Search

Roberto Velez

Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )

Most Active Art Unit
2829
Art Unit(s)
2829, 2662, 2858, 3600
Total Applications
504
Issued Applications
309
Pending Applications
75
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5774772 [patent_doc_number] => 20060103412 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-18 [patent_title] => 'Display device' [patent_app_type] => utility [patent_app_number] => 11/259178 [patent_app_country] => US [patent_app_date] => 2005-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 30 [patent_no_of_words] => 24057 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0103/20060103412.pdf [firstpage_image] =>[orig_patent_app_number] => 11259178 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/259178
Display device Oct 26, 2005 Abandoned
Array ( [id] => 592304 [patent_doc_number] => 07439729 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-21 [patent_title] => 'Integrated systems testing' [patent_app_type] => utility [patent_app_number] => 11/243660 [patent_app_country] => US [patent_app_date] => 2005-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 7809 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/439/07439729.pdf [firstpage_image] =>[orig_patent_app_number] => 11243660 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/243660
Integrated systems testing Oct 4, 2005 Issued
Array ( [id] => 5818378 [patent_doc_number] => 20060022691 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-02 [patent_title] => 'Semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/242082 [patent_app_country] => US [patent_app_date] => 2005-10-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3550 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0022/20060022691.pdf [firstpage_image] =>[orig_patent_app_number] => 11242082 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/242082
Semiconductor device Oct 3, 2005 Abandoned
Array ( [id] => 5134089 [patent_doc_number] => 20070075718 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-05 [patent_title] => 'Layout for DUT arrays used in semiconductor wafer testing' [patent_app_type] => utility [patent_app_number] => 11/243016 [patent_app_country] => US [patent_app_date] => 2005-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4857 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0075/20070075718.pdf [firstpage_image] =>[orig_patent_app_number] => 11243016 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/243016
Layout for DUT arrays used in semiconductor wafer testing Oct 2, 2005 Issued
Array ( [id] => 4913486 [patent_doc_number] => 20080094085 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-24 [patent_title] => 'Metalized Elastomeric Probe Structure' [patent_app_type] => utility [patent_app_number] => 11/718283 [patent_app_country] => US [patent_app_date] => 2005-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 8386 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0094/20080094085.pdf [firstpage_image] =>[orig_patent_app_number] => 11718283 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/718283
Metalized elastomeric probe structure Sep 29, 2005 Issued
Array ( [id] => 5169286 [patent_doc_number] => 20070069717 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-29 [patent_title] => 'Self-shielded electronic components' [patent_app_type] => utility [patent_app_number] => 11/237343 [patent_app_country] => US [patent_app_date] => 2005-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 4386 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0069/20070069717.pdf [firstpage_image] =>[orig_patent_app_number] => 11237343 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/237343
Self-shielded electronic components Sep 27, 2005 Abandoned
Array ( [id] => 274780 [patent_doc_number] => 07560947 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-07-14 [patent_title] => 'Pin electronics driver' [patent_app_type] => utility [patent_app_number] => 11/237384 [patent_app_country] => US [patent_app_date] => 2005-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4347 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/560/07560947.pdf [firstpage_image] =>[orig_patent_app_number] => 11237384 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/237384
Pin electronics driver Sep 27, 2005 Issued
Array ( [id] => 278484 [patent_doc_number] => 07557562 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-07-07 [patent_title] => 'Inverted magnetic isolator' [patent_app_type] => utility [patent_app_number] => 11/229282 [patent_app_country] => US [patent_app_date] => 2005-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 12716 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/557/07557562.pdf [firstpage_image] =>[orig_patent_app_number] => 11229282 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/229282
Inverted magnetic isolator Sep 15, 2005 Issued
Array ( [id] => 5661779 [patent_doc_number] => 20060252375 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-09 [patent_title] => 'Probing system for integrated circuit devices' [patent_app_type] => utility [patent_app_number] => 11/203380 [patent_app_country] => US [patent_app_date] => 2005-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1824 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0252/20060252375.pdf [firstpage_image] =>[orig_patent_app_number] => 11203380 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/203380
Probing system for integrated circuit devices Aug 11, 2005 Abandoned
Array ( [id] => 5175560 [patent_doc_number] => 20070176618 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-02 [patent_title] => 'Universal contactor for use with multiple handlers and method therefor' [patent_app_type] => utility [patent_app_number] => 11/203517 [patent_app_country] => US [patent_app_date] => 2005-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2064 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0176/20070176618.pdf [firstpage_image] =>[orig_patent_app_number] => 11203517 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/203517
Universal contactor for use with multiple handlers and method therefor Aug 11, 2005 Abandoned
Array ( [id] => 205592 [patent_doc_number] => 07629807 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-08 [patent_title] => 'Electrical test probe' [patent_app_type] => utility [patent_app_number] => 11/995279 [patent_app_country] => US [patent_app_date] => 2005-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 23 [patent_no_of_words] => 6572 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/629/07629807.pdf [firstpage_image] =>[orig_patent_app_number] => 11995279 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/995279
Electrical test probe Aug 8, 2005 Issued
Array ( [id] => 425623 [patent_doc_number] => 07271606 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-09-18 [patent_title] => 'Spring-based probe pin that allows kelvin testing' [patent_app_type] => utility [patent_app_number] => 11/197916 [patent_app_country] => US [patent_app_date] => 2005-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 2955 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/271/07271606.pdf [firstpage_image] =>[orig_patent_app_number] => 11197916 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/197916
Spring-based probe pin that allows kelvin testing Aug 3, 2005 Issued
Array ( [id] => 5049475 [patent_doc_number] => 20070030019 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-08 [patent_title] => 'Power sink for IC temperature control' [patent_app_type] => utility [patent_app_number] => 11/196948 [patent_app_country] => US [patent_app_date] => 2005-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5765 [patent_no_of_claims] => 47 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20070030019.pdf [firstpage_image] =>[orig_patent_app_number] => 11196948 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/196948
Power sink for IC temperature control Aug 3, 2005 Abandoned
Array ( [id] => 5275999 [patent_doc_number] => 20090128131 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-21 [patent_title] => 'Detector' [patent_app_type] => utility [patent_app_number] => 11/658977 [patent_app_country] => US [patent_app_date] => 2005-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2907 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0128/20090128131.pdf [firstpage_image] =>[orig_patent_app_number] => 11658977 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/658977
Detector Jul 27, 2005 Abandoned
Array ( [id] => 450197 [patent_doc_number] => 07250784 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-31 [patent_title] => 'Integrated systems testing' [patent_app_type] => utility [patent_app_number] => 11/189458 [patent_app_country] => US [patent_app_date] => 2005-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 7840 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/250/07250784.pdf [firstpage_image] =>[orig_patent_app_number] => 11189458 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/189458
Integrated systems testing Jul 25, 2005 Issued
Array ( [id] => 4667607 [patent_doc_number] => 20080042667 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-21 [patent_title] => 'Electronic Device Test Apparatus and Method of Configuring Electronic Device Test Apparatus' [patent_app_type] => utility [patent_app_number] => 11/570682 [patent_app_country] => US [patent_app_date] => 2005-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 11604 [patent_no_of_claims] => 52 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0042/20080042667.pdf [firstpage_image] =>[orig_patent_app_number] => 11570682 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/570682
Electronic device test apparatus and method of configuring electronic device test apparatus Jul 21, 2005 Issued
Array ( [id] => 5878641 [patent_doc_number] => 20060028225 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-09 [patent_title] => 'Process and a device for the calibration of a semiconductor component test system' [patent_app_type] => utility [patent_app_number] => 11/185967 [patent_app_country] => US [patent_app_date] => 2005-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 7786 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20060028225.pdf [firstpage_image] =>[orig_patent_app_number] => 11185967 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/185967
Process and a device for the calibration of a semiconductor component test system Jul 20, 2005 Abandoned
Array ( [id] => 5878591 [patent_doc_number] => 20060028195 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-09 [patent_title] => 'Current measuring device' [patent_app_type] => utility [patent_app_number] => 11/183781 [patent_app_country] => US [patent_app_date] => 2005-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4419 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20060028195.pdf [firstpage_image] =>[orig_patent_app_number] => 11183781 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/183781
Current measuring device Jul 18, 2005 Abandoned
Array ( [id] => 5878632 [patent_doc_number] => 20060028220 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-09 [patent_title] => 'Reinforced probes for testing semiconductor devices' [patent_app_type] => utility [patent_app_number] => 11/184581 [patent_app_country] => US [patent_app_date] => 2005-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4515 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20060028220.pdf [firstpage_image] =>[orig_patent_app_number] => 11184581 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/184581
Reinforced probes for testing semiconductor devices Jul 18, 2005 Abandoned
Array ( [id] => 869898 [patent_doc_number] => 07365561 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-29 [patent_title] => 'Test probe and tester, method for manufacturing the test probe' [patent_app_type] => utility [patent_app_number] => 11/184763 [patent_app_country] => US [patent_app_date] => 2005-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 7157 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 323 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/365/07365561.pdf [firstpage_image] =>[orig_patent_app_number] => 11184763 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/184763
Test probe and tester, method for manufacturing the test probe Jul 18, 2005 Issued
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