Search

Roberto Velez

Supervisory Patent Examiner (ID: 6169, Phone: (571)272-8597 , Office: P/2662 )

Most Active Art Unit
2829
Art Unit(s)
2829, 2662, 2858, 3600
Total Applications
504
Issued Applications
309
Pending Applications
75
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6068343 [patent_doc_number] => 20110043192 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-24 [patent_title] => 'COAXIAL-CABLE PROBE STRUCTURE' [patent_app_type] => utility [patent_app_number] => 12/546479 [patent_app_country] => US [patent_app_date] => 2009-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2361 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20110043192.pdf [firstpage_image] =>[orig_patent_app_number] => 12546479 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/546479
COAXIAL-CABLE PROBE STRUCTURE Aug 23, 2009 Abandoned
Array ( [id] => 5926295 [patent_doc_number] => 20110037484 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-17 [patent_title] => 'System and Method for Augmented Impedance Sensing' [patent_app_type] => utility [patent_app_number] => 12/540190 [patent_app_country] => US [patent_app_date] => 2009-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4514 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0037/20110037484.pdf [firstpage_image] =>[orig_patent_app_number] => 12540190 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/540190
System and method for augmented impedance sensing Aug 11, 2009 Issued
Array ( [id] => 6247779 [patent_doc_number] => 20100136802 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-03 [patent_title] => 'TESTING DEVICE AND TESTING FIXTURES USED THEREIN' [patent_app_type] => utility [patent_app_number] => 12/534283 [patent_app_country] => US [patent_app_date] => 2009-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1574 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0136/20100136802.pdf [firstpage_image] =>[orig_patent_app_number] => 12534283 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/534283
TESTING DEVICE AND TESTING FIXTURES USED THEREIN Aug 2, 2009 Abandoned
Array ( [id] => 6193562 [patent_doc_number] => 20110025316 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-03 [patent_title] => 'EDDY CURRENT PROBE ASSEMBLY ADJUSTABLE FOR INSPECTING TEST OBJECTS OF DIFFERENT SIZES' [patent_app_type] => utility [patent_app_number] => 12/533417 [patent_app_country] => US [patent_app_date] => 2009-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6913 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0025/20110025316.pdf [firstpage_image] =>[orig_patent_app_number] => 12533417 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/533417
Eddy current probe assembly adjustable for inspecting test objects of different sizes Jul 30, 2009 Issued
Array ( [id] => 5556012 [patent_doc_number] => 20090267589 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-29 [patent_title] => 'CIRCUIT AND APPARATUS FOR DETECTING ELECTRIC CURRENT' [patent_app_type] => utility [patent_app_number] => 12/501782 [patent_app_country] => US [patent_app_date] => 2009-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4918 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0267/20090267589.pdf [firstpage_image] =>[orig_patent_app_number] => 12501782 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/501782
Circuit and apparatus for detecting electric current Jul 12, 2009 Issued
Array ( [id] => 8572481 [patent_doc_number] => 08339131 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-12-25 [patent_title] => 'Electric field sensor with electrode interleaving vibration' [patent_app_type] => utility [patent_app_number] => 12/501721 [patent_app_country] => US [patent_app_date] => 2009-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1982 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12501721 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/501721
Electric field sensor with electrode interleaving vibration Jul 12, 2009 Issued
Array ( [id] => 5300732 [patent_doc_number] => 20090295384 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-03 [patent_title] => 'Magnetic field sensor and electrical current sensor therewith' [patent_app_type] => utility [patent_app_number] => 12/459691 [patent_app_country] => US [patent_app_date] => 2009-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3069 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20090295384.pdf [firstpage_image] =>[orig_patent_app_number] => 12459691 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/459691
Magnetic field sensor and electrical current sensor therewith Jul 6, 2009 Issued
Array ( [id] => 8676290 [patent_doc_number] => 08384407 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-02-26 [patent_title] => 'Test pad structure, a pad structure for inspecting a semiconductor chip and a wiring subtrate for a tape package having the same' [patent_app_type] => utility [patent_app_number] => 12/457775 [patent_app_country] => US [patent_app_date] => 2009-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6623 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 330 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12457775 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/457775
Test pad structure, a pad structure for inspecting a semiconductor chip and a wiring subtrate for a tape package having the same Jun 21, 2009 Issued
Array ( [id] => 8329328 [patent_doc_number] => 08237427 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-08-07 [patent_title] => 'Wideband high impedance bridging module' [patent_app_type] => utility [patent_app_number] => 12/485383 [patent_app_country] => US [patent_app_date] => 2009-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6222 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 199 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12485383 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/485383
Wideband high impedance bridging module Jun 15, 2009 Issued
Array ( [id] => 4528039 [patent_doc_number] => 07952345 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-31 [patent_title] => 'Inverted magnetic isolator' [patent_app_type] => utility [patent_app_number] => 12/456028 [patent_app_country] => US [patent_app_date] => 2009-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 12859 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/952/07952345.pdf [firstpage_image] =>[orig_patent_app_number] => 12456028 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/456028
Inverted magnetic isolator Jun 9, 2009 Issued
Array ( [id] => 5300762 [patent_doc_number] => 20090295414 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-03 [patent_title] => 'TRANSIENT EMISSION SCANNING MICROSCOPY' [patent_app_type] => utility [patent_app_number] => 12/477082 [patent_app_country] => US [patent_app_date] => 2009-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2757 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20090295414.pdf [firstpage_image] =>[orig_patent_app_number] => 12477082 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/477082
Transient emission scanning microscopy Jun 1, 2009 Issued
Array ( [id] => 5401788 [patent_doc_number] => 20090237101 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-24 [patent_title] => 'METHOD FOR CORRECTING DISPLACEMENT OF MULTI CARD AND METHOD FOR TESTING CIRCUIT ELEMENT' [patent_app_type] => utility [patent_app_number] => 12/476281 [patent_app_country] => US [patent_app_date] => 2009-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4134 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20090237101.pdf [firstpage_image] =>[orig_patent_app_number] => 12476281 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/476281
METHOD FOR CORRECTING DISPLACEMENT OF MULTI CARD AND METHOD FOR TESTING CIRCUIT ELEMENT Jun 1, 2009 Abandoned
Array ( [id] => 6339161 [patent_doc_number] => 20100019792 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-28 [patent_title] => 'TESTING MODULE' [patent_app_type] => utility [patent_app_number] => 12/475675 [patent_app_country] => US [patent_app_date] => 2009-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1648 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20100019792.pdf [firstpage_image] =>[orig_patent_app_number] => 12475675 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/475675
Testing module for testing key buttons of portable electronic device May 31, 2009 Issued
Array ( [id] => 5556052 [patent_doc_number] => 20090267629 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-29 [patent_title] => 'Contact for interconnect system in a test socket' [patent_app_type] => utility [patent_app_number] => 12/386778 [patent_app_country] => US [patent_app_date] => 2009-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2259 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0267/20090267629.pdf [firstpage_image] =>[orig_patent_app_number] => 12386778 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/386778
Contact for interconnect system in a test socket Apr 21, 2009 Abandoned
Array ( [id] => 5478082 [patent_doc_number] => 20090201039 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-08-13 [patent_title] => 'PROBING SYSTEM FOR INTEGRATED CIRCUIT DEVICE' [patent_app_type] => utility [patent_app_number] => 12/424969 [patent_app_country] => US [patent_app_date] => 2009-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 3942 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20090201039.pdf [firstpage_image] =>[orig_patent_app_number] => 12424969 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/424969
Probing system for integrated circuit device Apr 15, 2009 Issued
Array ( [id] => 7724803 [patent_doc_number] => 08098076 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-01-17 [patent_title] => 'Method and apparatus for terminating a test signal applied to multiple semiconductor loads under test' [patent_app_type] => utility [patent_app_number] => 12/416375 [patent_app_country] => US [patent_app_date] => 2009-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 7104 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/098/08098076.pdf [firstpage_image] =>[orig_patent_app_number] => 12416375 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/416375
Method and apparatus for terminating a test signal applied to multiple semiconductor loads under test Mar 31, 2009 Issued
Array ( [id] => 4635170 [patent_doc_number] => 08013626 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-09-06 [patent_title] => 'Test apparatus and driver circuit' [patent_app_type] => utility [patent_app_number] => 12/414681 [patent_app_country] => US [patent_app_date] => 2009-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5678 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/013/08013626.pdf [firstpage_image] =>[orig_patent_app_number] => 12414681 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/414681
Test apparatus and driver circuit Mar 30, 2009 Issued
Array ( [id] => 7796531 [patent_doc_number] => 08125239 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-02-28 [patent_title] => 'Self calibrating current sensor' [patent_app_type] => utility [patent_app_number] => 12/381782 [patent_app_country] => US [patent_app_date] => 2009-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 6282 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/125/08125239.pdf [firstpage_image] =>[orig_patent_app_number] => 12381782 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/381782
Self calibrating current sensor Mar 16, 2009 Issued
Array ( [id] => 6296138 [patent_doc_number] => 20100066395 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-18 [patent_title] => 'Wafer Prober Integrated With Full-Wafer Contacter' [patent_app_type] => utility [patent_app_number] => 12/404277 [patent_app_country] => US [patent_app_date] => 2009-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 37 [patent_figures_cnt] => 37 [patent_no_of_words] => 2162 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20100066395.pdf [firstpage_image] =>[orig_patent_app_number] => 12404277 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/404277
Wafer Prober Integrated With Full-Wafer Contacter Mar 12, 2009 Abandoned
Array ( [id] => 6524284 [patent_doc_number] => 20100231250 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-16 [patent_title] => 'Pin Electronics Liquid Cooled Multi-module for High Performance, Low Cost Automated Test Equipment' [patent_app_type] => utility [patent_app_number] => 12/402380 [patent_app_country] => US [patent_app_date] => 2009-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 6776 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0231/20100231250.pdf [firstpage_image] =>[orig_patent_app_number] => 12402380 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/402380
Pin electronics liquid cooled multi-module for high performance, low cost automated test equipment Mar 10, 2009 Issued
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