
Roberto Velez
Supervisory Patent Examiner (ID: 13733, Phone: (571)272-8597 , Office: P/2662 )
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2662, 3600, 2829, 2858 |
| Total Applications | 482 |
| Issued Applications | 298 |
| Pending Applications | 68 |
| Abandoned Applications | 135 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6247779
[patent_doc_number] => 20100136802
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-03
[patent_title] => 'TESTING DEVICE AND TESTING FIXTURES USED THEREIN'
[patent_app_type] => utility
[patent_app_number] => 12/534283
[patent_app_country] => US
[patent_app_date] => 2009-08-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 1574
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0136/20100136802.pdf
[firstpage_image] =>[orig_patent_app_number] => 12534283
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/534283 | TESTING DEVICE AND TESTING FIXTURES USED THEREIN | Aug 2, 2009 | Abandoned |
Array
(
[id] => 6193562
[patent_doc_number] => 20110025316
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-02-03
[patent_title] => 'EDDY CURRENT PROBE ASSEMBLY ADJUSTABLE FOR INSPECTING TEST OBJECTS OF DIFFERENT SIZES'
[patent_app_type] => utility
[patent_app_number] => 12/533417
[patent_app_country] => US
[patent_app_date] => 2009-07-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 6913
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0025/20110025316.pdf
[firstpage_image] =>[orig_patent_app_number] => 12533417
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/533417 | Eddy current probe assembly adjustable for inspecting test objects of different sizes | Jul 30, 2009 | Issued |
Array
(
[id] => 5556012
[patent_doc_number] => 20090267589
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-29
[patent_title] => 'CIRCUIT AND APPARATUS FOR DETECTING ELECTRIC CURRENT'
[patent_app_type] => utility
[patent_app_number] => 12/501782
[patent_app_country] => US
[patent_app_date] => 2009-07-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4918
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0267/20090267589.pdf
[firstpage_image] =>[orig_patent_app_number] => 12501782
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/501782 | Circuit and apparatus for detecting electric current | Jul 12, 2009 | Issued |
Array
(
[id] => 8572481
[patent_doc_number] => 08339131
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-12-25
[patent_title] => 'Electric field sensor with electrode interleaving vibration'
[patent_app_type] => utility
[patent_app_number] => 12/501721
[patent_app_country] => US
[patent_app_date] => 2009-07-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1982
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 152
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12501721
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/501721 | Electric field sensor with electrode interleaving vibration | Jul 12, 2009 | Issued |
Array
(
[id] => 5300732
[patent_doc_number] => 20090295384
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-12-03
[patent_title] => 'Magnetic field sensor and electrical current sensor therewith'
[patent_app_type] => utility
[patent_app_number] => 12/459691
[patent_app_country] => US
[patent_app_date] => 2009-07-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 3069
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0295/20090295384.pdf
[firstpage_image] =>[orig_patent_app_number] => 12459691
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/459691 | Magnetic field sensor and electrical current sensor therewith | Jul 6, 2009 | Issued |
Array
(
[id] => 8676290
[patent_doc_number] => 08384407
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-02-26
[patent_title] => 'Test pad structure, a pad structure for inspecting a semiconductor chip and a wiring subtrate for a tape package having the same'
[patent_app_type] => utility
[patent_app_number] => 12/457775
[patent_app_country] => US
[patent_app_date] => 2009-06-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 6623
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 330
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12457775
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/457775 | Test pad structure, a pad structure for inspecting a semiconductor chip and a wiring subtrate for a tape package having the same | Jun 21, 2009 | Issued |
Array
(
[id] => 8329328
[patent_doc_number] => 08237427
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-08-07
[patent_title] => 'Wideband high impedance bridging module'
[patent_app_type] => utility
[patent_app_number] => 12/485383
[patent_app_country] => US
[patent_app_date] => 2009-06-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 6222
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 199
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12485383
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/485383 | Wideband high impedance bridging module | Jun 15, 2009 | Issued |
Array
(
[id] => 4528039
[patent_doc_number] => 07952345
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-05-31
[patent_title] => 'Inverted magnetic isolator'
[patent_app_type] => utility
[patent_app_number] => 12/456028
[patent_app_country] => US
[patent_app_date] => 2009-06-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 15
[patent_no_of_words] => 12859
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 187
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/952/07952345.pdf
[firstpage_image] =>[orig_patent_app_number] => 12456028
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/456028 | Inverted magnetic isolator | Jun 9, 2009 | Issued |
Array
(
[id] => 5401788
[patent_doc_number] => 20090237101
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-09-24
[patent_title] => 'METHOD FOR CORRECTING DISPLACEMENT OF MULTI CARD AND METHOD FOR TESTING CIRCUIT ELEMENT'
[patent_app_type] => utility
[patent_app_number] => 12/476281
[patent_app_country] => US
[patent_app_date] => 2009-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4134
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0237/20090237101.pdf
[firstpage_image] =>[orig_patent_app_number] => 12476281
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/476281 | METHOD FOR CORRECTING DISPLACEMENT OF MULTI CARD AND METHOD FOR TESTING CIRCUIT ELEMENT | Jun 1, 2009 | Abandoned |
Array
(
[id] => 5300762
[patent_doc_number] => 20090295414
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-12-03
[patent_title] => 'TRANSIENT EMISSION SCANNING MICROSCOPY'
[patent_app_type] => utility
[patent_app_number] => 12/477082
[patent_app_country] => US
[patent_app_date] => 2009-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 2757
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0295/20090295414.pdf
[firstpage_image] =>[orig_patent_app_number] => 12477082
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/477082 | Transient emission scanning microscopy | Jun 1, 2009 | Issued |
Array
(
[id] => 6339161
[patent_doc_number] => 20100019792
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-28
[patent_title] => 'TESTING MODULE'
[patent_app_type] => utility
[patent_app_number] => 12/475675
[patent_app_country] => US
[patent_app_date] => 2009-06-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 1648
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0019/20100019792.pdf
[firstpage_image] =>[orig_patent_app_number] => 12475675
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/475675 | Testing module for testing key buttons of portable electronic device | May 31, 2009 | Issued |
Array
(
[id] => 5556052
[patent_doc_number] => 20090267629
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-29
[patent_title] => 'Contact for interconnect system in a test socket'
[patent_app_type] => utility
[patent_app_number] => 12/386778
[patent_app_country] => US
[patent_app_date] => 2009-04-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2259
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0267/20090267629.pdf
[firstpage_image] =>[orig_patent_app_number] => 12386778
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/386778 | Contact for interconnect system in a test socket | Apr 21, 2009 | Abandoned |
Array
(
[id] => 5478082
[patent_doc_number] => 20090201039
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-13
[patent_title] => 'PROBING SYSTEM FOR INTEGRATED CIRCUIT DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/424969
[patent_app_country] => US
[patent_app_date] => 2009-04-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 3942
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0201/20090201039.pdf
[firstpage_image] =>[orig_patent_app_number] => 12424969
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/424969 | Probing system for integrated circuit device | Apr 15, 2009 | Issued |
Array
(
[id] => 7724803
[patent_doc_number] => 08098076
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-01-17
[patent_title] => 'Method and apparatus for terminating a test signal applied to multiple semiconductor loads under test'
[patent_app_type] => utility
[patent_app_number] => 12/416375
[patent_app_country] => US
[patent_app_date] => 2009-04-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 7104
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 154
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/098/08098076.pdf
[firstpage_image] =>[orig_patent_app_number] => 12416375
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/416375 | Method and apparatus for terminating a test signal applied to multiple semiconductor loads under test | Mar 31, 2009 | Issued |
Array
(
[id] => 4635170
[patent_doc_number] => 08013626
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-09-06
[patent_title] => 'Test apparatus and driver circuit'
[patent_app_type] => utility
[patent_app_number] => 12/414681
[patent_app_country] => US
[patent_app_date] => 2009-03-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 5678
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 90
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/013/08013626.pdf
[firstpage_image] =>[orig_patent_app_number] => 12414681
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/414681 | Test apparatus and driver circuit | Mar 30, 2009 | Issued |
Array
(
[id] => 7796531
[patent_doc_number] => 08125239
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-02-28
[patent_title] => 'Self calibrating current sensor'
[patent_app_type] => utility
[patent_app_number] => 12/381782
[patent_app_country] => US
[patent_app_date] => 2009-03-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 6282
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 177
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/125/08125239.pdf
[firstpage_image] =>[orig_patent_app_number] => 12381782
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/381782 | Self calibrating current sensor | Mar 16, 2009 | Issued |
Array
(
[id] => 6296138
[patent_doc_number] => 20100066395
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-03-18
[patent_title] => 'Wafer Prober Integrated With Full-Wafer Contacter'
[patent_app_type] => utility
[patent_app_number] => 12/404277
[patent_app_country] => US
[patent_app_date] => 2009-03-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 37
[patent_figures_cnt] => 37
[patent_no_of_words] => 2162
[patent_no_of_claims] => 1
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0066/20100066395.pdf
[firstpage_image] =>[orig_patent_app_number] => 12404277
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/404277 | Wafer Prober Integrated With Full-Wafer Contacter | Mar 12, 2009 | Abandoned |
Array
(
[id] => 6524284
[patent_doc_number] => 20100231250
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-16
[patent_title] => 'Pin Electronics Liquid Cooled Multi-module for High Performance, Low Cost Automated Test Equipment'
[patent_app_type] => utility
[patent_app_number] => 12/402380
[patent_app_country] => US
[patent_app_date] => 2009-03-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 6776
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0231/20100231250.pdf
[firstpage_image] =>[orig_patent_app_number] => 12402380
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/402380 | Pin electronics liquid cooled multi-module for high performance, low cost automated test equipment | Mar 10, 2009 | Issued |
Array
(
[id] => 8643425
[patent_doc_number] => 08368415
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-02-05
[patent_title] => 'Multi-position probe circuit tester'
[patent_app_type] => utility
[patent_app_number] => 12/389682
[patent_app_country] => US
[patent_app_date] => 2009-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 2377
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 165
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12389682
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/389682 | Multi-position probe circuit tester | Feb 19, 2009 | Issued |
Array
(
[id] => 5420186
[patent_doc_number] => 20090146641
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-06-11
[patent_title] => 'ELECTRONIC TAMPER DETECTION CIRCUIT FOR AN ELECTRICITY METER'
[patent_app_type] => utility
[patent_app_number] => 12/371754
[patent_app_country] => US
[patent_app_date] => 2009-02-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5080
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0146/20090146641.pdf
[firstpage_image] =>[orig_patent_app_number] => 12371754
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/371754 | Electronic tamper detection circuit for an electricity meter | Feb 15, 2009 | Issued |