
Roberto Velez
Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2829, 2662, 2858, 3600 |
| Total Applications | 504 |
| Issued Applications | 309 |
| Pending Applications | 75 |
| Abandoned Applications | 135 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 367110
[patent_doc_number] => 07479795
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-01-20
[patent_title] => 'Temperature control apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/415278
[patent_app_country] => US
[patent_app_date] => 2006-05-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 11
[patent_no_of_words] => 4094
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 138
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/479/07479795.pdf
[firstpage_image] =>[orig_patent_app_number] => 11415278
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/415278 | Temperature control apparatus | May 1, 2006 | Issued |
Array
(
[id] => 5139494
[patent_doc_number] => 20070001710
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-01-04
[patent_title] => 'Apparatus and method for testing picture quality of liquid crystal display'
[patent_app_type] => utility
[patent_app_number] => 11/414279
[patent_app_country] => US
[patent_app_date] => 2006-04-27
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0001/20070001710.pdf
[firstpage_image] =>[orig_patent_app_number] => 11414279
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/414279 | Apparatus and method for testing picture quality of liquid crystal display | Apr 26, 2006 | Issued |
Array
(
[id] => 5730707
[patent_doc_number] => 20060255821
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-16
[patent_title] => 'Interface assembly and dry gas enclosing apparatus using same'
[patent_app_type] => utility
[patent_app_number] => 11/407479
[patent_app_country] => US
[patent_app_date] => 2006-04-20
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0255/20060255821.pdf
[firstpage_image] =>[orig_patent_app_number] => 11407479
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/407479 | Interface assembly and dry gas enclosing apparatus using same | Apr 19, 2006 | Issued |
Array
(
[id] => 5089457
[patent_doc_number] => 20070229096
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-10-04
[patent_title] => 'System and method for detecting single event latchup in integrated circuits'
[patent_app_type] => utility
[patent_app_number] => 11/394784
[patent_app_country] => US
[patent_app_date] => 2006-03-31
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11394784
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/394784 | System and method for detecting single event latchup in integrated circuits | Mar 30, 2006 | Issued |
Array
(
[id] => 8018541
[patent_doc_number] => 08138778
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[patent_kind] => B1
[patent_issue_date] => 2012-03-20
[patent_title] => 'Apparatus for high density low cost automatic test applications'
[patent_app_type] => utility
[patent_app_number] => 11/394580
[patent_app_country] => US
[patent_app_date] => 2006-03-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/08/138/08138778.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/394580 | Apparatus for high density low cost automatic test applications | Mar 29, 2006 | Issued |
Array
(
[id] => 5276039
[patent_doc_number] => 20090128171
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-05-21
[patent_title] => 'Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer Program'
[patent_app_type] => utility
[patent_app_number] => 11/887476
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 11887476
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/887476 | Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer Program | Mar 29, 2006 | Abandoned |
Array
(
[id] => 5134073
[patent_doc_number] => 20070075702
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-04-05
[patent_title] => 'Insert having independently movable latch mechanism for semiconductor package'
[patent_app_type] => utility
[patent_app_number] => 11/391381
[patent_app_country] => US
[patent_app_date] => 2006-03-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
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[pdf_file] => publications/A1/0075/20070075702.pdf
[firstpage_image] =>[orig_patent_app_number] => 11391381
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/391381 | Insert having independently movable latch mechanism for semiconductor package | Mar 28, 2006 | Issued |
Array
(
[id] => 5060829
[patent_doc_number] => 20070222468
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-09-27
[patent_title] => 'High bandwidth probe system'
[patent_app_type] => utility
[patent_app_number] => 11/386624
[patent_app_country] => US
[patent_app_date] => 2006-03-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 1970
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[pdf_file] => publications/A1/0222/20070222468.pdf
[firstpage_image] =>[orig_patent_app_number] => 11386624
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/386624 | High bandwidth probe system | Mar 21, 2006 | Abandoned |
Array
(
[id] => 5756409
[patent_doc_number] => 20060207354
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-09-21
[patent_title] => 'Apparatus for testing liquid crystal display panels'
[patent_app_type] => utility
[patent_app_number] => 11/384626
[patent_app_country] => US
[patent_app_date] => 2006-03-20
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[firstpage_image] =>[orig_patent_app_number] => 11384626
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/384626 | Apparatus for testing liquid crystal display panels | Mar 19, 2006 | Abandoned |
Array
(
[id] => 5257186
[patent_doc_number] => 20070210818
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-09-13
[patent_title] => 'Temperature monitoring and control apparatus and method'
[patent_app_type] => utility
[patent_app_number] => 11/371382
[patent_app_country] => US
[patent_app_date] => 2006-03-09
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[firstpage_image] =>[orig_patent_app_number] => 11371382
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/371382 | Temperature monitoring and control apparatus and method | Mar 8, 2006 | Abandoned |
Array
(
[id] => 837496
[patent_doc_number] => 07394271
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-07-01
[patent_title] => 'Temperature sensing and prediction in IC sockets'
[patent_app_type] => utility
[patent_app_number] => 11/368283
[patent_app_country] => US
[patent_app_date] => 2006-03-03
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[pdf_file] => patents/07/394/07394271.pdf
[firstpage_image] =>[orig_patent_app_number] => 11368283
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/368283 | Temperature sensing and prediction in IC sockets | Mar 2, 2006 | Issued |
Array
(
[id] => 5129401
[patent_doc_number] => 20070205798
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[patent_issue_date] => 2007-09-06
[patent_title] => 'Three phase motor diagnostics and phase voltage feedback utilizing a single A/D input'
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[patent_app_number] => 11/359322
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/359322 | Three phase motor diagnostics and phase voltage feedback utilizing a single A/D input | Feb 21, 2006 | Issued |
Array
(
[id] => 4680275
[patent_doc_number] => 20080246501
[patent_country] => US
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[patent_issue_date] => 2008-10-09
[patent_title] => 'Probe Card With Stacked Substrate'
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[firstpage_image] =>[orig_patent_app_number] => 11885479
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/885479 | Probe card with stacked substrate | Feb 20, 2006 | Issued |
Array
(
[id] => 274772
[patent_doc_number] => 07560939
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[patent_issue_date] => 2009-07-14
[patent_title] => 'Electrical defect detection using pre-charge and sense scanning with prescribed delays'
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Array
(
[id] => 509052
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[patent_title] => 'Semiconductor chip and method of testing the same'
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Array
(
[id] => 5854927
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[patent_title] => 'Compensation board for measurement using prober, program and recording media therefor'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/350678 | Compensation board for measurement using prober, program and recording media therefor | Feb 8, 2006 | Abandoned |
Array
(
[id] => 5670692
[patent_doc_number] => 20060176046
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[patent_issue_date] => 2006-08-10
[patent_title] => 'Power meter for biasing an audio amplifier'
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/345220 | Measuring apparatus and measuring method | Feb 1, 2006 | Issued |
Array
(
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/339826 | Semiconductor apparatus testing arrangement and semiconductor apparatus testing method | Jan 25, 2006 | Issued |