_app_date] => 2007-06-25
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11819084
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/819084 | Structure of test area for a semiconductor tester | Jun 24, 2007 | Abandoned |
Array
(
[id] => 133067
[patent_doc_number] => 07701233
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-04-20
[patent_title] => 'Heat-resistant lens kit'
[patent_app_type] => utility
[patent_app_number] => 11/819083
[patent_app_country] => US
[patent_app_date] => 2007-06-25
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/701/07701233.pdf
[firstpage_image] =>[orig_patent_app_number] => 11819083
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/819083 | Heat-resistant lens kit | Jun 24, 2007 | Issued |
Array
(
[id] => 5313936
[patent_doc_number] => 20090278534
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-11-12
[patent_title] => 'MAGNETIC SENSOR DEVICE FOR AND A METHOD OF SENSING MAGNETIC PARTICLES'
[patent_app_type] => utility
[patent_app_number] => 12/305385
[patent_app_country] => US
[patent_app_date] => 2007-06-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 9014
[patent_no_of_claims] => 23
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[pdf_file] => publications/A1/0278/20090278534.pdf
[firstpage_image] =>[orig_patent_app_number] => 12305385
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/305385 | MAGNETIC SENSOR DEVICE FOR AND A METHOD OF SENSING MAGNETIC PARTICLES | Jun 17, 2007 | Abandoned |
Array
(
[id] => 7691793
[patent_doc_number] => 20070232240
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-10-04
[patent_title] => 'PROBING SYSTEM FOR INTEGRATED CIRCUIT DEVICES'
[patent_app_type] => utility
[patent_app_number] => 11/761964
[patent_app_country] => US
[patent_app_date] => 2007-06-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 1895
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[pdf_file] => publications/A1/0232/20070232240.pdf
[firstpage_image] =>[orig_patent_app_number] => 11761964
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/761964 | PROBING SYSTEM FOR INTEGRATED CIRCUIT DEVICES | Jun 11, 2007 | Abandoned |
Array
(
[id] => 4795918
[patent_doc_number] => 20080007504
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-10
[patent_title] => 'Liquid crystal display apparatus and testing method for liquid crystal display apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/811774
[patent_app_country] => US
[patent_app_date] => 2007-06-12
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0007/20080007504.pdf
[firstpage_image] =>[orig_patent_app_number] => 11811774
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/811774 | Liquid crystal display apparatus and testing method for liquid crystal display apparatus | Jun 11, 2007 | Issued |
Array
(
[id] => 221531
[patent_doc_number] => 07609077
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-10-27
[patent_title] => 'Differential signal probe with integral balun'
[patent_app_type] => utility
[patent_app_number] => 11/811682
[patent_app_country] => US
[patent_app_date] => 2007-06-11
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/609/07609077.pdf
[firstpage_image] =>[orig_patent_app_number] => 11811682
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/811682 | Differential signal probe with integral balun | Jun 10, 2007 | Issued |
Array
(
[id] => 5377760
[patent_doc_number] => 20090189599
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-07-30
[patent_title] => 'DEVICE AND METHOD FOR MEASURING CONCENTRATION OF MAGNETIC MATERIAL'
[patent_app_type] => utility
[patent_app_number] => 12/302631
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[patent_app_date] => 2007-05-29
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 12302631
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/302631 | Device and method for measuring concentration of magnetic material | May 28, 2007 | Issued |
Array
(
[id] => 4673884
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[patent_issue_date] => 2008-09-04
[patent_title] => 'Test circuit arrangement and testing method for testing of a circuit section'
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Array
(
[id] => 5044107
[patent_doc_number] => 20070262778
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[patent_title] => 'DC TEST APPARATUS'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/746584 | DC TEST APPARATUS | May 8, 2007 | Abandoned |
Array
(
[id] => 6579208
[patent_doc_number] => 20100097055
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[patent_issue_date] => 2010-04-22
[patent_title] => 'ANGLE DETECTOR'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/527794 | ANGLE DETECTOR | Apr 25, 2007 | Abandoned |
Array
(
[id] => 4716597
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[patent_title] => 'IMAGE CAPTURING SYSTEM AND TECHNIQUE'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/694946 | IMAGE CAPTURING SYSTEM AND TECHNIQUE | Mar 30, 2007 | Abandoned |
Array
(
[id] => 4715913
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[patent_title] => 'INTEGRATED CIRCUIT TESTING WITH LASER STIMULATION AND EMISSION ANALYSIS'
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[firstpage_image] =>[orig_patent_app_number] => 11691480
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/691480 | Integrated circuit testing with laser stimulation and emission analysis | Mar 25, 2007 | Issued |
Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/682781 | Method and system for automatically managing probe mark shifts | Mar 5, 2007 | Issued |
Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/680679 | Display device, display device testing system and method for testing a display device using the same | Feb 28, 2007 | Issued |