
Russell Marc Kobert
Examiner (ID: 14392)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2829, 2213 |
| Total Applications | 684 |
| Issued Applications | 583 |
| Pending Applications | 38 |
| Abandoned Applications | 63 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 709073
[patent_doc_number] => 07061250
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-06-13
[patent_title] => 'Capacitive sensor measurement method for discrete time sampled system for in-circuit test'
[patent_app_type] => utility
[patent_app_number] => 11/287768
[patent_app_country] => US
[patent_app_date] => 2005-11-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 19
[patent_no_of_words] => 9221
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/061/07061250.pdf
[firstpage_image] =>[orig_patent_app_number] => 11287768
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/287768 | Capacitive sensor measurement method for discrete time sampled system for in-circuit test | Nov 27, 2005 | Issued |
Array
(
[id] => 739490
[patent_doc_number] => 07034520
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-04-25
[patent_title] => 'Integrated circuit tester'
[patent_app_type] => utility
[patent_app_number] => 11/223421
[patent_app_country] => US
[patent_app_date] => 2005-09-09
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[pdf_file] => patents/07/034/07034520.pdf
[firstpage_image] =>[orig_patent_app_number] => 11223421
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/223421 | Integrated circuit tester | Sep 8, 2005 | Issued |
Array
(
[id] => 658047
[patent_doc_number] => 07105366
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-09-12
[patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies'
[patent_app_type] => utility
[patent_app_number] => 10/338522
[patent_app_country] => US
[patent_app_date] => 2005-09-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => patents/07/105/07105366.pdf
[firstpage_image] =>[orig_patent_app_number] => 10338522
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/338522 | Method for in-line testing of flip-chip semiconductor assemblies | Sep 7, 2005 | Issued |
Array
(
[id] => 5878965
[patent_doc_number] => 20060028417
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-09
[patent_title] => 'Display device'
[patent_app_type] => utility
[patent_app_number] => 11/195821
[patent_app_country] => US
[patent_app_date] => 2005-08-03
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0028/20060028417.pdf
[firstpage_image] =>[orig_patent_app_number] => 11195821
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/195821 | Display device | Aug 2, 2005 | Issued |
Array
(
[id] => 5766600
[patent_doc_number] => 20050264311
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[patent_issue_date] => 2005-12-01
[patent_title] => 'Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment'
[patent_app_type] => utility
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[pdf_file] => publications/A1/0264/20050264311.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/189953 | Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment | Jul 24, 2005 | Issued |
Array
(
[id] => 692358
[patent_doc_number] => 07075322
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-07-11
[patent_title] => 'Testing apparatus with electronic camera'
[patent_app_type] => utility
[patent_app_number] => 11/131032
[patent_app_country] => US
[patent_app_date] => 2005-05-16
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[pdf_file] => patents/07/075/07075322.pdf
[firstpage_image] =>[orig_patent_app_number] => 11131032
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/131032 | Testing apparatus with electronic camera | May 15, 2005 | Issued |
Array
(
[id] => 527457
[patent_doc_number] => 07187187
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[patent_issue_date] => 2007-03-06
[patent_title] => 'Signal acquisition probing system using a micro-cavity laser'
[patent_app_type] => utility
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[pdf_file] => patents/07/187/07187187.pdf
[firstpage_image] =>[orig_patent_app_number] => 11077692
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/077692 | Signal acquisition probing system using a micro-cavity laser | Mar 9, 2005 | Issued |
Array
(
[id] => 656162
[patent_doc_number] => 07109739
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-09-19
[patent_title] => 'Wafer-level opto-electronic testing apparatus and method'
[patent_app_type] => utility
[patent_app_number] => 11/075430
[patent_app_country] => US
[patent_app_date] => 2005-03-08
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/109/07109739.pdf
[firstpage_image] =>[orig_patent_app_number] => 11075430
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/075430 | Wafer-level opto-electronic testing apparatus and method | Mar 7, 2005 | Issued |
Array
(
[id] => 730806
[patent_doc_number] => 07042240
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-05-09
[patent_title] => 'Burn-in testing apparatus and method'
[patent_app_type] => utility
[patent_app_number] => 11/069589
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[pdf_file] => patents/07/042/07042240.pdf
[firstpage_image] =>[orig_patent_app_number] => 11069589
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/069589 | Burn-in testing apparatus and method | Feb 27, 2005 | Issued |
Array
(
[id] => 677408
[patent_doc_number] => 07088120
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[patent_issue_date] => 2006-08-08
[patent_title] => 'Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure'
[patent_app_type] => utility
[patent_app_number] => 11/065025
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[patent_app_date] => 2005-02-25
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[patent_drawing_sheets_cnt] => 4
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[pdf_file] => patents/07/088/07088120.pdf
[firstpage_image] =>[orig_patent_app_number] => 11065025
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/065025 | Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure | Feb 24, 2005 | Issued |
Array
(
[id] => 7073071
[patent_doc_number] => 20050146337
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-07
[patent_title] => 'Method of manufacturing and testing semiconductor device using assembly substrate'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/055627 | Method of manufacturing and testing semiconductor device using assembly substrate | Feb 10, 2005 | Abandoned |
Array
(
[id] => 7239066
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[patent_title] => 'Probe device, probe card channel information creation program, and probe card information creation device'
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Array
(
[id] => 734833
[patent_doc_number] => 07038442
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[patent_issue_date] => 2006-05-02
[patent_title] => 'Apparatus and method for detecting photon emissions from transistors'
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[firstpage_image] =>[orig_patent_app_number] => 11040333
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/040333 | Apparatus and method for detecting photon emissions from transistors | Jan 19, 2005 | Issued |
Array
(
[id] => 5742053
[patent_doc_number] => 20060087777
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[patent_title] => 'A CURRENT SENSOR THAT INCLUDES A PAIR OF SEGMENTS'
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[firstpage_image] =>[orig_patent_app_number] => 11026929
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/026929 | Current sensor that includes a pair of segments | Dec 28, 2004 | Issued |
Array
(
[id] => 6918319
[patent_doc_number] => 20050095880
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[patent_title] => 'Stress relieved contact array'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/997223 | Stress relieved contact array | Nov 22, 2004 | Issued |
Array
(
[id] => 6989834
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[patent_title] => 'Semiconductor device and method of inspecting the same'
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Array
(
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[patent_title] => 'Compensation for test signal degradation due to DUT fault'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/979059 | Compensation for test signal degradation due to DUT fault | Oct 31, 2004 | Issued |
Array
(
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Array
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Array
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