Search

Roberto Velez

Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )

Most Active Art Unit
2829
Art Unit(s)
2829, 2662, 2858, 3600
Total Applications
504
Issued Applications
309
Pending Applications
75
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6162207 [patent_doc_number] => 20110193586 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-11 [patent_title] => 'Alternating Current (AC) Stress Test Circuit, Method for Evaluating AC Stress Induced Hot Carrier Injection (HCI) Degradation, and Test Structure for HCI Degradation Evaluation' [patent_app_type] => utility [patent_app_number] => 12/703949 [patent_app_country] => US [patent_app_date] => 2010-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4563 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0193/20110193586.pdf [firstpage_image] =>[orig_patent_app_number] => 12703949 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/703949
Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation Feb 10, 2010 Issued
12/704322 Determining Beacon Location Using Magnetic Field Ratios Feb 10, 2010 Abandoned
Array ( [id] => 6068338 [patent_doc_number] => 20110043187 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-24 [patent_title] => 'METHOD AND CIRCUIT FOR TRACKING MAXIMUM POWER OF A PHOTO-VOLTAIC ARRAY' [patent_app_type] => utility [patent_app_number] => 12/701445 [patent_app_country] => US [patent_app_date] => 2010-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8177 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20110043187.pdf [firstpage_image] =>[orig_patent_app_number] => 12701445 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/701445
Method and circuit for tracking maximum power of a photo-voltaic array Feb 4, 2010 Issued
Array ( [id] => 8078229 [patent_doc_number] => 08146427 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-04-03 [patent_title] => 'Vibrating wire ice indicator' [patent_app_type] => utility [patent_app_number] => 12/698723 [patent_app_country] => US [patent_app_date] => 2010-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3321 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/146/08146427.pdf [firstpage_image] =>[orig_patent_app_number] => 12698723 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/698723
Vibrating wire ice indicator Feb 1, 2010 Issued
Array ( [id] => 6282199 [patent_doc_number] => 20100156426 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-24 [patent_title] => 'APPARATUS AND METHOD FOR SENSING LEAKAGE CURRENT OF BATTERY, AND BATTERY-DRIVEN APPARATUS AND BATTERY PACK COMPRISING THE APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/696656 [patent_app_country] => US [patent_app_date] => 2010-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5685 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0156/20100156426.pdf [firstpage_image] =>[orig_patent_app_number] => 12696656 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/696656
Apparatus and method for sensing leakage current of battery, and battery-driven apparatus and battery pack comprising the apparatus Jan 28, 2010 Issued
Array ( [id] => 6436896 [patent_doc_number] => 20100188112 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-07-29 [patent_title] => 'INSPECTION SOCKET' [patent_app_type] => utility [patent_app_number] => 12/695714 [patent_app_country] => US [patent_app_date] => 2010-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5895 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0188/20100188112.pdf [firstpage_image] =>[orig_patent_app_number] => 12695714 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/695714
INSPECTION SOCKET Jan 27, 2010 Abandoned
Array ( [id] => 6257253 [patent_doc_number] => 20100295572 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-25 [patent_title] => 'UNIVERSAL TEST SOCKET AND SEMICONDUCTOR PACKAGE TESTING APPARATUS USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/684581 [patent_app_country] => US [patent_app_date] => 2010-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 5857 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20100295572.pdf [firstpage_image] =>[orig_patent_app_number] => 12684581 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/684581
Universal test socket and semiconductor package testing apparatus using the same Jan 7, 2010 Issued
Array ( [id] => 6305859 [patent_doc_number] => 20100109673 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-06 [patent_title] => 'HEAT-RESISTANT LENS KIT' [patent_app_type] => utility [patent_app_number] => 12/652325 [patent_app_country] => US [patent_app_date] => 2010-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1738 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20100109673.pdf [firstpage_image] =>[orig_patent_app_number] => 12652325 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/652325
HEAT-RESISTANT LENS KIT Jan 4, 2010 Abandoned
Array ( [id] => 8410902 [patent_doc_number] => 08274301 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-25 [patent_title] => 'On-chip accelerated failure indicator' [patent_app_type] => utility [patent_app_number] => 12/610683 [patent_app_country] => US [patent_app_date] => 2009-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2146 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12610683 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/610683
On-chip accelerated failure indicator Nov 1, 2009 Issued
Array ( [id] => 6225832 [patent_doc_number] => 20100182035 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-07-22 [patent_title] => 'SEMICONDUCTOR DEVICE TEST APPARATUS INCLUDING INTERFACE UNIT AND METHOD OF TESTING SEMICONDUCTOR DEVICE USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/582980 [patent_app_country] => US [patent_app_date] => 2009-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3825 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0182/20100182035.pdf [firstpage_image] =>[orig_patent_app_number] => 12582980 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/582980
Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same Oct 20, 2009 Issued
Array ( [id] => 4624998 [patent_doc_number] => 08004300 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-08-23 [patent_title] => 'Circuit board testing device with self aligning plates' [patent_app_type] => utility [patent_app_number] => 12/571916 [patent_app_country] => US [patent_app_date] => 2009-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 3702 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 273 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/004/08004300.pdf [firstpage_image] =>[orig_patent_app_number] => 12571916 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/571916
Circuit board testing device with self aligning plates Sep 30, 2009 Issued
Array ( [id] => 6339141 [patent_doc_number] => 20100019789 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-28 [patent_title] => 'SYSTEM FOR MULTIPLE LAYER PRINTED CIRCUIT BOARD MISREGISTRATION TESTING' [patent_app_type] => utility [patent_app_number] => 12/571169 [patent_app_country] => US [patent_app_date] => 2009-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 32 [patent_figures_cnt] => 32 [patent_no_of_words] => 12745 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20100019789.pdf [firstpage_image] =>[orig_patent_app_number] => 12571169 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/571169
System for multiple layer printed circuit board misregistration testing Sep 29, 2009 Issued
Array ( [id] => 6371108 [patent_doc_number] => 20100315110 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-16 [patent_title] => 'HERMETICITY TESTING' [patent_app_type] => utility [patent_app_number] => 12/569474 [patent_app_country] => US [patent_app_date] => 2009-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8415 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0315/20100315110.pdf [firstpage_image] =>[orig_patent_app_number] => 12569474 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/569474
Hermeticity testing Sep 28, 2009 Issued
Array ( [id] => 6403700 [patent_doc_number] => 20100148801 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-17 [patent_title] => 'CAPACITANCE-TYPE ENCODER' [patent_app_type] => utility [patent_app_number] => 12/566798 [patent_app_country] => US [patent_app_date] => 2009-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 4917 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20100148801.pdf [firstpage_image] =>[orig_patent_app_number] => 12566798 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/566798
CAPACITANCE-TYPE ENCODER Sep 24, 2009 Abandoned
Array ( [id] => 7703505 [patent_doc_number] => 08089264 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-01-03 [patent_title] => 'Voltage measuring circuit' [patent_app_type] => utility [patent_app_number] => 12/564058 [patent_app_country] => US [patent_app_date] => 2009-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1524 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 360 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/089/08089264.pdf [firstpage_image] =>[orig_patent_app_number] => 12564058 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/564058
Voltage measuring circuit Sep 21, 2009 Issued
Array ( [id] => 6361551 [patent_doc_number] => 20100079161 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-01 [patent_title] => 'PROBE APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/564381 [patent_app_country] => US [patent_app_date] => 2009-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 8136 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0079/20100079161.pdf [firstpage_image] =>[orig_patent_app_number] => 12564381 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/564381
Probe apparatus Sep 21, 2009 Issued
Array ( [id] => 8352752 [patent_doc_number] => 08248092 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-08-21 [patent_title] => 'Conductivity measurement device' [patent_app_type] => utility [patent_app_number] => 12/563173 [patent_app_country] => US [patent_app_date] => 2009-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1000 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12563173 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/563173
Conductivity measurement device Sep 20, 2009 Issued
Array ( [id] => 4444109 [patent_doc_number] => 07928720 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-19 [patent_title] => 'Power conversion efficiency measurement system and method' [patent_app_type] => utility [patent_app_number] => 12/558582 [patent_app_country] => US [patent_app_date] => 2009-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1670 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 241 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/928/07928720.pdf [firstpage_image] =>[orig_patent_app_number] => 12558582 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/558582
Power conversion efficiency measurement system and method Sep 13, 2009 Issued
Array ( [id] => 4480318 [patent_doc_number] => 07906981 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-03-15 [patent_title] => 'Test apparatus and test method' [patent_app_type] => utility [patent_app_number] => 12/557483 [patent_app_country] => US [patent_app_date] => 2009-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9619 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/906/07906981.pdf [firstpage_image] =>[orig_patent_app_number] => 12557483 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/557483
Test apparatus and test method Sep 9, 2009 Issued
Array ( [id] => 6216912 [patent_doc_number] => 20100052656 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-04 [patent_title] => 'VOLTAGE SENSING DEVICE' [patent_app_type] => utility [patent_app_number] => 12/553375 [patent_app_country] => US [patent_app_date] => 2009-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 14186 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0052/20100052656.pdf [firstpage_image] =>[orig_patent_app_number] => 12553375 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/553375
Voltage sensing device Sep 2, 2009 Issued
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