
Russell Marc Kobert
Examiner (ID: 14392)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2829, 2213 |
| Total Applications | 684 |
| Issued Applications | 583 |
| Pending Applications | 38 |
| Abandoned Applications | 63 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6107813
[patent_doc_number] => 20020171443
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-11-21
[patent_title] => 'Connector assembly with decoupling capacitors'
[patent_app_type] => new
[patent_app_number] => 09/858224
[patent_app_country] => US
[patent_app_date] => 2001-05-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 3081
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 68
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0171/20020171443.pdf
[firstpage_image] =>[orig_patent_app_number] => 09858224
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/858224 | Connector assembly with decoupling capacitors | May 14, 2001 | Issued |
Array
(
[id] => 1285412
[patent_doc_number] => 06642728
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-11-04
[patent_title] => 'Holder of electroconductive contactor, and method for producing the same'
[patent_app_type] => B1
[patent_app_number] => 09/744825
[patent_app_country] => US
[patent_app_date] => 2001-05-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 4352
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 167
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/642/06642728.pdf
[firstpage_image] =>[orig_patent_app_number] => 09744825
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/744825 | Holder of electroconductive contactor, and method for producing the same | May 10, 2001 | Issued |
Array
(
[id] => 1422814
[patent_doc_number] => 06509750
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-01-21
[patent_title] => 'Apparatus for detecting defects in patterned substrates'
[patent_app_type] => B1
[patent_app_number] => 09/846487
[patent_app_country] => US
[patent_app_date] => 2001-04-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 15
[patent_no_of_words] => 9554
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 119
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/509/06509750.pdf
[firstpage_image] =>[orig_patent_app_number] => 09846487
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/846487 | Apparatus for detecting defects in patterned substrates | Apr 29, 2001 | Issued |
Array
(
[id] => 6748408
[patent_doc_number] => 20030042928
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-03-06
[patent_title] => 'S-parameter microscopy for semiconductor devices'
[patent_app_type] => new
[patent_app_number] => 09/840563
[patent_app_country] => US
[patent_app_date] => 2001-04-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 40
[patent_figures_cnt] => 40
[patent_no_of_words] => 7599
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 37
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0042/20030042928.pdf
[firstpage_image] =>[orig_patent_app_number] => 09840563
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/840563 | S-parameter microscopy for semiconductor devices | Apr 22, 2001 | Issued |
Array
(
[id] => 6171205
[patent_doc_number] => 20020153914
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-10-24
[patent_title] => 'AC testing of leakage current'
[patent_app_type] => new
[patent_app_number] => 09/838730
[patent_app_country] => US
[patent_app_date] => 2001-04-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5414
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 45
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0153/20020153914.pdf
[firstpage_image] =>[orig_patent_app_number] => 09838730
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/838730 | AC testing of leakage current in integrated circuits using RC time constant | Apr 18, 2001 | Issued |
Array
(
[id] => 1198125
[patent_doc_number] => 06727722
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-04-27
[patent_title] => 'Process of testing a semiconductor wafer of IC dies'
[patent_app_type] => B2
[patent_app_number] => 09/835802
[patent_app_country] => US
[patent_app_date] => 2001-04-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 30
[patent_figures_cnt] => 79
[patent_no_of_words] => 9380
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 149
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/727/06727722.pdf
[firstpage_image] =>[orig_patent_app_number] => 09835802
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/835802 | Process of testing a semiconductor wafer of IC dies | Apr 15, 2001 | Issued |
Array
(
[id] => 1267032
[patent_doc_number] => 06661247
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-12-09
[patent_title] => 'Semiconductor testing device'
[patent_app_type] => B2
[patent_app_number] => 09/828221
[patent_app_country] => US
[patent_app_date] => 2001-04-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 32
[patent_figures_cnt] => 80
[patent_no_of_words] => 20503
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 118
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/661/06661247.pdf
[firstpage_image] =>[orig_patent_app_number] => 09828221
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/828221 | Semiconductor testing device | Apr 8, 2001 | Issued |
Array
(
[id] => 1074203
[patent_doc_number] => 06838869
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-01-04
[patent_title] => 'Clocked based method and devices for measuring voltage-variable capacitances and other on-chip parameters'
[patent_app_type] => utility
[patent_app_number] => 09/825027
[patent_app_country] => US
[patent_app_date] => 2001-04-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 38
[patent_figures_cnt] => 38
[patent_no_of_words] => 31643
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 143
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/838/06838869.pdf
[firstpage_image] =>[orig_patent_app_number] => 09825027
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/825027 | Clocked based method and devices for measuring voltage-variable capacitances and other on-chip parameters | Apr 1, 2001 | Issued |
Array
(
[id] => 7063788
[patent_doc_number] => 20010043077
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-11-22
[patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies'
[patent_app_type] => new
[patent_app_number] => 09/819472
[patent_app_country] => US
[patent_app_date] => 2001-03-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2681
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 12
[patent_words_short_claim] => 55
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0043/20010043077.pdf
[firstpage_image] =>[orig_patent_app_number] => 09819472
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/819472 | Method for in-line testing of flip-chip semiconductor assemblies | Mar 27, 2001 | Issued |
Array
(
[id] => 6959776
[patent_doc_number] => 20010011898
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-08-09
[patent_title] => 'IC socket, a test method using the same and an IC socket mounting mechanism'
[patent_app_type] => new
[patent_app_number] => 09/809204
[patent_app_country] => US
[patent_app_date] => 2001-03-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 11089
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 100
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0011/20010011898.pdf
[firstpage_image] =>[orig_patent_app_number] => 09809204
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/809204 | IC socket, a test method using the same and an IC socket mounting mechanism | Mar 15, 2001 | Issued |
Array
(
[id] => 7012819
[patent_doc_number] => 20010050570
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-12-13
[patent_title] => 'Method of forming an apparatus configured to engage an electrically conductive pad on a semiconductive substrate and a method of engaging electrically conductive pads on a semiconductive substrate'
[patent_app_type] => new
[patent_app_number] => 09/808879
[patent_app_country] => US
[patent_app_date] => 2001-03-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 3825
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 86
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0050/20010050570.pdf
[firstpage_image] =>[orig_patent_app_number] => 09808879
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/808879 | Method of forming an apparatus configured to engage an electrically conductive pad on a semiconductive substrate and a method of engaging electrically conductive pads on a semiconductive substrate | Mar 13, 2001 | Issued |
Array
(
[id] => 1285312
[patent_doc_number] => 06642708
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-11-04
[patent_title] => 'Marker system for test fixture'
[patent_app_type] => B1
[patent_app_number] => 09/782785
[patent_app_country] => US
[patent_app_date] => 2001-02-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5683
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 143
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/642/06642708.pdf
[firstpage_image] =>[orig_patent_app_number] => 09782785
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/782785 | Marker system for test fixture | Feb 13, 2001 | Issued |
Array
(
[id] => 1598355
[patent_doc_number] => 06492824
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-12-10
[patent_title] => 'Adapter base for receiving electronic test objects'
[patent_app_type] => B1
[patent_app_number] => 09/719930
[patent_app_country] => US
[patent_app_date] => 2001-01-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 4
[patent_no_of_words] => 1347
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/492/06492824.pdf
[firstpage_image] =>[orig_patent_app_number] => 09719930
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/719930 | Adapter base for receiving electronic test objects | Jan 23, 2001 | Issued |
Array
(
[id] => 6887383
[patent_doc_number] => 20010008377
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-07-19
[patent_title] => 'Non-contact board inspection probe'
[patent_app_type] => new-utility
[patent_app_number] => 09/765290
[patent_app_country] => US
[patent_app_date] => 2001-01-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 5753
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 201
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0008/20010008377.pdf
[firstpage_image] =>[orig_patent_app_number] => 09765290
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/765290 | Non-contact board inspection probe | Jan 21, 2001 | Issued |
Array
(
[id] => 1563522
[patent_doc_number] => 06362614
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-03-26
[patent_title] => 'Electronic probe for measuring high impedance tri-state logic circuits'
[patent_app_type] => B1
[patent_app_number] => 09/755265
[patent_app_country] => US
[patent_app_date] => 2001-01-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 3414
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 177
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/362/06362614.pdf
[firstpage_image] =>[orig_patent_app_number] => 09755265
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/755265 | Electronic probe for measuring high impedance tri-state logic circuits | Jan 4, 2001 | Issued |
Array
(
[id] => 1418710
[patent_doc_number] => 06528986
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-03-04
[patent_title] => 'Inner component board assembly for an electric utility meter'
[patent_app_type] => B2
[patent_app_number] => 09/751316
[patent_app_country] => US
[patent_app_date] => 2000-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 21
[patent_figures_cnt] => 26
[patent_no_of_words] => 6997
[patent_no_of_claims] => 60
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 36
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/528/06528986.pdf
[firstpage_image] =>[orig_patent_app_number] => 09751316
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/751316 | Inner component board assembly for an electric utility meter | Dec 27, 2000 | Issued |
Array
(
[id] => 6577839
[patent_doc_number] => 20020084795
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-07-04
[patent_title] => 'System for and method of testing a microelectronic device using a dual probe technique'
[patent_app_type] => new
[patent_app_number] => 09/751355
[patent_app_country] => US
[patent_app_date] => 2000-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3821
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0084/20020084795.pdf
[firstpage_image] =>[orig_patent_app_number] => 09751355
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/751355 | System for and method of testing a microelectronic device using a dual probe technique | Dec 27, 2000 | Issued |
Array
(
[id] => 6577794
[patent_doc_number] => 20020084792
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-07-04
[patent_title] => 'SOI die analysis of circuitry logic states via coupling through the insulator'
[patent_app_type] => new
[patent_app_number] => 09/751097
[patent_app_country] => US
[patent_app_date] => 2000-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3230
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 86
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0084/20020084792.pdf
[firstpage_image] =>[orig_patent_app_number] => 09751097
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/751097 | SOI die analysis of circuitry logic states via coupling through the insulator | Dec 27, 2000 | Abandoned |
Array
(
[id] => 7012814
[patent_doc_number] => 20010050565
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-12-13
[patent_title] => 'Multi-point probe'
[patent_app_type] => new
[patent_app_number] => 09/750645
[patent_app_country] => US
[patent_app_date] => 2000-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 8143
[patent_no_of_claims] => 64
[patent_no_of_ind_claims] => 53
[patent_words_short_claim] => 18
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0050/20010050565.pdf
[firstpage_image] =>[orig_patent_app_number] => 09750645
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/750645 | Multi-point probe | Dec 27, 2000 | Abandoned |
Array
(
[id] => 6368376
[patent_doc_number] => 20020118034
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-08-29
[patent_title] => 'Transistor device testing employing virtual device fixturing'
[patent_app_type] => new
[patent_app_number] => 09/749027
[patent_app_country] => US
[patent_app_date] => 2000-12-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 4155
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 37
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0118/20020118034.pdf
[firstpage_image] =>[orig_patent_app_number] => 09749027
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/749027 | Transistor device testing employing virtual device fixturing | Dec 25, 2000 | Issued |