Search

Roberto Velez

Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )

Most Active Art Unit
2829
Art Unit(s)
2829, 2662, 2858, 3600
Total Applications
504
Issued Applications
309
Pending Applications
75
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4724527 [patent_doc_number] => 20080204068 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'METHOD FOR ESTIMATING DEFECTS IN AN NPN TRANSISTOR ARRAY' [patent_app_type] => utility [patent_app_number] => 11/680283 [patent_app_country] => US [patent_app_date] => 2007-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2229 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0204/20080204068.pdf [firstpage_image] =>[orig_patent_app_number] => 11680283 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/680283
METHOD FOR ESTIMATING DEFECTS IN AN NPN TRANSISTOR ARRAY Feb 27, 2007 Abandoned
Array ( [id] => 203673 [patent_doc_number] => 07633308 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-12-15 [patent_title] => 'Combined pulse and DC test system' [patent_app_type] => utility [patent_app_number] => 11/704479 [patent_app_country] => US [patent_app_date] => 2007-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1348 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/633/07633308.pdf [firstpage_image] =>[orig_patent_app_number] => 11704479 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/704479
Combined pulse and DC test system Feb 8, 2007 Issued
Array ( [id] => 5003018 [patent_doc_number] => 20070200585 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-30 [patent_title] => 'Semiconductor wafer, semiconductor chip, semiconductor device, and wafer testing method' [patent_app_type] => utility [patent_app_number] => 11/702180 [patent_app_country] => US [patent_app_date] => 2007-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 10454 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0200/20070200585.pdf [firstpage_image] =>[orig_patent_app_number] => 11702180 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/702180
Semiconductor wafer, semiconductor chip, semiconductor device, and wafer testing method Feb 4, 2007 Abandoned
Array ( [id] => 330971 [patent_doc_number] => 07511470 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-31 [patent_title] => 'Electronic tamper detection circuit for an electricity meter' [patent_app_type] => utility [patent_app_number] => 11/668180 [patent_app_country] => US [patent_app_date] => 2007-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 5080 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/511/07511470.pdf [firstpage_image] =>[orig_patent_app_number] => 11668180 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/668180
Electronic tamper detection circuit for an electricity meter Jan 28, 2007 Issued
Array ( [id] => 4774794 [patent_doc_number] => 20080282792 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-20 [patent_title] => 'Device and Method For Measuring and Monitoring the Level of Liquid Metal in a Crystalliser' [patent_app_type] => utility [patent_app_number] => 12/162259 [patent_app_country] => US [patent_app_date] => 2007-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3598 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0282/20080282792.pdf [firstpage_image] =>[orig_patent_app_number] => 12162259 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/162259
Device and method for measuring and monitoring the level of liquid metal in a crystalliser Jan 25, 2007 Issued
Array ( [id] => 5093412 [patent_doc_number] => 20070115021 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-24 [patent_title] => 'TESTING METHOD FOR ARRAY SUBSTRATE' [patent_app_type] => utility [patent_app_number] => 11/626530 [patent_app_country] => US [patent_app_date] => 2007-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 7363 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0115/20070115021.pdf [firstpage_image] =>[orig_patent_app_number] => 11626530 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/626530
Testing method for array substrate Jan 23, 2007 Issued
Array ( [id] => 5340982 [patent_doc_number] => 20090179632 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-16 [patent_title] => 'Magnetic Resolver' [patent_app_type] => utility [patent_app_number] => 12/087101 [patent_app_country] => US [patent_app_date] => 2006-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8991 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20090179632.pdf [firstpage_image] =>[orig_patent_app_number] => 12087101 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/087101
Magnetic resolver Dec 21, 2006 Issued
Array ( [id] => 810745 [patent_doc_number] => 07417450 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-08-26 [patent_title] => 'Testing combinational logic die with bidirectional TDI-TMS/TDO chanel circuit' [patent_app_type] => utility [patent_app_number] => 11/565979 [patent_app_country] => US [patent_app_date] => 2006-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 23 [patent_no_of_words] => 4400 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/417/07417450.pdf [firstpage_image] =>[orig_patent_app_number] => 11565979 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/565979
Testing combinational logic die with bidirectional TDI-TMS/TDO chanel circuit Nov 30, 2006 Issued
Array ( [id] => 4963432 [patent_doc_number] => 20080106252 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-08 [patent_title] => 'INTEGRATED CURRENT SENSING TRANSFORMER AND CURRENT SENSING CIRCUIT USING SUCH TRANSFORMER' [patent_app_type] => utility [patent_app_number] => 11/564978 [patent_app_country] => US [patent_app_date] => 2006-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3700 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0106/20080106252.pdf [firstpage_image] =>[orig_patent_app_number] => 11564978 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/564978
Integrated current sensing transformer and current sensing circuit using such transformer Nov 29, 2006 Issued
Array ( [id] => 5039235 [patent_doc_number] => 20070091517 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-26 [patent_title] => 'SYSTEM AND METHOD FOR REGENERATIVE BURN-IN' [patent_app_type] => utility [patent_app_number] => 11/557912 [patent_app_country] => US [patent_app_date] => 2006-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 3944 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0091/20070091517.pdf [firstpage_image] =>[orig_patent_app_number] => 11557912 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/557912
SYSTEM AND METHOD FOR REGENERATIVE BURN-IN Nov 7, 2006 Abandoned
Array ( [id] => 5181066 [patent_doc_number] => 20070052408 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-08 [patent_title] => 'Current measuring device' [patent_app_type] => utility [patent_app_number] => 11/593564 [patent_app_country] => US [patent_app_date] => 2006-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4419 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0052/20070052408.pdf [firstpage_image] =>[orig_patent_app_number] => 11593564 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/593564
Current measuring device Nov 6, 2006 Issued
Array ( [id] => 5197116 [patent_doc_number] => 20070296434 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'Temperature control method and apparatus and test method and apparatus of semiconductor devices' [patent_app_type] => utility [patent_app_number] => 11/585284 [patent_app_country] => US [patent_app_date] => 2006-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5287 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0296/20070296434.pdf [firstpage_image] =>[orig_patent_app_number] => 11585284 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/585284
Temperature control method and apparatus and test method and apparatus of semiconductor devices Oct 23, 2006 Abandoned
Array ( [id] => 7541045 [patent_doc_number] => 08058891 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-15 [patent_title] => 'Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method' [patent_app_type] => utility [patent_app_number] => 12/083577 [patent_app_country] => US [patent_app_date] => 2006-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 24 [patent_no_of_words] => 9238 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 220 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/058/08058891.pdf [firstpage_image] =>[orig_patent_app_number] => 12083577 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/083577
Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method Oct 17, 2006 Issued
Array ( [id] => 881409 [patent_doc_number] => 07355377 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-04-08 [patent_title] => 'Telescoping electrical tester' [patent_app_type] => utility [patent_app_number] => 11/581982 [patent_app_country] => US [patent_app_date] => 2006-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 3387 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 207 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/355/07355377.pdf [firstpage_image] =>[orig_patent_app_number] => 11581982 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/581982
Telescoping electrical tester Oct 16, 2006 Issued
Array ( [id] => 5234284 [patent_doc_number] => 20070126439 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-07 [patent_title] => 'METHODS AND APPARATUS FOR CREATING A HIGH SPEED CONNECTION BETWEEN A DEVICE UNDER TEST AND AUTOMATIC TEST EQUIPMENT' [patent_app_type] => utility [patent_app_number] => 11/548382 [patent_app_country] => US [patent_app_date] => 2006-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 4786 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0126/20070126439.pdf [firstpage_image] =>[orig_patent_app_number] => 11548382 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/548382
METHODS AND APPARATUS FOR CREATING A HIGH SPEED CONNECTION BETWEEN A DEVICE UNDER TEST AND AUTOMATIC TEST EQUIPMENT Oct 10, 2006 Abandoned
Array ( [id] => 8665199 [patent_doc_number] => 08378662 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-02-19 [patent_title] => 'Current sensor' [patent_app_type] => utility [patent_app_number] => 12/162127 [patent_app_country] => US [patent_app_date] => 2006-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 15 [patent_no_of_words] => 4475 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 246 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12162127 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/162127
Current sensor Oct 6, 2006 Issued
Array ( [id] => 5037269 [patent_doc_number] => 20070089551 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-26 [patent_title] => 'Cantilever probe structure for a probe card assembly' [patent_app_type] => utility [patent_app_number] => 11/529784 [patent_app_country] => US [patent_app_date] => 2006-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 7673 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0089/20070089551.pdf [firstpage_image] =>[orig_patent_app_number] => 11529784 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/529784
Cantilever probe structure for a probe card assembly Sep 28, 2006 Abandoned
Array ( [id] => 203640 [patent_doc_number] => 07633288 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-15 [patent_title] => 'Method of testing semiconductor devices and handler used for testing semiconductor devices' [patent_app_type] => utility [patent_app_number] => 11/527378 [patent_app_country] => US [patent_app_date] => 2006-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5127 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/633/07633288.pdf [firstpage_image] =>[orig_patent_app_number] => 11527378 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/527378
Method of testing semiconductor devices and handler used for testing semiconductor devices Sep 26, 2006 Issued
Array ( [id] => 5038543 [patent_doc_number] => 20070090825 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-26 [patent_title] => 'Current sensor' [patent_app_type] => utility [patent_app_number] => 11/526683 [patent_app_country] => US [patent_app_date] => 2006-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 15042 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0090/20070090825.pdf [firstpage_image] =>[orig_patent_app_number] => 11526683 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/526683
Current sensor Sep 25, 2006 Issued
Array ( [id] => 4907584 [patent_doc_number] => 20080018350 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-24 [patent_title] => 'Test probe for integrated circuits with ultra-fine pitch terminals' [patent_app_type] => utility [patent_app_number] => 11/525581 [patent_app_country] => US [patent_app_date] => 2006-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3370 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20080018350.pdf [firstpage_image] =>[orig_patent_app_number] => 11525581 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/525581
Test probe for integrated circuits with ultra-fine pitch terminals Sep 21, 2006 Abandoned
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