
Roberto Velez
Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2829, 2662, 2858, 3600 |
| Total Applications | 504 |
| Issued Applications | 309 |
| Pending Applications | 75 |
| Abandoned Applications | 135 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6162207
[patent_doc_number] => 20110193586
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-08-11
[patent_title] => 'Alternating Current (AC) Stress Test Circuit, Method for Evaluating AC Stress Induced Hot Carrier Injection (HCI) Degradation, and Test Structure for HCI Degradation Evaluation'
[patent_app_type] => utility
[patent_app_number] => 12/703949
[patent_app_country] => US
[patent_app_date] => 2010-02-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0193/20110193586.pdf
[firstpage_image] =>[orig_patent_app_number] => 12703949
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/703949 | Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation | Feb 10, 2010 | Issued |
| 12/704322 | Determining Beacon Location Using Magnetic Field Ratios | Feb 10, 2010 | Abandoned |
Array
(
[id] => 6068338
[patent_doc_number] => 20110043187
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-02-24
[patent_title] => 'METHOD AND CIRCUIT FOR TRACKING MAXIMUM POWER OF A PHOTO-VOLTAIC ARRAY'
[patent_app_type] => utility
[patent_app_number] => 12/701445
[patent_app_country] => US
[patent_app_date] => 2010-02-05
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0043/20110043187.pdf
[firstpage_image] =>[orig_patent_app_number] => 12701445
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/701445 | Method and circuit for tracking maximum power of a photo-voltaic array | Feb 4, 2010 | Issued |
Array
(
[id] => 8078229
[patent_doc_number] => 08146427
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-03
[patent_title] => 'Vibrating wire ice indicator'
[patent_app_type] => utility
[patent_app_number] => 12/698723
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[pdf_file] => patents/08/146/08146427.pdf
[firstpage_image] =>[orig_patent_app_number] => 12698723
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/698723 | Vibrating wire ice indicator | Feb 1, 2010 | Issued |
Array
(
[id] => 6282199
[patent_doc_number] => 20100156426
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-24
[patent_title] => 'APPARATUS AND METHOD FOR SENSING LEAKAGE CURRENT OF BATTERY, AND BATTERY-DRIVEN APPARATUS AND BATTERY PACK COMPRISING THE APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/696656
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/696656 | Apparatus and method for sensing leakage current of battery, and battery-driven apparatus and battery pack comprising the apparatus | Jan 28, 2010 | Issued |
Array
(
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[patent_doc_number] => 20100188112
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[patent_kind] => A1
[patent_issue_date] => 2010-07-29
[patent_title] => 'INSPECTION SOCKET'
[patent_app_type] => utility
[patent_app_number] => 12/695714
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 12695714
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/695714 | INSPECTION SOCKET | Jan 27, 2010 | Abandoned |
Array
(
[id] => 6257253
[patent_doc_number] => 20100295572
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[patent_kind] => A1
[patent_issue_date] => 2010-11-25
[patent_title] => 'UNIVERSAL TEST SOCKET AND SEMICONDUCTOR PACKAGE TESTING APPARATUS USING THE SAME'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/684581 | Universal test socket and semiconductor package testing apparatus using the same | Jan 7, 2010 | Issued |
Array
(
[id] => 6305859
[patent_doc_number] => 20100109673
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-05-06
[patent_title] => 'HEAT-RESISTANT LENS KIT'
[patent_app_type] => utility
[patent_app_number] => 12/652325
[patent_app_country] => US
[patent_app_date] => 2010-01-05
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[pdf_file] => publications/A1/0109/20100109673.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/652325 | HEAT-RESISTANT LENS KIT | Jan 4, 2010 | Abandoned |
Array
(
[id] => 8410902
[patent_doc_number] => 08274301
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-09-25
[patent_title] => 'On-chip accelerated failure indicator'
[patent_app_type] => utility
[patent_app_number] => 12/610683
[patent_app_country] => US
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[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/610683 | On-chip accelerated failure indicator | Nov 1, 2009 | Issued |
Array
(
[id] => 6225832
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[patent_title] => 'SEMICONDUCTOR DEVICE TEST APPARATUS INCLUDING INTERFACE UNIT AND METHOD OF TESTING SEMICONDUCTOR DEVICE USING THE SAME'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/582980 | Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same | Oct 20, 2009 | Issued |
Array
(
[id] => 4624998
[patent_doc_number] => 08004300
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[patent_issue_date] => 2011-08-23
[patent_title] => 'Circuit board testing device with self aligning plates'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/571916 | Circuit board testing device with self aligning plates | Sep 30, 2009 | Issued |
Array
(
[id] => 6339141
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[patent_title] => 'SYSTEM FOR MULTIPLE LAYER PRINTED CIRCUIT BOARD MISREGISTRATION TESTING'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/571169 | System for multiple layer printed circuit board misregistration testing | Sep 29, 2009 | Issued |
Array
(
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/566798 | CAPACITANCE-TYPE ENCODER | Sep 24, 2009 | Abandoned |
Array
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Array
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Array
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Array
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