Search

Roberto Velez

Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )

Most Active Art Unit
2829
Art Unit(s)
2829, 2662, 2858, 3600
Total Applications
504
Issued Applications
309
Pending Applications
75
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6507680 [patent_doc_number] => 20100013508 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-21 [patent_title] => 'PROBE CARD CASSETTE AND PROBE CARD' [patent_app_type] => utility [patent_app_number] => 11/995081 [patent_app_country] => US [patent_app_date] => 2007-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4788 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0013/20100013508.pdf [firstpage_image] =>[orig_patent_app_number] => 11995081 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/995081
PROBE CARD CASSETTE AND PROBE CARD Jul 22, 2007 Abandoned
Array ( [id] => 6403796 [patent_doc_number] => 20100148813 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-17 [patent_title] => 'APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q-V, AND I-V TESTING OF SEMICONDUCTOR MATERIALS' [patent_app_type] => utility [patent_app_number] => 11/779282 [patent_app_country] => US [patent_app_date] => 2007-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 9500 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20100148813.pdf [firstpage_image] =>[orig_patent_app_number] => 11779282 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/779282
APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q-V, AND I-V TESTING OF SEMICONDUCTOR MATERIALS Jul 17, 2007 Abandoned
Array ( [id] => 5297821 [patent_doc_number] => 20090012747 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-08 [patent_title] => 'Multiple Line Width Electromigration Test Structure and Method' [patent_app_type] => utility [patent_app_number] => 11/772310 [patent_app_country] => US [patent_app_date] => 2007-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4118 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20090012747.pdf [firstpage_image] =>[orig_patent_app_number] => 11772310 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/772310
Multiple line width electromigration test structure and method Jul 1, 2007 Issued
Array ( [id] => 5395486 [patent_doc_number] => 20090315549 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-24 [patent_title] => 'METHOD FOR PROCESSING SENSOR SIGNALS SUBJECT TO AN OFFSET AND SENSOR ARRANGEMENT DESIGNED TO CARRY OUT THE METHOD' [patent_app_type] => utility [patent_app_number] => 12/305425 [patent_app_country] => US [patent_app_date] => 2007-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5777 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0315/20090315549.pdf [firstpage_image] =>[orig_patent_app_number] => 12305425 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/305425
Method for processing sensor signals subject to an offset and sensor arrangement designed to carry out the method Jun 28, 2007 Issued
Array ( [id] => 4763121 [patent_doc_number] => 20080174331 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-24 [patent_title] => 'Structure of test area for a semiconductor tester' [patent_app_type] => utility [patent_app_number] => 11/819084 [patent_app_country] => US [patent_app_date] => 2007-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2163 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20080174331.pdf [firstpage_image] =>[orig_patent_app_number] => 11819084 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/819084
Structure of test area for a semiconductor tester Jun 24, 2007 Abandoned
Array ( [id] => 133067 [patent_doc_number] => 07701233 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-20 [patent_title] => 'Heat-resistant lens kit' [patent_app_type] => utility [patent_app_number] => 11/819083 [patent_app_country] => US [patent_app_date] => 2007-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 1671 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/701/07701233.pdf [firstpage_image] =>[orig_patent_app_number] => 11819083 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/819083
Heat-resistant lens kit Jun 24, 2007 Issued
Array ( [id] => 5313936 [patent_doc_number] => 20090278534 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-11-12 [patent_title] => 'MAGNETIC SENSOR DEVICE FOR AND A METHOD OF SENSING MAGNETIC PARTICLES' [patent_app_type] => utility [patent_app_number] => 12/305385 [patent_app_country] => US [patent_app_date] => 2007-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 9014 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0278/20090278534.pdf [firstpage_image] =>[orig_patent_app_number] => 12305385 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/305385
MAGNETIC SENSOR DEVICE FOR AND A METHOD OF SENSING MAGNETIC PARTICLES Jun 17, 2007 Abandoned
Array ( [id] => 7691793 [patent_doc_number] => 20070232240 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-10-04 [patent_title] => 'PROBING SYSTEM FOR INTEGRATED CIRCUIT DEVICES' [patent_app_type] => utility [patent_app_number] => 11/761964 [patent_app_country] => US [patent_app_date] => 2007-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1895 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0232/20070232240.pdf [firstpage_image] =>[orig_patent_app_number] => 11761964 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/761964
PROBING SYSTEM FOR INTEGRATED CIRCUIT DEVICES Jun 11, 2007 Abandoned
Array ( [id] => 4795918 [patent_doc_number] => 20080007504 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-10 [patent_title] => 'Liquid crystal display apparatus and testing method for liquid crystal display apparatus' [patent_app_type] => utility [patent_app_number] => 11/811774 [patent_app_country] => US [patent_app_date] => 2007-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9424 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20080007504.pdf [firstpage_image] =>[orig_patent_app_number] => 11811774 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/811774
Liquid crystal display apparatus and testing method for liquid crystal display apparatus Jun 11, 2007 Issued
Array ( [id] => 221531 [patent_doc_number] => 07609077 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-10-27 [patent_title] => 'Differential signal probe with integral balun' [patent_app_type] => utility [patent_app_number] => 11/811682 [patent_app_country] => US [patent_app_date] => 2007-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 6036 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 247 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/609/07609077.pdf [firstpage_image] =>[orig_patent_app_number] => 11811682 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/811682
Differential signal probe with integral balun Jun 10, 2007 Issued
Array ( [id] => 5377760 [patent_doc_number] => 20090189599 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-30 [patent_title] => 'DEVICE AND METHOD FOR MEASURING CONCENTRATION OF MAGNETIC MATERIAL' [patent_app_type] => utility [patent_app_number] => 12/302631 [patent_app_country] => US [patent_app_date] => 2007-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 11405 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0189/20090189599.pdf [firstpage_image] =>[orig_patent_app_number] => 12302631 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/302631
Device and method for measuring concentration of magnetic material May 28, 2007 Issued
Array ( [id] => 4673884 [patent_doc_number] => 20080211512 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-04 [patent_title] => 'Test circuit arrangement and testing method for testing of a circuit section' [patent_app_type] => utility [patent_app_number] => 11/807181 [patent_app_country] => US [patent_app_date] => 2007-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5724 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0211/20080211512.pdf [firstpage_image] =>[orig_patent_app_number] => 11807181 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/807181
Test circuit arrangement and testing method for testing of a circuit section May 24, 2007 Abandoned
Array ( [id] => 5044107 [patent_doc_number] => 20070262778 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-15 [patent_title] => 'DC TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 11/746584 [patent_app_country] => US [patent_app_date] => 2007-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3805 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0262/20070262778.pdf [firstpage_image] =>[orig_patent_app_number] => 11746584 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/746584
DC TEST APPARATUS May 8, 2007 Abandoned
Array ( [id] => 6579208 [patent_doc_number] => 20100097055 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-22 [patent_title] => 'ANGLE DETECTOR' [patent_app_type] => utility [patent_app_number] => 12/527794 [patent_app_country] => US [patent_app_date] => 2007-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 2394 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20100097055.pdf [firstpage_image] =>[orig_patent_app_number] => 12527794 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/527794
ANGLE DETECTOR Apr 25, 2007 Abandoned
Array ( [id] => 4716597 [patent_doc_number] => 20080239119 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'IMAGE CAPTURING SYSTEM AND TECHNIQUE' [patent_app_type] => utility [patent_app_number] => 11/694946 [patent_app_country] => US [patent_app_date] => 2007-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5744 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0239/20080239119.pdf [firstpage_image] =>[orig_patent_app_number] => 11694946 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/694946
IMAGE CAPTURING SYSTEM AND TECHNIQUE Mar 30, 2007 Abandoned
Array ( [id] => 4715913 [patent_doc_number] => 20080238435 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'INTEGRATED CIRCUIT TESTING WITH LASER STIMULATION AND EMISSION ANALYSIS' [patent_app_type] => utility [patent_app_number] => 11/691480 [patent_app_country] => US [patent_app_date] => 2007-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3368 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0238/20080238435.pdf [firstpage_image] =>[orig_patent_app_number] => 11691480 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/691480
Integrated circuit testing with laser stimulation and emission analysis Mar 25, 2007 Issued
Array ( [id] => 5157907 [patent_doc_number] => 20070170951 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-26 [patent_title] => 'Control system and method of semiconductor inspection system' [patent_app_type] => utility [patent_app_number] => 11/723808 [patent_app_country] => US [patent_app_date] => 2007-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2645 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0170/20070170951.pdf [firstpage_image] =>[orig_patent_app_number] => 11723808 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/723808
Control system and method of semiconductor inspection system Mar 21, 2007 Issued
Array ( [id] => 4763108 [patent_doc_number] => 20080174318 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-24 [patent_title] => 'TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 11/688878 [patent_app_country] => US [patent_app_date] => 2007-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2842 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20080174318.pdf [firstpage_image] =>[orig_patent_app_number] => 11688878 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/688878
Test apparatus Mar 20, 2007 Issued
Array ( [id] => 7546123 [patent_doc_number] => 08054097 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-08 [patent_title] => 'Method and system for automatically managing probe mark shifts' [patent_app_type] => utility [patent_app_number] => 11/682781 [patent_app_country] => US [patent_app_date] => 2007-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 4172 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/054/08054097.pdf [firstpage_image] =>[orig_patent_app_number] => 11682781 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/682781
Method and system for automatically managing probe mark shifts Mar 5, 2007 Issued
Array ( [id] => 4444196 [patent_doc_number] => 07928752 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-19 [patent_title] => 'Display device, display device testing system and method for testing a display device using the same' [patent_app_type] => utility [patent_app_number] => 11/680679 [patent_app_country] => US [patent_app_date] => 2007-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 11056 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/928/07928752.pdf [firstpage_image] =>[orig_patent_app_number] => 11680679 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/680679
Display device, display device testing system and method for testing a display device using the same Feb 28, 2007 Issued
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