Search

Roberto Velez

Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )

Most Active Art Unit
2829
Art Unit(s)
2829, 2662, 2858, 3600
Total Applications
504
Issued Applications
309
Pending Applications
75
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4769263 [patent_doc_number] => 20080054921 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-06 [patent_title] => 'Inspection Equipment of Circuit Board and Inspection Method of Circuit Board' [patent_app_type] => utility [patent_app_number] => 11/632287 [patent_app_country] => US [patent_app_date] => 2005-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 28 [patent_figures_cnt] => 28 [patent_no_of_words] => 28541 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20080054921.pdf [firstpage_image] =>[orig_patent_app_number] => 11632287 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/632287
Inspection equipment of circuit board and inspection method of circuit board Jul 13, 2005 Issued
Array ( [id] => 7601298 [patent_doc_number] => 07385408 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-06-10 [patent_title] => 'Apparatus and method for testing integrated circuit devices having contacts on multiple surfaces' [patent_app_type] => utility [patent_app_number] => 11/180463 [patent_app_country] => US [patent_app_date] => 2005-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2721 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/385/07385408.pdf [firstpage_image] =>[orig_patent_app_number] => 11180463 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/180463
Apparatus and method for testing integrated circuit devices having contacts on multiple surfaces Jul 11, 2005 Issued
Array ( [id] => 4769223 [patent_doc_number] => 20080054881 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-06 [patent_title] => 'Dc Current Sensor' [patent_app_type] => utility [patent_app_number] => 11/571881 [patent_app_country] => US [patent_app_date] => 2005-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5760 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20080054881.pdf [firstpage_image] =>[orig_patent_app_number] => 11571881 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/571881
Dc Current Sensor Jul 6, 2005 Abandoned
Array ( [id] => 5139488 [patent_doc_number] => 20070001704 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-04 [patent_title] => 'Method and apparatus for equalization of connection pads' [patent_app_type] => utility [patent_app_number] => 11/173836 [patent_app_country] => US [patent_app_date] => 2005-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5215 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20070001704.pdf [firstpage_image] =>[orig_patent_app_number] => 11173836 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/173836
Method and apparatus for equalization of connection pads Jun 29, 2005 Abandoned
Array ( [id] => 6979697 [patent_doc_number] => 20050289415 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-29 [patent_title] => 'Intelligent probe chips/heads' [patent_app_type] => utility [patent_app_number] => 11/165679 [patent_app_country] => US [patent_app_date] => 2005-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2804 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0289/20050289415.pdf [firstpage_image] =>[orig_patent_app_number] => 11165679 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/165679
Intelligent probe chips/heads Jun 23, 2005 Abandoned
Array ( [id] => 664435 [patent_doc_number] => 07102377 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-09-05 [patent_title] => 'Packaging reliability superchips' [patent_app_type] => utility [patent_app_number] => 11/159913 [patent_app_country] => US [patent_app_date] => 2005-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 4365 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 221 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/102/07102377.pdf [firstpage_image] =>[orig_patent_app_number] => 11159913 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/159913
Packaging reliability superchips Jun 22, 2005 Issued
Array ( [id] => 5878657 [patent_doc_number] => 20060028231 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-09 [patent_title] => 'System for manufacturing display panel, method to be used in same, and testing apparatus therefor' [patent_app_type] => utility [patent_app_number] => 11/158992 [patent_app_country] => US [patent_app_date] => 2005-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5659 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20060028231.pdf [firstpage_image] =>[orig_patent_app_number] => 11158992 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/158992
System for manufacturing display panel, method to be used in same, and testing apparatus therefor Jun 21, 2005 Abandoned
Array ( [id] => 5763516 [patent_doc_number] => 20060017455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-01-26 [patent_title] => 'Defect diagnosis method and apparatus for semiconductor integrated circuit' [patent_app_type] => utility [patent_app_number] => 11/151263 [patent_app_country] => US [patent_app_date] => 2005-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3178 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0017/20060017455.pdf [firstpage_image] =>[orig_patent_app_number] => 11151263 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/151263
Defect diagnosis method and apparatus for semiconductor integrated circuit Jun 13, 2005 Abandoned
Array ( [id] => 4795693 [patent_doc_number] => 20080007279 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-10 [patent_title] => 'Probe Cards' [patent_app_type] => utility [patent_app_number] => 11/628681 [patent_app_country] => US [patent_app_date] => 2005-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1986 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20080007279.pdf [firstpage_image] =>[orig_patent_app_number] => 11628681 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/628681
Probe Cards Jun 7, 2005 Abandoned
Array ( [id] => 5713602 [patent_doc_number] => 20060076965 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-13 [patent_title] => 'Contact-free test system for semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/147437 [patent_app_country] => US [patent_app_date] => 2005-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1469 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0076/20060076965.pdf [firstpage_image] =>[orig_patent_app_number] => 11147437 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/147437
Contact-free test system for semiconductor device Jun 7, 2005 Abandoned
Array ( [id] => 6929377 [patent_doc_number] => 20050280410 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-22 [patent_title] => 'Test apparatus and method for testing circuit units to be tested' [patent_app_type] => utility [patent_app_number] => 11/145610 [patent_app_country] => US [patent_app_date] => 2005-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4288 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0280/20050280410.pdf [firstpage_image] =>[orig_patent_app_number] => 11145610 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/145610
Test apparatus and method for testing circuit units to be tested Jun 5, 2005 Issued
Array ( [id] => 398191 [patent_doc_number] => 07295026 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-11-13 [patent_title] => 'Automated position control of a surface array relative to a liquid microjunction surface sampler' [patent_app_type] => utility [patent_app_number] => 11/144882 [patent_app_country] => US [patent_app_date] => 2005-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 15 [patent_no_of_words] => 7483 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 252 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/295/07295026.pdf [firstpage_image] =>[orig_patent_app_number] => 11144882 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/144882
Automated position control of a surface array relative to a liquid microjunction surface sampler Jun 2, 2005 Issued
Array ( [id] => 7231376 [patent_doc_number] => 20050270049 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-08 [patent_title] => 'Semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/140963 [patent_app_country] => US [patent_app_date] => 2005-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5874 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0270/20050270049.pdf [firstpage_image] =>[orig_patent_app_number] => 11140963 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/140963
Semiconductor device May 31, 2005 Abandoned
Array ( [id] => 4768605 [patent_doc_number] => 20080054260 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-06 [patent_title] => 'Semiconductor Integrated Circuit Device, Method For Testing The Semiconductor Integrated Circuit Device, Semiconductor Wafer And Burn-In Test Apparatus' [patent_app_type] => utility [patent_app_number] => 11/661680 [patent_app_country] => US [patent_app_date] => 2005-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8943 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20080054260.pdf [firstpage_image] =>[orig_patent_app_number] => 11661680 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/661680
Semiconductor Integrated Circuit Device, Method For Testing The Semiconductor Integrated Circuit Device, Semiconductor Wafer And Burn-In Test Apparatus May 31, 2005 Abandoned
Array ( [id] => 638733 [patent_doc_number] => 07126360 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-10-24 [patent_title] => 'Differential signal acquisition probe having retractable double cushioned probing tips with EOS/ESD protection capabilities' [patent_app_type] => utility [patent_app_number] => 11/139079 [patent_app_country] => US [patent_app_date] => 2005-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 17 [patent_no_of_words] => 11734 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 318 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/126/07126360.pdf [firstpage_image] =>[orig_patent_app_number] => 11139079 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/139079
Differential signal acquisition probe having retractable double cushioned probing tips with EOS/ESD protection capabilities May 26, 2005 Issued
Array ( [id] => 7208019 [patent_doc_number] => 20050258856 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-24 [patent_title] => 'High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method' [patent_app_type] => utility [patent_app_number] => 11/133290 [patent_app_country] => US [patent_app_date] => 2005-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 27007 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0258/20050258856.pdf [firstpage_image] =>[orig_patent_app_number] => 11133290 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/133290
High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method May 19, 2005 Abandoned
Array ( [id] => 5898997 [patent_doc_number] => 20060044000 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-02 [patent_title] => 'Method and apparatus for evaluating semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/131391 [patent_app_country] => US [patent_app_date] => 2005-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6044 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0044/20060044000.pdf [firstpage_image] =>[orig_patent_app_number] => 11131391 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/131391
Method and apparatus for evaluating semiconductor device May 17, 2005 Issued
Array ( [id] => 5623335 [patent_doc_number] => 20060261840 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-23 [patent_title] => 'System and method for determining channel mobility' [patent_app_type] => utility [patent_app_number] => 11/131521 [patent_app_country] => US [patent_app_date] => 2005-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5558 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0261/20060261840.pdf [firstpage_image] =>[orig_patent_app_number] => 11131521 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/131521
System and method for determining channel mobility May 17, 2005 Abandoned
Array ( [id] => 562147 [patent_doc_number] => 07161364 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-01-09 [patent_title] => 'Dermal phase meter with replaceable probe tips' [patent_app_type] => utility [patent_app_number] => 10/908327 [patent_app_country] => US [patent_app_date] => 2005-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 3078 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/161/07161364.pdf [firstpage_image] =>[orig_patent_app_number] => 10908327 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/908327
Dermal phase meter with replaceable probe tips May 5, 2005 Issued
Array ( [id] => 5909781 [patent_doc_number] => 20060125499 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-15 [patent_title] => 'Test apparatus' [patent_app_type] => utility [patent_app_number] => 11/119344 [patent_app_country] => US [patent_app_date] => 2005-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5934 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0125/20060125499.pdf [firstpage_image] =>[orig_patent_app_number] => 11119344 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/119344
Test apparatus Apr 28, 2005 Issued
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