Search

Roberto Velez

Supervisory Patent Examiner (ID: 13736, Phone: (571)272-8597 , Office: P/2662 )

Most Active Art Unit
2829
Art Unit(s)
3600, 2829, 2858, 2662
Total Applications
486
Issued Applications
302
Pending Applications
66
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4739006 [patent_doc_number] => 20080232659 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-25 [patent_title] => 'Analysis Processing Method and Device' [patent_app_type] => utility [patent_app_number] => 11/883439 [patent_app_country] => US [patent_app_date] => 2006-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 14543 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0232/20080232659.pdf [firstpage_image] =>[orig_patent_app_number] => 11883439 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/883439
Analysis Processing Method and Device Jan 30, 2006 Abandoned
Array ( [id] => 881570 [patent_doc_number] => 07355421 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-08 [patent_title] => 'Semiconductor apparatus testing arrangement and semiconductor apparatus testing method' [patent_app_type] => utility [patent_app_number] => 11/339826 [patent_app_country] => US [patent_app_date] => 2006-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4927 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/355/07355421.pdf [firstpage_image] =>[orig_patent_app_number] => 11339826 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/339826
Semiconductor apparatus testing arrangement and semiconductor apparatus testing method Jan 25, 2006 Issued
Array ( [id] => 153169 [patent_doc_number] => 07679381 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-16 [patent_title] => 'Method and apparatus for nondestructively evaluating light-emitting materials' [patent_app_type] => utility [patent_app_number] => 11/307083 [patent_app_country] => US [patent_app_date] => 2006-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3415 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/679/07679381.pdf [firstpage_image] =>[orig_patent_app_number] => 11307083 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/307083
Method and apparatus for nondestructively evaluating light-emitting materials Jan 22, 2006 Issued
Array ( [id] => 5157890 [patent_doc_number] => 20070170934 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-26 [patent_title] => 'Method and Apparatus for Nondestructive Evaluation of Semiconductor Wafers' [patent_app_type] => utility [patent_app_number] => 11/307084 [patent_app_country] => US [patent_app_date] => 2006-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3443 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0170/20070170934.pdf [firstpage_image] =>[orig_patent_app_number] => 11307084 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/307084
Method and Apparatus for Nondestructive Evaluation of Semiconductor Wafers Jan 22, 2006 Abandoned
Array ( [id] => 5869778 [patent_doc_number] => 20060164110 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-27 [patent_title] => 'Semiconductor device and method of fabricating the same' [patent_app_type] => utility [patent_app_number] => 11/336882 [patent_app_country] => US [patent_app_date] => 2006-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3237 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20060164110.pdf [firstpage_image] =>[orig_patent_app_number] => 11336882 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/336882
Semiconductor device and method of fabricating the same Jan 22, 2006 Pending
Array ( [id] => 5186452 [patent_doc_number] => 20070164760 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-19 [patent_title] => 'Methods and apparatuses for improved stabilization in a probing system' [patent_app_type] => utility [patent_app_number] => 11/335081 [patent_app_country] => US [patent_app_date] => 2006-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4095 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20070164760.pdf [firstpage_image] =>[orig_patent_app_number] => 11335081 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/335081
Methods and apparatuses for improved stabilization in a probing system Jan 17, 2006 Issued
Array ( [id] => 5692095 [patent_doc_number] => 20060152240 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-13 [patent_title] => 'Probe device with micro-pin inserted in interface board' [patent_app_type] => utility [patent_app_number] => 11/332079 [patent_app_country] => US [patent_app_date] => 2006-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2483 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0152/20060152240.pdf [firstpage_image] =>[orig_patent_app_number] => 11332079 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/332079
Probe device with micro-pin inserted in interface board Jan 12, 2006 Abandoned
Array ( [id] => 5186456 [patent_doc_number] => 20070164764 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-19 [patent_title] => 'Method of kelvin current sense in a semiconductor package' [patent_app_type] => utility [patent_app_number] => 11/331783 [patent_app_country] => US [patent_app_date] => 2006-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4275 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20070164764.pdf [firstpage_image] =>[orig_patent_app_number] => 11331783 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/331783
Method of Kelvin current sense in a semiconductor package Jan 12, 2006 Issued
Array ( [id] => 5746095 [patent_doc_number] => 20060109025 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-25 [patent_title] => 'Testing method for array substrate' [patent_app_type] => utility [patent_app_number] => 11/329124 [patent_app_country] => US [patent_app_date] => 2006-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 7368 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20060109025.pdf [firstpage_image] =>[orig_patent_app_number] => 11329124 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/329124
Testing method for array substrate Jan 10, 2006 Issued
Array ( [id] => 559941 [patent_doc_number] => 07468612 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-12-23 [patent_title] => 'Dermal phase meter with improved replaceable probe tips' [patent_app_type] => utility [patent_app_number] => 11/306686 [patent_app_country] => US [patent_app_date] => 2006-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 4270 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 288 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/468/07468612.pdf [firstpage_image] =>[orig_patent_app_number] => 11306686 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/306686
Dermal phase meter with improved replaceable probe tips Jan 5, 2006 Issued
Array ( [id] => 5681251 [patent_doc_number] => 20060197518 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-09-07 [patent_title] => 'PARAMETRIC MEASURING CIRCUIT FOR MINIMIZING OSCILLATION EFFECT' [patent_app_type] => utility [patent_app_number] => 11/306382 [patent_app_country] => US [patent_app_date] => 2005-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2680 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0197/20060197518.pdf [firstpage_image] =>[orig_patent_app_number] => 11306382 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/306382
PARAMETRIC MEASURING CIRCUIT FOR MINIMIZING OSCILLATION EFFECT Dec 26, 2005 Abandoned
Array ( [id] => 5117318 [patent_doc_number] => 20070139032 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-21 [patent_title] => 'Integrated current sensor' [patent_app_type] => utility [patent_app_number] => 11/311603 [patent_app_country] => US [patent_app_date] => 2005-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3585 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0139/20070139032.pdf [firstpage_image] =>[orig_patent_app_number] => 11311603 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/311603
Integrated current sensor Dec 18, 2005 Issued
Array ( [id] => 5146262 [patent_doc_number] => 20070046316 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-01 [patent_title] => 'Test circuit for flat panel display device' [patent_app_type] => utility [patent_app_number] => 11/301479 [patent_app_country] => US [patent_app_date] => 2005-12-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4427 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0046/20070046316.pdf [firstpage_image] =>[orig_patent_app_number] => 11301479 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/301479
Test circuit for flat panel display device Dec 11, 2005 Issued
Array ( [id] => 436355 [patent_doc_number] => 07262613 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-08-28 [patent_title] => 'Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object' [patent_app_type] => utility [patent_app_number] => 11/296482 [patent_app_country] => US [patent_app_date] => 2005-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4669 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/262/07262613.pdf [firstpage_image] =>[orig_patent_app_number] => 11296482 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/296482
Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object Dec 7, 2005 Issued
Array ( [id] => 5837672 [patent_doc_number] => 20060118330 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-08 [patent_title] => 'Wired circuit board and connecting structure thereof' [patent_app_type] => utility [patent_app_number] => 11/295520 [patent_app_country] => US [patent_app_date] => 2005-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8801 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0118/20060118330.pdf [firstpage_image] =>[orig_patent_app_number] => 11295520 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/295520
Wired circuit board and connecting structure thereof Dec 6, 2005 Issued
Array ( [id] => 5617342 [patent_doc_number] => 20060186874 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-24 [patent_title] => 'System and method for mechanical testing of freestanding microscale to nanoscale thin films' [patent_app_type] => utility [patent_app_number] => 11/292958 [patent_app_country] => US [patent_app_date] => 2005-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 8356 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0186/20060186874.pdf [firstpage_image] =>[orig_patent_app_number] => 11292958 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/292958
System and method for mechanical testing of freestanding microscale to nanoscale thin films Dec 1, 2005 Abandoned
Array ( [id] => 5276047 [patent_doc_number] => 20090128179 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-21 [patent_title] => 'Wiring Pattern Characteristic Evaluation Mounting Board' [patent_app_type] => utility [patent_app_number] => 12/084582 [patent_app_country] => US [patent_app_date] => 2006-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7009 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0128/20090128179.pdf [firstpage_image] =>[orig_patent_app_number] => 12084582 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/084582
Wiring pattern characteristic evaluation mounting board Nov 29, 2005 Issued
Array ( [id] => 5646374 [patent_doc_number] => 20060132106 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-22 [patent_title] => 'System and method for regenerative burn-in' [patent_app_type] => utility [patent_app_number] => 11/287580 [patent_app_country] => US [patent_app_date] => 2005-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 3919 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20060132106.pdf [firstpage_image] =>[orig_patent_app_number] => 11287580 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/287580
System and method for regenerative burn-in Nov 22, 2005 Abandoned
Array ( [id] => 5519092 [patent_doc_number] => 20090027073 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-29 [patent_title] => 'DEVICE MOUNTED APPARATUS, TEST HEAD, AND ELECTRONIC DEVICE TEST SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/093976 [patent_app_country] => US [patent_app_date] => 2005-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 6112 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0027/20090027073.pdf [firstpage_image] =>[orig_patent_app_number] => 12093976 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/093976
Device mounted apparatus, test head, and electronic device test system Nov 16, 2005 Issued
Array ( [id] => 334779 [patent_doc_number] => 07508191 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-24 [patent_title] => 'Pin electronics implemented system and method for reduced index time' [patent_app_type] => utility [patent_app_number] => 11/264949 [patent_app_country] => US [patent_app_date] => 2005-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 17 [patent_no_of_words] => 12051 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 410 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/508/07508191.pdf [firstpage_image] =>[orig_patent_app_number] => 11264949 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/264949
Pin electronics implemented system and method for reduced index time Oct 31, 2005 Issued
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