Roberto Velez

Array ( [id] => 4992635 [patent_doc_number] => 20070007979 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-11 [patent_title] => 'Probe device capable of being used for plural kinds of testers' [patent_app_type] => utility [patent_app_number] => 11/522984 [patent_app_country] => US [patent_app_date] => 2006-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5787 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20070007979.pdf [firstpage_image] =>[orig_patent_app_number] => 11522984 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5157891 [patent_doc_number] => 20070170935 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-26 [patent_title] => 'TEST MODULE FOR WAFER' [patent_app_type] => utility [patent_app_number] => 11/309678 [patent_app_country] => US [patent_app_date] => 2006-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2799 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0170/20070170935.pdf [firstpage_image] =>[orig_patent_app_number] => 11309678 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5186467 [patent_doc_number] => 20070164775 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-19 [patent_title] => 'Method of Kelvin current sense in a semiconductor package' [patent_app_type] => utility [patent_app_number] => 11/467401 [patent_app_country] => US [patent_app_date] => 2006-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4357 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20070164775.pdf [firstpage_image] =>[orig_patent_app_number] => 11467401 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5150630 [patent_doc_number] => 20070050690 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-01 [patent_title] => 'Circuit and method for component communication' [patent_app_type] => utility [patent_app_number] => 11/466579 [patent_app_country] => US [patent_app_date] => 2006-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6621 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20070050690.pdf [firstpage_image] =>[orig_patent_app_number] => 11466579 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4812640 [patent_doc_number] => 20080193271 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-14 [patent_title] => 'Test Handler' [patent_app_type] => utility [patent_app_number] => 11/997974 [patent_app_country] => US [patent_app_date] => 2006-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4801 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0193/20080193271.pdf [firstpage_image] =>[orig_patent_app_number] => 11997974 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7492872 [patent_doc_number] => 08030952 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-10-04 [patent_title] => 'Power sink for IC temperature control' [patent_app_type] => utility [patent_app_number] => 11/494808 [patent_app_country] => US [patent_app_date] => 2006-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 5755 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/030/08030952.pdf [firstpage_image] =>[orig_patent_app_number] => 11494808 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 889581 [patent_doc_number] => 07348792 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-25 [patent_title] => 'Packaging reliability super chips' [patent_app_type] => utility [patent_app_number] => 11/491216 [patent_app_country] => US [patent_app_date] => 2006-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 4391 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/348/07348792.pdf [firstpage_image] =>[orig_patent_app_number] => 11491216 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5730713 [patent_doc_number] => 20060255827 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-16 [patent_title] => 'Inspection method and inspection device for display device and active matrix substrate used for display device' [patent_app_type] => utility [patent_app_number] => 11/489881 [patent_app_country] => US [patent_app_date] => 2006-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 10210 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0255/20060255827.pdf [firstpage_image] =>[orig_patent_app_number] => 11489881 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5118121 [patent_doc_number] => 20070139835 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-21 [patent_title] => 'CURRENT SENSOR WITH RESET CIRCUIT' [patent_app_type] => utility [patent_app_number] => 11/428082 [patent_app_country] => US [patent_app_date] => 2006-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5556 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0139/20070139835.pdf [firstpage_image] =>[orig_patent_app_number] => 11428082 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4992639 [patent_doc_number] => 20070007983 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-11 [patent_title] => 'Semiconductor wafer tester' [patent_app_type] => utility [patent_app_number] => 11/454674 [patent_app_country] => US [patent_app_date] => 2006-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6350 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20070007983.pdf [firstpage_image] =>[orig_patent_app_number] => 11454674 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 143020 [patent_doc_number] => 07688085 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-30 [patent_title] => 'Contactor having a global spring structure and methods of making and using the contactor' [patent_app_type] => utility [patent_app_number] => 11/423878 [patent_app_country] => US [patent_app_date] => 2006-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 45 [patent_no_of_words] => 9221 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/688/07688085.pdf [firstpage_image] =>[orig_patent_app_number] => 11423878 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5640852 [patent_doc_number] => 20060279307 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-14 [patent_title] => 'Automatic testing apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/451184 [patent_app_country] => US [patent_app_date] => 2006-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3125 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0279/20060279307.pdf [firstpage_image] =>[orig_patent_app_number] => 11451184 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 881601 [patent_doc_number] => 07355432 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-08 [patent_title] => 'Buffer circuit, driver circuit, and semiconductor testing apparatus' [patent_app_type] => utility [patent_app_number] => 11/447666 [patent_app_country] => US [patent_app_date] => 2006-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 9535 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/355/07355432.pdf [firstpage_image] =>[orig_patent_app_number] => 11447666 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5640816 [patent_doc_number] => 20060279271 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-14 [patent_title] => 'Electric field sensor with electrode interleaving vibration' [patent_app_type] => utility [patent_app_number] => 11/446781 [patent_app_country] => US [patent_app_date] => 2006-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1982 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0279/20060279271.pdf [firstpage_image] =>[orig_patent_app_number] => 11446781 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4533704 [patent_doc_number] => 07924034 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-12 [patent_title] => 'Electric connecting apparatus' [patent_app_type] => utility [patent_app_number] => 12/300784 [patent_app_country] => US [patent_app_date] => 2006-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4598 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/924/07924034.pdf [firstpage_image] =>[orig_patent_app_number] => 12300784 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5606103 [patent_doc_number] => 20060267619 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-30 [patent_title] => 'Transfer device' [patent_app_type] => utility [patent_app_number] => 11/442778 [patent_app_country] => US [patent_app_date] => 2006-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1045 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0267/20060267619.pdf [firstpage_image] =>[orig_patent_app_number] => 11442778 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 296525 [patent_doc_number] => 07541799 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-06-02 [patent_title] => 'Method and device for measuring a current flowing in an electrical conductor' [patent_app_type] => utility [patent_app_number] => 11/441280 [patent_app_country] => US [patent_app_date] => 2006-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 4716 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 255 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/541/07541799.pdf [firstpage_image] =>[orig_patent_app_number] => 11441280 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5757811 [patent_doc_number] => 20060208756 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-09-21 [patent_title] => 'Connection apparatus and cable assembly for semiconductor - device characteristic measurement apparatus' [patent_app_type] => utility [patent_app_number] => 11/437362 [patent_app_country] => US [patent_app_date] => 2006-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7998 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0208/20060208756.pdf [firstpage_image] =>[orig_patent_app_number] => 11437362 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5780579 [patent_doc_number] => 20060202674 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-09-14 [patent_title] => 'Method for detecting and correcting wiring errors in power monitoring applications' [patent_app_type] => utility [patent_app_number] => 11/434978 [patent_app_country] => US [patent_app_date] => 2006-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3466 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0202/20060202674.pdf [firstpage_image] =>[orig_patent_app_number] => 11434978 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8411775 [patent_doc_number] => 08275181 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-25 [patent_title] => 'Method for tracking of contrast enhancement pattern for pharmacokinetic and parametric analysis in fast-enhancing tissues using high-resolution MRI' [patent_app_type] => utility [patent_app_number] => 11/919938 [patent_app_country] => US [patent_app_date] => 2006-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 13 [patent_no_of_words] => 4902 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11919938 [rel_patent_id] =>[rel_patent_doc_number] =>)