Search

Russell Marc Kobert

Examiner (ID: 14392)

Most Active Art Unit
2858
Art Unit(s)
2858, 2829, 2213
Total Applications
684
Issued Applications
583
Pending Applications
38
Abandoned Applications
63

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 709073 [patent_doc_number] => 07061250 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-06-13 [patent_title] => 'Capacitive sensor measurement method for discrete time sampled system for in-circuit test' [patent_app_type] => utility [patent_app_number] => 11/287768 [patent_app_country] => US [patent_app_date] => 2005-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 9221 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/061/07061250.pdf [firstpage_image] =>[orig_patent_app_number] => 11287768 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/287768
Capacitive sensor measurement method for discrete time sampled system for in-circuit test Nov 27, 2005 Issued
Array ( [id] => 739490 [patent_doc_number] => 07034520 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-04-25 [patent_title] => 'Integrated circuit tester' [patent_app_type] => utility [patent_app_number] => 11/223421 [patent_app_country] => US [patent_app_date] => 2005-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 2823 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 288 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/034/07034520.pdf [firstpage_image] =>[orig_patent_app_number] => 11223421 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/223421
Integrated circuit tester Sep 8, 2005 Issued
Array ( [id] => 658047 [patent_doc_number] => 07105366 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-12 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => utility [patent_app_number] => 10/338522 [patent_app_country] => US [patent_app_date] => 2005-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2706 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/105/07105366.pdf [firstpage_image] =>[orig_patent_app_number] => 10338522 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/338522
Method for in-line testing of flip-chip semiconductor assemblies Sep 7, 2005 Issued
Array ( [id] => 5878965 [patent_doc_number] => 20060028417 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-09 [patent_title] => 'Display device' [patent_app_type] => utility [patent_app_number] => 11/195821 [patent_app_country] => US [patent_app_date] => 2005-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 12132 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20060028417.pdf [firstpage_image] =>[orig_patent_app_number] => 11195821 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/195821
Display device Aug 2, 2005 Issued
Array ( [id] => 5766600 [patent_doc_number] => 20050264311 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-01 [patent_title] => 'Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment' [patent_app_type] => utility [patent_app_number] => 11/189953 [patent_app_country] => US [patent_app_date] => 2005-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 4695 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0264/20050264311.pdf [firstpage_image] =>[orig_patent_app_number] => 11189953 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/189953
Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment Jul 24, 2005 Issued
Array ( [id] => 692358 [patent_doc_number] => 07075322 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-07-11 [patent_title] => 'Testing apparatus with electronic camera' [patent_app_type] => utility [patent_app_number] => 11/131032 [patent_app_country] => US [patent_app_date] => 2005-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 1761 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/075/07075322.pdf [firstpage_image] =>[orig_patent_app_number] => 11131032 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/131032
Testing apparatus with electronic camera May 15, 2005 Issued
Array ( [id] => 527457 [patent_doc_number] => 07187187 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-03-06 [patent_title] => 'Signal acquisition probing system using a micro-cavity laser' [patent_app_type] => utility [patent_app_number] => 11/077692 [patent_app_country] => US [patent_app_date] => 2005-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8660 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 286 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/187/07187187.pdf [firstpage_image] =>[orig_patent_app_number] => 11077692 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/077692
Signal acquisition probing system using a micro-cavity laser Mar 9, 2005 Issued
Array ( [id] => 656162 [patent_doc_number] => 07109739 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-19 [patent_title] => 'Wafer-level opto-electronic testing apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/075430 [patent_app_country] => US [patent_app_date] => 2005-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3813 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/109/07109739.pdf [firstpage_image] =>[orig_patent_app_number] => 11075430 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/075430
Wafer-level opto-electronic testing apparatus and method Mar 7, 2005 Issued
Array ( [id] => 730806 [patent_doc_number] => 07042240 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-09 [patent_title] => 'Burn-in testing apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/069589 [patent_app_country] => US [patent_app_date] => 2005-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4078 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/042/07042240.pdf [firstpage_image] =>[orig_patent_app_number] => 11069589 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/069589
Burn-in testing apparatus and method Feb 27, 2005 Issued
Array ( [id] => 677408 [patent_doc_number] => 07088120 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-08 [patent_title] => 'Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure' [patent_app_type] => utility [patent_app_number] => 11/065025 [patent_app_country] => US [patent_app_date] => 2005-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 2778 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/088/07088120.pdf [firstpage_image] =>[orig_patent_app_number] => 11065025 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/065025
Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure Feb 24, 2005 Issued
Array ( [id] => 7073071 [patent_doc_number] => 20050146337 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-07 [patent_title] => 'Method of manufacturing and testing semiconductor device using assembly substrate' [patent_app_type] => utility [patent_app_number] => 11/055627 [patent_app_country] => US [patent_app_date] => 2005-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4583 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20050146337.pdf [firstpage_image] =>[orig_patent_app_number] => 11055627 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/055627
Method of manufacturing and testing semiconductor device using assembly substrate Feb 10, 2005 Abandoned
Array ( [id] => 7239066 [patent_doc_number] => 20050140380 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-06-30 [patent_title] => 'Probe device, probe card channel information creation program, and probe card information creation device' [patent_app_type] => utility [patent_app_number] => 11/038026 [patent_app_country] => US [patent_app_date] => 2005-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 9760 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0140/20050140380.pdf [firstpage_image] =>[orig_patent_app_number] => 11038026 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/038026
Probe device, probe card channel information creation program, and probe card information creation device Jan 20, 2005 Issued
Array ( [id] => 734833 [patent_doc_number] => 07038442 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-02 [patent_title] => 'Apparatus and method for detecting photon emissions from transistors' [patent_app_type] => utility [patent_app_number] => 11/040333 [patent_app_country] => US [patent_app_date] => 2005-01-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 31 [patent_no_of_words] => 14343 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/038/07038442.pdf [firstpage_image] =>[orig_patent_app_number] => 11040333 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/040333
Apparatus and method for detecting photon emissions from transistors Jan 19, 2005 Issued
Array ( [id] => 5742053 [patent_doc_number] => 20060087777 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-27 [patent_title] => 'A CURRENT SENSOR THAT INCLUDES A PAIR OF SEGMENTS' [patent_app_type] => utility [patent_app_number] => 11/026929 [patent_app_country] => US [patent_app_date] => 2004-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4508 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0087/20060087777.pdf [firstpage_image] =>[orig_patent_app_number] => 11026929 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/026929
Current sensor that includes a pair of segments Dec 28, 2004 Issued
Array ( [id] => 6918319 [patent_doc_number] => 20050095880 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-05 [patent_title] => 'Stress relieved contact array' [patent_app_type] => utility [patent_app_number] => 10/997223 [patent_app_country] => US [patent_app_date] => 2004-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4456 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0095/20050095880.pdf [firstpage_image] =>[orig_patent_app_number] => 10997223 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/997223
Stress relieved contact array Nov 22, 2004 Issued
Array ( [id] => 6989834 [patent_doc_number] => 20050088871 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-28 [patent_title] => 'Semiconductor device and method of inspecting the same' [patent_app_type] => utility [patent_app_number] => 10/988710 [patent_app_country] => US [patent_app_date] => 2004-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 8762 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20050088871.pdf [firstpage_image] =>[orig_patent_app_number] => 10988710 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/988710
Semiconductor device and method of inspecting the same Nov 15, 2004 Issued
Array ( [id] => 946914 [patent_doc_number] => 06965248 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-15 [patent_title] => 'Compensation for test signal degradation due to DUT fault' [patent_app_type] => utility [patent_app_number] => 10/979059 [patent_app_country] => US [patent_app_date] => 2004-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 20 [patent_no_of_words] => 6370 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/965/06965248.pdf [firstpage_image] =>[orig_patent_app_number] => 10979059 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/979059
Compensation for test signal degradation due to DUT fault Oct 31, 2004 Issued
Array ( [id] => 935756 [patent_doc_number] => 06975106 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-12-13 [patent_title] => 'Phase locked time interval analyzer' [patent_app_type] => utility [patent_app_number] => 10/966229 [patent_app_country] => US [patent_app_date] => 2004-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 5301 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/975/06975106.pdf [firstpage_image] =>[orig_patent_app_number] => 10966229 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/966229
Phase locked time interval analyzer Oct 14, 2004 Issued
Array ( [id] => 7081031 [patent_doc_number] => 20050046411 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-03 [patent_title] => 'Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment' [patent_app_type] => utility [patent_app_number] => 10/965245 [patent_app_country] => US [patent_app_date] => 2004-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 4936 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0046/20050046411.pdf [firstpage_image] =>[orig_patent_app_number] => 10965245 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/965245
Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment Oct 12, 2004 Issued
Array ( [id] => 5898995 [patent_doc_number] => 20060043998 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-02 [patent_title] => 'Method of increasing reliability of packaged semiconductor integrated circuit dice' [patent_app_type] => utility [patent_app_number] => 10/940128 [patent_app_country] => US [patent_app_date] => 2004-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 3551 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20060043998.pdf [firstpage_image] =>[orig_patent_app_number] => 10940128 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/940128
Method of increasing reliability of packaged semiconductor integrated circuit dice Sep 13, 2004 Issued
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