
Roberto Velez
Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2829, 2662, 2858, 3600 |
| Total Applications | 504 |
| Issued Applications | 309 |
| Pending Applications | 75 |
| Abandoned Applications | 135 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5774772
[patent_doc_number] => 20060103412
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-05-18
[patent_title] => 'Display device'
[patent_app_type] => utility
[patent_app_number] => 11/259178
[patent_app_country] => US
[patent_app_date] => 2005-10-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 30
[patent_figures_cnt] => 30
[patent_no_of_words] => 24057
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0103/20060103412.pdf
[firstpage_image] =>[orig_patent_app_number] => 11259178
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/259178 | Display device | Oct 26, 2005 | Abandoned |
Array
(
[id] => 592304
[patent_doc_number] => 07439729
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-10-21
[patent_title] => 'Integrated systems testing'
[patent_app_type] => utility
[patent_app_number] => 11/243660
[patent_app_country] => US
[patent_app_date] => 2005-10-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 8
[patent_no_of_words] => 7809
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[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 99
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/439/07439729.pdf
[firstpage_image] =>[orig_patent_app_number] => 11243660
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/243660 | Integrated systems testing | Oct 4, 2005 | Issued |
Array
(
[id] => 5818378
[patent_doc_number] => 20060022691
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-02
[patent_title] => 'Semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 11/242082
[patent_app_country] => US
[patent_app_date] => 2005-10-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3550
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[pdf_file] => publications/A1/0022/20060022691.pdf
[firstpage_image] =>[orig_patent_app_number] => 11242082
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/242082 | Semiconductor device | Oct 3, 2005 | Abandoned |
Array
(
[id] => 5134089
[patent_doc_number] => 20070075718
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-04-05
[patent_title] => 'Layout for DUT arrays used in semiconductor wafer testing'
[patent_app_type] => utility
[patent_app_number] => 11/243016
[patent_app_country] => US
[patent_app_date] => 2005-10-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 4857
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 4
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0075/20070075718.pdf
[firstpage_image] =>[orig_patent_app_number] => 11243016
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/243016 | Layout for DUT arrays used in semiconductor wafer testing | Oct 2, 2005 | Issued |
Array
(
[id] => 4913486
[patent_doc_number] => 20080094085
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-24
[patent_title] => 'Metalized Elastomeric Probe Structure'
[patent_app_type] => utility
[patent_app_number] => 11/718283
[patent_app_country] => US
[patent_app_date] => 2005-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 8386
[patent_no_of_claims] => 38
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0094/20080094085.pdf
[firstpage_image] =>[orig_patent_app_number] => 11718283
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/718283 | Metalized elastomeric probe structure | Sep 29, 2005 | Issued |
Array
(
[id] => 5169286
[patent_doc_number] => 20070069717
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-03-29
[patent_title] => 'Self-shielded electronic components'
[patent_app_type] => utility
[patent_app_number] => 11/237343
[patent_app_country] => US
[patent_app_date] => 2005-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 4386
[patent_no_of_claims] => 20
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0069/20070069717.pdf
[firstpage_image] =>[orig_patent_app_number] => 11237343
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/237343 | Self-shielded electronic components | Sep 27, 2005 | Abandoned |
Array
(
[id] => 274780
[patent_doc_number] => 07560947
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-07-14
[patent_title] => 'Pin electronics driver'
[patent_app_type] => utility
[patent_app_number] => 11/237384
[patent_app_country] => US
[patent_app_date] => 2005-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4347
[patent_no_of_claims] => 31
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/560/07560947.pdf
[firstpage_image] =>[orig_patent_app_number] => 11237384
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/237384 | Pin electronics driver | Sep 27, 2005 | Issued |
Array
(
[id] => 278484
[patent_doc_number] => 07557562
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-07-07
[patent_title] => 'Inverted magnetic isolator'
[patent_app_type] => utility
[patent_app_number] => 11/229282
[patent_app_country] => US
[patent_app_date] => 2005-09-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 15
[patent_no_of_words] => 12716
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/557/07557562.pdf
[firstpage_image] =>[orig_patent_app_number] => 11229282
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/229282 | Inverted magnetic isolator | Sep 15, 2005 | Issued |
Array
(
[id] => 5661779
[patent_doc_number] => 20060252375
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-09
[patent_title] => 'Probing system for integrated circuit devices'
[patent_app_type] => utility
[patent_app_number] => 11/203380
[patent_app_country] => US
[patent_app_date] => 2005-08-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => publications/A1/0252/20060252375.pdf
[firstpage_image] =>[orig_patent_app_number] => 11203380
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/203380 | Probing system for integrated circuit devices | Aug 11, 2005 | Abandoned |
Array
(
[id] => 5175560
[patent_doc_number] => 20070176618
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-02
[patent_title] => 'Universal contactor for use with multiple handlers and method therefor'
[patent_app_type] => utility
[patent_app_number] => 11/203517
[patent_app_country] => US
[patent_app_date] => 2005-08-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 2064
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0176/20070176618.pdf
[firstpage_image] =>[orig_patent_app_number] => 11203517
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/203517 | Universal contactor for use with multiple handlers and method therefor | Aug 11, 2005 | Abandoned |
Array
(
[id] => 205592
[patent_doc_number] => 07629807
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-12-08
[patent_title] => 'Electrical test probe'
[patent_app_type] => utility
[patent_app_number] => 11/995279
[patent_app_country] => US
[patent_app_date] => 2005-08-09
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/629/07629807.pdf
[firstpage_image] =>[orig_patent_app_number] => 11995279
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/995279 | Electrical test probe | Aug 8, 2005 | Issued |
Array
(
[id] => 425623
[patent_doc_number] => 07271606
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-09-18
[patent_title] => 'Spring-based probe pin that allows kelvin testing'
[patent_app_type] => utility
[patent_app_number] => 11/197916
[patent_app_country] => US
[patent_app_date] => 2005-08-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/07/271/07271606.pdf
[firstpage_image] =>[orig_patent_app_number] => 11197916
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/197916 | Spring-based probe pin that allows kelvin testing | Aug 3, 2005 | Issued |
Array
(
[id] => 5049475
[patent_doc_number] => 20070030019
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-08
[patent_title] => 'Power sink for IC temperature control'
[patent_app_type] => utility
[patent_app_number] => 11/196948
[patent_app_country] => US
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[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0030/20070030019.pdf
[firstpage_image] =>[orig_patent_app_number] => 11196948
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/196948 | Power sink for IC temperature control | Aug 3, 2005 | Abandoned |
Array
(
[id] => 5275999
[patent_doc_number] => 20090128131
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-05-21
[patent_title] => 'Detector'
[patent_app_type] => utility
[patent_app_number] => 11/658977
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[pdf_file] => publications/A1/0128/20090128131.pdf
[firstpage_image] =>[orig_patent_app_number] => 11658977
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/658977 | Detector | Jul 27, 2005 | Abandoned |
Array
(
[id] => 450197
[patent_doc_number] => 07250784
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-07-31
[patent_title] => 'Integrated systems testing'
[patent_app_type] => utility
[patent_app_number] => 11/189458
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[pdf_file] => patents/07/250/07250784.pdf
[firstpage_image] =>[orig_patent_app_number] => 11189458
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/189458 | Integrated systems testing | Jul 25, 2005 | Issued |
Array
(
[id] => 4667607
[patent_doc_number] => 20080042667
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-21
[patent_title] => 'Electronic Device Test Apparatus and Method of Configuring Electronic Device Test Apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/570682
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[patent_app_date] => 2005-07-22
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[pdf_file] => publications/A1/0042/20080042667.pdf
[firstpage_image] =>[orig_patent_app_number] => 11570682
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/570682 | Electronic device test apparatus and method of configuring electronic device test apparatus | Jul 21, 2005 | Issued |
Array
(
[id] => 5878641
[patent_doc_number] => 20060028225
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-09
[patent_title] => 'Process and a device for the calibration of a semiconductor component test system'
[patent_app_type] => utility
[patent_app_number] => 11/185967
[patent_app_country] => US
[patent_app_date] => 2005-07-21
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[pdf_file] => publications/A1/0028/20060028225.pdf
[firstpage_image] =>[orig_patent_app_number] => 11185967
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/185967 | Process and a device for the calibration of a semiconductor component test system | Jul 20, 2005 | Abandoned |
Array
(
[id] => 5878591
[patent_doc_number] => 20060028195
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-09
[patent_title] => 'Current measuring device'
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[firstpage_image] =>[orig_patent_app_number] => 11183781
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/183781 | Current measuring device | Jul 18, 2005 | Abandoned |
Array
(
[id] => 5878632
[patent_doc_number] => 20060028220
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-09
[patent_title] => 'Reinforced probes for testing semiconductor devices'
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[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 11184581
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/184581 | Reinforced probes for testing semiconductor devices | Jul 18, 2005 | Abandoned |
Array
(
[id] => 869898
[patent_doc_number] => 07365561
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-04-29
[patent_title] => 'Test probe and tester, method for manufacturing the test probe'
[patent_app_type] => utility
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[pdf_file] => patents/07/365/07365561.pdf
[firstpage_image] =>[orig_patent_app_number] => 11184763
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/184763 | Test probe and tester, method for manufacturing the test probe | Jul 18, 2005 | Issued |