Search

Roberto Velez

Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )

Most Active Art Unit
2829
Art Unit(s)
2829, 2662, 2858, 3600
Total Applications
504
Issued Applications
309
Pending Applications
75
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 367110 [patent_doc_number] => 07479795 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-20 [patent_title] => 'Temperature control apparatus' [patent_app_type] => utility [patent_app_number] => 11/415278 [patent_app_country] => US [patent_app_date] => 2006-05-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 4094 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/479/07479795.pdf [firstpage_image] =>[orig_patent_app_number] => 11415278 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/415278
Temperature control apparatus May 1, 2006 Issued
Array ( [id] => 5139494 [patent_doc_number] => 20070001710 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-04 [patent_title] => 'Apparatus and method for testing picture quality of liquid crystal display' [patent_app_type] => utility [patent_app_number] => 11/414279 [patent_app_country] => US [patent_app_date] => 2006-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4730 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20070001710.pdf [firstpage_image] =>[orig_patent_app_number] => 11414279 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/414279
Apparatus and method for testing picture quality of liquid crystal display Apr 26, 2006 Issued
Array ( [id] => 5730707 [patent_doc_number] => 20060255821 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-16 [patent_title] => 'Interface assembly and dry gas enclosing apparatus using same' [patent_app_type] => utility [patent_app_number] => 11/407479 [patent_app_country] => US [patent_app_date] => 2006-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3795 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0255/20060255821.pdf [firstpage_image] =>[orig_patent_app_number] => 11407479 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/407479
Interface assembly and dry gas enclosing apparatus using same Apr 19, 2006 Issued
Array ( [id] => 5089457 [patent_doc_number] => 20070229096 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-10-04 [patent_title] => 'System and method for detecting single event latchup in integrated circuits' [patent_app_type] => utility [patent_app_number] => 11/394784 [patent_app_country] => US [patent_app_date] => 2006-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2967 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0229/20070229096.pdf [firstpage_image] =>[orig_patent_app_number] => 11394784 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/394784
System and method for detecting single event latchup in integrated circuits Mar 30, 2006 Issued
Array ( [id] => 8018541 [patent_doc_number] => 08138778 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2012-03-20 [patent_title] => 'Apparatus for high density low cost automatic test applications' [patent_app_type] => utility [patent_app_number] => 11/394580 [patent_app_country] => US [patent_app_date] => 2006-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 26 [patent_no_of_words] => 7374 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/138/08138778.pdf [firstpage_image] =>[orig_patent_app_number] => 11394580 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/394580
Apparatus for high density low cost automatic test applications Mar 29, 2006 Issued
Array ( [id] => 5276039 [patent_doc_number] => 20090128171 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-21 [patent_title] => 'Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer Program' [patent_app_type] => utility [patent_app_number] => 11/887476 [patent_app_country] => US [patent_app_date] => 2006-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 6511 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0128/20090128171.pdf [firstpage_image] =>[orig_patent_app_number] => 11887476 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/887476
Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer Program Mar 29, 2006 Abandoned
Array ( [id] => 5134073 [patent_doc_number] => 20070075702 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-05 [patent_title] => 'Insert having independently movable latch mechanism for semiconductor package' [patent_app_type] => utility [patent_app_number] => 11/391381 [patent_app_country] => US [patent_app_date] => 2006-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 4644 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0075/20070075702.pdf [firstpage_image] =>[orig_patent_app_number] => 11391381 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/391381
Insert having independently movable latch mechanism for semiconductor package Mar 28, 2006 Issued
Array ( [id] => 5060829 [patent_doc_number] => 20070222468 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-27 [patent_title] => 'High bandwidth probe system' [patent_app_type] => utility [patent_app_number] => 11/386624 [patent_app_country] => US [patent_app_date] => 2006-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1970 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0222/20070222468.pdf [firstpage_image] =>[orig_patent_app_number] => 11386624 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/386624
High bandwidth probe system Mar 21, 2006 Abandoned
Array ( [id] => 5756409 [patent_doc_number] => 20060207354 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-09-21 [patent_title] => 'Apparatus for testing liquid crystal display panels' [patent_app_type] => utility [patent_app_number] => 11/384626 [patent_app_country] => US [patent_app_date] => 2006-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 1633 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0207/20060207354.pdf [firstpage_image] =>[orig_patent_app_number] => 11384626 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/384626
Apparatus for testing liquid crystal display panels Mar 19, 2006 Abandoned
Array ( [id] => 5257186 [patent_doc_number] => 20070210818 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-13 [patent_title] => 'Temperature monitoring and control apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/371382 [patent_app_country] => US [patent_app_date] => 2006-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1719 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0210/20070210818.pdf [firstpage_image] =>[orig_patent_app_number] => 11371382 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/371382
Temperature monitoring and control apparatus and method Mar 8, 2006 Abandoned
Array ( [id] => 837496 [patent_doc_number] => 07394271 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-07-01 [patent_title] => 'Temperature sensing and prediction in IC sockets' [patent_app_type] => utility [patent_app_number] => 11/368283 [patent_app_country] => US [patent_app_date] => 2006-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2618 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/394/07394271.pdf [firstpage_image] =>[orig_patent_app_number] => 11368283 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/368283
Temperature sensing and prediction in IC sockets Mar 2, 2006 Issued
Array ( [id] => 5129401 [patent_doc_number] => 20070205798 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-06 [patent_title] => 'Three phase motor diagnostics and phase voltage feedback utilizing a single A/D input' [patent_app_type] => utility [patent_app_number] => 11/359322 [patent_app_country] => US [patent_app_date] => 2006-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2373 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0205/20070205798.pdf [firstpage_image] =>[orig_patent_app_number] => 11359322 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/359322
Three phase motor diagnostics and phase voltage feedback utilizing a single A/D input Feb 21, 2006 Issued
Array ( [id] => 4680275 [patent_doc_number] => 20080246501 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-09 [patent_title] => 'Probe Card With Stacked Substrate' [patent_app_type] => utility [patent_app_number] => 11/885479 [patent_app_country] => US [patent_app_date] => 2006-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3867 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0246/20080246501.pdf [firstpage_image] =>[orig_patent_app_number] => 11885479 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/885479
Probe card with stacked substrate Feb 20, 2006 Issued
Array ( [id] => 274772 [patent_doc_number] => 07560939 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-07-14 [patent_title] => 'Electrical defect detection using pre-charge and sense scanning with prescribed delays' [patent_app_type] => utility [patent_app_number] => 11/357374 [patent_app_country] => US [patent_app_date] => 2006-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3257 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/560/07560939.pdf [firstpage_image] =>[orig_patent_app_number] => 11357374 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/357374
Electrical defect detection using pre-charge and sense scanning with prescribed delays Feb 16, 2006 Issued
Array ( [id] => 509052 [patent_doc_number] => 07202692 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-04-10 [patent_title] => 'Semiconductor chip and method of testing the same' [patent_app_type] => utility [patent_app_number] => 11/349979 [patent_app_country] => US [patent_app_date] => 2006-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 21 [patent_no_of_words] => 11981 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/202/07202692.pdf [firstpage_image] =>[orig_patent_app_number] => 11349979 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/349979
Semiconductor chip and method of testing the same Feb 8, 2006 Issued
Array ( [id] => 5854927 [patent_doc_number] => 20060226860 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-10-12 [patent_title] => 'Compensation board for measurement using prober, program and recording media therefor' [patent_app_type] => utility [patent_app_number] => 11/350678 [patent_app_country] => US [patent_app_date] => 2006-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4231 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0226/20060226860.pdf [firstpage_image] =>[orig_patent_app_number] => 11350678 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/350678
Compensation board for measurement using prober, program and recording media therefor Feb 8, 2006 Abandoned
Array ( [id] => 5670692 [patent_doc_number] => 20060176046 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-10 [patent_title] => 'Power meter for biasing an audio amplifier' [patent_app_type] => utility [patent_app_number] => 11/347914 [patent_app_country] => US [patent_app_date] => 2006-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3537 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0176/20060176046.pdf [firstpage_image] =>[orig_patent_app_number] => 11347914 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/347914
Power meter for biasing an audio amplifier Feb 5, 2006 Abandoned
Array ( [id] => 307945 [patent_doc_number] => 07532019 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-05-12 [patent_title] => 'Measuring apparatus and measuring method' [patent_app_type] => utility [patent_app_number] => 11/345220 [patent_app_country] => US [patent_app_date] => 2006-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 8643 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/532/07532019.pdf [firstpage_image] =>[orig_patent_app_number] => 11345220 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/345220
Measuring apparatus and measuring method Feb 1, 2006 Issued
Array ( [id] => 4739006 [patent_doc_number] => 20080232659 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-25 [patent_title] => 'Analysis Processing Method and Device' [patent_app_type] => utility [patent_app_number] => 11/883439 [patent_app_country] => US [patent_app_date] => 2006-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 14543 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0232/20080232659.pdf [firstpage_image] =>[orig_patent_app_number] => 11883439 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/883439
Analysis Processing Method and Device Jan 30, 2006 Abandoned
Array ( [id] => 881570 [patent_doc_number] => 07355421 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-08 [patent_title] => 'Semiconductor apparatus testing arrangement and semiconductor apparatus testing method' [patent_app_type] => utility [patent_app_number] => 11/339826 [patent_app_country] => US [patent_app_date] => 2006-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4927 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/355/07355421.pdf [firstpage_image] =>[orig_patent_app_number] => 11339826 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/339826
Semiconductor apparatus testing arrangement and semiconductor apparatus testing method Jan 25, 2006 Issued
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